Professional Documents
Culture Documents
Kavitha Arunachalam
Dept of Engineering Design
(akavitha@iitm.ac.in)
Objectives:
• To introduce fundamental behavior of analog circuit components and their non-
ideal behavior in a system with emphasis on product design, and EMC directives
for compliance aspects of electronic products
Outcomes:
• Knowledge of device design for compliance to EMC directives, EMC directives for
product development
• Credits – 12
• E slot – Tue, Wed, Thu
• Q slot – Practical (End of lectures)
• Text Book:
– Introduction to Electromagnetic Compatibility, P. R. Clayton, Wiley India Pvt. Ltd.,
ISBN13: 9788126528752, ISBN 10:8126528753, 2006.2. EMC for Product Designers, T.
Williams, Elsevier Science, ISBN-10: 0750681705, ISBN-13: 9780750681704, 2007.
• Reference:
– Lecture notes.
Introduction - EMC
• Basic understanding of electrical engineering courses
– Electric circuit analysis
– Signals and systems
– Electronics (Analog & Digital)
– Electromagnetic field theory
CISPR 16 Series, IEC/EN/K 61000-4 Series for ESD, RS/CS, Surge, EFT
burst tests
Generic Standard
Generic standards – Immunity (EMS) and emission (EMI) for residential,
commercial and light-industrial environments
9
Standards (cont…)
• IEC 60945(Maritime Navigation and Radio communication Equipment and
Systems)
• IEC 60533(Electrical and electronics installation in ships)
• IEC 61326(Electrical equipment for measurement, control and laboratory use)
• IEC 61131-2(Programmable controllers )
• IEC 61204-3(Low voltage power supplies)
• and many more…
EMC Testing
EMC
TESTING
Oscilloscope
ESD Generator
EMI test Receiver
Signal Generator
Spectrum Analyzer LISN
Antenna 30
Brief history
• Prior 1930s – Natural noise sources such as lightning or sunspots
• Man made noise sources
– information carrying signals from telephone, TV and radio communication systems
– dc motors, ac power lines, relays, and fluorescent light bulbs
• 1933 – CISPR produced document regarding equipment for measuring EMI
emissions
• World war II (1939-45)
– burst in use of radar and telecomm system
– Electronic warfare to disrupt radio communication
• Post war – EM pulse generated by a nuclear blast damaged/destroyed
certain types of electronic equipment
0 2
• Consider a component with leads and total length, L
• In lumped circuit analysis (KVL/KCL), leads and interconnect
wires are neglected
• Let a current pass through the component.
• Current travelling through it is a function of space and time
• Time delay in travelling through the component is given by,
TD=L/v;
v: velocity of current wave in the component
z
v depends on medium
EM material properties
• Teflon (dielectric),
• = =0.69 v0
• where
• In ratio,