Supersedes 39-GP-18a, August 1957

and 39-GP-18M, February 1979 '

National Standard of Canada

W.
,
The CANADIAN GENERAL STANDARDS BOARD (CGSB),
under whose auspices this standard has been developed is a
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NATIONAL STANDARD OF CANADA

Supersedes 39-GP- 18a, August 1957

and 39-GP-18M, February 1979

MICROMETERS

Prepared by the Approved by the

Canadian General Standards Board -
3 Standards Council of Canada @

Published February 1996 by the

Canadian General Standards Board

Ottawa, Canada K1A 1G6

OMinister of Supply and Services Canada - 1996

No part of this publication may be reproduced in any form without the pnor permission of the publisher.
 CANADIAN GENERAL STANDARDS BOARD

COMMITTEE ON MEASURING AND LAYOUT TOOLS

(Membership ut date of approval)

Green, E. Chairperson Metrology Engineering Ltd.

Cox, H.J. Frank J. Cox Sales Ltd.

De St. Croix, R. Alexander Tools Ltd.

Detmers, P. MT1 Canada Ltd.

Egenter, W.B. Department of National Defence

Grosz, 1. Fuller Tool Company Ltd.

Leblanc, C. - Canadair Inc.

Mazur, A. Department of Transport

Minow, M. General Motors of Canada Ltd.

Pekelsky, J. National Research Council of Canada

Petelle, G. AMF Technotransport Inc.

Scanlan, H. Fowler Tools of Canada Ltd.

Sonnenburg, E. Department of National Defence

St-Arnaud, D. Department of Supply and Services

Tabri, J. The L.S. Starrett Co. of Canada Ltd.

Craig, W. Secretary Canadian General Standards Board

Acknowledgntent is made for the translation of this National Standard of Canada by the Translation Bureau of the Department of the
Secretary of State. d
 Supersedes 39.GP.l8a, August 1957
and 39.GP.l8M, February 1979

CANADIAN GENERAL STANDARDS BOARD

MICROMETERS

TABLE OF CONTENTS Page

1. SCOPE .................................................................................................................................................................. 1

2. REFERENCED PUBLICATIONS .................................................................................................................... 1

3. TERMINOLOGY ................................................................................................................................................ 1

4. CLASSIFICATION .............................................................................................................................................

GENE- REQUIREMENTS..........................................................................................................................

Illustrations ...........................................................................................................................................................

Material .................................................................................................................................................................

Workmanship .......................................................................................................................................................

Finish .....................................................................................................................................................................

Identification .........................................................................................................................................................

Adjustment ...........................................................................................................................................................

Accessories ............................................................................................................................................................

Case .......................................................................................................................................................................

DETAILED REQUIREMENTS.........................................................................................................................

Type 1 .
Outside Micrometers .........................................................................................................................

Type 2 .
Inside Micrometers ............................................................................................................................

-
Type 3 Depth Micrometers ...........................................................................................................................

PREPARATION FOR DELWERY ..................................................................................................................

Packaging. Labelling and Packing ....................................................................................................................

INSPECTION .......................................................................................................................................................

Sampling ...............................................................................................................................................................

Visual Examination ..............................................................................................................................................

Dimensional Inspection .......................................................................................................................................

Test Procedures ...................................................................................................................................................

9. NOTES ..................................................................................................................................................................

9.1 Options ..................................................................................................................................................................

9.2 Sources of Referenced Publications ..................................................................................................................

APPENDIX A - EXAMPLES OF SPECIAL PURPOSE MICROMETERS .......................................................

APPENDIX B - FLATNESS INFORMATION ........................................................................................................

APPENDIX C - SUGGESTED METHODS OF TESTING MICROMETERS ...................................................

 Supersedes 39-GP- 18a, August 1957

and 39-GP- 18M, February 1979

CANADIAN GENERAL STANDARDS BOARD

MICROMETERS

SCOPE

This standard applies to inside, outside and depth microrneters with or without digital readout. Special purpose
microrneters are listed in an Appendix.

Quantities and dimensions in this standard are given in metric units with y d p o u n d equivalents, mostly obtained
through soft conversion, given in parentheses. The metric units shall be regarded as official in the event of dispute or
unforeseen difficulty arising from the conversion.

The testiiig and evaluation of a product against this standard may require the use of materials andor equipment that
could be hazardous. This document does not purport to address al1 the safety aspects associated with its use. Anyone
using this standard has the responsibility to consult the appropriate authorities and to establish appropriate health
and safety practices in conjunction with any existing applicable regulatory requirements prior to its use.

REFERENCED PUBLICATIONS

The following publications are referenced in this standard:

Canadian Standards Association (CSA)

B 78.2 - Dimensioning and Tolerancing of Technical Drawings

B 97.2 - Interpretation of Limits and Tolerances.

American Society for Testing and Materials (ASTM)

E 18 - Test Methods for Rockwell Hardness and Rockwell Superficial Hardness of Metallic Materials

E 140 - Hardness Conversion Tables for Metals.

International Organization for Standardization (ISO)

ISO 1 - Standard reference temperature for industrial length measurements

ISO 468 - Surface Texture (Roughness, Waviness and Lay)

ISO 361 1 - Micrometer calipers for extemal measurement.

A reference to a regulation is always to the latest issue. A dated reference is to the issue specified. An undated
reference is to the latest issue, unless otherwise specified by the authority applying this standard. The sources are
given in the Notes section.

TERMINOLOGY

The following definitions are applicable to this standard:

Eccentncity (Excentricité)

Eccentricity is the distance of a geometric centre of a revolving body from the axis of rotation.

