DEPARTMENT OF HUMANITIES & APPLIED SCIENCES

CERTIFICATE

This is to certify that Mr./Ms.________________________________________

Student ID _________ Semester___ has completed all the specified practical
work / term work in the subject __________________________ as laid down
by University of Mumbai in satisfactory manner within the premises of Institution
during the academic year 20___ - 20___

Date:

________________ ____________
Subject In-Charge Head of Dept.

ENGINEERING PHYSICS-I LAB MANUAL

 INSTITUTE VISION
“APSIT aspires to be a premier institute
producing globally competent engineering
professionals to contribute towards socio-
economic growth of India.”

INSTITUTE MISSION
“To provide conducive and collaborative
environment to meet contemporary and future
engineering challenges by project-based and
value-added education with the support of
trained faculty.”

ENGINEERING PHYSICS-I LAB MANUAL

 EXPERIMENT NO. 1

Course Outcome: Illustrate Miller Indices to verify theory learned in

Crystallography.

Aim: - To find Miller Indices and directions for the giving planes.

Date of Performance:
Date of Correction:

Rubrics of Assessment:

Score/ Category 4 3 2 1 Score

Did all the Tried to do Tried to do Tried to do

Effort work most of the some of the very little ___ /4
work work work.
Completely Understood Understood Did not
understood the problem part of the understand
Understanding the and mostly problem but the problem
___ /4
& Explanation problem solved it could not
and solved solve it
it
Some of the None of the
Accuracy &
solutions are solutions ___ /2
Neatness
correct are correct
Total score ___ /10

ENGINEERING PHYSICS-I LAB MANUAL

Chapter in the syllabus : Crystallography
Concept to be delivered:
ENGINEERING PHYSICS-I
It is often useful to describe the crystal structure in the form
of lattice points of a space lattice occupied in imaginary
planes. Since the lattice is periodic, we can imagine a set of
parallel planes oriented in some directions. These planes are
particularly useful in the study of crystal structure using X-
ray diffraction analysis and in the crystal growth techniques.
Imaginary parallel planes associated with the lattice of a
crystal structure are called as crystal lattice planes. Different
crystallographic planes and directions are nomenclature for
the ease of X-ray diffraction study. The scheme was adopted
by R.C.Miller and now it is called Miller indices of planes
and directions. Any plane in a lattice makes certain
intercepts on the crystallographic axes. Miller indices are
obtained from intercepts of the plane.
LAB MANUAL
Aim:
To find Miller Indices and directions for the giving planes.

Apparatus:
Sample blocks of unit cell with different planes.

𝒂
Formula: 𝒅=
√𝒉𝟐 +𝒌𝟐 +𝒍𝟐

Theory:
The crystal structure may be regarded as made up of an aggregate of a set of parallel
equidistant planes passing through at least one lattice point or a number of lattice points. In a
given crystal plane may be selected in number of ways.
Miller evolved a method to designate a plane in the crystal by three integers which
are called Miller Indices which are denoted by (h k l).
Miller Indices are the three smallest possible integers which are the reciprocals of
intercepts made by the plane along three crystallographic axes.
Features of Miller Indices:
• Miller indices definite a set of parallel planes and not a single plane only.
• For a plane parallel to a co-ordinate axis, the intercepts is infinity and hence the Miller
index of that axis is 0.
Applications and significance:
1) The study of miller indices is useful in introduction of X- ray with crystal for planes.
Crystals behaves like particle reflecting mirror in presence of X- rays.
2) Miller indices help in study of planes.
3) Miller indices study helps in manufacturing semiconductor circuits.

