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Abstract— The diffraction mechanisms of electromag- a contributing contour of integration is defined on the surface
netic (EM) transient scattering from large scatterers are of the scatterer. Various diffraction mechanisms, including
examined by applying a general time-domain aperture reflection and truncation diffraction, can be well explained
integration (TD-AI) technique when the scatterer is illuminated
by an incident EM field. This incident field exhibits a transient- in TD by considering the characteristics of this contributing
step field response and can be the radiation from a relatively contour.
arbitrary EM source located at any place. The mechanism This work serves as a complement to the past works of
is interpreted by considering an equal time-delay curved transient analysis of EM scattering from large structures and
aperture (ETDCA) where a set of EM equivalent current makes the TD theoretical solutions [1]–[25] more complete.
sources are defined to radiate the scattering field. The transient
responses at any instant time are then found by considering the It is particularly useful to treat the scattering structure with
effects of equal net time-delay in propagation when the incident concave surface curvatures, which is beneficial to define an
wave propagates to the field point via EM scattering from the equivalent aperture with a finite boundary and define a set of
scatterer. A contributing contour in the radiation integral of the equivalent currents on it to radiate the EM scattering fields.
equivalent currents define on the ETDCA by its intersection Potential applications include the designs of various reflector
with a time-varying equal path-length sphere defined by the field
point is therefore extracted to reduce the surface integral into antennas to radiate focus beams in realistic applications of
a line one. The characteristics of this contributing contour are ultra-wideband or short-pulse antenna systems for target iden-
employed to interpret the EM scattering mechanisms. Practical tification and remote sensing, such as in the design of impulse-
numerical examples are presented to demonstrate the validity radiating antennas (IRAs) [26]–[28]. Recently applications of
and feasibility of this general TD-AI technique. near-field focused radiations for RFID [29], the detections
Index Terms— Aperture integration (AI) technique, diffraction of vital signal and underground objects [30], or noncontact
mechanism, electromagnetic (EM) scattering, time-domain (TD) microwave inspection system [31], [32] have also attracted
EM, transient analysis. increasing interest to use reflector antennas because of its
nature to focus the scattering field in the near zone of antenna.
I. I NTRODUCTION
In addition, the presented works may also be applied to
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CHOU: GENERAL DIFFRACTION MECHANISM INTERPRETATION OF EM TRANSIENT SCATTERING 6575
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6576 IEEE TRANSACTIONS ON ANTENNAS AND PROPAGATION, VOL. 67, NO. 10, OCTOBER 2019
assumption of F̄(θ f , φ f ) has been widely used in the transient into the dielectric material with refraction, and transmit into
analysis of reflector antennas for impulse-radiation applica- the free space in the shadow side from the dielectric material.
tions [8], [9], [20], [27], [37]–[39]. It remains valid when The transmitted field can be expressed as
most of the radiation energy concentrates within a reasonable
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CHOU: GENERAL DIFFRACTION MECHANISM INTERPRETATION OF EM TRANSIENT SCATTERING 6577
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6578 IEEE TRANSACTIONS ON ANTENNAS AND PROPAGATION, VOL. 67, NO. 10, OCTOBER 2019
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CHOU: GENERAL DIFFRACTION MECHANISM INTERPRETATION OF EM TRANSIENT SCATTERING 6579
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6580 IEEE TRANSACTIONS ON ANTENNAS AND PROPAGATION, VOL. 67, NO. 10, OCTOBER 2019
V. N UMERICAL E XAMPLES
Numerical examples are presented to demonstrate the char-
acteristics of this TD-AI technique. It is noted that the TD-AI
analysis of near- and far-field impulse radiating reflector anten-
nas by using ellipsoidal and parabolic reflectors, respectively,
Fig. 5. Illustration of integration mapping from the curved surface of ETDCA was previously investigated in [1] and [2], respectively. These
to variables analogous to polar variables, and the determination of Cϕ in two
different scenarios on the projection plane. (a) Mapping of the integration to two cases of analysis are special cases of the presented general
the projection plane. (b) Determination of Cϕ on the projection. TD-AI analysis, and will not be repeated. In this section,
we present EM scattering problems of two typical metal
where Rt = R(t) = v(t − ta ). Substituting (22), (5) and (14) structures that appear very often in practical applications.