Fiatness (Planéité)

The condition of a surface having al1 elements in one plane.

Flatness Tolerance (Tolérance de planéité)

A tolerance zone defined by two parallel planes within which the surface must lie.

 Parallelism (Parallélisme)
The condition of a surface equidistant at al1 points from a datum plane or a centre line that is equidistant throughout
its length to a datum axis.
Parallelism Tolerance (Tolérance de parallélisme)
A tolerance zone defined by two planes or lines, parallel to a datum plane or axis within which the line elements of a

3
surface or centre line must lie.

Perpendicularity (Perpendicularité)

The condition of a surface at a right angle to a datum plane or axis.

Perpendicularity Tolerance (Tolérance de perpendicularité)

A tolerance zone defined by two parallel planes perpendicular to a datum plane or axis, within which al1 elements of

the surface must lie.

Range (Étendue de mesure)

The span of minimum to maximum measurements obtained with a particular micrometer.

Rigidity (Rigidité)

-
The resistance of a body to elastic strain, i.e. a reversible change in its dimension(s) or shape when subjected to a

shearing andlor a bending stress resulting from the application of a force or load.

Rigidity Tolerance (Tolérance de rigidité)

The numerical value of the linear dimension expressing the permissible elastic strain under a specified load applied

under defined conditions.

Straightness (Rectitude)

The condition of a generator of a surface (cylindrical, conical, plane), or of a centre line.

Straightness Tolerance (Tolérance de rectitude)

A tolerance zone within which the considered generator or centre line must lie.

4. CLASSIFICATION

4.1 The micrometers shall be supplied in the following types, styles, and graduations shown in Table 1, and as specified
(par. 9.1). Special purpose micrometers are listed in Appendix A.
TABLE 1

Types, Styles and Graduations of Micrometers

Graduation (Designation)
Type Style
0.01 0.001 0.002 0.001 0.0001
mm 111111 mm in in
1. Fixed anvil, X X X X X
enamelled frame
2. Fixed anvil, full X X X X X
finished frame*
1. Outside
3. Interchangeable anvil, X - X X -
enamelled frame
4. Interchangeable anvil, X - - X -
full finished frame*
2. Inside 1. Rod, and spacing X - - X -
collar
3. Depth 1. 60 mm (2.5 in) base X - - X -
1
2. 100 mm (4 in) base
* Capacity up ro 50 mm ( 2 in) only
5. GENERAL REQUIREMENTS

5.1 Illustrations - The illustrations herein are descriptive and meant to be generic.

Matenal - The micrometers shall be made from the materials specified in the detailed requirements whose
chemical composition and heat treatment shall allow the production of micrometers capable of extended use.

Workmanship - The micrometers shall be free from defects that may affect their operation.

Finish - The finish shall be free from visible blemishes or variations that would adversely affect the appearance
andlor operation of the instrument.

Identification - Al1 micrometers shall be marked clearly and permanently with the manufacturer's or supplier's
name, or with a trademark of such known character that the source of manufacture or supply and the country of
origin may be readily determined.

Adjustment - Each micrometer shall have a means of adjustment to compensate both for Wear between the
threaded portion of the spindle and the sleeve, and for changes in the zero setting. This adjustment shall remain
secure after resetting, and shall not impair the onginal accuracy of the instrument.
-
Accessories - A suitable tool(s) shall be supplied with each micrometer to make the adjustments specified in
par. 5.6.

Case - A case may or may not be required (par. 9.1). When required, the cases shall be rigid and durable and made
of metal, wood, or plastic unless otherwise specified (par. 9.1). The cases shall be constructed so that the instrument
and ail accessories are held securely in place when the case is closed.

Unless otherwise noted, ail tests shall be conducted so as to prevent damage to the instrument, which would
compromise it's function.

DETAILED REQUIREMENTS

Type 1 - Outside Micrometers

Design - An outside micrometer shall consist of a frame, a micrometer screw spindle and nut, an anvil (or
interchangeable anvils where applicable), a sleeve, a thimble and an adjusting nut. Each outside micrometer shall be
equipped with or without either a ratchet or a friction stop, and with or without a spindle locking device as specified
(par. 9.1).

Frame - The frame of an outside micrometer shall be made of a suitable material, either enamelled or full-finished
(steel is commonly used). An enamelled frame shall have either a smooth or rippled finish. It is recornmended that a
full-finished frame have a non-glare finish. The frame throat shall be of sufficient depth to accommodate a cylinder
with a diameter equal to the size of the outside micrometer. The frame shall have a cut-away, or long-taper back
portion at the anvil, to permit access to restricted areas. Heat-insulating gnps may be supplied for some frame styles
as specified (par. 9.1).
a. Frame Rigidity - When tested in accordance with the requirements of par. 8.4.1, the flexure of the frarne shall
not exceed the tolerances specified in Tables 2 and 3.