PROCEDURE:

1. Find the intercepts of the plane with the crystal axes along the basic vectors
a. a , b , and c. Let the intercepts be m, n and p respectively.
2. Express m, n and p in terms of the respective basic vectors, as fractional multiples we
m n p
get , , .
a b c
3. Take the reciprocals of the three fractions
a b c
a. i.e. , ,
m n p

ENGINEERING PHYSICS-I LAB MANUAL

 4. Find the LCM of the denominator, by which the above three ratios are multiplied. This
operation reduces them to a set of three integers h, k and
5. The resultant three integers are called Miller Indices of the given plane denoted by (h k
l).
The following points should be taken into consideration:
• When plane is parallel to one of the co-ordinate axes it is to rest axis at ∞ i.e., 1/∞ = 0
• The normal to the plane with index nx is dm.
• For negative intercepts on axis the moment of inertia is represented by a bar over it.
• For a plane passing through origin, we represent it by a plane parallel to given plane by
shifting origin.

RESUIT:
Using the simple blocks of miller indices for planes and miller indices direction have
been studied.

Sr. Interplanar distance 𝒅 =

Miller Indices 𝒂
No. √𝒉𝟐 +𝒌𝟐 +𝒍𝟐

1 (111)
2 (242)
3 (100)
4 (1̅ 1̅1̅)
5 [2̅1̅3]
6
7
8
Note: - Draw the miller planes and direction for above example.

REFERENCE BOOKS:
1. Solid State Physics – Charles Kittle.
2. Experiments in Engineering Physics - M. N. Avadhanulu, A. A. Dani, P. M. Pokley.

ENGINEERING PHYSICS-I LAB MANUAL

 EXPERIMENT NO. 2

Course Outcome: Perform the experiments to categorize the type of

semiconductor using Hall effect and Energy band gap.

Aim: - To study Hall Effect and determine the Hall coefficient.

Date of Performance:
Date of Correction:

Rubrics of Assessment:

Score/ Category 4 3 2 1 Score

Did all the Tried to do Tried to do Tried to do

Effort work most of the some of the very little ___ /4
work work work.
Completely Understood Understood Did not
understood the problem part of the understand
Understanding the and mostly problem but the problem
___ /4
& Explanation problem solved it could not
and solved solve it
it
Some of the None of the
Accuracy &
solutions are solutions ___ /2
Neatness
correct are correct
Total score ___ /10

ENGINEERING PHYSICS-I LAB MANUAL

Chapter in the syllabus : Semiconductor Physics

Concept to be delivered: If an electric current flows through a conductor in

a perpendicular magnetic field, the magnetic field exerts
a transverse force on the moving charge carriers which
tends to push them to one side of the conductor. This is
most evident in a thin flat conductor as illustrated. A
build-up of charge at the sides of the conductors will
balance this magnetic influence, producing a measurable
voltage between the two sides of the conductor. The
presence of this measurable transverse voltage is called
the Hall effect after E. H. Hall who discovered it in 1879.

ENGINEERING PHYSICS-I LAB MANUAL

Aim: To study Hall Effect and determine the Hall coefficient.
Apparatus: Electromagnet, Power supply for electromagnet, constant current source (10 mA
to 100mA), current meter (0-100) mA, DMM, Current meter (0-1 Amp), Hall probe.
Theory:
If a piece of conductor carrying a current is placed in a transverse magnetic field, an electric
field is produced inside the conductor in a direction normal to both the current and the magnetic
field. This phenomenon is known as Hall Effect. The generated voltage is called the Hall
voltage.

Assuming the material is an n-type semiconductor; the current flow consists almost entirely of
electrons moving from right to left. This corresponds to the direction of conventional current
from left to right. If v is the velocity of electrons at right angles to the magnetic field, there is
downward force on each electron of magnitude Bev. This causes the electron current to be
deflected in a downward direction and causes a negative charge to accumulate on the bottom
face of the slab. Therefore, a potential difference is created which causes a field 𝑉𝐻 in the
negative Y direction.
Procedure and observation:
1. Adjust the spacing between the pole pieces to a suitable value (around 1cm). Connect
the electromagnet to the magnet terminals pf the Hall Effect Kit. Place the Hall probe
at the centre of the gap with its face parallel to the faces of the pole pieces of the
electromagnet.
2. Set magnet current and probe current on 0 mA and nullify Hall voltage to 0 V using
zero control facility.

