Sub By: Sarita Roll no: 1311 M.Sc. FORENSIC SCIENCE INTRODUCTION • A scanning electron microscope is type of electron microscope that produces image of a sample by scanning the surface with a focused beam of electrons. • The electrons interact with atoms in the sample, producing various signals that contain information about the surface topography and composition of the sample. Conti….. • The electron beam is scanned in a raster scan pattern, and the position of the beam is combined with the intensity of the detected signal to produce an image. • The secondary electrons emitted by atoms excited by the electron beam are detected using an Everhart-Thornley detector. • SEM can achieve resolution better than 1 nm. A LOOK OF AN SEM………. HISTORY • An account of the early history of SEM has been presented by McMullan. • Max Knoll produced a photo with a 50mm object field width showing channeling contrast by the use of an electron beam scanner. • It was Manfred von Ardenne who in 1937 invented a true microscope with high magnification by scanning a very small raster with a demagnified and finely focused electron beam. It was commercially used in 1965. Principle Basically SEM depends upon the various kinds of electronic signals. Such as: 1. Secondary electrons(SE) 2. Reflected or Back scattered electrons (BSE) 3. X-Rays 4. light(cathodoluminescence) 5.Absorbed current (specimen current) CHARACTERSTICS THAT CAN BE VIEWED… Topography: The surface features of an object or “how it looks”, its texture, direct relation b/w these features and materials properties. Morphology: The shape and size of the particles making up the object ;direct relation b/w these structures and materials properties . Composition: The elements and the compounds that the object is compared of and relative amounts of them ;direct relation b/w composition and materials properties. Conti… Crystallographic information: How the atoms are arranged in the object. COMPARISION B/W OM & EM • OPTICAL MICROSCOPE • ELECTRON MICROSCOPE 1. the source of light. 1. The light source is replaced by a fast 2. The specimen. moving electrons beam. 3. The lenses that makes 2. The specimen is the makes the specimen specially prepared. seem bigger. 3. The lenses are replaced 4. The magnified image of by a electromagnetic the specimen that we coils. see. 4. The image is formed as a photograph on a TV screen. SEM Sample Preparation • Cleaning the surface of specimen: The specimen should be free from the dust, silt, detritus and other kind contamination before the examination. • Stabilizing the specimen: Stabilizing is typically done with fixatives. Fixation can be achieved, for e.g., by perfusion, microinjection, immersion and by using vapours like osmium tetraoxide, aldehydes, tannic acid etc. Conti.. • Rinsing the specimen: Use to remove the excess of fixative. • Dehydrating the specimen: It is perforated with acetone or ethanol • Drying the specimen: In SEM it is necessary to dry the samples at its critical point drying(CPD) otherwise in vacuum chamber the sample can be destroyed. Conti.. • Mounting the specimen: After dried using an appropriate protocol, specimen must be mounted on a holder that can be inserted into the SEM. Typically samples are mounted on a metallic stub(aluminum) using a double sticky tape. • Coating the specimen: It is use to increase the conductivity of specimen in SEM to prevent the high voltage charges on the specimen by conducting the to ground. E.g. gold, Pt. Prepared specimen.. HOW A SCANNING ELECTRON MICROSCOPE WORK?? SCANNING ELECTRON MICROSCOPE SCANNING ELECTRON MICROSCOPE 1) The virtual source at the top represents the electron gun, producing a stream of monochromatic electrons. 2) The stream is condensed by the first condenser lens (usually controlled by the coarse probe current knob). This lens is used to both form the beam and light the amount of current in the beam . Its works in conjunction with the condenser aperture to eliminate the high angle electrons from the beam. SCANNING ELECTRON MICROSCOPE SCANNING ELECTRON MICROSCOPE SCANNING ELECTRON MICROSCOPE 6) A set of coils then scan or sweep the beam in a grid fashion (like a TV), dwelling on points for a period of time determined by the scan speed (usually in microscope range). 7) The final lens, the objective, focuses the scanning beam onto the other part of the specimen desired. 8) when the beam strikes the sample interactions occur inside the sample and detected by instruments. SCANNING ELECTRON MICROSCOPE 9) Before the beam to its next dwell point these instruments count the number of electrons interactions and display a pixel on CRT. 10) This process is repeated until the grid scan is finished and then repeated, the entire pattern can be scanned 30 times/sec. SEM APPLICATIONS
• It is used in a number of scientific and industries
especially where the characterization of solid materials is beneficial. • To get topographical, morphological and compositional information. • SEMs are essential research tool in life science, gemology, medical and forensic science, metallurgy. • Also used in semiconductors and microchips production. ADVANTAGE USING SEM OVER OM Magnification depth of field resolution OM: 4X-1400X 0.5mm -0.2mm SEM:10X-500kx 30mm 1.5nm 1. The seem has a large depth of field ,which allows a large amount of the sample to be in focus at one time and produces an image that is good representation of the 3-D sample . 2. The combination of higher magnification, larger depth of field, greater resolution, compositional and crystallographic information's makes the SEM one of the most heavily used instrument in academic/ national lab research areas and industry. DISADVANTAGE • Firstly it is very expensive and large. • Its handling is very complicated. • The sample preparation require special training. • It is limited to solid, inorganic samples and size to fit in sample chamber. • Its carry a small risk of radiation exposure. • It needs highly precautions during working. THANK YOU