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Communication
Direct detection of optical forces of
magnetic nature in dielectric nanoantennas
Martín Poblet, Yi Li, Emiliano Cortés, Stefan A. Maier, Gustavo Grinblat, and Andrea V. Bragas
Nano Lett., Just Accepted Manuscript • Publication Date (Web): 16 Sep 2020
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Page 1 of 24 Nano Letters

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7 Direct detection of optical forces of magnetic
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nature in dielectric nanoantennas
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17 Martin Poblet†, Yi Li§, Emiliano Cortés‡, Stefan A. Maier‡∥*, Gustavo
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21 Grinblat†*, Andrea V. Bragas†
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26 †Departamento de Física, FCEN, IFIBA CONICET, Universidad de Buenos
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30 Aires, Intendente Güiraldes 2160, C1428EGA Buenos Aires, Argentina.
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34 §School of Microelectronics, MOE Engineering Research Center of Integrated
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Circuits for Next Generation Communications, Southern University of Science
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42 and Technology, Shenzhen 518055, China.
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‡Chair in Hybrid Nanosystems, Nanoinstitute Munich, Faculty of Physics,
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50 Ludwig-Maximilians-Universität München, 80539 München, Germany.
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53 ∥Department of Physics, Imperial College London, London SW7 2AZ, UK
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4 * corresponding authors: stefan.maier@physik.uni-muenchen.de,
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7 grinblat@df.uba.ar
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13 ABSTRACT. Optical forces on nanostructures are usually characterized by their
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16 interaction with the electric field component of the light wave, given that most materials
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18 present negligible magnetic response at optical frequencies. This is not the case however
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20 of a high-refractive-index dielectric nanoantenna, which has been recently shown to
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efficiently support both electric and magnetic optical modes. In this work, we use a photo-
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25 induced force microscopy configuration to measure optically induced forces produced by
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27 a germanium nanoantenna on a surrounding silicon near-field probe. We reveal the spatial
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distribution, character, and magnitude of the generated forces when exciting the
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32 nanoantenna at its anapole state condition. We retrieve optical force maps showing values
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34 of up to 20 pN, which are found to be mainly magnetic in nature, according to our
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36 numerical simulations. The results of this investigation open new pathways for the study,
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39 detection, and generation of magnetic light forces at the nanometer scale.
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42 KEYWORDS: Photo-induced Force Microscopy, Dielectric nanoantenna, Anapole
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44 excitation, Magnetic field enhancement.
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3 Light carries energy as well as linear and angular momentum that can be transferred
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to atoms, molecules, and particles. The general law for electromagnetic forces relies on
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8 the conservation of momentum and connects the electromagnetic and the mechanical
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10 realms. Optical forces have been of enormous significance in describing a wide variety
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of fundamental physical phenomena, with experimental realizations including milestones
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15 such as optical tweezers1,2, laser printing of nanoparticles3,4, ion trapping and cooling5,
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17 and cavity optomechanics6–8. In general, since most structures have a very weak magnetic
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19 response at optical frequencies, it is only the effect of the electric field of light on the
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22 optically induced forces that is usually considered. This is the case for example for a
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24 plasmonic nanoparticle, which can highly concentrate the electric field component of
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26 light at sub-wavelength volumes but cannot significantly enhance the magnetic
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component, because of the vanishing field inside the metal9. Indeed, it was not until 2009
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31 that the magnitude and vector character of the magnetic field of light in the near field was
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33 measured using a near-field probe with a split ring resonator design10. Moreover, only
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very recently an algorithm that extracts all the six components of the electromagnetic
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38 field with just a single near field measurement has been published11. In this context,
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40 enhancing the nanoscale magnetic response at optical frequencies could aid in completing
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42 our understanding of light-matter interactions, in the same way that plasmonic systems
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45 have shed light on nanoscale manipulation of the electric component of light.
