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CERTIFICATE OF ACCREDITATION

The ANSI National Accreditation Board


Hereby attests that

WK Electric Co., Ltd.


68/242 Moo 5 Sawaipracharaj Rd. T.Ladsawai A.Lamlukka
Pathumthani, Thailand 12150

Fulfills the requirements of

ISO/IEC 17025:2017
In the field of

CALIBRATION, DIMENSIONAL MEASUREMENT, AND


TESTING
This certificate is valid only when accompanied by a current scope of accreditation document.
The current scope of accreditation can be verified at www.anab.org.

______________________________
R. Douglas Leonard Jr., VP, PILR SBU
Expiry Date: 28 July 2023
Certificate Number: AC-2487

This laboratory is accredited in accordance with the recognized International Standard ISO/IEC 17025:2017.
This accreditation demonstrates technical competence for a defined scope and the operation of a laboratory
quality management system (refer to joint ISO-ILAC-IAF Communiqué dated April 2017).
SCOPE OF ACCREDITATION TO ISO/IEC 17025:2017

WK Electric Co., Ltd.


68/242 Moo 5 Sawaipracharaj Rd. T.Ladsawai A.Lamlukka
Pathumthani, Thailand 12150
Ms. Yuwadee Thanitasorathon +66 2993-4773

CALIBRATION, DIMENSIONAL MEASUREMENT AND TESTING


Valid to: July 28, 2023 Certificate Number: AC-2487
CALIBRATION
Acoustics and Vibration
Reference Standard,
Expanded Uncertainty of
Parameter / Equipment Range Method and/or
Measurement (+/-)
Equipment
1 Sound 94 dB 0.2 dB CEM SC-05 Sound Level
Level Meter
114 dB 0.2 dB Calibrator
Acceleration (RMS)
1 m/s² 0.06 % of reading
2 m/s² 0.06 % of reading
5 m/s² 0.14 % of reading
10 m/s² 0.27 % of reading
50 m/s² 1.4 % of reading
100 m/s² 2.7 % of reading
200 m/s² 5.4 % of reading
1 Vibration @ Test Frequency 300 m/s² 8.1 % of reading 3-AXIS G Force Data
160 Hz to 1 kHz Velocity (RMS) Logger
1 mm/s 0.06 % of reading
2 mm/s 0.06 % of reading
5 mm/s 0.14 % of reading
10 mm/s 0.27 % of reading
50 mm/s 1.4 % of reading
100 mm/s 2.7 % of reading
200 mm/s 5.4 % of reading
300 mm/s 8.1 % of reading
Displacement (RMS)
1 µm 0.06 % of reading
1 Vibration @ Test Frequency 2 µm 0.06 % of reading
3-AXIS G Force Data
5 µm 0.14 % of reading
160 Hz to 1 kHz 10 µm 0.27 % of reading Logger
50 µm 1.4 % of reading
100 µm 2.7 % of reading

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Chemical Quantities
Reference Standard,
Expanded Uncertainty of
Parameter / Equipment Range Method and/or
Measurement (+/-)
Equipment
4.0 pH 0.061 pH
1 pH Buffer Solution, pH Meter
Meter 7.0 pH 0.061 pH
Standard
10.0 pH 0.065 pH
84 µS/cm 1.5 µS/cm Buffer Solution,
1 Conductivity Meter 1.414 mS/cm 0.036 mS/cm Conductivity Meter
12.8 mS/cm 0.21 mS/cm Standard
1 Oxidation Reduction Buffer Solution, ORP
240 mV 5 mV
Potential (ORP) Meter Standard
1 Total Dissolved Solids Buffer Solution, TDS
1 000 mg/l 5 mg/l
(TDS) Meter Standard
10 NTU 0.041 NTU
1 Turbidity 100 NTU 0.4 NTU Turbidity
500 NTU 2 NTU Standard Solution
1 000 NTU 5 NTU
10 %Brix 0.010 %Brix
1 Refractometer 20 %Brix 0.010 %Brix Source Standard Solution
50 %Brix 0.010 %Brix
Air Flow Rate
28.3 l/min 0.004 5 l/min
Counting Efficiency
0.3 µm 2.9 % of reading Flow Meter/Particle
Particle Counter Meter 0.5 µm 2.9 % of reading Counter/Mono-sized
1.0 µm 2.9 % of reading Polymer Microspheres
3.0 µm 2.9 % of reading
5.0 µm 3.4 % of reading
10.0 µm 4.1 % of reading
Oxygen in Nitrogen O₂
1 Gas 18 % Concentration 1 % Concentration
Detector / Analyzer Gas Standard
Methane in Air
2.5 % Concentration 2 % Concentration
2 Ozone Concentration Calibration Method by
Detector
Up to 1 000 ppb 6.1 ppb Concentration Comparison with Standard
Ozone Chamber Tester
(> 1 000 to 5 000) ppb 31 ppb Concentration Ozone Detector
45 mg% 0.31 mg%
Breath Alcohol Tester Standard Alcohol Solutions
55 mg% 0.6 mg%
0 mg/l 0.15 mg/l
Zero Oxygen Solution and
8.4 mg/l 0.33 mg/l
Dissolved Oxygen Meter Compare with DO
8.7 mg/l 0.33 mg/l
Reference Value
9 mg/l 0.33 mg/l