Micrometer Spindle - Unless otherwise specified (par. 9.1), the entire micrometer spindle shall be made of
uniformly through hardened, dimensionally stabilized high-grade tool steel and shall be precision ground. For rapid-
reading micrometers the threads shall have a pitch of 0.5 mm (0.025 in) unless otherwise specified (par. 9.1). The
threads shall be measured with recognized commercial instruments, unless otherwise specified (par. 9.1). The
hardness of the micrometer spindle shall not be less than 61 HRC when tested in accordance with ASTM D 18,
unless another test method is specified (par. 9.1). Al1 conversion of hardness values shall be in accordance with
ASTM E 140. When micrometers with carbide (or equivalent material) measuring tips or faces are required
(par. 6.1.1.7), the hardness of the micrometer spindle shall not be less than 58 HRC when tested in accordance with
ASTM E 18, unless another test method is specified (par. 9.1).
The cylindrical front portion of the micrometer spindle shall be a free-turning fit in its frame bearing without bind or
radial play in excess of 8 pm (0.0003 in), measured as close as practicable to the outer face of the bearing, and shall
mn freely and smoothly throughout the length of its travel. There shall be full engagement of not less than 6 mm
(0.24 in) of the nut and the micrometer spindle thread throughout the measuring range. The diameter of the spindle
shall not be less than 5 mm (0.20 in) for a 13 mm (0.5 in) micrometer and not less than 6 mm (0.236 in) for 25 mm
(1 in) and larger micrometers. In any one instrument, the diameters of the spindle and of the anvil shall be equal to
within 50 pm (0.002 in).

TABLE 2
Tolerances for Fixed Anvil Outside Micrometers
Size Measuring Flexure Measuring Faces Spindle and Indicated
Range (for Anvil Measurement
Force of Alignrnent
10 N) Flatness Parallelism
mm mm mm mm mm mm hlm
13 0-13 0.0025 0.00076 0.0012 0.05 0.0025
25 O - 25 0.0025 0.00076 0.0012 0.05 0.004
50 25 - 50 0.0025 0.00076 0.0025 0.08 0.004
75 50 - 75 0.0025 0.00076 0.003 0.13 0.004
1O0 75 - 100 0.004 0.00076 0.005 0.15 0.005
125 100 - 125 0.005 0.00076 0.005 0.20 0.005
150 125 - 150 0.005 0.00076 0.005 0.23 0.005
175 150 - 175 0.005 0.00076 0.005 0.25 0.006
200 175 - 200 0.005 0.00076 0.005 0.30 0.006
225 200 - 225 0.005 0.00076 0.005 0.30 0.006
250 225 - 250 0.0075 0.00076 0.007 0.40 0.0075
275 250 - 275 0.0075 0.00076 0.0075 0.40 0.0075
300 275 - 300 0.0075 0.00076 0.0075 0.40 0.0075
in in in in in in fin
0.5 O - 0.5 0.0001 0.00003 0.00005 0.002 0.0001
1 O- 1 0.0001 0.00003 0.00005 0.002 0.00015
2 1-2 0.0001 0.00003 0.0001 0.003 0.00015
3 2-3 0.0001 0.00003 0.00012 0.005 0.00015
4 3- 4 0.00015 0.00003 0.0002 0.006 0.0002
5 4-5 0.0002 0.00003 0.0002 0.008 0.0002
6 5-6 0.0002 0.00003 0.0002 0.009 0.0002
7 6-7 0.0002 0.00003 0.0002 0.010 0.00025
8 7-8 0.0002 0.00003 0.0002 0.0 12 0.00025
9 8-9 0.0002 0.00003 0.0002 0.0 12 0.00025
1O 9 - 10 0.0003 0.00003 0.00028 0.0 15 0.0003
11 10 - 11 0.0003 0.00003 0.0003 0.015 0.0003
12 11 - 12 0.0003 0.00003 0.0003 0.0 15 0.0003
 TABLE 3

Tolerances for Interchangeable Anvil Outside Micrometers

Size and Range Flexure Measuring Faces Spindle and Indicated

(for Anvil Measurement
Force of Alignment
10 N) Flatness Parallelism
mm mm mm mm mm Imm
0 - 100 0.005 0.002 0.01 0.20 0.0075
50 - 150 0.005 0.002 0.0125 0.30 0.009
100- 200 0.005 0.002 0.0125 0.40 0.01
150 - 250 0.005 0.002 0.0125 0.45 0.01
150 - 300 0.0075 0.0025 0.0125 0.45 0.01
200 - 300 0.0075 0.0025 0.0125 0.50 0.01
225 - 300 0.0075 0.0025 0.0125 0.50 0.01
300 - 400 0.0125 0.0025 0.0125 0.60 0.01
400 - 500 0.0125 0.0025 0.0125 0.75 0.01
500 - 600 0.015 0.0025 0.0125 1.OO 0.0 1
in in in in in fin
0-4 0.0002 0.00008 0.0004 0.008 0.0003
0-6 0.0002 0.00008 0.0005 0.0 12 0.00035
2-6 0.0002 0.00008 0.0005 0.0 12 0.00035
4-8 0.0002 0.00008 0.0005 0.016 0.0004
6-9 0.0002 0.00008 0.0005 0.018 0.0004
6 - 12 0.0003 0.0001 0.0005 0.020 0.0004
8 - 12 0.0003 0.0001 0.0005 0.020 0.0004
9 - 12 0.0003 0.0001 0.0005 0.020 0.0004
12 - 16 0.0005 0.0001 0.0005 0.025 0.0004
12 - 18 0.0005 0.0001 0.0005 0.028 0.0004
16 - 20 0.0005 0.0001 0.0005 0.030 0.0004
18 - 24 0.0006 0.0001 0.0005 0.035 0.0004
20 - 24 0.0006 0.0001 0.0005 0.040 0.0004

6.1.1.3 Interchangeable Anvils - The anvils shall be readiiy interchangeable, and permanently marked with their
appropriate range. They shall be designed so as to provide secure and accurate location in the frame when
assembled, with a means of axial adjustment.

