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ABSTRACT
This paper presents a Rough Set Theory (RST) based approach for predicting the
surface contamination level of porcelain type insulators at different environmental
condition. The sample insulators have been contaminated by Solid layer Method (SLM)
according to IEC60507. Leakage current of the insulators are recorded at different
contamination level and at different humidity conditions. In the proposed method,
autocorrelation technique is used for feature selection from leakage current because it
is well suited for non-stationary leakage current signals and cancels out the effect of
noise present in the signal. Rough Set Theory is used for classification of extracted
features as it suits well with the correlation technique. Result shows that the proposed
method is able to detect the contamination level with acceptable range of accuracy.
DOI: 10.1109/TDEI.2016.005484
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2884 A. Banik et al.: Autocorrelation aided Rough Set Based Contamination Level Prediction of High Voltage Insulator
above effects, it is important to develop a reliable system with features from the leakage current waveforms. It is a
less computational complexity to indentify the actual conventional method to judge the similarity of two wave
contamination irrespective of environmental influence. forms. It has been applied here for its less computational
In this paper, test procedures of Solid Layer Method burden, which is essential for automatic pollution detection
(SLM) that are described in IEC 60507 [20] has been followed system. Rough Set Theory (RST) based classifier is used for
for artificial pollution test. This method is wildly used for classifying the extract features [22]. RST is suitable to use
artificial pollution test on different types of insulators [14-16]. when acquired data contains superfluous information. With the
For testing purpose 11 kV disc type porcelain insulators has help of RST method, it is possible to reduce a number of
been used. In this method salt (NaCl or KCl) is used as features keeping all the important information intact [22-25].
soluble component and kaolin is used as non soluble
component. It has been found the effect of these two salts in In this paper, the proposed method used for the analysis of
artificial pollution test is different [12-13]. In this paper, the the obtained results is utilized to minimize the computational
effect of both salts during artificial pollution test has been burden for contamination level prediction of high voltage
presented. After contamination, the leakage current has been insulator under different environmental conditions. Result
recorded at different ambient condition for the composition of shows that auto-correlation based featured extraction technique
contamination layer. along with RST classifier can determine different
In the present work, for analysis of the experimental contamination level with reasonable degree of accuracy.
results, auto-correlation technique [21] is employed to extract
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IEEE Transactions on Dielectrics and Electrical Insulation Vol. 23, No. 5; October 2016 2885
effect in solid layer method [12-13]. Thus, even for equal amount
of KCl and NaCl solution, ESDD and conductivity would be
different. This difference is caused due to the hydro phobicity of
the insulator surface. The insulator should be pre-contaminated at
the beginning. This pre-contamination is done by spraying
droplets of distilled water on the surface and then, kaolin powder
is poured over the surface of the insulator. In the next step, the
artificial pollution layer is prepared according to IEC 60507 by
Figure 5. Scheme of classification of the contaminaton level.
mixing kaolin and NaCl. Initially, the weight of the kaolin and
NaCI are measured by the weight gauge apparatus. This mixture 3 EXTRACTION OF FEATURE
is coated on the insulator surface and allowed to dry for 24 hours. BY AUTO- CORRELATION
The same procedure has been followed for artificial
contamination using KCl and Kaolin. Figure 3 shows such an The aim of the present work is to develop a scheme which is
artificially contaminated insulator. able to predict contamination level of outdoor high voltage
insulators by monitoring their leakage current. The recorded
leakage current data for different contamination level are
processed by feature extraction tool. Auto correlation based
feature extraction technique is used to extract the features from
the recorded data. Correlation based method is used for feature
extraction due to its low computational burden. In autocorrelation
technique, similarity of two identical waveforms is measured as a
function of time lag. It has been found that to find out the
inherent features of a signal auto correlation is very effective
Figure 3. Artificialy contaminated disc insulators.
[21]. A typical waveform of a leakage current signal is shown in
2.4 ESDD MEASUREMENT Figure 6. The corresponding auto correlogram is shown in Figure
In order to measure the leakage current through the 7. Auto-correlation of leakage current signal X(n) with itself is
artificially contaminated high voltage porcelain insulator, the given by equation (2).
insulator has been tested at different pollution levels as well
as different humidity levels. Relative humidity is kept in three
ranges viz. light (30-50)%, moderate (50-80)% and heavy
(over 80% ). For each contamination level, 10 set of leakage
current data is recorded at different ranges of humidity level Here m represents the time shift parameter
for the purpose of analysis. After measuring the leakage
and R XX represents auto-correlation sequence. If N is the total
current, ESDD and electrical conductance are measured
according to IEC 60815. ESDD is used to determine the number of sample, then number of coefficients of the resultant
severity of contamination on insulator surface which is auto correlation is (2N-1).The events studied in this paper are
standardized in terms of salt weight per unit area (mg/cm2). given in Table 3. Different types of feature (F1-F12) have been
ESDD is measured by using the equation (1). extracted from each auto-correlogram of leakage current
waveform. A brief description of each feature and their
ESDD SV / A (1) corresponding physical significance is listed in Table 4.
where S is salinity (gm/ml), V is the volume of the solution
(cm3) and A is the area (cm2) of the insulator surface.
