Professional Documents
Culture Documents
21
22 Biomedical Microsystems
TABLE 2.1
Classification of Materials Based on Electrical Resistivity
Range of Electrical
Classification Resistivity (t2 cm) + Examples
Insulator >lo8 Oxide, glass, diamond, quartz
Semiconductor 10-3 - 1 0 8 Germanium, silicon, gallium arsenide
Conductor d0-j Silver, copper, gold, aluminum,
platinum
2.1.2 Silicon
Silicon is the second most abundant material on earth but is not found in
pure form in nature and must be purified before microfabrication. Silicon
is the material of choice for the fabrication of integrated circuits for many
reasons, including
Due to its widespread use in the semiconductor industry and the historical
connection between MEMS and fabrication of integrated circuits, silicon has
also gained popularity as a MEMS material.
FIGURE 2.1
Solids classified according to atomic arrangement. The circles represent atoms or molecules
and the connecting lines represent the presence of chemical bonds.
0 0 0 0 0 0
m m m 0 0 0
0 0 0 0 0 0 0 0
0
m m m 0 0 0
0 0 0 0 0 0
m o m 0 0 0
Atom group Point lattice Periodic atom array
FIGURE 2.2
Example of a periodic atom array assembled using the point lattice and basic atom group.
FIGURE 2.3
Examples of two-dimensional close-packed atom arrangements.
24 Biomedical Microsystems
FIGURE 2.4
Three types of cubic lattice unit cells each with lattice constant a: (a) cubic, (b) body-centered
cubic, (c) face-centered cubic.
TABLE 2.2
Lattice Constants for Materials Having Cubic-Type Crystal Structure
Material Crystal Structure Lattice Constant, a (A)
Silicon Diamond 5.43
Germanium Diamond 5.65
Carbon (diamond) Diamond 3.57
Gallium arsenide (GaAs) Ziiicbleiide 5.65
Gallium phosphide (Gal’) Ziiicbleiide 5.45
sides (Figure 2.4). This defining dimension is called the lattice constant. The
lattice constant, a, of silicon is 0.543 nm. Although there are crystal lattices
having noncubic structures and thus nonidentical lattice constants, we will
not explore them here because silicon takes on a cubic structure (Table 2.2).
Silicon is based on a face-centered cubic (FCC) unit cell. The FCC crystal
derives its name from the fact that the atoms reside at the center of each face
of the cubic structure (there is also a body-centered cubic cell with an atom
located in the center of the cube; Figure 2.4). One additional feature of the
silicon crystal is that it is derived from two interpenetrating FCC unit cells
offset by one-fourth of the lattice constant in each of the x,y, and z directions.
Another way to think of this is to consider an FCC unit cell with an extra atom
placed at one-fourth of the lattice constant from each of the FCC atoms. This
adds four additional atoms to the silicon unit cell compared to a normal FCC
crystal; this structure is referred to as a diamond lattice (Figures 2.5 and 2.6). In
total, a silicon unit cell has 18 atoms: (1)eight atoms in corners, (2) six atoms on
faces, and (3)four interior atoms. Note that only a portion of the atoms located
at the corners and faces are associated with each unit cell. At the corners, the
lattice points are shared by eight unit cells, and at the faces, the lattice points
are shared by two unit cells. In the corner of a diamond crystal, there is a
tetrahedron formed by the four nearest neighbor atoms. These atoms possess
the closest spacing (0.235nm) in a diamond lattice.
Note that the overall structure of the silicon crystal is asymmetric, and
unequal distances exist between the constituent atoms. These structural
details result in the anisotropic nature of silicon’s thermophysical and
BioMEMS Materials 25
z O,%,%
O,O,% %,%,%
%,O,%
a a12
%,%,%
Y
O,%,O
x %,O,O
Four nearest neighbor structures'
FIGURE 2.5
Diamond lattice unit cell (left) with the four nearest-neighbor structures shown in detail
(right).
FIGURE 2.9
Several important crystal directions in a cubic
unit cell.
FIGURE 2.8
The crystallographic direction [22?] intercepts at ?h,1, and =. We take the recip-
denoted by the line OP. rocals of the intercepts and remove frac-
tions again. A set of three numbers, placed
W
in parentheses, denote the plane ABCD as
C ( h k l ) , or in this case, (210). Other plane
examples are shown in Figure 2.11. Using
9
Miller indices, we can also calculate the per-
pendicular distance between parallel planes,
V
dhkl,where one plane is closest to the origin
and the other passes through the origin:
B
A
U
TABLE 2.3
Summary of Crystallographic Notations for Planes and Directions
Crystal Parameter Notation
Plane (W
Equivalent planes IW
Direction [UVZU]
Equivalent directions (IIVZU)
[ O O l ] direction
z
1 z 1 ‘1
[ O l O ] direction
Y 1 y
x 1 x 1
[loo] direction
FIGURE 2.11
Three important planes in a cubic unit cell.
