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1736A 1, 2, 4 and 8G Fibre Channel

Dual Purpose Module


SAN Tester and Protocol Analyzer

Data Sheet

• Simplify Test Environment:


Traffic Generation, Performance
Test and Protocol Analysis all in
one hardware.

• Time to Market:
Accelerate your development
and QA cycle.

• Total Cost of Ownership:


Reduce your test equipment
expenditure.

Agilent Technologies
1736A 1, 2, 4 and 8G Fibre Channel Dual Purpose Module -
SAN Tester and Protocol Analyzer

Applications Key features • Flexible Link layer (FC-1) error


injection and negative test on
• Fibre Channel hardware and • Dual purpose module for SAN demand
ASIC turn-on and debug testing (traffic generation)
and protocol analysis Fibre • Extensive and well documented
• Performance and scalability Channel 1, 2, 4 and 8G. Application Programming
test of Fibre Channel equip- Interface (API) for automation
ment and components • Dual channel trigger sequencer and regression testing
in the Protocol Analyzer to
• Error injection and negative trigger on complex events • Compatible with all existing
test of Fibre Channel conditions 173x Series test modules
equipment and components and chassis, to protect your
• Easy to use drag and drop investment.
• Storage area network (SAN) trigger, search and filter
deployment testing and setup with predefined pattern • Multiuser, modular and scalable
troubleshooting library system

• SAN fabric • Easy Flow and Context


• services test Sensitive display provides
• scalability test a fast way of understanding
• stress test protocol interactions in
the trace
• Recreate realistic network
scenarios to aid debug and • Flexible multi-port traffic
troubleshooting generation and real time
statistics for comprehensive
system testing

• Configurable test port behavior


to emulate various HBAs, and
various topologies (N_Port,
or L_Port)

Figure 1. Toggle back and forth between the two configurations


by simply clicking an icon.

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1736A 1, 2, 4 and 8G Fibre Channel Dual Purpose Module -
SAN Tester and Protocol Analyzer

Combine traffic generation, The 1736A fits in a universal • Traffic load can be modified in
protocol analysis and performance chassis that you can easily real time to identify the knee
test to diagnose and characterize expand or upgrade. You can use of the system’s performance
your system faster either a 2-slot or 4-slot chassis curve.
for mobile or bench testing. You
configure and monitor tests over • Each test port acquires
The next generation of Fibre
the LAN through a convenient continuous real-time traffic
Channel runs at 8.5 Gb/s, a
graphical user interface or statistics for a detailed view
doubling of the speed that has
TCL-based script for automated of system performance.
an exponential effect on the
complexity that designers and testing. The modular system
• Performance measurements
system-level validation teams architecture supports from two
include throughput, latency,
face. To test effectively, you need to hundreds of time-synchronized
lost frames, and sequence
traffic generation tools to create test ports in a single test session;
errors.
realistic traffic conditions to it can be reconfigured as your test
exercise and stress their designs needs change. With this versatile
Passive test configuration
before real servers or storage architecture, you can use the
(Protocol Analyzer)
equipment at 8.5 Gb/s are same platform from the design
available. Traffic generators phase to system deployment,
• In passive test mode (protocol
(SAN Tester) are the tools of installation and maintenance,
analyzer mode), the 1736A
choice here, because they can so you reduce your expenditure
transparently captures traffic
emulate many different top- on test equipment.
between two real devices.
ologies (N_Port or L_Port),
simulate different HBA behavior, This common, scalable system • All analyzers can be
and can be configured to create for protocol analysis and traffic synchronized and cross
stressful scenarios to improve generation protects your financial triggered for multi-port
the test coverage in general. investment for years to come. system analysis.
Active test configuration
If problems are uncovered • Each analyzer includes a
(SAN tester) multilevel, state machine
during the testing, then Protocol
Analyzers are used to further based sequencer to trigger the
• In active test mode (SAN tester
debug and troubleshoot the issue analyzer on complex event
mode), both the 1736A module
at hand. At the very high data conditions.
and the 1736AB includes two
rates of 8.5 Gb/s, it is imperative test ports that can simulate
the protocol analyzer used has a multiple independent devices
sophisticated triggering system to generating wire-speed traffic
ensure that the event of interested to the DUT.
is captured in the trace. Further
more, protocol analyzers need • The 1736A can be used to
to provide intuitive visualization test performance of network
capabilities to highlight the semiconductors, networking
protocol interactions to the user. equipment (switches and
directors), or large fabrics.
Agilent’s 1736A solution is
unique because it provides both • Each test port can be
the SAN Tester and Protocol configured in N_port or L_port
Analyzer capabilities in a single mode.
test tool. The 1736A can be
configured as either a Protocol • Each device can be configured
Analyzer or a SAN Tester (traffic to mimic an HBA’s initial-
generator) by simply clicking ization process.
an icon.