Measured value of the ESDD, electrical conductance and
other parameter is tabulated in Table 2.
A typical pattern of leakage current waveform for both
NaCl and KCl solution is given in Figure 4. The scheme of
predicting the contamination level from the acquired leakage
current waveform is shown in Figure 5. Figure 6. A typical waveform of leakage current.
Figure 4. Leakage current waveshape of an Average contaminated Insulator Figure 7. Auto correlogram of leakage current of waveform as shown in
at 15 kV applied voltage. Figure 6.
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2886 A. Banik et al.: Autocorrelation aided Rough Set Based Contamination Level Prediction of High Voltage Insulator
Table 2. ESSD and Elecrical Conductance at 20 ˚C for different pollution layer.
Sl.no NaCl KCl Keolin Water ESDD Electrical Pollution type
(gm) (gm) (gm) (ml) (mg/cm2) Conductance [19]
(S/cm)
1 10 - 5 25 0.0690 0.0289 Average
2 - 10 5 25 0.0899 0.0357 Average
3 15 - 7 25 0.1180 0.0497 Average
4 - 15 7 25 0.1420 0.0595 Heavy
5 20 - 9 25 0.1801 0.0685 Heavy
6 - 20 9 25 0.2169 0.0789 Heavy
7 25 - 11 25 0.2450 0.0878 Very Heavy
8 - 25 11 25 0.2711 0.0989 Very Heavy
9 30 - 13 25 0.3008 0.1102 Very Heavy
R max
F4 Centroid [
N
n N
n .R n ]
N
n N
Rn
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IEEE Transactions on Dielectrics and Electrical Insulation Vol. 23, No. 5; October 2016 2887
F5 Absolute centroid [
N
n N
| n . R n |]
N
n N
Rn
F6 Root mean square width
N
n 2 . Rn
n N
N
n N
Rn
F7 Mean value N
Rn
n N ( 2 N 1)
F8 Standard deviation
N
n N
(R n F7 )2
( 2 N 1)
F9 Skewness
N
nN
( R n F7 )3
2 N ( F8 ) 3
F10 Kurtosis of correlation coefficient
N
( R n F7 )4
n N
2 N ( F8 )4
Varriation of signal (X)
F11
N 1
n 0
( X X )2
2N
F12 Kurtosis of signal respectively
N 1
( X X )4
n N
2N ( X s )4
Table 5. Decision Table contains normalized values of features for rule generation.
Condition Attributes Decision
Object Attributes
F1 F2 F3 F4 F5 F6 F7 F8 F9 F10 F11 F12
1 0.397 0.392 0 0.486 0.443 0.008 0.397 0.219 0.976 0.404 0.170 0.933 E1
2 0.397 0.372 0.012 0.486 0.443 0.018 0.485 0.219 0.976 0.424 0.172 0.933 E1
-
11 0.514 0.624 0.991 0.793 1 0.025 0.515 0.238 0.984 0.523 0.112 0.926 E2
12 0.514 0.624 0.991 0.793 0.998 0.035 0.625 0.238 0.984 0.329 0.231 0.729 E2
-
21 0.949 0.580 0.999 0.933 0.859 0.031 0.973 0.058 0.956 0.965 0.676 0.918 E3
22 0.534 0.780 0.815 0.858 0.958 0.071 0.848 0.021 0.815 0.723 0.524 0.728 E3
-
31 0.665 0.429 0.654 0.985 0.221 0.091 0.645 1.00 0.988 0.661 0.219 0.928 E4
32 0.712 0.389 0.695 0.895 0.189 0.085 0.543 1.00 0.781 0.661 0.219 0.918 E4
-
41 0.219 0.074 0.546 0.992 0.726 0.107 0.217 0.229 0.980 0.521 0.946 0.921 E5
42 0.224 0.121 0.621 0.992 0.695 0.078 0.345 0.187 0.875 0.522 0.485 0.854 E5
-
51 0.224 0.999 0.805 0.991 0.732 0.103 0.222 0.224 0.980 0.726 0.985 0.942 E6
52 0.312 0.853 0.789 0.991 0.789 0.103 0.232 0.234 0.875 0.695 0.931 0.931 E6
-
61 1 0.094 0.594 1 0.642 1 1 0.317 0.971 0.999 0.832 0.941 E7
62 1 0.085 0.584 0.983 0.592 1 1 0.305 0.884 0.895 0.921 0.934 E7
-
71 0.095 0.535 0.978 0 0 0.001 0.093 0.405 1 0.096 0 1 E8
72 0.127 0.612 0.872 0.001 0.012 0.002 0.095 0.459 1 0.089 0.004 0.999 E8
-
81 0.448 0.489 0.789 0.481 0.372 0.12 0.221 0.543 1 0.235 0.028 0.895 E9
82 0.438 0.512 0.789 0.485 0.421 0.022 0.221 0.432 1 0.421 0.028 0.935 E9
-
90 0.468 0.593 0.789 0.489 0.475 0.14 0.281 0.462 1 0.431 0.031 0.995 E9
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2888 A. Banik et al.: Autocorrelation aided Rough Set Based Contamination Level Prediction of High Voltage Insulator
Table 6. Reduced discretized Decision Table.