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Electrical – DC/Low Frequency
Reference Standard,
Expanded Uncertainty of
Parameter / Equipment Range Method and/or
Measurement (+/-)
Equipment
Up to 330 mV 70 µV/V + 3.8 µV
1 Source 330 mV to 3.3 V 58 µV/V + 6 µV
Fluke 5500A
(3.3 to 33) V 59 µV/V + 58 µV
DC Voltage Multiproduct Calibrator
(33 to 330) V 64 µV/V + 0.58 mV
330 V to 1.02 kV 64 µV/V + 1.8 mV
1 Source 50 V to 1 kV 64 µV/V + 0.58 mV Kikusui 149-10A / Chroma
DC High Voltage (1 to 6) kV 64 µV/V + 1.8 mV 19052
Up to 3.3 mA 0.16 mA/A + 58 nA
1 Source (3.3 to 33) mA 0.12 mA/A + 0.29 µA
Fluke 5500A
(33 to 330) mA 0.12 mA/A + 3.9 µA
DC Current Multiproduct Calibrator
330 mA to 3 A 0.35 mA/A + 51 µA
(3 A to 11) A 0.7 mA/A + 0.7 mA
1 DC Current Fluke 5500A
(11 to 550) A 5.9 mA/A + 1.5 A Multiproduct Calibrator,
Clamp-On Ammeters
Coil
(1 to 33) mV
(10 to 45) Hz 4.1 mV/V + 6 µV
45 Hz to 10 kHz 1.7 mV/V + 6 µV
(10 to 20) kHz 4.1 mV/V + 6 µV
(20 to 50) kHz 4.1 mV/V + 6 µV
(50 to 100) kHz 4.1 mV/V + 6 µV
(100 to 500) kHz 4.1 mV/V + 6 µV
(33 to 330) mV
(10 to 45) Hz 2.9 mV/V + 29 µV
1 Source 45 Hz to 10 kHz 0.59 mV/V + 12 µV
Fluke 5500A
(10 to 20) kHz 1.2 mV/V + 12 µV
AC Voltage Multiproduct Calibrator
(20 to 50) kHz 1.9 mV/V + 23 µV
(50 to 100) kHz 2.8 mV/V + 99 µV
(100 to 500) kHz 8.2 mV/V + 0.23 mV
330 mV to 3.3 V
(10 to 45) Hz 1.7 mV/V + 145 µV
45 Hz to 10 kHz 0.35 mV/V + 36 µV
(10 to 20) kHz 0.93 mV/V + 36 µV
(20 to 50) kHz 1.6 mV/V + 0.17 mV
(50 to 100) kHz 2.8 mV/V + 0.99 mV
(100 to 500) kHz 5.8 mV/V + 1.91 mV

