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WC 621.327.332.3:621.316.84
@ (kjyright 1966
Indian Standard
METHODS OF TEST FOR
RESISTANCEOF METALLIC
ELECTRICALRESISTANCEMATERIAL
Electrical Instruments and Meters Sectional Committee; ETDC 6
Chainmm R@rssmtiag
PM? H, N, R~MACR&NDmRAO Indhn Institute of S&we, Bar@ore
Members
ADDITIONALCmm ENOIYttXR, Directorate General of Posts & Telegraphs ( Miiwry
P &T, .J-ALP= of Transport & Gommunicatioru )
DIBXXWB or TELMJXAPES
(L) ( Altrrna&)
DXVISIOHAL ENCWNEEB TnLIt.
oRAFss (P) ( Altcmd# )
: SBBI S. K. BASU Volt= Limited, Bombay
SHBI S. R M’?QASWAMY( Afterwh )
SBE[ M: G. ~)3AT Automatic Electric Privxte ~~mited, Bombsy
SrIm N. N. CEAKBABOBTY Gommerm & Industries Department, Government of
Wat Bengal
SEW D. P. Cu4Tr6arBx Gentral Wakr & Power GornmiAon ( Power Wing)
SHM L. C.JMN ( .Wwnuh )
S=m P:,J.’DAItAW The Bombay Electric Supply & Transport Under-
taking, Rontbay
S-M. P. CEMJXMQ( Ahemak )
SIZBIS. DAWS Cmmpton Parkinson ( Work\} Limited, Bombay
SSBI A. MAJUUDAB( Altmeh )
SEM A. K. Gmtur Tbc ~~mc:a Electric Supply Corporation Ltd.
( (htfinsdjbm #age 1 )
Members i?bj$rwnfing
Smsr R. C. KIMNNA DelKl Electric Sup Iy Undertaking, Naw Delhi
WQ CDS D. J, LAWYEB Directorate of T- 1“meal Dcvclopmcnt & Production
(Air ), Ministry of Defence
&N Lms S. E. PtrrrhxIX ( Aknsa& )
%sx K. N MmEUR Standing Metric Committee, Minktry of Industry,
Government of Rajasttmrs
Ssmr S. N. MU~ZEJI Nasional ‘Test House, Csdcuttsi
SmsI B. K, kfmrrrm.m~ ( Aftsrrrate)
Srms V. RADEAWWJISNAN Heavy IkctricaIs (India) Ltd, Bhopal
Srrs] H. -K. RAKtSASWALSY Federation of Electricity Ihdcrtakings of India,
Bombay
SREI K. MAZT=AN( Altmsatc)
SE= A. S. SRAR Jyoti Liiitcd, Baroda
Srrx Y. P. KAT.XMiIIt
(,A%rsta&u
)
Kmartr B. FL SEANTA Elcetrmiic Measuring Equipment Subcommittee,
. ETDC 24:2, 1S1
%rm R. C. SEABZUA Elec~:~*hDepartmerrt, Govcmment of Uttar
Conrwr
SmsI R. K. T-AK~AN National Physical Laboratory ( CSIR ), New Delhi
Mnnk
DB G. N. BEATTMEAISYA University Coliege of Technology, Calcutta
Srqx B. M. S. @OFItA Department of Industries, Clmndigarlt
Smsr P. J. DAXANY The Bombay Electric Supply & Transport Under-
rakmg, Bosnbay
%mr M. P. &AmMN (Altmsak)
SXSSIS. DAW8 Crompton Parkinson ( Works) L]mited, Bombay
S-1 A. MAJUSSDAE (Alternate)
%sm R.N. DEXA Small Scale Industries ( Ministry of Industry )
SHEI R. R. DXOO~ AH India Instrument Manufacturers’ and Dcakrs’
Association, Bombay
PRO?P. N. Du. ( Akrnatt )
( Cosrtirsswi
on#age 8 )
2
Ists635 -1966
Indian Standard
METHODS OF TEST FOR
RESISTANCEOF METALLIC
ELECTRICALRESISTANCEMATERIAL
IL FOREWORD
-M This Indian Standard was ado ted by the Indian.. Wmdarcis Institu-
tion on 1S June 1966, after the dr a/’t finalized by the Electrical Instruments
and Meters Sectionai Committee had beers approved by the E1etrotechni-
cal Division Council.