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Versatile system architecture

1 Chassis (2 slot or 4 slot)


2 173x Series test module
3 PC Controller to manage and
interact with the system
• 100 M LAN card for connection
with chassis
• 10/100 M LAN Card for
connection to enterprise
LAN (optional)
• Click an icon to choose the test
3
software you need:
• Protocol analysis software
2 • SAN tester software for
1
traffic generation and
performance test

From a lightweight portable The light weight 2-slot chassis can be used
system to large-scale test for troubleshooting in the field. It includes
environment a built-in handle and soft carry bag and
is recommended for test scenarios where
portability and small size are important.
The Agilent Fibre Channel test
platform is a truly scalable
environment. It can be used
to capture traffic on-site and
can scale up to hundreds of
time-synchronized test ports
generating wire-speed Fibre
Channel traffic in a system
integration lab.

System features and benefits


Feature Benefits

Expandable, modular • Supports both small and large-scale SAN environments


system architecture • Protects your financial investment for future needs

Multi-application modules • Minimizes the number of test devices needed to


create a SAN test environment
• Common architecture for debug, peformance
and system validation tests

Multi-protocol platform • Correlated analysis of multiple technologies,


providing the clarity of a full system view of DUT.
For example, correlated PCI Express and Fibre Channel
analysis provides full system view of a HBA or
storage IC.

Test customization and • Automates tedious testing


automation with TCL • Repeats tests for subsequent product builds
• Creates and automates your specific test procedure
• Performs regression tests

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Protocol analysis application gives you fast insight into your system

Agilent’s protocol analyzer helps


you troubleshoot by funneling
large amounts of information
from multiple locations into
smaller and more manageable
data set for easy analysis. This
funneling is achieved by using
an array of powerful features
including Triggering, Visual-
ization, Search and Filter and
Post Analysis.

Powerful Triggering
Troubleshooting at data rates
of 1, 2, 4 or 8G, it is hard to
ensure that the error event you
are looking for is captured in the • Predefined views including Post Analysis
analyzer trace. Agilent’s trigger Virtual Fabric (VFT), Arbi- Agilent’s 173x Series Fibre
system can help you capture trated Loop, etc allows you Channel Protocol Analyzer, in
elusive issues with the least to quickly switch to the tandem with SanAlytics post
number of mis-triggers. appropriate view for your processing software provides
• Resolve complex issues debugging task additional insight into your
speedily with Agilent’s dual trace, letting you focus on more
channel trigger sequencer Fast Search & Filter challenging tasks.
• Quickly understand the trigger Search and filter functions are • Quickly find protocol errors in
configuration with the state critical in helping find relevant the trace by using SanAlytics
diagram events in a large trace. If these Fault View
• Drag and drop from an exten- tools are slow, they can become a • Graph views show perfor-
sive predefined patterns library frustrating impediment to gaining mance at the SCSI or Fibre
to easily setup triggers a full understanding of your Channel level to help reveal
system’s operation. performance issues quickly;
Flexible Visualization • Hardware based searching and a dramatic improvement over
Flexible and customizable visual- filtering can turn minutes of the conventional method of
ization is key to understanding searching into seconds using spreadsheets.
large amounts of data. Agilent’s • Independent filtering with
flexible GUI provides a clear multiple listings helps you
visualization of device interaction. isolate the conversation
• Easy Flow layout clearly (between single initiator and
highlights the protocol target) you are debugging
interactions without the distraction of
• Context sensitive columns irrelevant frames from other
minimize the amount of conversations.
scrolling and maximize
information density

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Technical specifications for protocol analysis

1736A Physical interface

Number of ports One bi-directional Fibre Channel analyzer per test card - 2 channels.
Can be configured as 1 bi-directional analyzer or used in the SAN tester application as two SAN tester ports

Line rate 1.0625, 2.125, 4.25 or 8.50 Gigabits/second (Gb/s). Industry Standard SFP Interface. Shipped with 850 nm SFP.

Protocol analysis (analyzer mode)

Analyzers Each analyzer has its own triggering and filtering resources.

Traffic capture Each analyzer captures bidirectional traffic between two fibre channel devices

Memory size 1 GB per analyzer (2 GB per module)

Trigger Multi-state, multi-level trigger sequencer per analyze

Dual channel Trigger on sequence of events in both directions (Tx and Rx)

Sequencer Eight states per sequencer

Resources Two counter/timers (for trigger on time-outs) per sequencer

Pattern matchers Eight 128-byte pattern matchers (primitives or frames) with associated local occurrence counters

Global timers Two 48-bit (7-day) global timers with associated reset

Counters Two 24-bit global counters that count up/down and have an associated reset

Combinations ‘AND’ or ’OR’ conditions between pattern matchers

Cross triggering (internal) Cross-module arm in/out for inclusion in sequencer events coming from another analyzer

Cross triggering (external) One external trigger in/out per chassis

Filters Hardware filter conditions can be defined individually for each sequence level

Error detection Disparity, code violation, CRC error, undersize frames, oversized frames, loss of synch

Frame truncation Beginning at the SOF, specified number of FC words are captured to memory - effectively deepening the trace

Resolution 10 ns TimeStamp resolution

Time correlation All analyzers in the same session share the same clock to allow for time-correlated measurements.
Time correlation on up to 40 modules (80 analyzers).