ENGINEERING PHYSICS-I LAB MANUAL

Probe current 𝑰𝒔 fixed
1. Set the Probe current 𝐼𝑠 on fixed value (say 40 mA, 50 mA etc.) and magnetic current
𝐼𝑚 on 0 mA.
2. Nullify the hall voltage to 0 V using zero control facility.
3. Keeping 𝐼𝑠 fixed set the magnetic current 𝐼𝑚 to various values between 0 to 500 mA and
(in steps of 100mA) and note down the corresponding values of Hall voltage𝑉𝐻 . Let it
be referred to as Hall voltage corresponding to𝐼𝑚 (+)𝐼𝑠 (+).
4. Repeat step 3 for negative magnetic current 𝐼𝑚 from 0 to -500mA (in steps of 100 mA).
Observations:
Thickness t = 0.01cm
𝑰𝒎 (mA) B Gauss 𝑽𝑯𝟏 volt 𝑽𝑯𝟐 volt 𝑽𝑯(𝒎𝒆𝒂𝒏) volt 𝑹𝑯
𝐼𝑚 (+)𝐼𝑠 (+) 𝐼𝑚 (−)𝐼𝑠 (+) |𝑽𝑯𝟏 | + |𝑽𝑯𝟏 |
=
𝟐
100
200
300
400
500
𝑹𝑯 (𝒎𝒆𝒂𝒏) = __________𝒄𝒎𝟑 /𝑪𝒐𝒍𝒐𝒖𝒎𝒃
Calculations:
𝑉𝐻 × 𝑡 × 108
𝑅𝐻 =
𝐵 × 𝐼𝐶

TO FIND OUT CONCENTRATION

−1
𝑅𝐻 =
𝑛𝑒
−1
𝑛=
𝑅𝐻 𝑒
Result:
Mean 𝑅𝐻 = 𝑐𝑚3 /𝑐𝑜𝑢𝑙𝑜𝑚𝑏

Reference:
1. Physics of Semiconductors- S.M.Sze.
2. Experiments in Engineering Physics- M.N.Avadhanulu,A.A.Dani,P.M.Pokley.

ENGINEERING PHYSICS-I LAB MANUAL

 EXPERIMENT NO. 3

Course Outcome: Analyse the characteristics of semiconductor device.

Aim: - To study & plot forward and reverse characteristic of p-n junction diode.

Date of Performance:
Date of Correction:

Rubrics of Assessment:

Score/ Category 4 3 2 1 Score

Did all the Tried to do Tried to do Tried to do

Effort work most of the some of the very little ___ /4
work work work.
Completely Understood Understood Did not
understood the problem part of the understand
Understanding the and mostly problem but the problem
___ /4
& Explanation problem solved it could not
and solved solve it
it
Some of the None of the
Accuracy &
solutions are solutions ___ /2
Neatness
correct are correct
Total score ___ /10

ENGINEERING PHYSICS-I LAB MANUAL

Chapter in the syllabus: Semiconductor

Concept to be delivered: When a dc voltage is applied to a device, the device is

said to be biased. A p n- junction diode can be biased in
two ways-forward biased and reversed biased. The graph
showing the variation of current in the diode with the
variation of applied dc voltage is called the static volt-
ampere characteristics. A diode is a non-linear device. It
conducts readily under forward biased condition and
conducts poorly in the reversed biased condition. Hence
it is said to possess rectifying property. The resistance
offered by the diode is less in the forward bias condition.
It is of a few tens of ohms. The resistance is high in the
reverse bias condition. It will be of the order of one mega
ohm.