0.2 This standard prescribes methods to lx used in determ-injng resistance
of metallic electrical resistance material in. rriferee and routine tests. The
qxuracy specified in the referee method is what could be achieved under
MbOratory conditions. Rout@ tests, Of course, do not aim at the s-
degree of precision as referee tests, but they would be found tq,be sufE-
cient for most practical. cases. In case of dispute, referee method should
be used.
0.3 The electrical resistivity raay be calculated from a knowledge of
resistance and dimensions of test specimen (SC64 ) but generally in practice
it is not required ‘to know the resist@it y of the resistance material to-the
same order of accuracy as resistance per unit length.
0.4 In the preparation of this standard, assistance has been derived from
B.S. 3466:196’2 ‘ Methods of test for resistance per unit length of metailic
electriczd resistance material’ issued by the British Standards Institution.
0.5 In reporting the result of a test made in accordance with this standard,
if the final value, obsqved or calculated, is to be rcmnded off, it shall be
done in accordance with IS: 2-19608.
1. SCOPE
1.1 This standard describes a referee method and a routirie method .of
determining the electrical resistance per unit length of metallic electrical
resistance material. The referee method provides for an overall accuracy
of 02 percestt and the routine method provides for an overall accuracy of
1 percent in resistance per umt length on test specimens having a resis-
tance of 1 milliohm or more.
*Rulca for mundmg C# numerical vaiucs ( rtvimf ).
3
r3:3635-K166
2. REPEREE METHOD
2.1 Test Sptc.imen
2.1.1 The test specimen shall have the following characteristics:
a) No joints or splices,
b) A test length of at least 30 cm, and
c) A resistance of at ieast 1 milliohm in the test length between
potential contacts.
2.2 Apparatus
2.2.1 Where the resistance of the test specimen is below 10 ohms, the
resistance shall be measured with a Kelvin double bridge or with a
tentiometer. Where the resistance is 10 ohms or more, a WheatStone
r ridge may be used.
2.3 Proiwdure
2.3.1 The resistance test length shall bc sttfliciently WCI1defined to
permit its determination with an accuracy of at least 005 percent.
2.3.1.1 When a Kelvin double bridge or a potentiometer is used, the
potentiai contacts shall be substantially shar needle pointi or knlfc-edges.
On flat surfaces needle points arc, in genera,r preferable. The test length
shall be determined either from the known distance between the potential
contacts or by measuring the distance between the marks left on the
specimen by the potential contacts.
23.L2 The test specimen shah not be under appreciable strain dur-
ing the determination of resistance.
2.3.2 Where potential leads are used, the distance between each potential
contact and the co~~nding current contact shall be at least equal to
i●5 times the cross-sectional perimeter of the specimen. Where the doublc-
bridgc method is USed; the yoke r~istance, between reference standard and
test specimen, shall be appreciably smaiier than that of either the rde-
rence standard or the test specimen, unless a suitable lead compensation
method is used, or it is known that the coil and lead ratios are sufficiently
balanced so that variation in yoke resistance will not decrease the bridge
accuracy be!ow requirement.
2.3S The specimen shall be subjected to a temperature of 140° & 5°C
for not less than 16 hours for alloys of the 80/20 nickel)chromium type and
of the copper/manganese type with -an apwoximate composition 84/12,
and to a baking period spec~fied by the manufacturer for other alioys.
The purpose of this treatment M to stibfiize the resistance of the wire, and
the measured characteristics of the specimen after treatment shall be consi-
dered as the true resistance characteristics of the material.
4
1s:3635.1%6
2.3.4 Resistance measurements shall be made to an accuracy of 01
percent and the specimen shall be immersed in oil while the measurement
is made.
2.3.4.X If the temperature coefficient of resistance ,of the material
under test does not exceed 500 ppm per deg C, the temperature of the oil
shall be measured with a thermometer wiich is accurate to 0°5 deg C.