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48 Different from the case of plasmonics, high-refractive-index dielectric nanoparticles
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50 have been recently shown to efficiently support both electric and magnetic optical modes
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52 through Mie resonances9-15. Moreover, it has been proved experimentally that when a
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silicon nanoparticle is subjected to an intense light field, magnetic forces produce
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57 detectable effects12. However, in general terms, the magnetic properties of optical nano-
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59 resonators have been only weakly characterized and utilized so far compared to their
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3 electric counterpart. Having a system supporting magnetic light resonances makes the
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dielectric nanoantenna a very attractive platform to measure optical forces of magnetic
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8 origin, in a similar way that optically induced electric forces have been detected close to
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10 metallic nanoparticles with Photo-induced Force Microscopy (PiFM)13,14. PiFM
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combines optical microscopy with atomic force microscopy (AFM)15,16 to map
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15 electromagnetic near-field forces on the order of some fN to pN using a polarizable probe.
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18 Dielectric nanoparticles can be described by a complex electrical and magnetic
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20 polarizability and are expected to feel (and produce) electric and magnetic forces when
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23 illuminated by a light beam17–22. However, while the distribution of the electric and
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25 magnetic near fields around a dielectric nanoantenna has been characterized theoretically
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27 and experimentally23, and even the optical forces produced on dielectric particles have
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been measured24, the associated near-field forces they would induce have not yet been
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32 measured, although they have been analyzed in theory22,25. In general, the quantitative
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34 measurement of optical near-field forces is of great interest for applications related to
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near-field trapping of nanoparticles and molecules in nanometric volumes26,27, such as
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39 biosensing28,29 and lab-on-a-chip experiments30,31. In addition, the existence of forces of
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41 magnetic and electrical origin in nanostructured dielectrics allows envisioning some type
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43 of sorting of particles and molecules in the near field via specific coupling depending on
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46 their electric or magnetic nature, in an analogous way that electric or magnetic dipoles
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48 can probe the local density of states of the optical electric or magnetic near fields,
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50 respectively32. Furthermore, when designing a nanophotonic hybrid system, there will be
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a differential local stress to consider over a material placed in the near-field region of the
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55 dielectric component33,34, since the electric and magnetic optical fields concentrate in
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57 different locations around the dielectric. Knowing that even small movements can
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translate into large changes in the optical properties of a hybrid system35, the nature,

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3 spatial distribution and strength of the near-field forces are of great importance for the
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6 construction of nanophotonic devices.
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9 To maximize sensitivity in optical force detection, gold-coated AFM tips have been
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11 usually employed in PiFM configurations13,15,16, considerably enhancing the optical
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electric field at the apex of the tip. However, such a local probe is poorly sensitive to
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16 magnetic near fields. Alternatively, a configuration using a dielectric AFM tip, which can
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18 be electrically and magnetically polarized by light, has been proposed theoretically36 and
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20 used in an experiment only to minimize the disturbance on the spectroscopic response of
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23 a plasmonic sample14. Here, we successfully implement a PiFM tool that uses a dielectric
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25 silicon tip, to image both electric and magnetic forces in individual germanium
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27 nanoantennas under illumination, thus revealing the spatial distribution of the induced
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30 optical forces and the confinement of electric and magnetic fields. The magnitude of the
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32 measured forces ranges in the tens of pN, comparable with a variety of other forces such
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34 as Casimir37 and van der Waals38 forces, intramolecular forces engaged in unfolding
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proteins39, or exerted by individual molecular motors40. Numerical simulations using
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39 finite-difference time-domain methods show very good agreement with the experiment.
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41 Our results bring new nanoscale spatial information of the optical forces acting in a single
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43 dielectric nano-resonator, revealing a dominant magnetic contribution.