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Electrical – DC/Low Frequency
Reference Standard,
Expanded Uncertainty of
Parameter / Equipment Range Method and/or
Measurement (+/-)
Equipment
(3.3 to 33) V
(10 to 45) Hz 1.7 mV/V + 0.16 mV
45 Hz to 10 kHz 0.47 mV/V + 0.38 mV
(10 to 20) kHz 0.93 mV/V + 0.17 mV
(20 to 50) kHz 2.2 mV/V + 0.31 mV
(50 to 100) kHz 2.8 mV/V + 1.1 mV
1 Source (33 to 330) V Fluke 5500A
AC Voltage 45 Hz to 1 kHz 0.58 mV/V + 3.9 mV Multiproduct Calibrator
(1 to 10) kHz 0.93 mV/V + 8.8 mV
(10 to 20) kHz 1.1 mV/V + 19 mV
(330 to 1 020) V
45 Hz to 1 kHz 0.58 mV/V + 47 mV
(1 to 5) kHz 2.3 mV/V + 58 mV
(5 to 10) kHz 2.3 mV/V + 0.29 V
1 Source 50 V to 1kV 4.1 mV/V + 6 µV
Kikusui 149-10A / Chroma
AC High Voltage (1 to 3) kV 4.1 mV/V + 6 µV
19052
50 Hz, 60 Hz (3 to 5) kV 4.1 mV/V + 6 µV
(29 to 330) µA
(10 to 20) Hz 2.9 mA/A + 0.18 µA
(20 to 45) Hz 1.5 mA/A + 0.18 µA
45 Hz to 1 kHz 1.5 mA/A + 0.29 µA
(1 to 5) kHz 4.7 mA/A + 0.18 µA
(5 to 10) kHz 15 mA/A + 0.18 µA
330 µA to 3.3 mA
(10 to 20) Hz 2.4 mA/A + 0.35 µA
(20 to 45) Hz 1.2 mA/A + 0.35 µA
45 Hz to 1 kHz 1.2 mA/A + 0.36 µA
(1 to 5) kHz 2.4 mA/A + 0.36 µA
1 Source (5 to 10) kHz 7 mA/A + 0.36 µA Fluke 5500A
AC Current (3.3 to 33) mA Multiproduct Calibrator
(10 to 20) Hz 2.4 mA/A + 3.5 µA
(20 to 45) Hz 1.2 mA/A + 3.5 µA
45 Hz to 1 kHz 1.1 mA/A + 3.6 µA
(1 to 5) kHz 2.3 mA/A + 3.7 µA
(5 to 10) kHz 7 mA/A + 3.6 µA
(33 to 330) mA
(10 to 20) Hz 2.4 mA/A + 19 µA
(20 to 45) Hz 1.2 mA/A + 19 µA
45 Hz to 1 kHz 1.1 mA/A + 22 µA
(1 to 5) kHz 2.4 mA/A + 36 µA
(5 to 10) kHz 7 mA/A + 40 µA

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Electrical – DC/Low Frequency
Reference Standard,
Expanded Uncertainty of
Parameter / Equipment Range Method and/or
Measurement (+/-)
Equipment
330 mA to 2.2 A
(10 to 45) Hz 2.4 mA/A + 0.36 mA
45 Hz to 1 kHz 1.2 mA/A + 0.36 mA
1 Source (1 to 5) kHz 8.7 mA/A + 0.4 mA
Fluke 5500A
(5 to 10) kHz 9 mA/A + 0.6 mA
AC Current Multiproduct Calibrator
(2.2 to 11 A)
(45 to 100 Hz) 0.71 mA/A + 0.63 mA
(100 to 500 Hz) 1.2 mA/A + 6.3 mA
500 Hz to 1 kHz 3.9 mA/A + 6.4 mA
1 Source
AC Current (11 to 50) A 6.7 mA/A + 1.4 A Fluke 5500A
Clamp-On Ammeters (50 to 550) A 6.7 mA/A + 1.4 A Multiproduct Calibrator,
45 Hz to 1kHz (550 to 1 000) A 6.7 mA/A + 1.4 A Coil
Up to 11 Ω 0.14 mΩ/Ω + 1 mΩ
(11 to 33) Ω 0.14 Ω/Ω + 1.8 mΩ
(33 to 110) Ω 0.11 mΩ/Ω + 1.8 mΩ
(110 to 330) Ω 0.1 mΩ/Ω + 1.8 mΩ
330 Ω to 1.1 kΩ 0.1 mΩ/Ω + 7 mΩ
(1.1 to 3.3) kΩ 0.1 mΩ/Ω + 8 mΩ
(3.3 to 11) kΩ 0.1 mΩ/Ω + 70 mΩ
1 Source (11 to 33) kΩ 0.1 mΩ/Ω + 70 mΩ Fluke 5500A
Resistance (33 to 110) kΩ 0.13 mΩ/Ω + 0.7 Ω Multiproduct Calibrator
(110 to 330) kΩ 0.14 mΩ/Ω + 7.5 Ω
330kΩ to 1.1 MΩ 0.17 mΩ/Ω + 64 Ω
(1.1 to 3.3) MΩ 0.18 mΩ/Ω + 72 Ω
(3.3 to 11) MΩ 0.7 mΩ/Ω + 0.78 kΩ
(11 to 33) MΩ 1.2 mΩ/Ω + 1.7 kΩ
(33 to 110) MΩ 5.8 mΩ/Ω + 7 kΩ
(110 to 330) MΩ 5.8 mΩ/Ω + 0.2 MΩ
(0.1 to 1) Ω 29 mΩ
(1 to 10) Ω 29 mΩ
(10 to 100) Ω 29 mΩ
1 Source (100 to 1000) Ω 0.12 Ω
Yokogawa 2793-01 / Time
(1 to 10) kΩ 29 Ω
Resistance 1040
(10 to 100) kΩ 0.1 kΩ
100 kΩ to 1 MΩ 1 kΩ
(1 to 10) MΩ 28 kΩ
(10 to 99.99) MΩ 0.12 MΩ