ENGINEERING PHYSICS-I LAB MANUAL

Aim: To study & plot forward and reverse characteristic of p-n junction diode.
Apparatus: D.C. power supply, multimeter, milliammeter, bread board, Wires, etc.
Theory:
If a suitable positive voltage (forward bias) is applied between the two ends of the PN junction,
it can supply free electrons and holes with the extra energy they require to cross the junction
as the width of the depletion layer around the PN junction is decreased.
By applying a negative voltage (reverse bias) result in the free charges being pulled away from
the junction resulting in the depletion layer width being increased. This has the effect of
increasing or decreasing the effective resistance of the junction itself allowing or blocking the
flow of current through the diodes p-n junction.
Then the depletion layer widens with an increase in the application of a reverse voltage and
narrows with an increase in the application of a forward voltage.

ENGINEERING PHYSICS-I LAB MANUAL

CIRCUIT DIAGRAM:
Forward Bias

Reverse Bias

PROCEDURE:
1. Connect the circuit as shown
2. Vary the source voltage (Vs) to adjust the forward voltage (Vf)
3. Measure VF for the corresponding VF
4. Plot the graph of VF vs IF
5. Find the static and dynamic resistance from the graph.

ENGINEERING PHYSICS-I LAB MANUAL

OBSERVATION TABLE:

Sr. FORWARD BIAS Sr. REVERSE BIAS

No. VF IF No. VR IR
(Volt) (mA) (Volt) (mA)
1. 0.1 1. 1
2. 0.2 2. 2
3. 0.3 3. 3
4. 4. 4
5. 5.
6. 6.
7. 7.
8. 8.
9.
10.

RESULT :

The Zener diode has a breakdown of __Volts

REFERENCE BOOKS:
1. Physics of Semiconductors- S. M. Sze.
2. Experiments in Engineering Physics- M. N. Avadhanulu, A. A. Dani, P. M. Pokley.

ENGINEERING PHYSICS-I LAB MANUAL

 EXPERIMENT NO. 4

Course Outcome: Identify the thickness of wire using Wedge shaped film
method.

Aim: - To determine the diameter of a thin wire using a wedge-shaped film.

Date of Performance:
Date of Correction:

Rubrics of Assessment:

Score/ Category 4 3 2 1 Score

Did all the Tried to do Tried to do Tried to do

Effort work most of the some of the very little ___ /4
work work work.
Completely Understood Understood Did not
understood the problem part of the understand
Understanding the and mostly problem but the problem
___ /4
& Explanation problem solved it could not
and solved solve it
it
Some of the None of the
Accuracy &
solutions are solutions ___ /2
Neatness
correct are correct
Total score ___ /10

ENGINEERING PHYSICS-I LAB MANUAL

Chapter in the syllabus: Optics-Interference due to Wedge shaped film.

Concept to be delivered: A Wedge is a transparent plate or film of varying

thickness, having zero thickness at one end and
progressively increasing to a particular thickness at the
other end. A thin wedge of air film can be formed by two
microscope slides resting on each other at one edge and
separated by a thin foil or wire at the opposite edge. The
wedge so formed has a very small angle. When light is
incident on the wedge from above, it gets partially
reflected from the glass to air boundary at the bottom of
the air film. The two reflected rays are coherent as they
are produced through the division of amplitude of the
parent ray. Therefore, they interfere and produce
interference pattern.

ENGINEERING PHYSICS-I LAB MANUAL

Aim: To determine the diameter of a thin wire using a wedge-shaped film.
Apparatus: A Travelling Microscope, a convex lens, a glass plate to be used as a reflector, a
thin wire or thin metal foil placed between two thin glasses plates.
Theory:
An air-wedge can simply be obtained when two small plates about 1 inch wide and 3 inches
Long (microscope slides are ideal) are placed one above another. They should be contact along
one short edge and separated wire along the other. They can be than fastened by means of
adhesive tape or clips at each end. Thus, an air-film is trapped between the glass plates, and its
thickness uniformly increase as we go from one end to the other. The fringes are produced by
the interference of light reflected from the upper and lower surface of the air film. When the
phase difference between two rays (which depends on the thickness) is 2n𝜋,bright fringes
would be observed and when it is (2n+1)𝜋 ,a dark fringes would be obtainedAs we go from
one bright fringe to the next, the path difference increases by A, and the thickness of the air
𝛌
film by .Hence a measurement of β, the distance between the neighbouring fringes, (darker
2
bright) allow us to calculate 𝛌. If the diameter of the wire is D and the length of the glass plate
𝐃 𝛌
L, the angle of the wedge 𝜃 ,is equal to 𝐿 . This is equal to 2 / β. Equating the both the terms:
𝐃 𝛌 𝛌𝐋
= 2β i.e., 𝐷 =
𝐿 2β

So that if A is assumed to be known, D can be calculated.

