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Diffraction_gratings.ppt

Introduction
Diffraction grating can be understood as an optical unit that separates
polychromatic light into constant monochromatic composition.
• Uses are tabulated below

FIELD USE
Quantum Mechanics Verification of Hydrogen spectrum
Astrophysics Composition and processes in stars and planetary
atmospheres
chemistry Concentration of chemical species in samples

Telecommunications Increase the capacity of fiber optic networks using


WDM

When an Electromagnetic radiation falls on a Diffraction Grating, the electric field


and Phase are modified in a predictable manner.

A Notes
• Slide 2/27

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Physicist view of Diffraction grating

A MuHi-sli1 arrangement which uses diffrac1i on to separate Ught


wavel;engths wi1h high res0l1
utfon and hlgh1in1ensity. lhe resol·ving pow·er is 1 1

achieved by interference of light

kiidillinl
~lllflt
W.IV6

.- - ____,;j j j~ •
m•
m= 2
,•
-~- ......--- ffl•.1
.....................iiillllllll!!!!!!!!!!!!!!!!!!!I fflliil. 'I

EgI.I!'! !'1111!1,e
m■2
..
~ tli:I lft!II bL!lil1 -!llllllliiiiiii-· ri'I I!!':!
B,as·ics of diffraction

• Stngle slit interference

p- l1'11 maximum
Q-, 1·• secon,dary maxim,um
8 = n)Jd
..____... Dlffracth:1111P'aHlilH

lffllllin■lly Clit1'1llilllllill
11'111111.1111 D,1trautJaa ot Dfffla:tllcl Light

lntensity of 1h1e beam is govern1


ed by

I = 10 { si 'n ~ I / f3 }2,
Where p = (n/ A) d sine 1
m = ..J
1 \ rel 111.· ,... 1\ 1,; I!'; me I L_l(!n I
Sli't wid1h b • ~, d a: , ~. ~,I, 1...• .. 11m,

' : , \\'1 1" L'"- ~111. _. ,nl ou1 fli - J


A, :
' 11.•I '1 ~~J L"LI L h ... hi \ \ ','\
Distance between f.tl ;;;; _:!:

_,{ \ ~
Ile slits ,d m = I

r ll))~)
1 = 10 { sin ~ / f3 }2 cos 2 ~ . l }) nJ
)I I , lj _. m-= I

r ,·n::v..•
Toli!I, - . uf •JI }J'

Where 1~ = (n/A).b sin e lh~ llo ub~~ ~li t _/ _p/1 m = 1

.l
..• ,
_,,,.-
, "'J11r '"·•,...,-,. i11111.· r lL~1 ..~ 111 11u.• ru =- J

p = (rr/A).d si1n e l t:'j-'14111 ,... hL.:T~ I IIL.:i) ~ n ·a:r l;1r

-L Brig In h irmg,:!w u . . ('UI u. I h: , ...


~f I

-~-,-• - ._..ii"! • ,. ' 1


rh,· illJHnw, t, 1 Ila., ,m" 1'lrl:b • I

1t w , 1,1. "'"' ui~ ~ ~n.

hI1tens,i1ty distribution is similar to S1


ingle slit and 'the spacing bebNeen 1he
fringes is determined! by (Aid) and width of the envelop by Mb~
Multi1plle sli1t interference
1

• A N-slits interierence pattern is the diffraction p,attern and we


develop diffraction gratings based on N-slilt interference pattern ..
1

• In tensity trans,mission fun,ction is

I= 10 { sin (3 /pp {(sin Nµ )/ (N s1in tJ) }2

Where P= (n/1'.).b sinre


1

1-1: (n/1\).d sine

• Princi rple fringes occur at 1-1 = n n ➔ n A= d sine


• Secondary fri1nges occur atµ= 311/2:N, 5n/2N. ··••u
Physics of diffraction
• Ray IPr 0pagati 0A 'through the grating
1 1

-'ln,,,w-o -
"3a "•.Jt:11 nCHl'l'l'M!I J.

l n:mnt, ni;M QI~ oolilnll

\
lrcide(llt ~M: •
: ~ iglttt
.:
I

\+ I -
\ Q I
. \ I

C~frncitect rvtit

''I .

l!nffmcim rig1h•

I
I
+ I

A Reflec·tion ~a1ing A 111n1m1


is:sion gra·ting

1
recticm of the incident ray· ➔ +ve angle
Light diffra cted in the s,ame di1 1
• Wa·ve front p ropagation llrough 1he g1rating
1

. I d-1*fl,~11~,
01asmca
11
..._..an:

Gr■ll1ng aquatian: nil= d(si na + sinP)


➔ Gn1l.= sina + sinp
\ 81 -1 Gml;;: 2-c.osK s1nl

G - grecve frequency= i Jd
A - wavelengfl ot·f"le diffrac·1ed1light
I( - deviia t on aigle = 1&(a-13)
0 scan alQl:e ~ '1':(a:tp)
\
1
-

Unrow con·figuralan : a=,P


-t mA= ·2dsina.
:a;a
..
Ii
d~• : Conical diffraction,:

Gm>t= coSE· (sioo + siin~)1

E - angle be·1ween 11e inci dem lighrt pa1, aid


1he pl arile perpencficul ar i1o 1\e grooves_
Characteristics of Diffraction Grating