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47 Germanium nanoantennas of 80 nm height were fabricated by means of thermal
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49 evaporation and electron beam lithography on a glass substrate (see Methods for
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51 fabrication details). The nanostructures were designed to have a cylindrical shape with
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54 two holes along one of its diameters, as shown in the scanning electron microscope (SEM)
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56 image of Fig. 1a. Throughout the sample, the external diameter (D) of the nanostructures
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58 was varied between 260 nm and 350 nm, while the diameter of the holes was kept fixed
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3 at 100 nm. A pitch of 3 m was chosen to avoid optical coupling between adjacent
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6 nanoantennas.
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9 The sample was characterized in situ with a combined home-made optical-AFM
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simultaneously with contact or tapping mode of atomic force imaging. Fig. 1b displays
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16 an AFM image of a nanoantenna taken in tapping mode, showing the dimensions of the
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18 nanodisk as well as the ability of the technique to perform a precise inspection of the
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20 internal holes. To identify the resonant modes of the germanium nanostructure, shown
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23 schematically in Fig. 1c, we carried out optical scattering measurements and plane wave
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25 finite-difference time domain simulations of scattering and absorption cross sections (see
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27 Methods for simulation details). Fig. 1f,g exhibits the obtained experimental and
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theoretical results for nanodisks of different diameters, respectively. The experimental
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32 illumination wavelength corresponds to 800 nm, while the wavelength in the simulation
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34 was set to 850 nm to better reproduce the measurement (refer to the Supporting
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Information S3.1 for the simulation of the scattering spectrum). Similar discrepancies in
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39 the resonant wavelength have been previously observed in studies of dielectric
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41 nanoantennas and have been ascribed to geometrical imperfections of the fabricated
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43 structures41. A relative scattering minimum is observed for a disk diameter of 320 nm,
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46 which is assigned to the anapole excitation (AE), as deduced from the corresponding
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48 electric and magnetic field intensity distributions shown in Fig. 1d,e, respectively. The
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50 AE is a nonradiative state, product of destructive interference between electrical and
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toroidal dipole modes42,43, and has been recently observed in simple structures such as
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55 nanodisks of silicon42, germanium41 and titanium dioxide44. At the AE condition,
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57 displacement currents circulate in opposite directions on the sides of the disk, with a
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circular magnetic field that points in the perpendicular direction at the top surface of the
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3 disk, as illustrated in Fig. 1c. For polarizations both horizontal (i.e., in the direction
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perpendicular to the line connecting the holes) and vertical (parallel to the line connecting
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8 the holes), the magnetic field is highly confined inside the nanoantenna45, with
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located mainly at the external edges of the nanoantenna.
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47 Figure 1. Germanium nanoantennas sample. (a) SEM image of the fabricated array of
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49 nanoantennas. The external diameter D ranges from 260 nm to 350 nm. Scale bar: 1 m.
50 The inset shows a magnified SEM image of a single nanodisk; each hole has a diameter
51 of 100 nm. Scale bar: 200 nm. (b) Tapping mode AFM image of a single nanoantenna.
52 (c) Schematic representation of the anapole excitation (AE) in a germanium nanodisk.
53 Linearly polarized light impinges from below in Z-direction and excites the sample at
54 resonance; electric and magnetic fields build up inside the nanoantenna. (d-e) Calculated
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electric d and magnetic e near-field field intensity distributions for horizontal and vertical
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57 polarizations, as indicated by the arrows, computed at mid-height of a nanoantenna of D
58 = 320 nm. E0, H0 are the amplitude of the electric and magnetic incident fields,
59 respectively. Scale bar: 100 nm. (f) Experimental optical scattering of nanoantennas of
60 different diameters, taken at 800 nm wavelength illumination. (g) Corresponding

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3 simulated scattering and absorption cross sections computed at 850 nm wavelength to
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better describe the experimental results (see main text).