2.3.4.2 If the temperature coefficient of resistance’ of the material
under test is greater than 500 ppm per deg Cl, the temperature of the oil
shall be measured with a thermometer which is accurate to 0“ 1 dcgj C,
and the temperature of the oil with the specimen immersed shall be mea-
sured at least twice, with an interval of not less than 15 minutes between
measurements. The last temperature read~ng shall be taken immediately
before making the resistance measurement and shall not vary fmm the
preceding reading by more than 01 dcg C, This temperature shall be
recorded.
2.3.5 The test current shall. not be of such a magnitude as to produeo
an appreciable change in resistance of the specimen or measuring appa~
ratus due to the heating effect.
2.3.5.1 To determine experimentally that the test current is not
too large, the specimen may be immersed in a bath at 27° + 1°C. The
test current is appiied -and maintained until the resistance of the speci-
men has become constant. The current is then increased in steps up to 140
percent of its initial vaiue, and the resistance is measured at each step.
If the resistance at any step diflkrs from the original value by more than
002 percent, -the test current is too large and should be reduced until
the foregoing limitation is reached.
2S.6 The measurements shall be made in such a way that the effects of
thermoelectrornotive forces and parasitic currents are minimized.
23.6.1 Thus, in a bridge circuit, if there is appreciable thermoehc-
tromotive force, it may be desirable to close the galvanometers key &t.
If the galvanometers deflects, it is allowed to’reach a steady deflection, and
balance is regarded as having been achieved if there is no further
movement of the galvanometers when the battery key is ciosed. If howeveri
there is appreciable inductance in the circuit there may be a transient
deflection when the battery key is closed, and it is then sometimes better
to close the battery key first.The bridge is adjusted until there is no deflec-
tion when the galvanomet~r key is closed, but since the balance may
be aflkctcd by thermoelectric effects, il is necessary to take another. reading
with the battery connections reversed. The, resistance of the specimen
is taken as the mean of the”two readings.
2.3.6.2 If a potentiometer method is used, the specimen under test<
and a high quaiity resistance standard are connected in series to a steady
and adjustable source of direct current, and the potentiometer is switched
5
XlYr3635- 1966
$ x resistance of standard
3. RCM7’HNE METEIOD
%3 Procedure
3.3.1 The msistancc testlength shali be sufficiently well defined to per-
mit itsdetermination with an accuracy of at least 0.2 percent
6
E3Z3635 -1966
where
p = resistivity,
A == cross-sectional area,
L = length, and
R = resistance.
7
lsf3635 -1986
( cairtilrudjbrn page 2 )
Membm R8&?Armting
PBOr C. S. GEOSE “’ University of Roorkee, Roorkee
SE= D. T. Gma4rr@I Directorate General of Su~plie9 & Diqxrd
Itxpection Wing) ( Mimatry of Supplica &
$ ccktticalDevelopment)
‘== d ; ~vy::~
Ssm-B. ( ~l~ate ) NationalTestHouse,~cutta
S@ Ma s. B. PvBA1’iIE Directorate of Technical Davelopment & Production,
(Air), Minia~o*Defence
-or H. N. RAXACFIAXDBA RAO Indian Institute of cicna, Bangalore
Snsx H. S. SAVABXAB Gmnnont-Kalcc limited, Bombay
KWMARX ~. H. SXANT4 Electronic Mcawhg Equipment Subcommittee,
ETDC 24:2. 1S1
SBBI N. G. SSIVATUA?Z Ccn&alScientifi~Inatrurncnts Organization ( OSIR),
Ohandigarh
LT.COL D. SWABOOP Chief Irmpectorate of Electronics, Ministry d
Ddencc, Banualore
SEX K. V. RAMAKUE’ f Mtrnafc ) - -
simx B. V. TOMIII Bajaj Ekctricals Limited, Poorm
SBBXL. J. Jos81 ( AftuIIti )
SEX MADAS G. TOSBIUWAL Toshniwal Brm Private Limited, Ajmcr
SIUI M. L. JAItt ( Alknatc )
*BI I-L S. VMWM3WAEXAX Radio & Elcctricals Manufacturing Co Ld
Bangalorc
S-V. R. c6AMJRIi ( Alkrnata )
8
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