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Electrical – DC/Low Frequency
Reference Standard,
Expanded Uncertainty of
Parameter / Equipment Range Method and/or
Measurement (+/-)
Equipment
(90 to 329.99) mA
90 W 0.29 mW/W + 58 mW
150 W 0.29 mW/W + 76 mW
330 W 0.29 mW/W + 76 mW
1 Source (0.90 to 2.1999) A
900 W 0.26 mW/W + 0.58 W Fluke 5500A
DC Power
1 100 W 0.26 mW/W + 0.76 W Multiproduct Calibrator
33 mV to 1 020 V
2 200 W 0.26 mW/W + 0.76 W
(4.5 to 11) A
2 000 W 0.81 mW/W + 0.71 W
5 000 W 0.81 mW/W + 0.76 W
10 000 W 0.81 mW/W + 0.76 W
1 Source (11 to 500) A
Fluke 5500A
(11 to 510) kW 60 µW/W + 0.73 W
DC Power Multiproduct Calibrator,
(500 to 1 000) A
33 mV to 1 020 V 50-turn Coil
(510 to 1 020) kW 60 µW + 0.88 W
(3.3 to 8.999) mA
1W 1.8 mW/W + 7.1 mW
5W 1.8 mW/W + 7.6 mW
9W 1.8 mW/W + 7.6 mW
(9 to 3.999) mA
3.3 W 1.8 mW/W + 7.1 mW
15 W 1.8 mW/W + 7.6 mW
33 W 1.8 mW/W + 7.6 mW
(33 to 89.99) mA
9W 1.8 mW/W + 7.1 mW
1 Source AC Power 45 W 1.8 mW/W + 7.6 mW
(45 to 65) Hz, 90 W 1.8 mW/W + 7.6 mW Fluke 5500A
330 mV to 1020 V (90 to 329.99) mA Multiproduct Calibrator
@PF = 1 33 W 1.8 mW/W + 71 mW
150 W 1.8 mW/W + 76 mW
330 W 1.8 mW/W + 76 mW
(0.33 to 0.899 9) A
90 W 1.8 mW/W + 76 mW
450 W 1.8 mW/W + 76 mW
900 W 1.8 mW/W + 76 mW
(0.9 to 2.199 9) A
220 W 1.9 mW/W + 0.76 W
1 000 W 1.9 mW/W + 0.76 W
2 200 W 1.9 mW/W + 0.76 W