The silicon is now -98% pure; it has to be chlorinated to change its solid state
to a liquid state, because solids are difficult to purify. Changing solid silicon
to the liquid form facilitates purification. To do this, the MGS is mechanically
pulverized and is reacted with anhydrous hydrogen chloride to form trichlo-
rosilane (SiHCl,), which is liquid at room temperature
Growing
crysta1
Seed
Crucible
Heater
(a) (b) (4
FIGURE 2.13
Czochralski method for single crystal silicon formation: (a) seed lowered down to melt, (b) seed
dipped in melt and crystal growth begins, (c) partially grown crystal ingot.
TABLE 2.4
Typical Specifications for Polished Silicon Wafers
Parameters 100 mm Wafer 125 mm Wafer 150 mm Wafer
Diameter (min) 100 f 1 125 f 1 150fl
Thickness (mm) 0.5-0.55 0.6-0.65 0.65-0.7
Primary flat length (inm) 30-35 40-45 55-60
Secondary flat length (inm) 16-20 25-30 35-40
Bow (pm) 60 70 60
Total thickness variation (pm) 50 65 50
Surface orientation +
(100) 1" Same Same
(111)f 1" Same Same
Source: Wolf, S.,and R. N. Tauber. 1986. Silicon Processing JOY the VLSI Era. Sunset Beach,
CA: Lattice Press.
( = ) e c o n d : : ] ~
-
Primary flat
-
Primary flat
0(:1 -
S e c o n d a r k 45"
flat Primary flat
-
Primary flat
<loo> n-type <loo> p-type <111>n-type <111>p-type
FIGURE 2.15
Primary and secondary flats of silicon wafers to indicate dopant type and orientation.
[ 1001 direction
(100) Si wafer
(100) Si wafer
FIGURE 2.16
Crystal plane and direction orientations on a standard (100) silicon wafer.
TABLE 2.5
Common Silicon Dopants
Donors (Electron Increasing Dopants) Acceptors (Hole Increasing Dopants)
P B
As Column V elements Ga Column I11 elements
Sb In
BioMEMS Materials 31
&=-
A1
(2.4)
10
where A1 is the change in length and 1, is the initial starting length of the bar.
The relationship between the stress and strain is given by Hooke's law (for
small strains):
1,
A1 0 0
0 = EE = -E (2.5)
10
TABLE 2.6
Properties of MEMS Materials
Coefficient
Yield Young's Specific Thermal of Thermal Melting
Strength Modulus Density Heat Conductivity Expansion Point
Material (lo9N / d ) N / d ) (g/cm3) (Jig. "C) (W/cm. "C) (10-6/"C) ("C)
s1 7.00 1.90 2.30 0.70 1.57 2.33 1400
SIC 21.00 7.00 3.20 0.67 3.50 3.30 2300
SIJ'J, 14.00 3.85 3.10 0.69 0.19 0.80 1930
s10, 8.40 0.73 2.27 1.00 0.014 0.50 1700
A1 0.17 0.70 2.70 0.942 2.36 25.0 660
Stainless 2.10 2.00 7.90 0.47 0.329 17.30 1500
Steel
cu 0.07 0.11 8.90 0.386 3.93 16.56 1080
GaAs 2.70 0.75 5.30 0.35 0.50 6.86 1238
Ge 1.03 5.32 0.31 0.60 5.80 937
Quartz 0.5-0.7 0.76-0.97 2.66 0.82-1.20 0.067-0.12 7.10 1710
Souvce: Madou, M.J. 1997.Fundanzenfals ojMicvojubrication. Boca Raton, FL: CRC Press.
32 Biomedical Microsystems
h Stressed
T
Note that the negative sign contributed by the
transverse strain component is due to a decrease
FIGURE 2.19 in dimension. The maximum value of v is 0.5, with
Shear to a typical materials having values of 0.25-0.35.
block.
Shear stress, T, refers to stress applied to sur-
faces (Figure 2.19). In contrast to normal stress,
shear stress creates shape change without any volume change. The shear
modulus, G, is a ratio of the shear stress to the shear strain and is also related
to Young’s modulus and Poisson’s ratio in the following manner:
This is also an expression of Hooke’s law and is true for small strains.