6.1.1.4 Sleeve and Thimble - The sleeve and thimble, which may include the friction stop, shall be made of high-grade
steel. Extemal surfaces shall have a chrome-plated, non-glare finish. The diameter of the graduated surface of the
sleeve shall not be less than 10 mm (0.40 in). The angle of the bevel at the graduated end of the thimble shall be
between 10" and 20" as measured from the sleeve, and the thimble shall be sufficiently knurled to facilitate ease of
rotation. The parallactic distance from the sleeve to the reading end of the graduations on the thimble shall not
exceed 0.4 mm (0.015 in) and shall remain constant for any position of the thimble. The construction of the sleeve
shall minimize the possibility of dust or other foreign matter corning into contact with the threaded portion of the
sleeve and thimble.

6.1.1.5 Ratchet or Friction Stop - The outside of the ratchet or friction stop shall be sufficiently knurled to allow
satisfactory operation, and shall exert a force between the measuring faces of 5 to 10 N (1 to 2 Ibf) when tested with
a suitable force gauge, unless otherwise specified (par. 9.1). The force shall remain constant within 1 N (114 Ibf)
throughout the measuring range of the instrument.

6.1.1.6 Spindle Locking Device - The device may be either a clamp ring or a lever type, and shall effectively lock the
f spindle without altering the setting by more than 0.003 mm (0.0001 in).
w 6.1.1.7 Measuring or Contact Faces - Measuring or contact faces shall be hardened, ground and lapped. The face of the
spindle shall be flat and, regardless of rotational position, parallel to the face of the anvil within the tolerances
 specified in Tables 2 and 3. The flatness (See Appendix B) and parallelism of the measuring faces shall be
determined by means of suitable optical flats (See Appendix C) unless otherwise specified (par. 9.1). If specified
(par. 9.1), micrometers shall be supplied with carbide (or equivalent material) measuring faces. Manufacturers of
micrometers with measuring faces made of carbide or an equivalent material shall include a Wear test analysis that
demonstrates that the faces meet or exceed Wear test results of conventional hardened steel measuring faces. These
faces shall be an integral part of the spindle and anvil. The hardness of al1 faces shall not be less than 61 HRC when 3
tested in accordance with par. 6.1.1.2 and the surface roughness shall not exceed 0.1 pm (4 pin) Ra with a cutoff of
0.08 mm (0.0003 in) when tested in accordance with ISO 468, unless another test method is specified (par. 9.1).

6.1.1.8 Graduations - Graduations shall be straight, parallel, uniformly spaced and of uniform width. Reference,
graduation and vemier lines on the outside micrometers shall have a width of between 0.13 mm (0.005 in) and
0.25 mm (0.010 in). Al1 lines and numbers shall have clean edges and shall be legible. The sleeve and thimble shall
be graduated as specified in the following paragraphs:
a. Metric-Reading Micrometers - The thimble shall be graduated with 50 divisions each representing 0.01 mm,
and shall be numbered at 0, 5, 10, 15...45. The sleeve shall be graduated at 0.5 mm intervals, with a longitudinal
reference line parallel to the axis of the spindle. The first and every tenth graduation shall be numbered 0, 5, 10,
15,20 and 25. The graduation lines indicating the full millimetres shall be distinguished from the graduation lines
indicating the half millimetres either by length or position. That is to Say, the full millimetre lines rnay be longer
or may meet and extend above the longitudinal reference line; the 0.5 mm lines rnay extend from the opposite
side of the reference line, or they rnay be set apart in a separate row or slanted. The 5 mm increment lines shall be
distinguished from both of these by their greater length or by their meeting and extending above the longitudinal
reference line. For micrometers reading to 0.001 or 0.002 mm, appropriate vernier lines shall be marked on the
upper part of the sleeve, and shall be appropriately numbered. These lines shall extend a sufficient length along
the sleeve to permit the reading of 0.001 or 0.002 mm at any point within the range of the micrometer.
b. Inch-Reading Micrometers - The thimble shall be graduated with 25 main divisions, each representing 0.001 in,
and numbered at 0, 5, 10, 15 and 20, or O, 1, 2, 3...24. The sleeve shall be graduated at 0.025 in intervals, with a
longitudinal reference line parallel to the axis of the spindle. The first and every fourth graduation shall be
numbered O, 1,2, 3...9. The 0.100 in increment lines and the 0.050 in increment lines shall meet (and rnay extend
above) the longitudinal reference line. The intervening 0.025 in increment lines shall meet the longitudinal
reference line. 3
For micrometers reading to 0.0001 in, appropriate vernier lines shall be marked on the upper part of the sleeve
and shall be appropriately numbered. These lines shall extend a sufficient length along the sleeve to permit the
reading of 0.0001 in at any point within the range of the micrometer.
When specified (par. 9. l), the digital readout outside micrometers shall be supplied with a mechanical or electronic
digital readout, as specified below, in which case the reference, graduation and vernier lines andlor numbers rnay be
omitted, at the manufacturer's option.
a. Mechanical Digital - The figures of the display shall have good contrast with the background and the least
significant digit shall agree with the analog reading within one unit of that digit. Determination of accuracy to
meet the requirement of this standard shall be by the analog readout.
b. Electronic Digital - The figures of the display shall have good contrast with the background and the least count
digit shall agree with the analog reading within one digit of least count. Determination of accuracy to meet the
requirement of this standard shall be by the analog readout. The electronics shall have the ability to retain the
zero setting when in the off mode and micrometers with a capacity greater than 25 mm (1 in) shall have preset
capabilities so that the complete measurement can be displayed and transmitted. If for any reason the
microprocessor loses count (too quick movement - low battery power) an error message shall appear on the
display. Micrometers having the ability to transfer data shall have the output protocol designated by the
manufacturer and described in sufficient detail to allow interface with existing equipment.