dependent. Let P ⊆Q and T⊆Q be considered to have an
Object Condition attributes Decision
F1 F2 F4 F5 F11 attribute equivalence relation in U. The P-positive region of Tis
1 0 0 0 1 0 E1 defined as
2
-
0 0 0 1 1 E1 POSP (T ) = PZ
Z IT
(3)
11 1 1 0 2 0 E2
12 1 1 0 1 0 E2 Equation (3) represents the set of objects which can be
- correctly classifiedinto T -elementary set generated by ITusing
21 1 1 1 2 1 E3
theinformation available from Ip. If q ∈P and POSP(T )=POS(P
22 1 1 1 2 1 E3
- −{q}) (T ) then qis T -dispensable in P, else qis T -indispensable
31 1 0 1 0 0 E4
32 1 0 1 0 0 E4 in P. If the set of attributes H (H كP) is a T -independent in P
- and POSH (T ) = POSP (T), then H is called T -reduct of P. For
41 0 0 1 2 1 E5 example, P={F1,F5,F11} & T={ contamination level } or
42 0 0 1 2 0 E5 decision attributes, then Ip={1},{2},{11},{12},{31}{32};
- IT={1,2},{21,22},{31,32}. Also POSp(T) ={1,2,21,31,32}. If
51 0 1 1 2 1 E6
F1 is removed from P then POS(P-F1)(T)= {1,2,21,31,32}=POSp
52 0 1 1 2 1 E6
- (T) . So F1 is T-dispensable in P. Again if F5 is removed then
61 1 0 1 1 1 E7 POS(P-F5) (T)={1,2,21,31} POSp(T), so F5 is T-indispensable
62 1 0 1 1 1 E7 in P. now if F11 removed then POS(p-
- F11)(T)={1,21,31,32} POSp(T) and F11is also T-indispensable
71 0 1 0 0 0 E8 in P. Thus Table 7 can be simplified as shown in Table 8. Now
72 0 1 0 0 1 E8
the decision table obtained from Table 8 is tabulated in Table
-
81 1 1 0 1 0 E9
9. In this table ‘ ’and ‘ ’ are logical ‘AND’ and ‘OR’
82 0 1 0 1 0 E9 operator.
-
89 0 1 0 1 0 E9
90 0 1 0 1 0 E9 5 RESULTS AND DISCUSSION
The main aim of this paper is to detect different
Table 7. Truncated decision Table. contamination level of porcelain insulator under different
Object Condition Attributes Decision humidity level. Total 144 leakage current waveform for
Attributes different contamination levels are recorded for the analysis of
F1 F5 F11
contamination level prediction. Among them 90 waveforms
1 0 1 0 E1 (60%) are used for training purpose and 54 waveforms
2 0 1 1 E1 (40%)are used for testing purpose. For training phase,
extracted features have been already tabulated in Table 5.
21 1 2 1 E3
Table 5 has 90 rows and 12 columns excluding the columns
22 1 2 1 E3 of object index. This table is used for rule generation. The
31 1 0 0 E4 following steps are used for rule generation.
32 0 0 1 E4
Table 8. Reduced form of Table 7.