Because the silicon crystal is anisotropically arranged, its mechani-
cal properties are orientation dependent. The relationship between
stresses and strains is also more complex than the simple case consid-
ered thus far. Generic forms for these expressions in a matrix form are
as follows:
n=l
6
n=1
TABLE 2.7
Stiffness and Compliance Coefficients for Silicon
Stiffness Coefficients Compliance Coefficients
E,, = 165.7 x lo9 Pa S,,= 7.68 x l0-l: Pa
El; = 63.9 x lo9 Pa S,;= -2.14 x l0-l: Pa
E,, = 79.6 x lo9 Pa S,, = 12.6 x Pa
Souvce: Brantley, W. A. 1973. ] Appl Pkys 44:534-5.
TABLE 2.8
Orientation Dependency of Silicon’s Mechanical Properties
Orientation Young‘s Modulus E (GPa) Shear Modulus G (GPa)
[loo1 129.5 79.0
[1101 168.0 61.7
11111 186.5 57.5
Source: Greenwood, J. C. 1988. Phys E Sci lnstvtirn 21:1114-28.
34 Biomedical Microsystems
\'
0.0
2 Pyrex
I
I
I I , , , , , , , , , , ,
0 25 50 100 150 200 250 300 350 400 450 500 550
Temperature ("C)
FIGURE 2.21
Thermal expansion coefficients of silicon and Pyrex 7740. (From Hsu, T.-R. 2004. MEMS
Packaging. London: INSPEC, The Institution of Electrical Engineers. With permission.)
BioMEMS Materials 35
2.1.2.3.4 Piezovesistivity
In 1954 Charles Smith found that doped silicon exhibits piezoresistance, or
a change in electrical resistance when subjected to a mechanical stress. This
effect, present in both n- and p-type silicon, is particularly useful in piezore-
sistive sensors such as pressure and flow sensors.
The overall resistance change for a silicon piezoresistor subjected to a
mechanical stress is
AR -
- Ap
- -+ A1 At AZO
(2.11)
R p l t z u
where p is the resistivity, I is the length, t is the thickness, and 70 is the width.
The primary contribution comes from the change in resistivity, so we express
Ohm’s law in this case as follows
where E is the electric field vector, r is the resistivity tensor, and j is the cur-
rent density vector. So, for a piezoresistive crystal having a three-dimensional
geometry, the change in resistivity due to a stress field is orientation depen-
dent due to the anisotropy of the crystal structure (Figure 2.22).
The following equation shows this relationship:
where [Ar] is the resistivity change matrix, [n] is the piezoresistive coeffi-
cient matrix, and [o]is the stress matrix containing six independent stress
components for the cubic crystal structure of silicon. There are three nor-
mal stress components ( ( J ~ ~ , ( J ~ ~and three
,(J~ ~ ) shearing ones ( ( J ~ ~ , ( J ~ ~ , ( J ~ ~ ) .
By expanding Equation 2.13 and by inserting the piezoresistivity coefficient
matrix we get
-
Ell El2 El2 0 0 0 (J**
7E12 X l l XlZ 0 0 0 (JYY
7E12 7E12 Xll 0 0 0 (Jzz
(2.14)
0 0 07E,,O 0 (J“y
0 0 0 O ? q 4 O (JYZ
0 0 0 0 OIL,, _(J?&
FIGURE 2.22
The final expression for the change of resistivity silicol, piezoresistor subjected
matrix is to a stress field.
Biomedical Microsystems
Y
x
AR
-= n,o,
R
+ n,o, (2.16)
TABLE 2.9
Properties of Doped <loo> Silicon at Room Temperature
Material Resistivity (a . cm) zl110-1(m2/N) zl2 (m2/N) q1 (m2/N)
p-type Si 7.8 +6.6 -1.1 +138.1
n-type Si 11.7 -102.2 +53.4 -13.6
Sotivce: Smith, C. S. 1954. Pkys Rev 94:42-9.
TABLE 2.1 0
Piezoresistive Coefficients of p-Type Silicon Piezoresistors
Crystal Plane x Orientation y Orientation =I =t
TABLE 2.1 1
Temperature Dependence of Resistivity and Piezoresistivity in Silicon
P Type Type
Temperature Temperature
Doping Coefficient of Coefficient of
Concentration Piezoresistivity Piezoresistivity
(101vcm3) ar(%I”C) (%I”C) ar(%I”C) (YoPC)
5 0.0 -0.27 0.01 -0.28
10 0.01 -0.27 0.05 -0.27
30 0.06 -0.18 0.09 -0.18
100 0.17 -0.16 0.19 -0.12
Source: French, P. J., and A. G. R. Evans. 1988. Piezoresistance in single crystal and polycrystal-
line Si. In Pvopevfies of Silicon, London: INSPEC, 94-103.
