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    241 views6 pages

    IEEE STD 4 High Voltage Testing Techniqu

    Uploaded by

    Nga Vũ

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    © All Rights Reserved
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    IEEE Std 4 “High Voltage Testing Techniques” Past, Present and Future ITEEE/PES/PSIM High Voltage Testing Techniques Subcommittee Report Chairman Bill Larzelere Secretary Kevin Loving Members: Ross Daharsh John Kise Terry McComb Emst Hanique Jeffrey Britton ‘Arthur Molden Barry Holst Larry Cofiten Nigel MeQuin Dave Nichols Dana Dufield Randy Newnam Herman Schneider Gerald Fitzpatrick Gary Schneider Stephen Sebo Jeff Hildreth Dan Schweickart David Train Rudi Kremer ‘Mel Smith Loren Wagenaar John Kuffel Eddy So Barry Ward Jim McBride Subhash Tuli Yicheng Wang Yixin Zhang Hugh Zhu. Johannes Rickmann KEY WORDS High Voltage Testing, Harmonization ABSTRACT IEEE Std 4 1995 is the latest version of the general IEEE standard dealing with High Voltage Testing and Measurement. The current revision is he seventh edition ofthis docameat a a separate standard ‘The previous revision of IEEE Sud4 was published in 1978. The major changes ftom that version to the present (2995) version ae Description of the wet resting procedure ‘Methods for artificial eortamination tests Enhanced techniques for assuring the accuracy of HV measurements Introduction of toe Reference divider method for checking the accuracy of Impulse Voltage Measuring systems Discussion of Dicletric Loss Measurements (Tan and Power Factor ) (Changes in Atmospheric Correction Factors ‘This paper presents a detailed review of the changes made in the las revision of TERE-4 compared to the 1978 version, the plans for Future revisions and the impact of harmonization with IEC sister standards, addressed in the earliest INTRODUCTION TEE Std 4-1995 is the latest version of the general IEEE standard dealing with High Voltage ‘Testing and Measurement Technique published under the chairmanship of Herman Schneider. This standard is built on the work done by pioneers in the field of HV testing. The current revision is the seventh edition of this document as a separate standard. The subject had been ‘Standardization Report of the American Institute of Electrical Engineers (AIBE) in 1889 and had been substantially claborated upon in the subsequent reports issued from 1902 to 1933. In 1922 it was decided to issue separate sections for measurement of test voltages by AIEE. The fist edition of IEEE Std 4 ‘was published in 1928, Those of us who remember Pete Bellaschi, Gianguido Carrara, Frank Creed, Nils ‘Hylten Cavallius, Mid Ouyang, Jack Moran, Oscars Petersons, Herman Schneider, Al Rohlf, David ‘Train, and Dan Whitchead to name a very few, can think fondly of the halcyon days when much of the information we take for granted now was being investigated forthe first time. MAJOR CHANGES 1995 Std. 4 from 1978 Std. 4 The previous revision of IEEE Std 4 was published in 1978, The major changes from that version to the present (1995) version are: 1. Description of the wet testing procedure 2. Methods for artificial contamination tests 3. Enhanced techniques for assuring the accuracy of HY measurements 4, Introduction of the Reference divider method for checking the accuracy of Impulse Voltage ‘Measuring systems 5. Discussion of Dielectric Loss Measurements (Tanb and Power Factor) 6 Changes in Atmospheric Correction Factors Remarkably, in the six years since the last revision ofthe stendard, which is referred to by many PES apparatus committees in their HV. testing standards, much has changed in the North American marketplace with respect to the power equipment ‘manufacturing industry. Testing has become more ‘axtomated, more precise and more informative about the quality of the insulation systems being evaluated. In eddition, more awareness of the complimentary IEC standards has developed namely IEC-60060 parts I and U ‘This paper presents a detailed review of the changes made in the last revision of IBEE Std 4 ‘compared to the 1978 version. We will then discuss the differences between the current version of and the latest versions of TEC-60060 Part I and Il. Since IEC stendards are also currently being revised, we will discuss the proposed changes they will take. Finally, ‘we will present our view on the future of IEEE Std 4 ‘The intention of this analysis will be to establish a road map for the next revision of IBEE Std 4 Comparison of IEEE Std 4 1978 and IEEE Std 4 1995 “At the time IBEB Std 4-195 was being Published, a review of the two versions of the