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To perform the optical force measurements, we modified our optical-AFM system to
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10 include PiFM capabilities, reaching the final form schematized in Fig. 2a. In the modified
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12 setup, the sample is optically excited with a CW Ti:Sapphire laser at 800 nm, and its
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14 optical response is measured through the induced forces on a silicon AFM tip (Olympus
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17 OMCL-AC240TS, nominal tip radius 7 nm), set to scan over the nanoantenna. We used
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19 a silicon probe instead of a conventional plasmonic tip so as not to mask the effects of the
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21 optical magnetism present in these nanostructures. To register simultaneous topography
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and photoinduced force measurements, we took advantage of the multiple mechanical
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26 resonances supported by the AFM cantilever46,47, which can be seen in the frequency
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28 sweep shown in Fig. 2b, recorded with the silicon tip far from the sample. We found two
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main resonances at 𝑓1≅75 𝑘𝐻𝑧 and 𝑓2≅440 𝑘𝐻𝑧, with corresponding nominal force
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33 constants of k1 ≅ 2 N/m and k2 ≅ 80 N/m, respectively. We note that this observation
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35 matches that expected for a rectangular cantilever, where the second resonance is
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calculated to be close to the sixth harmonic of the fundamental frequency47. In this
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40 experimental scheme, by setting the AFM tapping mode at the oscillating frequency f ⁓
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42 f1 and modulating the intensity of the laser beam at fL = f2, we could register both
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44 topography and amplified photoinduced effects at independent mechanical resonances
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47 using two lock-in amplifiers. Before each set of measurements, precise values of k1 and
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49 k2 were determined using the usual thermal tune method48.
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29 Figure 2. Photo-induced Force Microscopy (PiFM) scheme. (a) Schematic of the
30 combined optical/atomic force microscope (AFM) used for the experimental
31 measurements. OD: optical diode, AOM: acousto-optic modulator, PH: pinhole, APD:
32 avalanche photodiode, 4Q: four-quadrant AFM head detection. A detailed view in the
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square panel shows the configuration used for PiFM operation with simultaneous AFM
35 topography and optical force detection. Two lock-in amplifiers record the voltage signal
36 at the tapping modulation frequency, f, and the laser light modulation frequency, fL,
37 respectively. (b) Frequency spectrum of mechanical resonances of the AFM cantilever. f1
38 and f2 denote the first and second mechanical resonances, respectively. The peaks around
39 100 kHz are not characteristic of the cantilever and depend on the coupling of the AFM
40 tip substrate with the holder. (c) Schematics of the deflection of the cantilever when
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exerting forces on the tip in Z and Y directions (see Supporting information S2 for details).
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In most of the PiFM configurations found in the literature, sideband detection (i.e. fL
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47 around but not equal to fCantilever) is performed to remove the long-range force
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49 background13,15,16. However, we note that sideband detection does not eliminate
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photothermal contributions, and, furthermore, due to the small magnitude of the forces
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54 involved, it may provide poor sensitivity performance. In our experiment, we chose to
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56 execute measurements at maximum sensitivity (fL= f2), with careful subtraction of the
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58 long-range force background, and using a phase-sensitive detection of the lock-in signal
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3 at fL to eliminate the influence of photothermal effects. Indeed, while photoinduced forces
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are in quadrature with the laser modulation for the mechanical oscillator at resonance49,
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8 forces of thermal origin will show a certain phase shift that is dependent on the
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10 modulation frequency50. In particular, for high enough frequencies such as those used in
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our measurements, the photothermal contributions will appear in phase with the
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15 modulation. Therefore, the lock-in signals in phase with the laser modulation signal were
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17 filtered out from our PiFM measurements (see Supporting information S1 for a more
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19 detailed analysis and explanation). It is also important to mention that our setup was able
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22 to detect forces not only in the Z direction (perpendicular to the sample) as usual in any
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24 force microscope, but also in the Y direction (along the cantilever long axis), as illustrated
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26 in Fig. 2c, a component which is not commonly present in topography or friction
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experiments. Both force components produce an angular deflection on the cantilever
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31 which is detectable by the AFM head with a force sensitivity ratio estimated to be 1:8
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33 (Y:Z) (see analytical calculation included in the Supporting information S2). A
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voltage/force experimental calibration curve was used to convert lock-in voltage values
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38 to force values (see Supporting information S1).