2.1.3.I Adhesion
Excellent adhesion of films to the substrate is a necessity and, in part, a fac-
tor for processing these materials in a clean room environment to minimize
contamination. In some cases, it is necessary to use surface treatments or
intermediate adhesion promotion layers to obtain the required adhesive
strength. Adhesion is quickly assessed using a simple tape test in which a
pressure-sensitive adhesive is applied directly over the deposited film and
is then peeled away. This qualitative test determines if adhesion is compro-
mised. If any portion of the film is removed, a follow-up quantitative test can
be performed. For instance, to extract the critical load, an abrasion or scratch
test can be used to load a film until delamination occurs.
2.1.3.2 Stress
Thin films are all in a state of internal stress, either tensile or compressive,
with typical values in the range of 108-5 x 1O1Odynes/cm2 [l].A film in tensile
stress tends to contract parallel to the substrate whereas one in compressive
stress tends to expand. Thus, a tensile film causes concave bending in the
substrate and a compressive film causes convex bending. These effects
are illustrated in Figure 2.24, in which a deposited film has induced substrate
bending due to stress.
38 Biomedical Microsystems
(a) (b)
FIGURE 2.24
Substrate bending caused by deposition of stressed films for (a) tensile film, (b) compressive
film.
Highly stressed films are undesirable and can lead to poor adhesion to the
substrate; films are more susceptible to corrosion, cracks when under tensile
stress, buckling of structures under compressive stress, and higher resistivity
in the deposited film. Total stress in films is the sum of the external stress on
the film, thermal stress, and intrinsic stress, which is expressed as follows:
(2.19)
2.1.3.3 Resistivity
The resistivity of thin films can differ from that of bulk material. For exam-
ple, thin film metals have a higher resistivity because they tend to contain
more grain boundaries and more defects. The resistance, R, of a piece of film
shown in Figure 2.25 is given as follows:
(2.20)
The unit for sheet resistance is ohms per square (Wo) where the square
refers to a square piece of the film of any size. If we break up a patterned
resistor into squares of a known sheet resistance, then to calculate the total
resistance we simply multiply the sheet resistance by the number of squares.
In the resistor depicted in Figure 2.26, there are
a total of six squares, so the resistance is 6R,. W
Sheet resistance can be easily measured by
several techniques. If we know the sheet resis- t
FIGURE 2.26
Patterned resistor structure COII-
sisting of six numbered squares,
each having a sheet resistance
where T2> T,.
of R,.
40 Biomedical Microsystems
TABLE 2.1 2
Selected Properties of Thermal Silicon Dioxide
DC resistivity at 25°C (Q cm) 101'-10'6
Density (g/cm3) 2.27
Dielectric constant 3.8-3.9
Dielectric strength (V/cm) 5-10 x l o 6
Energy gap (eV) -8
Linear expansion coefficient (cm/cm . "C) 5.0 x lo-'
Etch rate in buffered HF (A/min) 1000
Melting point ("C) -1700
Molecular weight 60.08
Molecules/cm3 2.3 x lo2*
Refractive index 1.46
Specific heat (J/g"C) 1.0
Thermal conductivity (W/cm "C) 0.014
Stress in film on Si (dyne/cmi) 2-4 x lo9, compression
Souvce: Wolf, S., and R. N. Tauber. 1986. Silicon Pvocessingfov fke V L S I Eva. Sunset
Beach, CA: Lattice Press.
BioMEMS Materials 41
of the PECVD film; for this, a high etch rate in HF is obtained while LPCVD
nitrides etch slowly in HF.
s = SCJ (2.24)
Metal plate
Piezoelectric slab
z Metal plate
x y
FIGURE 2.27
Piezoelectric slab saiidwiched between two inetal plates.
