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Fast, powerful and accessible chemical analysis for surface and thin film characterization
K-Alpha XPS spectrometer
Designed for performance and productivity
High-performance spectroscopy Chemical state imaging
The Thermo Scientific™ K-Alpha™ X-ray photoelectron The K-Alpha spectrometer is capable of creating
spectrometer features a high-performance, micro- chemical state images of the surface, from
focusing X-ray monochromator that allows the investigating small features, to imaging samples
operator to tune the analysis area to the feature sized as large as the stage platen itself. The unique
of interest. The high-efficiency electron lens, optical viewing system now includes Thermo
hemispherical analyzer and multi-channel detector Scientific™ SnapMap™ capability, adding rapid XPS
allow for excellent signal-to-noise performance, imaging for feature alignment and analysis.
superb detectability, and rapid data acquisition.
Depth profiling
Insulator analysis The K-Alpha spectrometer is built to go beyond the
The single-click charge compensation system on the surface with the EX06 ion source. Automated source
Alpha spectrometer makes insulator analysis as easy optimization and automated gas handling ensure
as any other sample. The patented* dual-beam flood excellent performance and experimental reproducibility. K-Alpha atomic concentration image of organometallic
source is designed to prevent sample charging, using matrix on glass
Load Lock
ST E P 1 ST E P 2 ST E P 3 ST E P 4 ST E P 5
Place samples in Pump load lock and Set analysis position Collect survey Auto element
loadlock, select transfer samples and height spectrum identification
analysis
The K-Alpha XPS Reflex View of a
sample in the analysis position
ST E P 10 ST E P 9 ST E P 8 ST E P 7 ST E P 6
Reload sample holder Generate report Move to next sample Elemental Select narrow scan
for next analysis quantification, regions
chemical state
appraisal
K-Alpha spectrometer configuration
Analyzer Sample Handling Options
• 180° double focusing hemispherical analyzer • 4-axis sample stage • Tilt module for ARXPS
• High-efficiency electron transfer lens • 60 × 60 mm sample area • Vacuum transfer module for air-sensitive samples
• 128-channel detector • 20 mm maximum sample thickness • Sample bias module for work function
measurements
X-ray Source Vacuum System
• Interface to connect to glove box
• Al Kα micro-focused monochromator • Two 260 l/s turbo molecular pumps