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180
Solder Stress on fibre Max stress Figure 6 Geometry (left) and Stress map (right) for different
material (N/mm2) (N/mm2) hole sizes: a) 150 µm, b) 250µm. Left hand stress
Glass 141 223 scale design a). Right hand scale design b)
AuSn 370 490
Table 1 Stress results in OTI structure, internal diameter Comparisons have also been made between the optimised
OTI assembly and other designs for example the slotted rod
150µm
designs [11,12] with Au/Sn solder, where again the optimised
OTI design produced lower stress values.
Fibre
Fibre stress with Fibre stress with Hermeticity
support Hole
centred fibre offset fibre Several of the fibre assembly components after being fixed
diameter
(N/mm2) (N/mm2) into the laser package and the laser package lid sealed in place
(µm)
were tested for fine and gross leak. Good results where
150 141 192 obtained for the leak test both before and after thermal cycling
157 160 - of the devices, demonstrating the hermeticity of the OTI glass
163 178 - solders design.
176 180 -
200 184 241 PMF results
250 188 250 Three pieces of PMF fibre (Fujikura Panda 1550) were
soldered into tubes using the glass solder process. The tubes
Table 2 Simulated stress value with different hole sizes and (internal diameter 300µm) where soldered with a long length
fibre offset of bare fibre protruding from the tube in order to have
sufficient fibre to make a splice. The splice was required to
extend the fibre to the monitoring equipment. The soldered
It has been already shown [18] that the thinner the solder,
fibres with the splices were then placed in a thermal cycling
i.e. the smaller the internal diameter, the lower the stress
chamber along with a control spliced fibre. The extinction
induced on the fibre. This can be seen in Table 2 where the
ratio was then monitored during thermal cycling -40°C +85°C
Temperature in °C
26
40
Acknowledgements
20 The authors would like to thank Giovanni Tramontana for
0
his assistance in the production and testing of the fibre
25 assemblies and laser modules.
-20
ER [dB]
Temperature [°C]
References
-40
1. Huang et al, “High coupling design for laser diodes with
24 -60 high aspect ratio”, Proc ECTC 99
0 201 401 602 803 1003 1204
No of cycles 2. T Oleskevich, “Method for improving the coupling
efficiency of elliptical light beams into optical
waveguides”, US Patent no. 5701373
Figure 7 Variation of the polarisation extinction ratio during
3. Irie et al, “Over 200mW 980nm pump laser diode module
thermal cycling
using optimized high-coupling”, International
Conference on Integrated Optics and Optical Fiber
These results were obtained using tubes with an internal Communication. OFC/IOOC '99, Technical Digest, Vol.
diameter of 300 µm due to the availability of the tubes, further 2, pp. 238–240
tests with the optimised 150µm support tubes using 980nm 4. De Donno et al, “High coupling efficency between fiber
PMF fibre are now being conducted. and single-mode or broad-area laser diodes”, Proc IPC
Thermal cycling stability results. ’98, Taipei, Taiwan
Several modules using the two support tubes have been 5. Annovazzi Lodi et al, “Lens on wedge for high efficiency
assembled into laser devices. Coupling between fiber and pump laser”, NOC98
6. De Donno et al, “Intestazione in Fibra ottica di diodi laser
a 980nm”, Proc Fotonica 97, pp 368
7. Schiattone et al, “Investigation and fabrication of wedge
shaped fibre endface for high coupling efficiency between
fibre and pump laser diode”, MOC/GRIN 97
8. Tsushima et al, “Optical fiber with lens and method of
manufacturing the same”, US Patent no. 5845024
9. Annovazzi Lodi et al, “Intestazione e packaging di laser
di pompa per EDFA”, Amplificatori Ottici II AEI, Milano
1996
10. Mueller et al, “Automated fiber attachment for 980nm
pump modules”, Proc ECTC 2000
11. Janssen et al ‘Method of optically coupling fibres to
injection lasers’ US patent No. 5570444
12. Mobarahan et al, Laser diode packaging, Application note
Newport Corporation
13. Rassaian, M. et al, “Hermeticity lifetime of a 63Sn37Pb
Figure 8 Adhesion of glass solder after thermal cycling solder sealed optical fiber feedthrough”, Proc ECTC
45th, 1995, pp. 1110–1115
Thermal cycling tests –40°C +85°C has then been 14. Mitomi et al, “Effects of solder creep on optical
performed on the devices and the output power of the devices component reliability”, Trans on Comp IEEE, Vol
measured. Small variations in power (below 5%) where noted CHMT-9, No. 3, sept 1986