TABLE 2.1 3
Comparison of Piezoelectric Materials
Curie Maximum
Dielectric Temperature Coupling
Material Piezoelectric Constant (pCIN) Constant ("C) Coefficient
Quartz d,, = 2.31 d,, = 0.73 E, =4.52 550 0.1
E? = 4.63
PZT d,? = 80 d2, = -94 dIj = 494 E ? = 425 193-490 0.69-0.75
to 593 to -274 to 784 to 1900
Sol-gel PZT d,, = 23 d,; = 4 a,, = -35 4 >150 0.2
PVDF a,, = -12 a,, = 12 d3, = -4.7 E, = 8.2
where s is the compliance and o is the applied stress. Equation 2.24 is a repre-
sentation of Hooke’s law, where l/s is Young’s modulus. If we apply a poten-
tial across the slab, then the resulting displacement vector, 0, is
D = do + E,E
(2.26)
S = S,O + d’E
where E, is the permittivity under constant stress and sEis the compliance
for constant electric field. When the surface area is constant under applied
stress, then d = d’ (not true for polymers), where d is the piezoelectric charge
coefficient or piezoelectric constant. Rearranging Equation 2.26, we can solve
for the electric field and stress:
(2.27)
(2.28)
2.1.6 Metals
Metals provide a range of functions in microelectronics and MEMS, from
serving as etch masks to interconnects to structural elements. Several meth-
ods are used to deposit metals, including evaporation, sputtering, chemical
44 Biomedical Microsystems
vapor deposition (CVD), and electroplating. Aluminum and gold are com-
monly used. Chromium and titanium are often used in conjunction with
gold as adhesion layers. Other popular metals include nichrome (NiCr) for
thermal sources, shape memory alloys (e.g., TiNi), and permalloy (NiFe) for
magnetic devices. For implantable devices, titanium and platinum are pre-
ferred. In the case of electronic neural prostheses, iridium and platinum are
used for their charge delivery capabilities.
2.2.2 Polyimide
Polyimides have a long history of use as insulators and
packaging materials in microelectronics.
These flexible polymers can have a linear or aro-
matic structure (Figure 2.29), and the cured material F,CURE2.28
can have either a thermoset or thermoplastic behavior. Chelnical structure of
Polyimides first became popular in MEMS as flexible polydiinethylsiloxane.
46 Biomedical Microsystems
v
Linear polyimide Aromatic polyimide
FIGURE 2.29
Chemical structure of polyimide.
substrates for sensors and multielectrode arrays for their potential biocom-
patibility and biostability. Its key properties include a high glass transition
temperature, high thermal stability, high mechanical strength, low moisture
absorption, chemical stability, and solvent resistance. In addition, its flexibil-
ity, inertness, and low cytotoxicity make it an attractive material for biologi-
cal and medical applications.
Polyimides are available in many forms. Bulk polyimide is supplied as
films or tapes backed with pressure-sensitive adhesives. It is also available in
liquid form in both photodefinable and nonphotodefinable versions. Liquid
formulations consist of a polyamic acid precursor that undergoes a thermal
treatment called imidization to form the cured polyimide material.
2.2.3 SU-8
SU-8 was developed by IBM in 1989 and is a photodefineable epoxy-type
resist (Figure 2.30). This highly cross-linked thermoset is particularly use-
ful for inexpensively creating thick structures with high aspect ratios. Its
use in MEMS became popular in the late 1990s as an alternative to expen-
sive X-ray lithography techniques to produce molds for replicating metal or
plastic parts. More recently, it has gained popularity as a versatile MEMS
material. SU-8 can be used as an insulator, a structural material, mold, adhe-
sive bonding layer, and etch mask. Some argue that SU-8 has biocompatible
properties.
SU-8 is available in multiple viscosities for creating structures up to 2 mm
high. The liquid formulation contains the SU-8 resin, a solvent, and a photo-
sensitizer. The final polymer results after processing, which involves baking
and exposure to ultraviolet (UV) light. The high degree of cross-linking con-
fers excellent chemical compatibility. SU-8 is also relatively transparent. The
electrical, magnetic, optical, and mechanical properties of SU-8 are tunable
through the addition of functional materials to the prepolymer liquid.
2.2.4 Parylene
Parylene (poly (p-xylylene)) was well known to both microelectronics
and medical industries long before it became a popular MEMS mate-
rial (Figure 2.31). In earlier applications, Parylene was used primarily as
BioMEMS Materials 47
H, C-C-CH,
0 0
/ \
CH2CH-CH2
FIGURE 2.30
Chemical structure of SU-8 resin (modified from [12]).
FIGURE 2.31
Chemical structure of Parylenes.
Polyaniline Polypyrrole
FIGURE 2.32
Chemical structure of some conductive polymers.
2.3 Biomaterials
Certainly, new materials are required for bioMEMS that differ drastically
from those typically encountered in microelectronics or more historic MEMS
applications. A bioMEMS engineer must demonstrate not only the efficacy of
a device but also its biocompatibility, which ultimately means safety. These
factors are often determined by the interaction between the material or
device and the biological system.
For the purpose of this discussion, we will limit the term ”biomaterials” to
refer to materials used in medical implants, extracorporeal devices, and dis-
posable systems (others may use the term to refer to materials that are bio-
logical in origin or biological matevials). For example, the National Institutes of
Health uses the following definition [13]: “Any substance (other than a drug)
or combination of substances, synthetic or natural in origin, which can be
used for any period of time, as a whole or as a part of a system which treats,
augments or replaces any tissue, organ, or function of the body.” Regardless
of what definition we use, biomaterials must meet biocompatibility require-
ments for their intended application. The concept of biocompatibility is cov-
ered in depth in Section 2.3.3.