6.1.1.9 Accuracy - The accuracy of a micrometer shall be verified by compatison to measuring standards at intervals
throughout its total range. The error in the indicated measurement shall not exceed the values in Tables 2 and 3
when measured in accordance with par. 8.4.2.

6.1.2 Setting standards - Each outside micrometer over 25 mm (1 in) in size that has interchangeable anvils, shall be

supplied with standards for setting the minimum reading of the range of each anvil unless otherwise specified
(par. 9.1). Outside micrometers over 25 mm (1 in) capacity that have fixed anvils rnay be supplied with a standard
&

 for setting the minimum reading. The setting standards may be in the form of full or segmented disks or rods whose
reference surfaces may be either flat and parallel or spherical in form.

6.1.2.1 The setting standards shall be made from high-grade steel and shall be uniformly ground on their non-reference

C surfaces. The reference surfaces shall have a uniform surface texture not exceeding 0.25 pm (10 pin) Ra when tested
in accordance with par. 6.1.1.7. Reference faces shall be treated to provide a minimum hardness value of 58 HRC
when tested in accordance with par. 6.1.1.2.

6.1.2.2 The nominal size of setting standards may contain geometrical irregularities in roundness, flatness andfor
parallelism, provided they do not exceed half the length tolerance shown in Table 4.
TABLE 4
Tolerances for Setting Standards
Metric Size Tolerance on Inch Size Tolerance on
Length* Length*
Inrn fmm in &in
25 0.0013 1 0.00005
50, 75, 100 0.0025 2, 3, 4 0.00008
125, 150, 175, 200 0.0038 5, 6, 7, 8 0.00012
225, 250, 275 0.0045 9, 10, 11 0.00016
*The referenced temperature shall be the standard temperature of 20°C (68°F) (ISO 1).

6.1.3 Type 1, Style 1 - Outside Micrometer with Fixed Anvil and Enamelled Frame - These micrometers shall be
similar to Figure 1 and shall conform to the requirements of Table 2 for size, range and tolerances.

In the case where counter

is equipped
Anvil' Spindle Clamp Sleeve Clamp Counter

\-/
1,
-\Vr
\ fiducial line 1 rumble
Ratchet or
friction drivé

Insulating plates

FIGURE 1

-
Type 1, Style 1 Outside Micrometer with

Fixed Anvils and Enameled Frame (See Note 1)

6.1.4 Type 1, Style 2 - Outside Micrometer with Fixed Anvil and Full Finished Frame - These micrometers shall be
similar to Figure 1 and shall conform to the requirements in Table 2 for size, range and tolerances.

6.1.5 Type 1, Style 3 - Outside Micrometer with Interchangeable Anvils and Enamelled Frame - These micrometers
shall be similar to Figure 2, and shall conform to the requirements of Table 3 for range and tolerances.

Note 1 - Figure 1 depicts one of many variations of this type and style of micrometer. Individual manufacturers should be
consulted for further details.
 FIGURE 2
Type 1, Style 3 - Outside Micrometer with Interchangeable Anvils
and Enameled Frame (See Note 2)

6.1.6 Type 1, Style 4 - Outside Micrometer with Interchangeable Anvils and Full-Finished Frame - These
micrometers shall be similar to Figure 2, and shall conform to the requirements of Table 3 for range and tolerances.

6.2 Type 2 - Inside Micrometers

6.2.1 Design - An inside micrometer ( r d and spacing collar model) shall consist of a micrometer spindle, sleeve,
thimble with an anvil, adjusting nut, measuring rods, spacing collar(s) and a handle(s) if specified (par. 6.2.1.7), and
shall be capable of measuring any intemal dimension within the specified range.

6.2.1.1 Micrometer Spindle - The micrometer spindle shall conform to the requirements of par. 6.1.1.2, except for those
requirements covering the cylindrical front portion, which are not applicable. 3
6.2.1.2 Sleeve and Thimble - The sleeve and thimble shall conform to the requirements of par. 6.1.1.4.

6.2.1.3 Measuring Rods and Spacing Collars - A suftïcient number of measuring rods and spacing collars shall be
provided to perform any measurement within the range of each inside micrometer. Each shall be permanently
marked with its appropriate range. They shall be made of steel, and shall be designed so as to ensure secure and
accurate location when assembled. There shall be a means of axial adjustment. Rod diameters shall conform to the
requirements of Table 5.

6.2.1.4 Measuring or Contact Faces - Measuring or contact faces shall have a radius of curvature of less than one half of
the minimum measurement that is possible with the particular inside micrometer, and shall otherwise conform to the
requirements of par. 6.1.1.7.

6.2.1.5 Graduations - Reference and graduation lines and numbers shall conform to the requirements of par. 6.1.1.8,
except that the vernier line requirements are not applicable, and graduations shall extend a sufficient length along
the sleeve to permit readings at any point within the range of the particular micrometer. Digital readout inside
micrometers shall be as described in par. 6.1.1.8.

6.2.1.6 Accuracy - When tested in accordance with the requirements of par. 6.1.1.9, the tolerances in length, both
excluding and including rods and spacers, shall not exceed the values in Table 5.

6.2.1.7 Handles - Handles shall be supplied with inside micrometers that have a range of up to and including
50 to 300 mm (2 to 12 in). If specified (par. 9.1), handles shall be supplied for inside micrometers with higher
ranges. They shall be designed to fasten securely to the micrometer head, and shall have a knurled gnp.

