Near-field Probe Radiation Profile Boundaries

Assessment for Optimal Radiated RF Power

Susceptibility Pre-mapping

Audrius Merfeldas, Pranas Kuzas, Darius Gailius, Zilvinas Nakutis, Mindaugas Knyva, Algimantas Valinevicius,
Darius Andriukaitis, Mindaugas Zilys, Dangirutis Navikas
Electronics Engineering dpt.
Kaunas University of Technology
Kaunas, Lithuania
audrius.merfeldas@ktu.lt

Abstract — In this paper, the improved near-field probe
power radiation profile investigated. The modelling of the
electromagnetic field strength in 80-3000 MHz frequency range
in the proximity of the near-field probe was performed.
The -6 dB aperture boundaries of the magnetic near-field probe
were determined for adaptive scanning height systems in the
distance range of 1-15 mm for both X and Z axis. The simulation
of improved near-field probe absolute magnetic field strength
distribution reference map in open-air conditions is carried out
in this work and approximation by 9th order polynomial
function proposed for radiated susceptibility maps
post-processing and hotspot localization improvement.
Keywords—Electromagnetic compatibility, Electromagnetic
fields, Electromagnetic interference, Radio frequency interference
I. INTRODUCTION
Nowadays electronic devices are exposed by wide
spectrum of electromagnetic interferences. For successful
compliance to the existing electromagnetic compatibility
(EMC) standards [1, 2], printed circuit board (PCB) layout,
shielding materials, various filtering components for EMC
solutions or signal processing techniques should be taken into
consideration even at early design stages [3]. The existing
EMC testing methods are based on far-field measurements.
Device under test (DUT) is located in pre-calibrated uniform
field zone and exposed by various directions of
electromagnetic field [4]. Though these methods are high
precision and ensure excellent repeatability, they are not able
to localize the susceptible areas of the PCBs due to the
Pass/Fail report format and lack of detailed information for
schematics and layout developers. However, for more
comprehensive characterization of the electronic device
solution, the near-field radiated susceptibility mapping has
certain advantages, since it is possible to spot the susceptible
areas of PCB and requires low radio frequency (RF) power
equipment due to small distances between probe and DUT
PCB. The radiated susceptibility mapping resolution
improvement and error reducing [5] are achieved either by
improvement of the probe design [6] or by post processing of
the acquired map data [7]. The electric and magnetic near-
field probes for radiated susceptibility mapping exist.
However, the magnetic probes are less prone to the proximity
of the PCB ground plane and protruding components. The
microstrip near-field magnetic probe performance
investigated by the authors [6] yielded to 22÷47 % improved
radiated susceptibility mapping resolution in the
80÷3000 MHz range in the proximity of the coplanar
waveguide. Due to the PCB landscape and variation of
component height, density and magnetic properties, not all
areas can be scanned in close proximity and therefore the
resolution and accuracy of the radiated susceptibility map
degrades. The adaptive scenario of the prescanning and
successive field susceptibility scanning is beneficial in the
suspicious areas of the DUT PCB. The coupling efficiency
variations and therefore the probe aperture variations due to
the variable scanning height should be encountered in the
prescanning stage with the purpose to equalize the injected
MF strength at the PCB board level over the frequency range.
Based on the previous research and experience gained by
authors [6] in the electromagnetic compatibility field, the
adjustable scenario of radiated susceptibility mapping can
benefit both from structural improvement of the probe and
characterization of its performance under the scanning
conditions. Hardware adjustments at some degree in the probe
RF power stage such as equalization of the probe frequency
response curve or gain control can be performed to reduce the
variation of the coupling coefficient. The probe compensation
methods [5] or susceptibility map post-processing techniques
may be combined for adjustment of the acquired data and
therefore to improve the map resolution as well. In the radiated
susceptibility mapping, however, it is important to determine
the spatial resolution over the frequency range and to optimize
the scanning time and amount of the scanning points. Another
important aspect of the radiated susceptibility mapping is to
maintain the injected MF strength at the surface of the PCB
within the predetermined levels relevant to the existing
standards. Therefore, the aim of this work is to model the
near-field magnetic probe aperture for the improved probe
proposed by authors in the 80÷3000 MHz frequency range.
II. METHODOLOGY
Aiming to determine the electromagnetic field
distribution and aperture shaping parameters of the MF probe
in the near-field zone, the improved MF probe [6] was
modelled in the CST Studio environment. The modelling is
performed in two stages: 1) MF probe is modelled in open air
environment and the -6 dB MF aperture diameter variation
expressed as min, mean and max values was calculated for
both X and Z axis for frequency range of 80÷3000 MHz and
scanning distance range of 1÷15 mm; 2) the EM field
distribution of the MF probe is modelled in open air
environment for 5 mm scanning height.