There are three major classes of biomaterials: (1)metallic, (2) ceramic and
glass, and (3) polymeric [14]. While bulk metals are commonly used in load-
BioMEMS Materials 49
Biocompatibility
Physicochemical properties
Durability and length of use (and any other relevant mechanical
requirements)
50 Biomedical Microsystems
Examples of medical applications and the types of biomaterials used are pre-
sented in Table 2.14.
The biocompatibility of devices and the materials from which they are
constructed is a key requirement and must be demonstrated and approved
before marketing and clinical use. Prior to delving deeper into the concept of
biocompatibility, it is useful to understand medical device regulation.
TABLE 2.14
Applications of Various Biomaterials in Medical Devices
Application Materials
Joint replacements (hip and knee) Ti, Ti-A1-V alloy, stainless steel, polyethylene
Fracture fixation plate Stainless steel, cobalt-chromium alloy
Bone defect repair Hydroxyapatite
Artificial tendons and ligaments Teflon, Dacron
Heart valve Stainless steel, carbon
Catheters Silicone rubber, Teflon, polyurethane
Drug release Polylactide-co-glycolide
Intraocular lens Polymethylmethacrylate, silicone rubber,
hydrogel
Contact lens Silicone acrylate, hydrogel
Tissue engineering Polylactic acid, polyglycolic acid, polylactide-
co-glycolide
Sotivces: Dee, K. C., D. A. Puleo, and R. Bizios. 2002. An Intvodtiction f o Tissue-Bionzaferial
Infeuacfions. Hoboken, NJ: Wiley-Liss; and Ratner, B. D. 1996. Biomafeuials Science:
An Intvodticfion f o Matevials i n Medicine. San Diego, CA: Academic Press.
BioMEMS Materials 51
Generic device types, of which there are over 1700, are grouped by the FDA
into 16 medical specialty panels and also are assigned a regulatory class. For
example, a specialty panel may be cardiovascular or neurology.
Class I devices are subject to least regulatory control as they pose minimal
risk to users. These ”general controls” also apply to Class I1 and I11 devices.
General controls include manufacturer registration, listing devices to be mar-
keted with the FDA, good manufacturing practices (GMP), proper labeling,
submission of premarket notification, and reporting. Class I devices include
bandages, examination gloves, and hand-held surgical instruments
Class I1 devices are subject to general controls and special controls. These
special controls may include additional labeling requirements, demon-
stration of performance standards, and postmarket surveillance. Powered
wheelchairs, infusion pumps, and surgical drapes are examples of noninva-
sive devices in Class 11.
Class I11 devices are subject to the regulations of Classes I and I1 as
well as premarket approval. These stricter regulations pertain to devices
that are involved in supporting or sustaining human life and that may be
important for preventing impairment of human health. Companies must
obtain premarket approval for these devices that entails a thorough sci-
entific review to ensure safety and effectiveness. Class I11 devices include
heart valve replacements, silicone breast implants, and implanted brain
stimulators.
New technologies are often placed into Class 111. Regulations exist to
address primarily safety concerns. In particular, the FDA is concerned with
52 Biomedical Microsystems
(1) misuse or unintended use, (2) device failure, and (3) adverse biological
effects resulting from device materials. Thus, regardless of the potential ben-
efits of a new technology, the device approval process can be long or even
indefinite if unanswered questions or concerns exist. These issues, in par-
ticular, impact the potential translation of bioMEMS devices into practical
medical products.
A second form of classification was also issued by the FDA, in which seven
device categories were established: preamendment, postamendment, sub-
stantially equivalent, implant, custom, investigational, and transitional. Each
of these categories is described in Table 2.15.
Other important medical device legislation includes the following:
Other countries also have legislation and regulations that must be satisfied
prior to bringing a device to the market.
2.3.3 Biocompatibility
The biocompatibility of an implanted device is in large part attributed to
the constituent biomaterials although other factors can play a significant role
(e.g., surface condition, surface treatment, device shape). To understand bio-
materials and better evaluate their suitability for a particular application, we
should establish a definition of biocompatibility. Many definitions have been
proposed, such as
Acceptance of an artificial implant by the surrounding tissues and by
the body as a whole. The biomaterial must not be degraded by the body
environment, and its presence must not harm tissues, organs, or systems.