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41 Given that optical force measurements involve placing the silicon AFM tip in the
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43 vicinity of the germanium nanoantenna, it is important to analyze first how the fields
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would develop in the coupled system. We start by considering the situation where the tip
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48 is positioned at the center of one of the holes of the resonant D = 320 nm nanodisk (see
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50 schematic in Fig. 3a), as shown in Fig. 3b,c. For both horizontal and vertical polarizations,
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52 we observe that the electric and magnetic fields locate inside and around the nanoantenna-
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55 tip system. In particular, we find that the magnetic field concentrates efficiently inside
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57 the tip, while the electric field seems to spill out to the borders of the nanoantenna, thus
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59 validating the choice of the silicon probe for magnetic force measurements. By comparing
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3 the magnetic field maps in Fig. 1 (without tip) with those in Fig. 3, we observe that
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magnetic field values in the nanoantenna are of the same order in both cases. We also
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8 encounter that the magnitude of the magnetic field inside the tip, which is significantly
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10 higher than inside the nanoantenna, is similar to that computed when considering the tip
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in the absence of the nanoantenna, as shown in the Supporting information S4. However,
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15 as the incident magnetic field is polarized within the XY plane, its induced magnetic
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17 moment on the tip will not participate in the detection of forces in the (perpendicular) Z-
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19 direction. The Z-direction is the predominant direction for the field produced by the
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22 nanodisk inside the hole, which in turn induces a dipolar moment on the tip in the same
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24 direction. Therefore, the experiment is expected to mainly probe the interaction between
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26 the nanoantenna and its induced dipolar moment on the tip.
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53 Figure 3. Fields and forces simulations of the nanoantenna-tip coupled system. (a)
54 Schematic illustration of the XZ cut (in green) taken for the simulations of the fields. The
55 tip is positioned at the superior hole with its apex at mid-height inside the nanoantenna.
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(b-c) Simulated electric (b) and magnetic (c) field intensity distributions of the coupled
58 nanoantenna-tip system described in a, for horizontal and vertical polarizations. (d)
59 Calculated components of the optically induced electric and magnetic forces on the
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3 for both incident polarizations. In the abscissa, zero refers to the top surface of the antenna
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whereas negative (positive) means inside (outside) the nanoantenna.
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Next, we computed numerically the magnitude and character of the optical force acting
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10 on the silicon tip in a PiFM measurement under the specified experimental conditions.
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12 First, we evaluated how the force would change as the tip enters the nanoantenna through
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14 the holes, which corresponds to the path crossing the largest field gradients. To that end,
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17 we calculated the induced electric and magnetic forces in each one of the three directions
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19 for different positions of the tip along the hole Z axis, considering plane wave illumination
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21 at a fluence of 1 mW/m2. The results are shown in Fig. 3d, where positive and negative
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24 Z values indicate positions of the tip outside and inside the hole, respectively (i.e. Z = 0
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26 nm corresponds to the top surface of the disk). We found that the net force is mainly
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28 magnetic in nature and that it occurs mostly in the Z direction, although a small Y
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31 component is also present. For the two polarizations, maximum force values reach a few
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33 tens of pN at mid-height of the disk and decrease to negligible levels when the tip exits
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35 the hole. Noticeably, while the tip clearly detects how the force changes with the Z
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position, it fails to distinguish between horizontal and vertical polarizations. Even though
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40 the magnetic field inside the hole is greater for horizontal polarization incidence (Fig. 1e),
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42 the tip still strongly couples to the fields outside the hole for the vertical polarization (Fig.
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44 3c), compensating the difference. Regarding the force in the X direction, it is observed to
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47 be zero due to the symmetry of the problem.
