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Abstract. We have measured the resistive transition of molecular beam epitaxy prepared
Bi2 Sr 2 CaCu2 O8+x thin films in the presence of perpendicular low magnetic fields H
(0 Oe < H < 1100 Oe) for different values of the bias current density J
(102 A cm−2 < J < 105 A cm−2 ). The experimental data show two distinct dissipative
behaviours. In the low-current region (J < 103 A cm−2 ) the electrical resistivity ρ is
independent on J , changing only with H , while in the high-current region (J > 104 A cm−2 )
ρ is independent of both the bias current and the magnetic field. The result is considered in
terms of thermally activated flux flow–flux creep–steady flux flow crossovers. The role of the
statistical distribution of the pinning energy in the vortex dynamics is discussed.
Figure 1. Low-resistivity part versus temperature for different magnetic field values at J = 111 A cm−2 . Full curves are fits to the
experimental data obtained using the KT theory (equation (1)).
Figure 2. The U ((T ) dependences, as obtained from the ρ(T ) experimental data using equation (3), for different J values at H = 100 Oe.
3. Results and discussion In the case of BSCCO thin films, this broadening
could be tentatively interpreted in terms of a KT transition.
Figure 1 shows the low-resistivity part of typical ρ(T , H ) Strictly speaking, the KT transition occurs only in 2D
curves recorded using a bias current density J = clean superconductors (l/ξab > 1, l being a mean free
111 A cm−2 . The film thickness is df = 0.1 µm, the length path and ξab being the superconducting coherence length
is lf = 50 µm and the width is w = 30 µm. Symbols are for in the a–b plane), and, as was shown in [16], even a
magnetic fields changing from 0 Oe (right) to 1000 Oe (left). weak Josephson coupling between superconducting layers
The broadening of the curves is evident. makes the spontaneous creation of 2D vortices above TKT
534
Vortex dynamics of Bi2 Sr 2 CaCu2 O8+x thin films
535
S L Prischepa et al
Here A(H, T )J /Jl is the change in the energy of a flux line Table 1. The result of fitting procedure according to equation (6).
(bundle) associated with the Lorentz force acting on a vortex H (Oe) Umin (kB T ) σ (kB T )
and Jl is a local domain critical current. The parameter
C(H, T ) is expressed in terms of creep length Lc , flow length 50 5.6 0.8
150 4.1 1.2
Lf , pinning potential U and FF resistivity ρff [26]. Note that 600 2.6 1.4
in the limit of large J 850 1 0.7
1100 1 0.3
ρN J
Uρ (J ) ≈ kB T ln + kB T C(H, T )
ρff J1
A(H, T ) J
× exp −
k B T J1
which means that the resistivity reaches asymptotically the FF
regime. The fitting procedure, using A(H, T ) and C(H, T )
as fitting parameters and a linear U (T ) dependence, reveals
that equation (5) describes rather well the experimental
curves Uρ0 (J ) (full curves in figure 3).
As is clear from figure 3, in the intermediate current
range, 0.1J ∗ < J < J ∗ , we are in the presence of a crossover
region extending over a large range of currents. Probably,
the reason for this rather wide crossover window is related to
the presence of a pinning energy distribution. To prove this
idea we consider, in describing our data, a statistical model
[27], already successfully applied to explain the pinning force
behaviour in BSCCO thin films [28]. The model of [26] as
well as the one of [27] includes as limiting cases TAFF at Figure 4. The Uρ0 (H ) dependences for different J values.
small J and FF at large J values.
According to the statistical model of [27] (which in equation (6a) describes the TAFF regime with the logarithmic
the spirit of Griessen one may call the model of ‘series characteristic
resistors’), because of the presence of a pinning potential
distribution (with the consequent spread in the local critical ρN Jmin kB T + σ
kB T ln(ρn /ρ) ≈ Umin + kB T ln .
current densities) at relatively large current densities vortex Ec 2Umin
fractions undergo TAFF and FF simultaneously. Then the
At J Jmin we obtain
electric field strength is given by
Ec [1 − nf low (J )]
E ≈ ρff J + = ρff J
E = ncreep (J )Ec exp[−U (J )/kB T ] + nf low (J )ρff J 1 + σ/kB T
Ec Umin J
where nf low (J ) (ncreep (J )) is the fraction of vortices + exp − −1
1 + σ/kB T σ Jmin
participating in FF (FC), nf low (J ) + ncreep (J ) = 1, Ec is a
coefficient and exp[−U (J )/kB T ] = hexp(−U (J, Jc ))iJc >J , i.e. the current–voltage characteristic approaches exponen-
where the symbol h. . .i means the average over the set of the tially the FF regime according to the experimentally observed
pinning potential U values, for which the local critical current asymptotic behaviour. The results of the fitting procedure ac-
density Jc > J . cording to Equations (6), are shown in figure 3 by the broken
Using for simplicity an exponential distribution for the curves. Taking Jmin of the order of J ∗ , the FC–FF crossover
pinning energy and a linear dependence for U (J ) we obtain current density, we have Umin and σ as fitting parameters,
[27] which are summarized in table 1 for different values of the
magnetic field H . The behaviour of the obtained values of
exp(−Umin /kB T ) Umin J
E = Ec 2 sinh σ and Umin versus the external magnetic field is very in-
1 + σ/kB T kB T Jmin teresting. We can see, in fact, that, up to 600 Oe, Umin
at J 6 Umin /a ≡ Jmin (6a) decreases and σ increases, indicating that vortices occupy
different pinning centres (not only the strongest) when the
exp(−Umin /kB T ) Umin J
E = Ec 2 sinh magnetic field grows. For fields H >600 Oe, in our temper-
1 + σ/kB T kB T Jmin
ature range, the FF regime starts to dominate as revealed by
Umin σ J the fact that Umin = kB T and σ decreases. This is strong
× exp − 1+ −1
σ kB T Jmin evidence of the important role played by the presence of dis-
+nf low (J )ρff J at J > Jmin (6b) order in our films. Moreover, this result confirms our start-
ing hypothesis about the wide crossover window in the U (J )
Umin J
nf low = 1 − exp − −1 (6c) curves.
σ Jmin The Uρ0 (H ) data for low current densities, figure 4,
where σ is the variance of the distribution, a is a parameter and are qualitatively described in the framework of the previous
Umin is the minimum pinning potential value. At J Jmin model [27], according to which Umin (H ) = U ∗ +
536
Vortex dynamics of Bi2 Sr 2 CaCu2 O8+x thin films
∗ ∗
σ (ln(H /H ) (where H is the magnetic field related to the References
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