If the biomaterial is designed to be degraded, then the products of the
degradation should not harm the tissue and organs. [17]
allow simple, rapid, and low cost screening of materials and devices. Many
useful in vitro models exist due to advances in cell culture techniques but
provide only a limited perspective of the whole body. Thus, care must be
taken when extrapolating the results. Animal models may provide a more
realistic insight into the many events that occur at the tissue-biomaterial
interface and allow the determination of in vivo compatibility of materials
or devices. However, like in vitro models, extrapolation may be unreliable
and even dangerous due to species differences; positive results in animals
do not translate directly to human biocompatibility. These studies are expen-
sive and more complex than in vitro studies but are a necessary and useful
step prior to human clinical trials. Animal research works are governed by
the Animal Welfare Act (1985) and related amendments. These laws regu-
late the use of laboratory animals and animal research in the United States.
Animal research protocols are required prior to initiation of any study and
is subject to review and approval by local Institutional Animal Care and Use
Committees (IACUC).
In the United States, a test selection table (10993-1) is used that is defined
by the American National Standards Institute, Inc. (ANSI), Association for
the Advancement of Medical Instrumentation (AAMI),and the International
Standards Organization (ISO). The series of standards is further modified
by the FDA and are listed in Table 2.16. Devices are grouped by body con-
tact type into three categories: (1) surface devices (e.g., skin and mucosal
membranes), (2) external communicating devices (e.g., indirect path to
blood), and (3) implant devices (e.g., bone or tissue or blood contact). Tests
are performed in concordance with the FDA good laboratory practice (GLP)
regulations.
Finally, clinical trials are necessary to evaluate the performance of these
devices in humans prior to their commercial availability to the general pub-
lic. Clinical trials are subject to approval by the FDA and involve a sequence
of three phases designated as I, 11, or 111. In each phase, a small number of
human subjects receive the device and are monitored. The outcome of these
trials will be used by the FDA to determine whether the device is approved
for marketing.
2.3.4 Sterilization
An additional requirement of biomedical devices is that sterilization be
performed prior to use to avoid infection and its associated side effects.
Sterilization processes are intended to remove microorganisms (e.g., bacte-
ria, yeast, molds, and viruses). A variety of methods exist, and it is impera-
tive to determine the compatibility of the sterilization method chosen with
the materials contained in a particular device. Common sterilization meth-
ods are summarized in Table 2.1%
wl
TABLE 2.16 Q\
Surface Skin A
devices B
C
Mucosal A
membrane B 0 0
C 0
Breached or A
compro- B 0 0
mised C 0
surfaces
External Blood path A
communi- indirect B 0
cating C 0 0
devices
Tissue, bone A
dentin B 0 0
communi- C 0 0 0
cating
Circulating A 0
blood B 0 0
C 0
Implant Bone or A
devices tissue B 0
C 0
Blood A
B 0
C
Source: Anand, V. P.2000. Med Device Diagn Ind 22:206-19.
A = limited exposure (524 hours); B = prolonged exposure (24 hours-30 days); C = permanent contact (>30 days); = FDA and IS0 evaluation tests;
o = dditional tests required by FDA.
58 Biomedical Microsystems
TABLE 2.1 7
Common Sterilization Methods (adapted from [15])
Sterilization Method Method Details
High energy radiation Isotope, electron beam, or X-ray radiation doses
Autoclaoing Saturated steam at high pressures and elevated
temperatures (-130-140°C)
Dry heat High temperatures (>140"C)
Ethylene oxide [(CH,),O] gas Exposure to flammable toxic gas at or near ambient
temperatures; EtO is a suspected carcinogen
2.4 Problems
1. Print the 3D single crystal silicon model found at http://robotics
.eecs.berkeley.edu/-pister/crystal.pdf.Assemble the model.
2. Draw the (loo), (110), and (111)planes for silicon. In your drawings,
include the atomic arrangement within each plane and indicate the
silicon crystal lattice constant. Label any other key features needed
to fully describe the plane. Using the drawings, calculate the surface
atomic density of silicon in these planes. Which plane has the high-
est atomic density? [Hint: consider atoms contained in the "center" of
the unit cell planes to be entirely within the plane. Likewise, atoms at
the boundaries are shared.]
3. (a) Draw the following atomic planes and label all important identi-
fying features: (011), (ill),(021), (112), and (701).
(b) Draw the following directions and label all important identify-
ing features: [ i l l ] , [021], [112], [?Ol] ,and [131].
4. Many bioMEMS devices use anodically bonded silicon-to-glass sub-
strates to create microchannels. What are the thermal expansion
coefficients of single crystal silicon (bulk) and standard soda lime
glass? Does a thermal mismatch exist? What alternative glass(es)
can be used for bonding to silicon (provide thermal expansion coef-
ficients as an argument)? Cite your reference(s). [Hint: use journal
papers and other references to answer this question.]