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50 Fig. 4 summarizes the results from the PiFM measurements performed on a 320 nm
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52 diameter germanium nanoantenna at an illumination fluence of 1 mW/m2 (see
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representative AFM topography map in Fig. 4a). A PiFM control image taken with no
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57 illumination, as shown in Fig. 4b, was used to estimate the detection limit of our
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59 experiment. As can be seen from the noise histogram in the inset of the figure, we find
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3 this limit to be of the order of 2 pN. Fig. 4c,e presents the PiFM images acquired for
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horizontal and vertical incident polarizations, respectively. The 1x1 µm2 images contain
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8 128x128 pixels, registered at 156 ms integration time per pixel. In both cases, strong force
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10 responses are registered at hole regions and edges of the nanoantenna, while the measured
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signal on its top surface and outside antenna regions is nearly negligible. Fig. 4d,f shows
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15 optical force traces along the line crossing the disk holes in Fig. 4c,e, respectively. The
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17 graphs also include corresponding numerical simulations computed by tip-scanning over
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19 the antenna’s top surface and inside hole regions (see Supporting information S3 for
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22 simulation force maps). A very good agreement between experiment and theory is
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24 observed, with simulated and measured force values matching within a factor < 2. Given
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26 the low magnitude of the calculated Y component of the forces and the reduced force
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sensitivity of the measurement in that direction, we deduce that the experimental signal
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31 corresponds essentially to the Z component of the optical force, which is 80% of magnetic
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33 character, according to the numerical simulations. Fig. 4g shows the optical force trace
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taken along a horizontal line crossing one of the holes for horizontal polarization
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38 illumination. The actual profile of the sample is shown in dashed line for reference, while
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40 the topography scan line is marked as a solid line; the photoinduced force signal is shown
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42 in golden. The finite tip size affects the lateral resolution in such a way that the topography
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45 profile results in a convolution of the tip and the sample shapes. For the photoinduced
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47 force, we see a central peak that corresponds to the (mainly) magnetic force inside the
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49 hole, and two lateral smaller peaks that correspond to the circumference seen in Fig. 4c.
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By an inspection on the simulations, we can assign these latter peaks to forces of electrical
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36 Figure 4. PiFM measurements on a germanium nanoantenna excited at resonance.
37 (a) AFM topography image of a D = 320 nm germanium nanoantenna. Scale bar: 200 nm.
38 (b) Control PiFM image taken with no illumination in the same region as in a. The inset
39 shows the corresponding noise histogram. (c), (e) PiFM images of the nanoantenna under
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41 1 mW/m2 illumination fluence with horizontal (c) and vertical (e) polarizations. Color
42 bar scale in pN is obtained after a voltage/force calibration shown in Supporting
43 information S1. (d), (f) Experimental force profile along the line crossing the two holes
44 (golden curve) for horizontal (d) and vertical (f) polarizations. Simulated forces in Y (red)
45 and Z (blue) directions are included for comparison. In dashed green line the total force
46 FT is shown calculated as FT=Fz+Fy/8 according to the sensitivity of the experiment. (g)
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Experimental force (golden curve) and topography (black solid line) profiles taken in X
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49 direction along one of the holes for horizontal polarization. The dashed line represents
50 the actual topography of the sample. M: magnetic, E: electric (see main text).
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52
53 To further verify the resonant behavior of the chosen germanium nanoantenna, we
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acquired PiFM images of nanoantennas of different sizes around D = 320 nm, as shown
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58 in Fig. 5. Fig. 5a exhibits the dependence on D of the measured force signal inside the
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60 holes of the nanodisk, while Fig. 5b displays PiFM images for three representative cases.

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3 For both illumination polarizations, we observe that the detected force reduces in
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magnitude up to 3-4 times for diameters just above and below 320 nm, confirming the
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8 presence of a resonance effect at D = 320 nm. Consistent with this, we also find that the
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10 defined force pattern observed for D = 320 nm fades away when increasing or decreasing
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D, due to the reduced field confinement.