into (12) gives [1], [2], [40]–[42] The scattering from dielectric bodies is not considered in the
example demonstration as the GO ray tracing is the same
Z0
ε̄us (r̄ , t) ∼
= · [U (t − t1 ) − U (t − t2 )] with the same ray paths of reflection as in the conducting
4π R
m (r̄ )
body cases. The analysis is identical except the inclusion
R̂ × R̂ × n̂ × H̄ap of reflection and transmission coefficients found from the
m (r̄ )
J A (R, ϕ)dϕ (23)
Cϕ −Y0 R̂ × n̂ × Ē ap dielectric bodies.
In these examples, a linearly polarized source is employed
where ( H̄apm , Ē m )
ap = s( H̄ap (r̄ , s), Ē ap (r̄ , s))e(snet )/(v) to produce the illuminating field, whose electrical field pattern
when (5) is used. Here the “−” arising from ∂/∂ R is absorbed is given by
by considering the direction of Cϕ .
In (23), Cϕ is the span angle of Ct with respect to its inter- F̄ f (θ f , φ f ) = V0 cos θ f (cos φ f θ̂ f − sin φ f φ̂ f ) (28)
section with the boundary of ETDCA as illustrated in Fig. 5(b). where (r f , θ f , φ f ) is expressed in the feed’s coordinate system
When Ct is a closed loop, then Cϕ = [0 2π]. Also R is (x f , y f , z f ). The illuminating field becomes a plane wave
constant with respect to ϕ variation. Thus, J A (R, ϕ) in (12) when the feed source is moved to a far distance. In these
can be expressed as examinations, ẑ f points to the center of scatterers. For easy
ds comparison, the field point is expressed in the spherical
J A (R, ϕ) = = |r̄ R × r̄ϕ | (24)
d Rdϕ coordinate system by (r, θ, φ = 0o ) on the xz plane.
r̄ R × r̄ϕ
n̂ = ± (25) A. Transient Responses of Scattering From a Circular Disk
|r̄ R × r̄ϕ |
The first example considers the transient responses from a
where r̄ R = (∂/∂ R)r̄ and r̄ϕ = (∂/∂ϕ)r̄ . The sign in (25) circular metal disk of a radius a = 1 m as shown in Fig.
√ 4(c),
is selected to point toward the direction of scattering field. where its center is along ẑ at (0, 0, F) with F = 3 m.
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CHOU: GENERAL DIFFRACTION MECHANISM INTERPRETATION OF EM TRANSIENT SCATTERING 6581
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6582 IEEE TRANSACTIONS ON ANTENNAS AND PROPAGATION, VOL. 67, NO. 10, OCTOBER 2019
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CHOU: GENERAL DIFFRACTION MECHANISM INTERPRETATION OF EM TRANSIENT SCATTERING 6583
and subsequently (26) reduces to to composite EM scatterers can be obtained [1], [2], such as
V0 planar, parabolic, ellipsoidal and hyperbolical surfaces. This
ε̄us (r̄ , t) ∼
= · [U (t − t1 ) − U (t − t2 )] work may complement the TD quasi-analytical techniques in
4πr the transient analysis of EM scattering problems.
( R̂ × R̂ − R̂
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C. E. Baum, L. Carin, and A. P. Stone, Eds. New York, NY, USA: Hsi-Tseng Chou (F’12) received the B.S. degree
Plenum, 1997, pp. 81–87. in electrical engineering from National Taiwan Uni-
[28] E. G. Farr, C. E. Baum, W. D. Prather, and L. H. Bowen, “Multifunction versity, Taipei, Taiwan, in 1988, and the M.S. and
impulse radiating antennas: Theory and experiment,” in Ulta-Wideband, Ph.D. degrees in electrical engineering from The
Short-Pulse Electromagnetics, vol. 4. New York, NY, USA: Kluwer, Ohio State University (OSU), Columbus, OH, USA,
1999. in 1993 and 1996, respectively.