Note 2 - Figure 2 depicts one of mony variations of rhis type and style of micrometer. Individual manufacrurers should be
3
consulred for further details.
6.2.2 Type 2, Style 1 - Inside Micrometers with Rods and Spacing Collar(s) - These micrometers shall be similar to
Figure 3, and shall conform to the requirements of Table 5 for range and tolerances.

TABLE 5
Inside Micrometer Specifications
Range Diameter of Tolerance for Accuracy Tolerance for
Measuring Rods Excluding Rods and Spacing Accuracy Including
Collars Rods and Spacing
Collars

fin I fin

* A 50 to 800 mm unir consisrs of a 50 to 200 mm and a 200 mm to 800 mm unir.

** A 2 ro 32 in unit consisrs of a 2 ro 8 in and a 8 ro 32 in unir.

Measunng Grip Clamp Sleeve Thimble Clamp Counter

\ 1

\ \
Adjusting Trunk Reference Spindle surface
anvil line

FIGURE 3

Type 2, Style 1 - Inside Micrometer with Rods

and Spacing Collar(s) (See Note 3)

Note 3 - Figure 3 depicts one of many variarions of this rype and style of micrometer. Individual manufacturers should be
consulred for further details.
6.3 Type 3 - Depth Micrometers

6.3.1 Design - A depth micrometer shall consist of a base, a micrometer spindle, a sleeve, a thimble, an adjusting nut,
and measuring rods. Each depth micrometer shall be supplied with or without a ratchet or friction stop as specified
(par. 9.1).
3
6.3.1.1 Base - The base shall be made of steel, with a measuring surface between 9 mm (0.35 in) and 16 mm (0.63 in) in
width. The measuring surface shall have a hardness of not less than 61 HRC when tested in accordance with
par. 6.1.1.2 and shall be flat to 1.3 pm (50 pin) in any 25 mm (1 in) of length with a maximum error of
0.003 mm (0.00012 in) for the complete surface when tested in accordance with par. 6.1.1.7. Surface roughness shall
not exceed 0.2 pm (8 pin) Ra when tested in accordance with par. 6.1.1.7. The bore through the base shall allow for
a free fit of the measuring rods, without bind or perceptible play.

6.3.1.2 Micrometer Spindle - The micrometer spindle shall conform to the requirements of par. 6.1.1.2, except that it shall
be hollow to receive the measuring rods. It shall have a positive seat and a knuried cap or nut to secure the rods.

6.3.1.3 Sleeve and Thimble - The sleeve and thimble shall conform to the requirements of par. 6.1.1.4.

6.3.1.4 Measuring Rods - A sufficient number of measuring rods shall be provided to perform any measurement within the
range of each depth micrometer. They shall be made of steel and designed to ensure secure and accurate location
when assembled. There shall be a means of axial adjustment. The rods shall be straight, and shall run freely and
smoothly through the base throughout their length of travel. Total run out shall not exceed 0.08 mm (0.003 in) per
25 mm of length. Rod diarneter shall conform to the requirements of Table 6.

6.3.1.5 Ratchet or Friction Stop - The ratchet or friction stop shall conform to the requirements of par. 6.1.1.5.

6.3.1.6 Spindle Locking Device - The locking device if required (par. 9.1) shall conform to the requirements of
par. 6.1.1.6.

6.3.1.7 Measuring or Contact Faces - Measuring or contact faces of the rods shall have a hardness of not less than
61 HRC when tested in accordance with par. 6.1.1.2 and shall be flat within 2.5 pm (100 pin) when tested in
accordance with par. 6.1.1.7. The surface roughness shall not exceed 0.2 pm (8 pin) Ra when tested in accordance
with par. 6.1.1.7.
3
6.3.1.8 Graduations - Reference and graduation lines and numbers shall conform to the requirements of par. 6.1.1.8,
except that the vernier line requirements are not applicable and the graduations on the sleeve shall read from the
thimble end towards the base. Digital readout depth micrometers shall be as described in par. 6.1.1.8.

6.3.1.9 Accuracy - When tested in accordance with the requirements of par. 6.1.1.9, the allowable errors in accuracy shall
not exceed the values in Table 6. Depth micrometers shall be tested with the base positioned securely against a
suitable precision surface.

6.3.2 Type 3, Style 1 -Depth micrometer with 60 mm (2.5 in) Base - These micrometers shall be similar to Figure 4,
and shall conform to the requirements of Table 6 for range and tolerances.
 TABLE 6

Depth Micrometer Specifications

Range Tolerance for Accuracy Tolerance for Accuracy Diameter of

(Excluding Rods) (Including Rods) Measuring Rocis
mm fmm +mm mm
O - 75 0.003 0.008 3-4
O- 100 0.003 0.008 3-4
O - 150 0.003 0.008 3-4
O - 225 0.003 0.008 3-4
0-300 0.003 0.008 3-4
in Iin Sn in
0-3 0.00012 0.0003 0.125 - 0.156
0-4 0.00012 0.0003 0.125 - 0.156
0-6 0.00012 0.0003 0.125 - 0.156
0-9 0.00012 0.0003 0.125 - 0.156
' O - 12 0.00012 0.0003 0.125 - 0.156

Reference plane Base

n Clamp

~ a t c h e stop
t or
Thimble friction stop
w
Counter
i
Spindle or
exchange spindle

FIGURE 4

Type 3, Styles 1 and 2 - Depth Micrometer with 60 mm (2.5 in)

or 100 mm (4 in) Base (See Note 4)

6.3.3 Type 3, Style 2 -Depth Micrometers with 100 mm (4 in) Base - These micrometers shall be similar to Figure 4,
and shall conform to the requirements of par. 6.3.1.1 and Table 6 for range and tolerances.