5. What is the difference between a thermoset polymer and a thermo-
plastic polymer? What is the difference in their chemical structures?
6. What is the glass transition temperature? How should this material
property be used in MEMS design from a thermal point of view?
Recall that the Space Shuttle Challenger disaster was caused by
using a rubber O-ring below its glass transition temperature.
7. Obtain and read Kurt Petersen's paper "Silicon as a mechanical
material" by using library resources (Reference [2] below). What is
BioMEMS Materials 59
Young’s modulus for silicon and how can this parameter be used in
mechanical design? How does silicon compare with steel in terms
of mechanical properties? Describe some applications of mechanical
beams and diaphragms. How could a biomedical engineer utilize
these elements?
8. Conduct additional research on the common sterilization methods
presented in Table 2.17. Compare and contrast the respective advan-
tages and disadvantages for each. Also, suggest appropriate meth-
ods for sterilization of each class of biomaterial.
9. There are three classes of medical devices designated by the FDA.
What are they? Briefly explain the classification system, espe-
cially in terms of regulatory control. List examples for each class.
CardioMEMS, Inc. makes the EndoSure wireless pressure measure-
ment system for monitoring abdominal aortic aneurysms. What is
the FDA classification for this device? [Hint: do your own research
for this question.]
References
1. Wolf, S.,and R. N. Tauber. 1986. Silicon Processingfor the VLSI Era. Sunset Beach,
CA: Lattice Press.
2. Petersen, K.E. 1982. Silicon as a mechanical material. Proc IEEE 70:420-57.
3. Madou, M.J. 1997. Fundamentals of Microfabrication. Boca Raton, FL: CRC Press.
4. Brantley, W. A. 1973. Calculated elastic-constants for stress problems associated
with semiconductor devices. 1Appl Phys 44:534-5.
5. Greenwood, J. C. 1988. Silicon in mechanical sensors. 1 Phys E Sci Instrum
21:1114-28.
6. Suzuki, T., A. Mimura, and T. Ogawa. 1977. The deformation of polycrystalline-
silicon deposited on oxide-covered single crystal silicon substrates. Electrochein
SOC124:1776-80.
7. Hsu, 7.-R. 2004. M E M S Packaging. London: INSPEC, The Institution of Electrical
Engineers.
8. Smith, C. S. 1954. Piezoresistance effect in germanium and silicon. Phys Rev
94:42-9.
9. Hsu, T.-R. 2002. M E M S and Microsystems: Design and Mantlfacture. Boston:
McGraw-Hill.
10. French, P. J.,and A. G. R. Evans. 1988. Piezoresistance in single crystal and poly-
crystalline Si. In Properties of Silicon London: INSPEC, Institution of Electrical
Engineers, 94-103.
11. Bhushan, B. 2004. Springer Handbook of Nanotechnology. Berlin: Springer.
12. LaBianca, N. C., J. D. Gelorme, and K. Y. Lee, et al. 1995. High aspect ratio optical
resist chemistry for MEMS applications. In Proceedings of the Fourth International
Symposium on Magnetic Materials, Processes, and Devices. The Electrochemical
Society, 386-396.
60 Biomedical Microsystems
13. Boretos, J. W., M. Eden, and National Institutes of Health (US) 1984. Contemporary
Biomaterials: Material and Host Response, Clinical Applications, N e w Technology, and
Legal Aspects. Park Ridge, NJ: Noyes Publications.
14. Dee, K.C., D. A. Puleo, and R. Bizios. 2002. An Introduction to Tissue-Biomaterial
Interactions. Hoboken, NJ: Wiley-Liss.
15. Ratner, B. D.1996. Biomaterials Science: An Introdtiction to Materials in Medicine.
San Diego, CA: Academic Press.
16. Kessler, D. A., S. M. Pape, and D. N. Sundwall. 1987. The federal regulation of
medical devices .N Engl J Med 317:357-66.
17. Park, J. B., and R. S. Lakes. 2007. Biomaterials: An Introduction. New York:
Springer.
18. Williams, D. F.,and European Society for Biomaterials. 1987. Definitions in
Bioinaterials: Proceedings of a Consensus Conference of the European Society for
Biomaterials, Chester, England, March 3-5, 1986. Amsterdam: Elsevier.
19. Anand, V. P. 2000. Biocompatibility safety assessment of medical devices: FDA/
I S 0 and Japanese guidelines. Med Device Diagn Ind 22:206-19.