Object Condition Attributes Decision
Now for any rough set R, PR and PR are called P- F1 F5 F11 Attributes
1 - 1 0 E1
lower and P- upper approximation of R and defined as
2 - 1 1 E1
PR {x R | I p (x) R} and
21 - 2 1 E3
P R { x R | I p ( x ) R } respectively. This 22 - 2 1 E3
31 - 0 0 E4
indiscernibility relation can make a decision table simpleby 32 - 0 1 E4
using the concept of reductand core. Reduct refers to the
minimal set of attributes which are capable of classifying the
faults while core is the set of attributes occurring in every Table 9. Decision Base obtained from Table 8.
reduct.The decision rules can be framed using the reductand Rule Rule statement
no. IF THEN
core. Let P be a given set of attribute such that P ⊆Q, then an 1 (F5=1 F11=0) E1
attribute q∈P is dispensable in the given set P if and only if, (F5=1 F11=1)
2 (F5=2 F11=1) E3
Ip= I(p−{q}); else, qis indispensable. If every element in P is 3 (F5=0 F11=0) E4
indispensable then Pis said to be independent otherwise (F5=0 F11=1)
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IEEE Transactions on Dielectrics and Electrical Insulation Vol. 23, No. 5; October 2016 2889
Table 10. Simplified form of the decision Table.
Serial Condition Attributes Decision Similar
No. Attributes Cases
F1 F2 F4 F5 F11
1 0 0 0 1 0 E1 4
2 0 1 0 1 0 E1 1
3 0 0 1 1 0 E1 1
4 1 1 0 2 0 E2 3
5 1 0 0 1 0 E2 2
6 1 0 0 2 0 E2 1
7 1 1 1 2 1 E3 3
8 0 1 1 2 1 E3 1
9 0 1 0 2 1 E3 1
10 1 1 0 2 1 E3 1 Figure 8. Flow-Chart of proposed algorithm
11 1 0 1 0 0 E4 5 Table 11. Modified form of complete decision Table.
12 1 1 1 0 0 E4 1 Serial Condition Attributes Decision
13 0 0 1 2 1 E5 1 No. F1 F2 F4 F5 F11 attributes
1 0 - - 1 0 E1
14 0 0 1 2 0 E5 4
2 1 - 0 - 0 E2
15 0 0 0 2 0 E5 1
16 0 1 1 2 1 E6 1 3 - 1 - 2 1 E3
17 0 1 1 2 0 E6 1 4 1 - 1 0 0 E4
18 0 0 1 1 1 E6 3 5 0 0 - 2 - E5
19 0 1 1 0 1 E6 1 6 0 - 1 - - E6
20 1 0 1 1 1 E7 2
7 0 - 1 1 E7
21 1 0 0 1 1 E7 3
8 0 1 0 - 0 E8
22 0 0 0 1 1 E7 1
23 0 1 0 0 0 E8 1 9 - 1 0 1 - E9
24 0 1 0 1 0 E8 5
25 1 1 0 1 0 E9 5
26 0 1 0 1 1 E9 1 Table 12. Decision Rules based on Table 11.
Decision Statement
Step1- discretized data table and keep indispensable Rule no. IF THEN
attributes 1 F1=0 F5=1 F11=0 E1
Table 10 represents the discretized data table. The data 2 F1=1 F4=0 F11=0 E2
table is discretized according to RST methodology as
3 F2=1 F5=2 F11=1 E3
presented in previous section. It was evident from the table
4 F1=1 F4=1 F5=0 F11=0 E4
that features F1, F2, F4, F5and F11are indispensable and those
features contains the most significant information of 5 F1=0 F2=0 F5=2 E5
contamination level. 6 F1=0 F4=1 E6
Step2- rule selection and finding core values 7 F2=0 F5=1 F11=1 E7
Rules 1, 4, 7, 11, 14, 18, 21, 24, 25 are selected from 8 F1=0 F2=1 F4=0 F11=0 E8
table 10, because these similarity index are higher compared 9 F2=1 F4=0 F5=1 E9
to other rules of the similar events. By using concept of reduct
and core values, the decision rules are much simpler and these
core values are presented in Table 11. Table 13. Classification Results of the Tested Signal.
Step3-decision rules are generated from the core values Events E1 E2 E3 E4 E5 E6 E7 E8 E9
Finally, decision rules are obtained from the core values E1 6 0 0 0 0 0 0 0 0
as mentioned in Table 11. These decision rules are based on E2 0 5 0 0 0 1 0 0 0
IF-THEN format and are shown in Table 12. To validate E3 0 0 6 0 0 0 0 0 0
these decision rules, 54 leakage current signals, for different E4 0 0 0 5 0 0 0 1 0
contamination levels of signal are used. From these detected
E5 0 0 0 0 6 0 0 0 0
signals, at first, only the indispensable features are extracted E6 0 0 0 0 1 5 0 0 0
using auto- correlation technique. This reduces the
E7 0 0 0 0 0 0 6 0 0
computational burden of the testing phase. These extracted E8 0 0 0 0 0 0 0 6 0
features are then classified using decision rules as mentioned E9 0 0 0 1 0 1 0 0 4
in Table 12. Figure 8 represents the flow chart of the proposed Overall accuracy =90.7%
algorithm.