7. PREPARATION FOR DELIVERY

7.1 Packaging, Labelling and Packing - Unless otherwise specified (par. 9.1), packaging, labelling and packing shall
conform to normal commercial practice.

8. INSPECTION

8.1 Sampling - Sampling for examination and testing shall be left to the discretion of the purchaser, unless a specific
sampling plan is specified (par. 9.1).

Note 4 - Figure 4 depicts one of manv variations of this type a d style of micrometer. Individual manufacturers should be
consulted forfurther details.
8.2 Visual Examination - Each sample unit shall be examined for any visible nonconformance with the requirements
listed in Table 7.
TABLE 7

Analysis of Visual Defects

Micrometer Characteristic
Material
Defect
Not fabricated from a specified material
I
Fractured, bent, bowed, broken, or otherwise impaired
Loose or rnisaligned components
Workmanship
Functional component requires abnormal force to operate
Failure to lock in position
Indication of corrosion

I Finish I Indication of chipping. flaking, or peeling

I
I Not smooth, not clean, not free from burrs
Identification Missing, incorrect, not legible
Not the type or style or not having the graduations specified
Design Part rnissing
Improperly assembled or does not function as required

8.3 Dimensional Inspection - Each sample unit shall be examined for any nonconformance to dimensional
requirements. Al1 dimensional accuracy requirements are referenced to the environmental standard temperature of
20°C (68OF) (ISO 1). They shall be traceable to a physical standard of measurement recognized by a national
standards laboratory.
3
8.3.1 Al1 inaccuracies, such as manufacturing variations, errors, Wear, or changes in tools, gauges, test equipment,
machines, processes, and measurements shall be included within these limits, unless otherwise specified (also see
CSA B 97.2).

8.4 Test Procedures - Each sample unit shall be tested in accordance with the requirements of par. 8.4.1 to 8.4.3.

8.4.1 Frame R i g i d e (Type 1) - Hold the micrometer with its anvil pointing down and its spindle axis vertical, suspend
a mass of 10 N (2 lbf) from the anvil, and then measure the amount of deflection of the frame (See Figure 5).

FIGURE 5

Deflecüon of a Frame Apparatus

8.4.2 Calibration of a micrometer screw

8.4.2.1 The accuracy of the readings of a O to 25 mm micrometer or a O to 1 in micrometer can be checked by taking
readings on a senes of gauge blocks or other masters. The sizes of these gauge blocks should be chosen so as to test
the micrometer not only at complete turns of its thimble but also at intermediate positions. This is required as a
check on the accuracy of the graduations around the thimble. The following series of gauges serves for testing
micrometers both for progressive errors throughout its range and for periodic errors:
Metric size (mm):
2.5, 5.1, 7.7, 10.3, 12.9, 15.0, 17.6, 20.2, 22.8, and 25.0.
Inch size (in):
0.105, 0.210, 0.315, 0.420, 0.500, 0.605, 0.710, 0.815, 0.920, and 1.000.

8.4.2.2 As a check on the vernier graduations of a 25 mm (1 in) micrometer; readings can be taken on the following series
of gauges:
Metric size (mm):
2.540, 2.545, 2.550, 2.555, 2.560 and 2.565.
Inch size <in):

0.1000, 0.1002, 0.1004, 0.1006, 0.1008, and 0.1010.

8.4.2.3 In order to facilitate the accurate readings of the micrometer during such a calibration, the thimble may be viewed
under a microscope of low-power magnification.

8.4.2.4 For micrometers with a capacity above 25 mm (1 in), the errors in the traverse of the micrometer screw can still be
checked with gauge blocks of the sizes mentioned above by clamping the micrometer to a surface plate and fixing a
temporary anvil, with a rounded face, close to the face of its spindle. Alternatively, an indicator having a sensitivity
of at least 0.0013 mm (0.00005 in) may be used with advantage as the temporary anvil. The errors in the traverse of
the micrometer can then be read with greater certainty on the scale of the indicator instead of on the micrometer
itself. When an indicator is used, the micrometer is set accurately "line-to-line" at the exact readings corresponding
to the sizes of the gauge blocks inserted between the micrometer face and the contact point of the indicator.

8.4.2.5 If it is not possible to fix an indicator directly opposite the face of the micrometer spindle of the smaller sizes of
micrometers, such as 50 to 75 mm (2 to 3 in) or 75 to 100 mm (3 to 4 in), a reading may be obtained by inserting a
simple form of lever between the face and the contact point of the indicator, which is secured in some convenient
position.

9. NOTES

9.1 Options - The following options must be specified in the application of this standard:
a. Type, style, and graduation of micrometers (par. 4.1)
b. Case, if required and if other than as specified (par. 5.8)
c. Ratchet or friction stop, if required (par. 6.1.1, 6.3.1)
d. Spindle locking device, if required (par. 6.1.1, 6.3.1.6)
e. Heat insulating grips, if required (par. 6.1.1.1)
f. Spindle material, if other than as specified (par. 6.1.1.2)
g. Pitch of threads for rapid-reading micrometers (par. 6.1.1.2)
h. Method of measuring the pitch of threads, if other than as specified (par. 6.1.1.2)
i. Method of testing hardness, if other than as specified (par. 6.1.1.2)
j. Method of testing force, if other than as specified (par. 6.1.1.5)
k. Method of deterrnining flatness and parallelism, if other than as specified (par. 6.1.1.7)
1. Carbide (or equivalent) measuring faces, if required (par. 6.1.1.7)
 m. Method of determining surface roughness, if other than as specified (par. 6.1.1.7)
n. Mechanical or electronic digital readout rnicrometers, if required (par. 6.1.1.8, 6.2.1.5, 6.3.1.8.)
o. Setting standards, if required (par. 6.1.2)
p. Whether handles for inside rnicrometers larger than 300 mm (12 in) are required (par. 6.2.1.7)
q. Packaging, labelling and packing details, if other than as specified (par. 7.1)
r. Sampling, if a specific plan is required (par. 8.1).