Search High-speed hardware assisted search

Trigger in/out One external trigger in/out per chassis

Programming languages

Programming languages Tcl/Tk with graphical interface

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SAN tester application helps you characterize your system’s performance
under realistic network conditions

All-in-one window gives you


easy visibility into your system’s
performance; Traffic activity,
port link status, traffic config-
uration and real time statistics
simultaneously displayed.

Perform realistic tests with


device emulation
SAN tester provides realistic
device emulation to help you
quickly reproduce your customer’s
environment, allowing you to
minimize the number of real
devices required for large
scale test.
• Each port can emulate either
a Fibre Channel Node device
(N_Port) or a large number
of Arbitrated Loop (AL_Port)
devices.
• Each device can behave • Easily configure traffic Test customization and automation
as standard Fibre Channel sources and destinations in Automate tests that would be
devices, or to take on non- a point-to-point or a meshed too tedious or imprecise to do
standard behavior for boundary configuration. manually or repeatedly through
condition testing. • Flexible data link level errors the GUI with the built in TCL/
• Dynamic, and configurable (FC-1) can be generated on TK Application Programming
HBA behavior including demand to validate perfor- Interface (API).
automatic login, register for mance under negative • Predefined test suite for
state change notification conditions. common test cases to save
registration, and fabric your time and accelerate
services testing. Immediately see your system’s perfor- your testing.
mance with Real-time statistics • All SAN Tester features and
Increase test coverage with You can monitor “live” measure- capability are accessible
configurable traffic generation ment results while a test is through the API.
Testing using stressful network running for better insight into • Integrate the SAN Tester into
conditions ensures on time how your DUT is performing. your regression environment to
product delivery that meets your • Real-time statistics include ensure high quality releases.
customer’s expectations. Agilent’s throughput, latency (min/avg/
SAN Tester, can create a wide max), lost frames, and error
range of specific real-world traffic counters.
conditions. • Real-time measurements are
• Hardware based traffic gener- presented in both tabular and
ation technology generates graphical format, allowing you
traffic at 1, 2, 4 or 8 Gb/s. to identify performance issues
• User configurable frame header quickly.
fields, frame size, inter-frame • Real-time measurements are
gap size, buffer-to-buffer credit guaranteed regardless of the
behavior, error type, and more. scale of your test system.

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Technical specifications for SAN Tester application

1736A Physical interface


Number of ports Two Fibre Channel test ports for the SAN tester application. Can be configured as 1 bi-directional
analyzer (2 channels) or used in the SAN tester application as two ports.
Line rate 1.0625, 2.125, 4.25 or 8.50 Gigabits/second (Gb/s). Industry Standard SFP Interface. Shipped with 850 nm SFPs.

Traffic generation ( SAN tester mode)


Number of ports Two ports for traffic generation
Rate Full line speed rate
Port type N_port, Arbitrated loop port (including up to 126 loop devices)
Port behavior Control of port initialization either as FCP or FICON port. FCP includes control of Flogi, NS registration,
RSCN, Discovery, NS Query. FICON includes control of Flogi, QSA, RNID, RSCN, LIRR
Classes of service Class 2 (FICON initialization) and Class 3 traffic
Traffic profiles 15
Traffic streams 256 streams per port
Oversized frame Oversized frames traffic generation and capture. Frames will be captured in the trace buffer, but they will
cut off at 2136 bytes and will be flagged as oversized and invalid.
Interframe gap Adjustable from 3 to 1000
Minimum frame length Transmitted: 24 bytes, Received: 24 bytes
Buffer-to-buffer credit Adjustable from 1 to 256
Error generation Aborted frame, CRC error, oversized frame, invalid SOF, idropped SOF, dropped EOF, LOS, invalid ordered sets

Measurements ( SAN tester mode)


Measurements 24 real-time measurements including throughput, latency, dropped frames, disparity errors, BB credit,
failover recovery time
Result types Cumulative: measurements are reported from the start of the measurement interval.
Sampled: measurements are reported from the most recently completed sampling interval.
Measurement clock resolution 10 ns resolution; ± 0.5 ppm/year clock drift; 3 ppm maximum difference between cards
Measurement interval Range: 1 second to 7 days
Display sampling interval Range: 1 second to 1 hour
Test card synchronization All measurements are synchronized across all test cards within the SAN tester application.