Procedure:
1.Keep a thin wire parallel to one edge of the horizontal glass plate and place other glass
platoon it so that wedge shaped air film is formed between them.
2.Mount the reflecting plate above the air film and rotate it till the air film is illuminated and
a clear interference pattern is observed by looking in vertically downward direction.
3.Focus the microscope on the interference bands and bring the point of intersection of
crosswire at the center of a bright band near the line of intersection of the glass plates, note
the corresponding microscope reading(a)on horizontal scale.
4.Using slow motion screw, take similar readings after every-five bright bands.
5.Measure the distance(L)from the edge of glass plates to the thin wire using a ruler.

Formula:

ENGINEERING PHYSICS-I LAB MANUAL

 𝛌𝐋
𝐷=
2β
D= is diameter of the wire or thickness of foil.
2=is wave length of the source of light.
L=is length of air film.
X= is band width.
Diagram:

Observations:
1.Wavelength of given source of light=
2.Length of wedge-shaped air film(L)=_cm.
Smallest division of main scale
Least count of Travelling Microscope =
Total number of division on Vernier scale

Observation table:

ENGINEERING PHYSICS-I LAB MANUAL

 Obs.no. Fringe No. Travelling fringes Width β (cm) Mean β (cm)
Microscope
reading ‘a’ (cm)
1. 1
2. 2
3. 3
4. 4
5. 5
6. 6

Calculation:
𝝀𝑳
𝑫= = ____𝒄𝒎
𝟐𝜷

RESULT: The Diameter of the wire is ____cm.

REFERENCE BOOKS:
1. Fundamentals of Physics-Jenkins & White.
2. Applied Physics Experiments- Dr. L. D. Wahegaonkar, Dr. R. S. Deshmukh.

EXPERIMENT NO. 5

ENGINEERING PHYSICS-I LAB MANUAL

 Course Outcome: Examine the radius of curvature of a plano-convex lens
using Newton’s ring set up

Aim: - To determine the radius of the curvature of the convex lens by obtaining
the Newton’s ring.

Date of Performance:
Date of Correction:

Rubrics of Assessment:

Score/ Category 4 3 2 1 Score

Did all the Tried to do Tried to do Tried to do

Effort work most of the some of the very little ___ /4
work work work.
Completely Understood Understood Did not
understood the problem part of the understand
Understanding the and mostly problem but the problem
___ /4
& Explanation problem solved it could not
and solved solve it
it
Some of the None of the
Accuracy &
solutions are solutions ___ /2
Neatness
correct are correct
Total score ___ /10

ENGINEERING PHYSICS-I LAB MANUAL

Chapter in the syllabus : Optics- Interference of thin film
Concept to be delivered:
ENGINEERING PHYSICS-I
The system used to form the Newton’s rings consists of
a plano convex lens of a large radius of curvature placed
on a sheet of plane glass. This combination forms a thin
circular air film of progressively increasing thickness in
all directions around the point of contact of the lens and
the glass plate. The thin film of air formed between the
curved surface of the convex lens and the plane surface
of the glass plate is a circular wedge which can be viewed
by rotating the wedge-shaped air film around an axis
passing vertically. Therefore, the locus of all points
corresponding to equal thickness of air film falls on a
circle. Consequently, the interference fringes obtained
are a series of concentric rings with their centre at O.
These circular fringes are called Newton’s rings. They
are fringes of equal thickness. The fringes are due to the
interference of light waves reflected from upper surface
and the lower surface of the air film enclosed between
the lens and the glass plate.
LAB MANUAL
 AIM: To determine the radius of the curvature of the convex lens by obtaining the Newton’s
ring.
APPARATUS: Travelling microscope, plane glass plate (or clean old photographic plate),
Plano-convex lens of larger radius of curvature, condensing lens of small focal length,
sodium source (monochromatic source), magnifying lens, thin glass plate, etc.