9.2 Sources of Referenced Publications

9.2.1 The publications referred to in par. 2.1.1 may be obtained from the Canadian Standards Association, 178 Rexdale
Boulevard, Etobicoke, Ontario M9W 1R3.

9.2.2 The publications referred to in par. 2.1.2 may be obtained from the American Society for Testing and Materials,
100 Barr Harbor Drive, West Conshohocken, PA 19428-2959, U.S.A., or from the Standards Council of Canada,
Standards Sales Branch, 45 O'Connor Street, Suite 1200, Ottawa, Ontario K1P 6N7.

9.2.3 The publications referred to in par. 2.1.3 may be obtained from the Standards Council of Canada, Standards Sales
Branch, 45 O'Connor Street, Suite 1200, Ottawa, Ontario K1P 6N7.
 APPENDIX A

EXAMPLES OF SPECIAL PURPOSE MICROMETERS

Al. As noted in par. 4.1, there are several special purpose micrometers which are not covered in CAN/CGSB-39.18.
They are as follows:

A l .1 Outside - Screw thread, disc, point, spline, spherical, blade, hub, can seam, "vu-anvil, indicating, digital, hot rnill,
universal, deep throat, post, inside groove, other sizes.

A1.2 Inside - Tubular, digital, three point, split ball, other ranges, indicating.

A1.3 Depth - Digital, half-base, other base lengths, indicating.

 APPENDIX B

FLATNESS INFORMATION
(Reference CSA B 78.2, Page 101, Par. 13.2.4.3)

BI. Flatness Tolerance

B 1.1 Flatness is the condition of a surface having al1 elements in one plane. A flatness tolerance specifies a tolerance zone
defined by two parallel planes within which the surface must lie. When a flatness tolerance is specified, the feature
control symbol is attached to a leader directed to the surface or to an extension line of the surface. It is placed in a
view where the surface to be controlled is represented by a line (see Figure Bl). Where the considered surface is
associated with a size dimension, the flatness tolerance must be less than the size tolerance.

FIGURE B1

Drawing Callout

The surface must lie between two parallel planes 0.25 mm apart. Additionally, the surface must be located within
any specified limits of size.

r 0.25mm wide tolerance zone -,

The surface must lie between two paraliel planes 0.25 mm apart.
Additionally, the surface must be located
within any specified limits of size.

FIGURE B2

Specifying Flatness

B1.2 Flatness, similar to straightness, may be applied on a limited area basis. The size of the limited area, e.g.,
25 x 25 mm, is specified to the right of the flatness tolerance, separated by a slash line (see Figure B2).

B 1.3 Flatness, except when the surface is one of a feature of size on an MMC basis, applies only to the surface or surfaces
to which the tolerance is directed. When it is required to control two or more surfaces independently, the "times"
symbol may be added.
 APPENDM C

SUGGESTED METHODS OF TESTING MICROMETERS

The most important points that require attention in the testing of micrometers are the accuracy of the measuring
faces in flatness and parallelism and the accuracy of the micrometer screw. The following test methods are
recommended for the purpose of assembly and maintenance.

Measuring faces - The flatness of the measuring faces can be tested by means of an optical flat. Having cleaned
the faces thoroughly, the optical flat is brought into contact with each one in tum. Unless the faces are perfectly flat,
a number of coloured interference bands will be seen on their surfaces, and the shape and number of these bands
indicate the degree of flatness of the face.

The bands are rendered much more distinct if the test is carried out in the light from a mercury vapour lamp,
particularly if the bands are then viewed through a green filter.

The parallelism of the measuring faces of O to 25 mm (O to 1 in) micrometers may be tested very conveniently by
utilizing the same principle of optical interference. For this purpose, a number of optical flats of different
thicknesses are used, the opposite faces of which are accurately parallel as well as flat. These optical flats are placed
in tum bètween the measuring faces as though their thicknesses were being measured, and in each case attention is
paid to the interference bands which are formed simultaneously on the two measuring faces.

The object of making the test with four optical flats of different thicknesses is to check the parallelism of the faces
for four different angular positions of the face approximately 90" apart on the micrometer spindle.

If desired, the same method can be used for testing the parallelism of the faces of larger micrometers up to about
100 mm (4 in). Two of the optical flats are then wmng ont0 the ends of a combination of gauge blocks and the
whole combination thus formed is used as a parallel-ended test piece between the measuring faces. The test can be
carried out in four positions as before by changing the length of the slip gauge combination between the glass
end-pieces by 0.150 mm to 0.180 mm (0.006 in or 0.007 in) in succession.

For the larger sizes of micrometers, the optical test for parallelism of the faces is too sensitive in relation to the
tolerance. In such cases it is possible to make test pieces of suitable length for each size of micrometer by soldering
3 mm or 5 mm (118 in or 3116 in) steel balls on to the ends of a length of 6 mm (114 in) diameter steel rod. These test
pieces are inserted between the measuring faces of the micrometer at a number of positions around their periphery.
Any resulting variation which is found to occur in the micrometer reading should not exceed the tolerance
prescribed for the parallelism between the measuring faces. Instead of making a separate test piece for each size of
micrometer, a single one capable of adjustment for length may be used.
Notes