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2890 A. Banik et al.: Autocorrelation aided Rough Set Based Contamination Level Prediction of High Voltage Insulator
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IEEE Transactions on Dielectrics and Electrical Insulation Vol. 23, No. 5; October 2016 2891
[14] B. Dong, X. Jiang , J. Hu, L. Shu and C. Sun, “Effect of Artificial [25] D. Dey, B. Chatterjee, S. Chakravorti, and S. Munshi, “Rough-granular
Polluting Method on AC Flashover Voltage of Composite Insulators”, approach for impulse fault classification of transformers using
IEEE Trans. Dielectr. Electr. Insul., Vol. 19, pp. 714-722, 2011. crosswavelet transform,” IEEE Trans. Dielectr. Electr.Insul., Vol. 15, pp.
1297–1304, 2008.
[15] X. Jiang, S. Wang, Z. Zhang, J. Hu and Q. Hu, “Investigation of
flashover voltage and non-uniform pollution correction coefficient of
short samples of composite insulator intended for ±800 kV UHVDC”,
IEEE Trans. Dielectr. Electr.Insul., Vol. 17 , pp.71-80, 2010.
[16] X. Jiang, J. Yuan, Z. Zhang, Q. Hu and A. Cheng, “Study on AC Apu Banik received the B.Sc. and M.E, degrees in
pollution flashover performance of composite insulators at high altitude engineering from Ahsanullah University of Science
sites of 2800-4500 m”, IEEE Trans. Dielectr. Electr.Insul., Vol. 16, and Technology, Bangladesh and Jadavpur
pp.123-132, 2009. University, Kolkata, India in 2012 and 2015,
[17] S. Venkataramman and R.S. Gorur, “Flashover voltage prediction of respectively. Currently he is Lecturer in the Electrical
outdoor insulators subjected to road salt contamination”, IEEE Conf. and Electronic Engineering Department of Stamford
Electr. Insul. Dielectr. Phenomena (CEIDP), pp. 293-296, 2005. University, Bangladesh. His areas of interest are data
[18] J.Y. Li, C.X. Sun and S.A. Sebo, “Humidity and contamination Severity acquisition and condition monitoring related to high
Impact on Leakage Currents of Porcelain Insulators” IET Gener. Trnasm. voltage engineering
Distrib.Vol.5, pp. 19-28, 2009.
[19] Working Group 33.04, Study Committee 33, "A Critical Comparison of
ArtificialPollution Test Methods for HV Insulators," Electra, No. 64, pp. Sovan Dalai received the B.E.E., M.E.E and, and Ph.D.
117-136, 1979. degrees in engineering from B.E. College (Deemed
Univ.), Howrah and Jadavpur University, Kolkata, India
[20] Int’l. Electrotechnical Commission, “Artificial pollution tests on high- in 2000, 2003 and 2015, respectively. Currently he is an
voltage insulators to be used on a.c. systems”, Int’l. std. IEC 60507, Assistant Professor in the Electrical Engineering
1991. Department of Jadavpur University. His areas of interest
[21] K. Rana, R. Singh and K.S. Sayann, “Auto correlation based intelligent are power quality event detection, smart metering,
technique for complex wavwform presentation”, J. Science. Instr. Vol. 4, condition monitoring and signal conditioning in high
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[22] Z. Pawlak, “Rough Set Theory and its application,” J. Telecom. Inf.
Techo. Vol. 9, No. 3, pp. 7-10, 2002.
[23] S. Biswas, D. Dey, B. Chatterjee and S. Chakravorti, “An Approach Biswendu Chatterjee received the M.E.E. and the
based on rough set theory for identification of single and multiple partial Ph.D. degrees in engineering from Jadavpur University,
discharge source” J. Electrical power and Energy Systems, Vol. 46, Kolkata, India in 2004 and 2009, respectively. Currently
pp.163-174, 2013. he is an Assistant Professor in the Electrical Engineering
[24] S. Dalai, B. Chatterjee, D. Dey, S. Chakraborty, K. Bhattacharya. Department of Jadavpur University. His areas of interest
“Rough-Set-Based Feature Selection and Classification for Power are data acquisition and condition monitoring related to
Quality Sensing Device Employing Correlation Techniques.” IEEE high voltage systems.
Sensor J., Vol. 13, pp. 562-573, 2013.
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