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 III. PROBE MAGNETIC FIELD CHARACTERIZATION IN
OPEN-AIR CONDITIONS
A. Geometry of the Probe
The improved near-field magnetic probe model geometry
developed in the CST studio software for estimation of
near-field EM distribution is presented in the Fig. 1. The RF
power is connected to the probe input 50 Ω port 1. The probe
is encapsulated in the copper cylinder 2 with internal
diameter of 8 mm for improved focusing of the MF. The
probe is produced using the microstrip technology on the
FR-4 laminate 4. The taper line 3 is used for the improvement
of the broadband matching of the magnetic loop 6 which is
shaped as a rectangular trace loop on the top layer of the
probe PCB with parameters w=0.3 mm and d=5.3 mm. The
loop feed is provided through the PCB via 5 to the ground
layer (Fig. 1b).
15 mm to cover the most probable range of distances for
prescanning purposes.
The -6 dB relative MF decrease margin regarding the peak
value at the center of the near-field probe is used to define the
aperture of the probe. For the first stage, the open-air
conditions were created and the simulation was performed at
3, 5 and 10 mm distance. The simulation results at 1 GHz
probe excitation frequency are shown in Fig. 3. The contour
of the copper cylinder was highlighted as red color ring and
isolines of the MF strength in 0.2 dB increments were overlaid
to display the distribution of the MF in the XZ plane. The
offset of the MF distribution and therefore the probe aperture
shift is observed in the proximity of 3 mm (see Fig. 3a). The
elliptic shape of the -6 dB aperture is evident in bigger
distances at 5 mm and 10 mm (see Fig. 3b and Fig. 3c).

a b
Fig. 2. Near-field magnetic probe model in the CST Studio.
Fig. 1. Near-field magnetic probe model geometry in the CST Studio.

The 5x5mm copper area is removed from the ground layer

and the 0.3 mm gap 8 for the high frequency (HF) current
path management is formed near the working edge of the
probe PCB. The probe construction allows for close
proximity to the PCB under the test, as the copper cylinder
and working edge are aligned.
B. Modelling of the Near-field Probe a b c
The near-field probe model is presented in Fig 2. The Fig. 3. Near-field magnetic probe relative MF strength -6 dB apertures in
criteria of 30 grid elements per minimal wavelength was set the CST Studio: a) 3 mm distance, b) 5mm distance, c) 10mm distance.
while generating the mesh grid for the 3D model time domain
solver in the CST Studio suit. The cell dimension range was In the open air conditions, the MF strength distribution in
from 0.0175 mm to 3.29 mm; total number of 3143448 the proximity zone of the near-field probe has single global
adaptive hexahedral mesh elements was generated in the maximum value and the cross-section of the absolute MF
solver for simulation. The EM field calculation results in the strength map can either be approximated with a low order
model by default are acquired in the 3D field monitors as a polynomial or interpolated. To define the MF aperture
color map at a chosen frequency. For numerical data exporting diameters and their variation over the frequency range, the
purposes, the grid consisting of 169 isotropic EM field virtual aperture cross-sections in XY plane and ZY planes were
probes in the proximity of the magnetic near-field probe were estimated. The results are presented in Fig. 4.
displaced in the XZ plane of the model (see Fig. 2). The virtual
probe grid density is 1 mm. A 101x2 element length array of
absolute MF strength values versus frequency (80÷3000 MHz
range) is exported to the data file. The distance from the probe
grid plane in the model was set in the range from 3 mm to

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 Probe model geometry parameter Parameter value
Distance from probe working edge to the
5 mm
microstrip top layer surface
Virtual absolute MF probes’ grid density 1x1 mm

Virtual absolute MF probes’ quantity 169

Virtual absolute MF probes’ coverage
13x13 mm
area
Probe RF port excitation power level 27 dBm