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Electrical – DC/Low Frequency
Reference Standard,
Expanded Uncertainty of
Parameter / Equipment Range Method and/or
Measurement (+/-)
Equipment
1 Source AC Power (2.2 to 4.499 9) A
(45 to 65) Hz, 450 W 1.9 mW/W + 0.71 W Fluke 5500A
330 mV to 1020 V 2 000 W 1.9 mW/W + 0.76 W Multiproduct Calibrator
@PF = 1 4 500 W 1.9 mW/W + 0.76 W
1 Source
(4.5 to 11) A
AC Power 2000 W 1.9 mW/W + 0.76 W Fluke 5500A
(45 to 65) Hz,
5 000 W 1.9 mW/W + 0.76 W Multiproduct Calibrator
330 mV to 1020 V
11 000W 1.9 mW/W + 0.76 W
@PF = 1
1 Source AC Power (11 to 500) A
Fluke 5500A
(45 to 65) Hz, (11 to 510) kW 2 mW/W + 0.8 W
Multiproduct Calibrator,
330 mV to 1020 V (500 to 1 000) A
50-turn Coil
@PF = 1 (510 to 1 020) kW 1.9 mW/W + 1.3 W
1 Source Capacitance

50 Hz to 10 kHz (0.33 to 0.499 9) nF 5.9 mF/F + 12 pF


50 Hz to 10 kHz (1.1 to 3.299 9) nF 7.4 mF/F + 14 pF
50 Hz to 10 kHz (3.3 to 10.999) nF 5.9 mF/F + 13 pF
50 Hz to 10 kHz (11 to 32.999) nF 3 mF/F + 59 pF
50 Hz to 10 kHz (33 to 109.99) nF 3 mF/F + 130 nF
50 Hz to 10 kHz (110 to 329.99) nF 3 mF/F + 0.59 nF Fluke 5500A
50 Hz to 5 kHz (0.33 to 1.099 9) μF 3 mF/F + 1.4 nF Multiproduct Calibrator
50 Hz to 2 kHz (1.1 to 3.299 9) μF 4.2 mF/F + 6.8 nF
50 Hz to 1.5 kHz (3.3 to 10.999) μF 4.1 mF/F + 13 nF
(50 to 800) Hz (11 to 32.999) μF 4.7 mF/F + 68 nF
(50 to 400) Hz (33 to 109.99) μF 5.9 mF/F + 0.13 µF
(50 to 200) Hz (110 to 329.99) μF 8.2 mF/F + 0.68 µF
(50 to 150) Hz 330 μF to 1.1 mF 12 mF/F + 0.7 µF
Type K
(-200 to -100) °C 0.44 °C
(-100 to -25) °C 0.37 °C
1 Source Electrical Simulation (-25 to 120) °C 0.37 °C
of Thermocouple (120 to 1 000) °C 0.35 °C
Fluke 5500A
Indicating Devices (1 000 to 1 372) °C 0.35 °C
(Without Cold Junction Type T Multiproduct Calibrator
Compensation) (-250 to -150) °C 0.44 °C
(-150 to 0) °C 0.35 °C
(0 to 120) °C 0.35 °C
(120 to 400) °C 0.35 °C

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Electrical – DC/Low Frequency
Reference Standard,
Expanded Uncertainty of
Parameter / Equipment Range Method and/or
Measurement (+/-)
Equipment
Type J
(-210 to -100) °C 0.35 °C
(-100 to -30) °C 0.34 °C
(-30 to 150) °C 0.34 °C
(150 to 760) °C 0.34 °C
(760 to 1 200) °C 0.34 °C
1 Source Electrical Simulation Type E

of Thermocouple (-250 to -100) °C 0.56 °C Fluke 5500A


Indicating Devices (-100 to -25) °C 0.51 °C
Multiproduct Calibrator
(Without Cold Junction (-25 to 350) °C 0.5 °C
Compensation) (350 to 650) °C 0.5 °C
(650 to 1 000) °C 0.5 °C
Type R, S
(0 to 250) °C 0.5 °C
(250 to 400) °C 0.5 °C
(400 to 1 000) °C 0.49 °C
(1 000 to 1 767) °C 0.5 °C
Pt385 (100 Ω)
(-200 to -80) °C 0.082 °C
1 Source Electrical Simulation (-80 to 0) °C 0.082 °C
(0 to 100) °C 0.1 °C Fluke 5500A
of RTD
Indicating Devices (100 to 300) °C 0.11 °C Multiproduct Calibrator
(300 to 400) °C 0.12 °C
(400 to 630) °C 0.13 °C
(630 to 800) °C 0.25 °C
Type K
(-200 to -100) °C 0.44 °C
(-100 to -25) °C 0.37 °C
1 Measure Electrical (-25 to 120) °C 0.37 °C
Simulation of Thermocouple (120 to 1 000) °C 0.35 °C
Indicating Devices Agilent 3458A Opt 002
(1 000 to 1 372) °C 0.35 °C
8.5 Digit Multimeter
(Without Cold Junction Type T
Compensation) (-250 to -150) °C 0.44 °C
(-150 to 0) °C 0.35 °C
(0 to 120) °C 0.35 °C
(120 to 400) °C 0.35 °C