Capture memory (SAN tester mode)


Capture memory 64 MB real time memory per port.
Capture triggers Eight patterns per port, as well as triggering capabilities on statistics (throughput, latency, sequence error)

Fabric service test


Fabric service test • Zone test
• Name server performance
• Name server command coverage
• State change notification latency

Programming languages
Programming languages Tcl/Tk with graphical interface

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How to configure a system

The Agilent 173x Series SAN test These and future SAN test cards compact 2-slot chassis houses up
system consists of a Windows®- will fit within the chassis. Each to eight ports of
based system controller and test card features its own CPU Fibre Channel SAN.
one or more chassis containing and distributed processing
Agilent 173x SAN test cards. power that allows synchronized You can easily daisy-chain
The system controller provides performance measurements multiple chassis to support
a graphical interface to drive across multiple chassis. hundreds of test ports in a
protocols and applications single test system. You can move
running on the test cards. Chassis hot-swappable test cards between
The compact, 4-slot, 2U-high chassis without affecting other
This flexible test system will be chassis houses up to 16 ports test sessions.
compatible with new Agilent of Fibre Channel SAN. An ultra-
test cards in the future, thereby
securing your investment.

System controller
System
Several system controllers controller
are available to meet your
performance requirements. The
controller provides an easy-to-
use Windows environment for System
running the test system software. under test

Fibre Channel test card System hub


High-density, scalable Fibre
Channel SAN test cards are
equipped with powerful traffic
generation and measurement
capabilities. There are many
types of cards to choose from
depending on your test needs.
Agilent SAN
• 1733A – 2G and 4G, test system
4-port active test card
• 1735A – 1G, 2G, and 4G
2 port multi-application Figure 8. system controller and SAN test chassis filled with four Fibre Channel test
(active and passive) test card.
• 1736A - 1G, 2G, 4G and 8G
dual-purpose (SAN Tester and Mechanical specifications
protocol analyzer) Fibre Channel
Physical (per card) Width: 206 mm (8.11 in)
Interface Module (2 port). Depth: 313 mm (12.32 in)
Requires a N5321A module. Height: 30 mm (1.18 in)
Weight: 875 g
• N5321A - Protocol Processing
Module. Only required with the Electrical (per card) Power consumption: 32 W typical; 110 W maximum. (8 W per port)
1736A module.
Environmental Operating temperature: 0 °C to 50 °C
Storage temperature: –40 °C to 70 °C
Humidity: 50% to 95% relative humidity at 5 °C to 40 °C

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Ordering information

Agilent product number Description


Typical configuration
Test Cards
1736A 1, 2, 4 and 8 Gb/s Fibre Channel Interface Module (2 ports)
Option ST0 SAN tester application License
N5541A 4- slot chassis
Option A00 Fibre Channel Protocol Analysis License
Option P00 Fibre Channel Protocol Analysis License with N5543B Laptop with preloaded
Premium SanAlytics Software Option 120 software
N5321A Protocol Processing Module
1736A 1, 2, 4 and 8 Gb/s
Chassis Fibre Channel
N5540A 2-slot 2U-high chassis Interface Module
N5541A 4-slot 2U-high chassis
N5542A 4-slot 2U-high chassis with BITS clock
N5321A Protocol Processing
System controller Module
N5543B Option 120 Portable laptop system controller
N5544B Option 120 Standard 1U rack-mount server controller. Pentium® 2.4 GHz, 1736A-ST0 Fibre Channel SAN
1-GB RAM, 2 LAN cards; includes switch. Software instant tester License
ignition for 1730 Series products.
N5545B Option 120 High-performance 1U rack-mount server controller. Pentium 1736A-A00 Fibre Channel Protocol
2.8 GHz twin processor, 4-GB RAM, 2 LAN cards; includes
Analyzer License
switch. Software instant ignition for 1730 Series products.
Option AQ2 15-inch flat panel display: 1024 x 768

Accessories
E7900-64207 Chassis-to-chassis cable. (Required for multi-chassis
configuration)
E7900-64208 Rack-to-rack-cable. (Required for multi-rack configuration)
E7900-80002 Transit case

Related Literature
Publication Title Publication Type Publication Number
Agilent Technologies 173x Series Storage Color Brochure 5988-6806EN
Area Network (SAN) Test Solutions
N2X 4-Slot Chassis (N5541A) Technical Data Sheet 5989-1531EN
1733A 2 and 4 Gb/s Fibre Channel SAN Tester Data Sheet 5988-7227EN
1735A 1, 2 and 4 Gb/s Fibre Channel Datasheet 5989-1661EN
Multi-application Protocol Analyzer
and Traffic generator

Windows® is a U.S. registered trademark of Microsoft Corporation.


Pentium® is a U.S. registered trademark of Intel Corporation.

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