DIAGRAM:

L1 Bright ring
45 Dark ring

S
Sodium
Source
Glass plate
Condensing f
as a reflector
lens

Central dark
spot
Plano convex lens
Glass plate

FORMULA :
𝐷2 𝑁2 − 𝐷2 𝑁1 𝑆𝐿𝑂𝑃𝐸
𝑅= =
4(𝑁2 − 𝑁1 )ƛ 4ƛ
where DN1 = diameter of N1th dark ring
DN2 = diameter of N2th dark ring
ƛ = wavelength of light used
R = radius or curvature of Plano convex lens.

ENGINEERING PHYSICS-I LAB MANUAL

PROCEDURE:
1. Keep the sodium source at the focus condensing lens. Thus, on the other side of a lens, a
parallel beam of light will be formed.
2. Adjust the thin transparent glass such that its plane makes angle of 450 with the parallel
beam. After reflection from the transparent glass beam will go vertically downward.
3. Keep the Plano convex lens on the thick glass plate, so that the curved surface of the lens
will touch the glass plate.
4. Keep the combination below the thin glass plate so that reflected beam from the transparent
glass will be incident normally on the combination.
5. Adjust the microscope vertically over the thin glass plate. Focus the microscope on the
Newton’s rings.
6. Set the cross wire tangentially to the outer edge of the 10th fringe (dark ring or bright ring)
on the left of central spot and note down the reading.
7. Now set the cross wire tangentially to the inner edge of the same fringe (dark ring or bright
ring) and take the reading.
8. Take the reading as explaining in procedure (6) and (7) up to 3rd dark ring.
9. Then gradually move the microscope to right of the central spot till the cross wire become
tangential to the inner edge of the 3rd dark ring. Take the reading.
10. Next set the cross wire tangential to the outer edge of the 3rd dark ring.
11. Take the reading as explained in procedure (9) and (10) up to the 10th dark ring.
13. Tabulate all the readings.
14. Plot the graph of Dn (on Y-axis) against ‘n’ the serial number of fringe (on X-axis) and find
the slope.

OBSERVATION:
1. No. of division on the vernier scale of traveling microscope (horizontal scale) N = _____
2. Smallest reading on the main scale of traveling microscope (horizontal scale) M =___ cm.
3. Least count of traveling microscope = L = M/N = _____cm.
4. Wavelength of light from sodium source = _____cm.

ENGINEERING PHYSICS-I LAB MANUAL

OBSERVATION TABLE:
Obs. Ring
Microscope reading on Horizontal scale Diameter Dn
No. No.
= |X2 - X1| Dn2 (cm)
Left side of central Right side of (cm)
spot X1 (cm) central spot X2(cm)
1 2
2 4
3 6
4
5
6

Calculations:
R by calculation:
𝑫𝟐𝒏+𝒑 − 𝑫𝟐𝒏
𝑹=
𝟒𝒑𝝀
Mean R =_____cm

Y
A
D2 n 2 slope =
2
D n
D 2 n1 B
C

O n n1 n2 X

ENGINEERING PHYSICS-I LAB MANUAL

R by Graph

𝑺𝒍𝒐𝒑𝒆
𝑹= = ________𝒄𝒎
𝟒𝝀
RESULT:

Mean radius of curvature of lens =

R by calculation = _____ cm.
R by Graph = ______cm
REFERENCE BOOKS:
1. Fundamentals of Optics- Jenkins & White.
2. Optics- Brij Lal & Subramanyam.

ENGINEERING PHYSICS-I LAB MANUAL