[29] A. Buffi, A. A. Serra, P. Nepa, and G. Manara, “A focused planar He was a Graduate Research Associate from
microstrip array for 2.4 GHz RFID readers,” IEEE Trans. Antennas 1991 to 1996 and a Post-Doctoral Researcher from
Propag., vol. 58, no. 5, pp. 1536–1544, May 2010. 1996 to 1998 with the ElectroScience Labora-
[30] M. Bogosanovic and A. G. Williamson, “Antenna array with beam tory (ESL), OSU. He is currently a Distinguished
focused in near-field zone,” Electron. Lett., vol. 39, no. 9, pp. 704–705, Professor with the Graduate Institute of Communi-
May 2003. cation Engineering and the Department of Electrical Engineering, National
[31] M. Bogosanovic and A. G. Williamson, “Microstrip antenna array with Taiwan University. He has authored or coauthored more than 500 journal
a beam focused in the near-field zone for application in noncontact and conference papers. He holds 40 patents. His current research interests
microwave industrial inspection,” IEEE Trans. Instrum. Meas., vol. 56, include wireless communication networks, antenna design, antenna measure-
no. 6, pp. 2186–2195, Dec. 2007. ment, electromagnetic scattering, asymptotic high-frequency techniques such
[32] K. D. Stephan, J. B. Mead, D. M. Pozar, L. Wang, and J. A. Pearce, as uniform geometrical theory of diffraction (UTD), novel Gaussian beam
“A near field focused microstrip array for a radiometric temperature techniques, and UTD-type solution for periodic structures.
sensor,” IEEE Trans. Antennas Propag., vol. 55, no. 4, pp. 1199–1203, Dr. Chou is an IET Fellow and an Elected Member of the URSI Inter-
Apr. 2007. national Radio Science U.S. Commission B. He was a recipient of many
[33] T. Han and Y. Long, “Time-domain UTD-PO analysis of a UWB pulse awards to recognize his distinguished contributions in the technological
distortion by multiple-building diffraction,” IEEE Antennas Wireless developments, including the Distinguished Contribution Award in Promoting
Propag. Lett., vol. 9, pp. 795–798, 2010. Inter-Academic and Industrial Cooperation from the Ministry of Education,
[34] P. Liu, J. Tan, and Y. Long, “Time domain UTD-PO solution for the the Distinguished Engineering Professor Award from the Chinese Institute
multiple diffraction of spherical waves for UWB signals,” IEEE Trans. of Engineers, the Distinguished Electrical Engineering Professor Award from
Antennas Propag., vol. 59, no. 4, pp. 1420–1424, Apr. 2011. the Chinese Institute of Electrical Engineering, and the University’s Industrial
[35] P. Pathak, “High frequency techniques for antenna analysis,” Proc. IEEE, Economics Contribution Award in 2008, the National Industrial Innovation
vol. 80, no. 1, pp. 44–65, Jan. 1992. Awards—Key Technology Elite Award in 2011, and the Industrial-Academia
[36] H. Chou, “A generalized physical optics based diffraction mech- Collaboration Award in 2017 from the Ministry of Economics. He was also a
anism analysis of transient scattering from perfectly conducting recipient of the Best Chapter Award in 2012, the outstanding branch counselor
surfaces,” IEEE Trans. Antennas Propag., to be published. doi: awards from IEEE including IEEE Headquarter, R-10, and Taipei Section,
10.1109/TAP.2019.2908111. respectively, and the IEEE Technical Field Undergraduate Teaching Award
[37] S. P. Skulkin and V. I. Turchin, “Transient fields of offset reflector,” in in 2014. He was elected as one of the nation’s ten outstanding young persons
Ultra-Wideband, Short-Pulse Electromagnetics, vol. 5. New York, NY, by Junior Chamber International, in 2004, the National Young Person Medal
USA: Springer, 2002, pp. 371–375. from China Youth Corps of Taiwan, in 2005, and as one of the top ten rising
[38] J. S. Tyo, E. G. Farr, and D. I. Lawry, “Effect of defocus on the prompt stars in Taiwan by the Central News Agency of Taiwan. He has served as
response of a reflector IRA,” IEEE Trans. Antennas Propag., vol. 53, the Chair for the IEEE AP-S Taipei Chapter and is currently the Chair of the
no. 10, pp. 3247–3254, Oct. 2005. EMC-S Taipei Chapter.
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