• Disp1ersion1: • Sca.ttered and s:tray ti ght


1

angu lar dispers.ion scattered fight


lin,ear dispersion instrumental s.way tight
,. Reso1 1Ying power 1
• al to noise ratio.
Sign1
• Spec1ral r'esol u1lon
1

• Band pass
,. Focal leng1th and f-number
1
• Anamorphic magnification
• Free spectral ran,g e
• Emergy di1strib·u tion
DJSPERSl ON 1

• Angular IDisparaion is the m,easure of 1h,e separation between d1ffrac·ted


ligh1 of differ,en1.waveleng1hs. It gives th e spec~al range per unit angle.
1
1

Ma1hematically 1

D·= ap1aA= G.m .secp


1

= (2/A)tanp -•·Liftrow condition

• Linear disparainn is 1he product of an gula r dispersion D and effective focal


1 1

leng1h r'(~)
'l inear dispersion (I) ; ~D = (.G.m ..secp

Platefactor is change i1 n Wraveleng·fll when we mo,ve along 1he spec·1rum and


is griven by P = 1/1 •= dcosp I 1
r'm

Obliqu1
1
i ty factor is 1he factor· that governs ·the platefac1Dr when ·I le incident
1

ray is not perpendicular to the groov·es and i.s = 1lsin0


RESOLVING PO'WER.
• This ts the ability 1o .separate adjacent spectral lines of av·erage warvellen.g1h
A. Ma1hema1icany,.

,_differenc:e ·rn
l!iA - Umi1 of res,olution1
wavel eng·1h of e-qual in1ernsity
1 1

Th eore1ically, i1 is 1he product of di ffrac1ion 0rder and 1h e to 1al number of


1 1
1 1 1

grooves i11 umi naled.

R = N.d.(sina + sinl3)/A ➔ RillilX =· 2n.d/ A


1

SPECTRAL RESOILUTION:
• AA is the spec1ral resolution and is measured by convoluting 1he image
of the entrance ap.er1u re wi1h 1he e1:i•t aperture. -
BAN.DPA.SS
• Th•is ·i s.Ile wavel,en.gth i,nterval that passes throu gh 1he ,exi1 slit
1 1

• Also,, 1he dtfference in waveleng1hs be·'tween the points of ha!lf-maximum


in1en:sity ,on e.i1her sid1e of 1he intensi•ty maximum,.
• Mathematically, i·t s estima1·e is givein by
B iii w. P where w'-· e.x it sUt width
P - ·1reciprocal of linear Di.spersi0n.
1

FREE S1PECTRAL. RANGE

• 11 is the rang e of wavelengfls in a given spiectral order for which ligh1 from
1

adjacent orders ar,e nc1,superposed.


• Mathematically,
F ~-= A.1 /m where A 1 is 1he wavelength 0f Ugh1 diffrac1ed 1
1
in
llie ~ -h order.
• The gr eater the free spec1ral ranges the less is the fil1ers required.
1
F0 CAL LENGTH AND f/NUMBEIR
1
1

• l'f 1he bea1


m dJffracted from 1he· grating of a1gtven wavelength and order
converges to a fo.cu:s., 1hen 1he d1
is1ance between 1he focus and Ile gr-ailing
cen1re,is 1he focal leng1h and the ratio of 1he focal leng1h to Uie wi dlh o·f 1he
gra1ing1.
1

Saurce fIn o,~ input ;;: r/W

r -..-~
lnoiderrtl'ig!}_~
--- .. -..... -·
r.. . ., . . .
_ r~P -

I
A

.·1
w - - ••

-cf~r::;::-_-:..~: . ~~-~~--_.•.
.

~
• •
f-
-s-a;!!I
. -----
.

: l8
--. ----■

Grating. Normal

Diffracled light Image r/r' determines the eXlit sHt W1


idth

• TI1e more 1h·e I/number 1he less is· the spec1ral aberrationsh
1 1

ANAMORPHIC MA,GNIFICATJ0N 1

• 11 is 1he r.atio of 1he wid1h O'f 1he collimated diffracted beam to fie collimated
incident beam.
Ruled grati1ngs

1
• Mechanically. ruled by bumishing grDoves wi.1h a dia,mond 1ool against a thin
co,atiing of evapor·ated metal using Ruling engines.

•, Mrich ataon enigi ne


serv·o controlled laserr interJerome1er
20 groove,s/mm to 10,,B00 grooves/m1m

• Mann engine
a.utoma1ic interferometric servo system
no ghos1s and 1heore1ical resol•ving po,wer
1

• MIT ·a•Engine
double interferometric control sys1em based on frequ,ency stabili:zed laser
2D grooves/mm to 1 500 grooveslmm
Applications

Gratings as Principle used


FILTERS Plane gratings blazed for the wavelength of
unwanted shorter wavelength radiation
ELECTRON MICROSCOPE Replica gratings made from master gratings
CALIBRATION so that a space is left between the grooves.
LASER TIJNING Plane reflection grating used in littrow mode

BEAM DIVIDERS Symmetrically shaped grooves and laminar


transmission gratings

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Grating spectrometers

• Czerny-turner spec1rograph
Entrance slit
collimator

Exit slit
Camera

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