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Figure 5. Resonant behavior detected by PiFM. (a) Experimental optical force
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amplitude inside the two holes (averaged) of the nanoantenna for different disk diameters
33 at 1 mW/m2 illumination fluence for horizontal and vertical polarizations. (b)
34 Corresponding PiFM images for representative sizes around D = 320 nm.
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36
37 In summary, we have shown for the first time, to the best of our knowledge, that a
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40 Photo-induced Force Microscopy configuration using a dielectric silicon tip represents a
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42 successful approach to measure optical forces of electric and magnetic character at the
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44 nanoscale. We demonstrate that an especially designed germanium nanoantenna can
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47 induce forces of up to ⁓20 pN under resonant anapole illumination when the silicon tip
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49 access inside the hollow regions of the nanostructure. We found that the force is mostly
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51 magnetic in nature, as revealed by numerical simulations. The results of this investigation
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53
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demonstrate the capability of dielectric nanoantennas of efficiently confining optical
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56 magnetic fields, producing magnetic light forces which are comparable in magnitude to
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58 the electric forces detected in plasmonic nanoantennas.
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4 METHODS
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7 Fabrication of germanium nanoantennas
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11 Arrays of germanium nanoantennas were fabricated on borosilicate glass
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14 substrate via electron beam lithography. A clean substrate was first coated with
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Poly(methyl methacrylate) (PMMA 950K A4) e-beam resist, and baked at 180℃
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21 for 5 min. The nanostructures were then defined by an electron beam exposure
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at 20 keV (Raith eLINE) with a conductive layer of Espacer (Showa Denko),
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28 followed by a standard development procedure with isopropanol and methyl
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isobutyl ketone. Germanium was thermally evaporated at 1.5 Å/s, and carefully
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35 removed by MICROPOSIT 1165 as the final lift-off step.
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Simulation of scattering and absorption cross sections
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42 Numerical studies of the electromagnetic responses were performed using a finite-
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44 difference time-domain (FDTD) commercial software (Lumerical FDTD Solutions
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46
2019a) with normal incidence through the substrate. The dielectric functions of
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49 germanium were extracted from our previous measured ellipsometry results.41,51,52 Total-
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51 field scattered-field (TFSF) source was used to investigate the scattering and absorption
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53 performance of the individual nanoantennas.
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55
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58 ACKNOWLEDGMENTS
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60

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3 This work was partially supported by PICT 2017-2534, PIP 112 201301 00619, UBACyT
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5 Proyecto 20020170100432BA. E.C and S.A.M. acknowledge funding and support from
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7 the Deutsche Forschungsgemeinschaft (DFG, German Research Foundation) under
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Germany´s Excellence Strategy – EXC 2089/1 – 390776260, the Bavarian program Solar
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10 Energies Go Hybrid (SolTech) and the Center for NanoScience (CeNS). E.C.
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12 acknowledge funding of the European Commission through the ERC Starting Grant
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14 CATALIGHT (802989).
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16
17
18 AUTHOR CONTRIBUTIONS
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MP, GG and AVB designed the experiments and MP implemented the
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24
25 experimental techniques and measurements. YL fabricated the samples and
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performed all the simulations. SAM, AVB, GG and EC conceived the idea and
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30
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32 EC, SAM, AVB and GG lead the project. All authors contributed with discussions
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34
35
and the writing of the manuscript.
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41 COMPETING INTERESTS
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44 The authors declare no competing financial interest.
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49
50 ASSOCIATED CONTENT
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53 The Supporting Information is available free of charge on the ACS Publications
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55 website at DOI:
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4 Phase-sensitive detection. Photothermal contribution; Detection sensitivity of the
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6 force components; Simulation of the scattering cross section and force maps;
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9 Field simulations for the tip in the absence of the nanoantenna.
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12
13
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