C. Modelling of the near-field probe MF strength

distribution map in open-air conditions
The absolute MF strength distribution in the proximity
zone of the probe and its variation due to the changing
conditions of scanning may be handled in the radiated
susceptibility map post-processing algorithms. The exported
data from the isotropic EM field virtual probe map (see Fig. 2)
is used for estimation of the MF distribution. The open-air
Fig. 4. Modeled near-field magnetic probe averaged aperture sizes (green modelling results at 1000 MHz frequency are presented in Fig.
and green dotted lines) and min-max aperture size boundaries over 5. It can be seen from the magnetic probe aperture map in Fig.
80÷3000 MHz range. 5 that variation of the MF strength is within 16 dB in the
13x13 mm modelled area.
Interpolated apertures in the 80÷3000 MHz range were
simulated and their average values in the given frequency
range are displayed in the Fig. 4 by the green line (ZY plane)
and green dotted line (XY plane). The maximum (red and red
dotted lines) and minimum (blue and blue dotted lines)
aperture measures were determined respectively. The
performance of the near-field probe can be defined by two
parameters:
1. The slope of average -6 dB aperture diameter over the
scanning distance in the given plane D-6dB(H)
2. Variance of the probe aperture over the given
frequency range σ-6dB(H)
It may be noted from the Fig. 4, that in the ZY plane, the
value of the D-6dB(H) slope is higher than that in the XY plane. Fig. 5. Modeled near-field magnetic probe aperture map sample in XZ
Yet, the variance of the D-6dB(H) slope in the ZY plane is also plane at 1000 MHz at 5 mm distance.
smaller, which indicates the improved focusing of the injected
MF and therefore the better susceptibility mapping resolution The resulting near-field magnetic probe aperture shape at
in the ZY plane. A trade-off between the near-field probe the open-air condition will be used as a reference for
aperture dimensions and the scanning height above the PCB comparison of the apertures in case of other conditions (probe
must be considered for precise location of the hotspots in loads). The open-air map with a 9th order 2D polynomial
radiated susceptibility maps. For prescanning purposes, approximation over 80÷3000 MHz frequency range is shown
maximizing of the scanning speed at a constant scanning in Fig. 6.
height with a predefined injected absolute MF strength and
predictable injected MF strength variation limits are preferred.
The mid-range of prescanning at 5 mm height above the PCB
was chosen for more detailed analysis. It can be seen in Fig. 4
that the probe aperture size boundaries’ variation in the
80÷3000 MHz scanning frequency range at open air
conditions is less than 20 % both in ZY and XZ planes. The
MF strength map display form as a 3D mesh grid surface is
used in the following sections for analysis. Due to the
numerous degrees of freedom, modelling results will be
presented in case of fixed scanning height. The full definition
of geometric parameters of the model is presented in the
Table 1.

TABLE I. PROBE MODEL GEOMETRY DEFINITION

Probe model geometry parameter Parameter value

Microstrip line impedance 50 Ω
Fig. 6. Modeled near-field magnetic probe aperture map in XZ plane
Base laminate Dk 4.2 averaged over 80÷3000 MHz frequency range at 5 mm distance
approximated by 9th order polynome.

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 The approximation metrics are R2 = 0.9990, RMS error post-processing and lower requirements for susceptibility
(RMSE) = 0.1324, DoF = 114. Polynomial coefficients are map rendering system. For improved precision the correction
listed in the Table 2. map might be calculated for each frequency sample and post-
processed individually.
TABLE II. 9TH ORDER POLYNOME COEFICIENTS VALUES
P Value P Value
P90 1.6005E-08 P27 1.4072E-06 CONCLUSIONS
P81 -5.0398E-08 P26 1.0302E-05 The results of MF absolute strength simulations in the
P80 -2.7656E-06 P25 -1.148E-04
proximity of the PCB improved near-field probe were
P72 3.5276E-08 P24 -7.6614E-04
P71 -1.3432E-07 P23 2.9816E-03 analysed. -6 dB field strength aperture boundaries were
P70 -1.3913E-06 P22 1.9168E-02 calculated for both X and Z axis in the scanning height range
P63 5.5634E-08 P21 -2.5511E-02 of 1÷15 mm. The averaged over the frequency range
P62 -3.1256E-07 P20 -3.9832E-01 reference MF aperture in the open-air conditions was defined
P61 2.2788E-06 P18 2.5093E-07
P60 1.8944E-04 P17 -4.0127E-07
and approximated by 9th order polynomial function. The
P54 5.0689E-09 P16 -1.8379E-05 practical confirmation of simulated results is not possible due
P53 -3.5868E-07 P15 4.6865E-05 to small scanning distances, physical dimensions of the real
P52 -2.2125E-06 P14 5.3531E-04 probe and measuring probe influence to the field. The MF
P51 2.1868E-05 P13 -1.6446E-03 map could contribute for optimal scanning resolution
P50 7.7482E-05 P12 -1.2437E-02
P45 4.2213E-07 P11 1.0406E-02 selection and post-processing or radiated susceptibility maps
P44 1.7274E-06 P10 2.4499E-01 by improving precision and hotspot localization.
P43 -2.4113E-05 P09 2.3619E-06
P42 -5.6934E-05 P08 9.9889E-06 REFERENCES
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Averaged map in 80÷3000 MHz frequency range was
calculated over whole frequency range for faster

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