standard was made. When the new version of the standard was being produced, many editorial and structural changes were implemented. The changes ‘were made to improve the readability and precision of the standard. In addition, many technical changes were made that were based on then current knowledge. Other technical changes were adopted from joint activities between the common members of IEEE PSIM Subcommittee of HVTT and of US IEC TC-42, ‘Technical Advisory Group and CIGRE WG 33.03. During the time of revision of IEEE Std4, revisions to IEC 60 Part 2 were also taking place. Attempts were made to unify technical requirements between TEC and IEEE where possible. ‘The following list describes the technical differences between the 1978 and 1995 versions of IEEE Std 4 1) Added scetion on high voltage capacitance and dielectric loss measurements including tutorial 2) Added definition that the standard is applicable to testing of equipment rated above 1000 volts. 3) Added methods for statistical evaluation of test results 4) Added recommendations for clearances to be used during HV test. 5) Reduced the requirement for ripple voltage during DC tess from $% to 3%. 6) Added additional guidance in the use of Sphere ‘Gaps for voltage measurements 7) Added the rod-rod gap method for DC voltage ‘measurement checks. 8) Added the lincarity check for AC, DC and Impalse calibration procedures. 9) Introduced the concept of a reference divider for calibration comparison for AC, DC and impulse voliages. 10) Defines the characteristics of a Standard Reference Voltage Divider for impulse measurements 11) Reduces the source impedance requirements for ‘transformers used in dry withstand tess 12) Improves the definitions for sources used in AC pollution testing 13) Mathematically defines the time to chop for chopped wave testing, 14) Defines oscillating impulse waveshapes. 15) Mathematically defines the Time to Peak for Switching impulse waveshapes 16) Allows disruptive discharges not on the test “object to be distegarded during withstand tests 17) Added the requirement for step response tests on {impulse current shunts, 18) Added additional information on combined test procedures, 19) Added Additional information on composite test procedures 20) Revised wet test precipitation rate values 21) Specifies only one nozale for wet testing instead of four. 22) Introduced advanced digital signal processing techniques including convolution and transfer function calculations. 23) Added notes regarding the evaluation of ‘measurement accuracies. 24) Qualifies the artificial pollution testing protocol to apply to ceramic or glass insulators only. 25) Added requirements for quantities to be measured during artifical pollution testing 26) Modifies the sample preparation procedures for antficial pollution testing 27) Introduces changes in the Atmospheric Comrection Factors. 28) Deleted the usc of correction factors for impulse front time calculations 29) Updated Bibliography and references, ‘The printing of the 1995 version of Std 4 omitted atmospheric correction information for certain geometric configurations thet are actively used by ‘other technical committees. This occurred despite the fact that the balloting pool included members of the Technical Committees affected by this change. This information has been reintroduced to the standard by the publication of P4A in March 2001. Differences between IEEE Std 41995 and_IKC- (50060 Parts [and I ‘Comparing the IEE and IEC standards, even though they have basically the same title, is not straightforward. First IEC-60060 is in two separate parts covering the same subject. Part is entitled * General Definitions and Test Requirements”. Part 11 is entitled "Measuring Systems”. The structure of the TEC documents is quite different than the structure of the IEEE standard. In addition, the IEEE version ‘gives a great deal of space to tutorial information mixed in with the requirements to help educate the test technician. This tutorial is not contained within the TEC standard. Another major difference is that TEC refers to a separate standard for “ Voltage ‘Measurements by Means of Sphere Gaps”. IEC-52, and for “Artificial Pollution Testing”, TEC-507. IBC also places some of the statistical analysis, information in a separate appendix On the IEBE side, Sid 4 includes Artificial Pollution Testing, includes the sphere gap tables and. aumospherie correction factors formulas and also includes a section on Dielectric Loss Measurements not covered by IBC. Needless to say, these differences make a point by point comparison

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