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Electrical – DC/Low Frequency
Reference Standard,
Expanded Uncertainty of
Parameter / Equipment Range Method and/or
Measurement (+/-)
Equipment
Type J
(-210 to -100) °C 0.35 °C
(-100 to -30) °C 0.34 °C
(-30 to 150) °C 0.34 °C
(150 to 760) °C 0.34 °C
(760 to 1 200) °C 0.34 °C
1 Measure Electrical Type E
Simulation of Thermocouple (-250 to -100) °C 0.56 °C Agilent 3458A Opt 002
Indicating Devices (-100 to -25) °C 0.51 °C
8.5 Digit Multimeter
(Without Cold Junction (-25 to 350) °C 0.5 °C
Compensation) (350 to 650) °C 0.5 °C
(650 to 1 000) °C 0.5 °C
Type R, S
(0 to 250) °C 0.5 °C
(250 to 400) °C 0.5 °C
(400 to 1 000) °C 0.49 °C
(1 000 to 1 767) °C 0.5 °C
PT385 (100Ω)
1 Measure Electrical (-200 to -80) °C 0.082 °C
(-80 to 0) °C 0.082 °C
Simulation of RTD Indicating
(0 to 100) °C 0.1 °C Agilent 3458A Opt 002
Devices
(Without Cold Junction (100 to 300) °C 0.11 °C 8.5 Digit Multimeter
(300 to 400) °C 0.12 °C
Compensation)
(400 to 630) °C 0.13 °C
(630 to 800) °C 0.25 °C
1 Source 35 mV to 5 V
HP 33120A
< 100 kHz to 1 MHz 1.5 % of reading + 2 mV
AC Voltage Wide Band Function Generator
(1 to 15) MHz 2 % of reading + 2 mV
(1 to 10) µH 0.29 μH
(10 to 100) µH 2.9 μH
1 Source 100µH to 1 mH 29 μH
MCP BXL-70
Inductance (1 to 10) mH 0.29 mH
Decade Inductor
≤ 1kHz (10 to 100) mH 2.9 mH
100 mH to 1H 29 mH
(1 to 10) H 0.29 H
Up to 100 mV 11 µV/V + 0.78 µV
1 Measure 100 mV to 1 V 9.4 µV/V + 3.6 µV
Agilent 3458A Opt 002
(1 to 10) V 9.4 µV/V + 8.2 µV
DC Voltage 8.5 Digit Multimeter
(10 to 100) V 12 µV/V + 58 µV
100 V to 1 kV 12 µV/V + 0.59 mV

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Electrical – DC/Low Frequency
Reference Standard,
Expanded Uncertainty of
Parameter / Equipment Range Method and/or
Measurement (+/-)
Equipment
Up to 1 000 V 4.5 V
(1 000 to 2 000) V 8.5 V
1 Measure (2 000 to 3 000) V 13 V Kikusui 149-10A
DC High Voltage (3 000 to 4 000) V 17 V Voltmeter
(4 000 to 5 000) V 21 V
(5 000 to 6 000) V 25 V
(6 000 to 7 000) V 13 V
1 Measure (7 000 to 8 000) V 17 V Kikusui 149-10A
DC High Voltage (8 000 to 9 000) V 21 V Voltmeter
(9 000 to 10 000) V 25 V
(1 to 4) kV 0.031 kV
(4 to 8) kV 0.095 kV
Agilent 3458A Opt 002
1 Measure (8 to 12) kV 0.19 kV
8.5 Digit Multimeter,
(12 to 16) kV 0.38 kV
DC High Voltage (16 to 20) kV 0.48 kV Fluke 80K-40
High Voltage Probe
(20 to 30) kV 0.72 kV
(30 to 40) kV 0.95 kV
Up to 100 nA 40 nA/A + 6 pA
100 nA to 1 µA 30 nA/A + 6 pA
(1 to 10) µA 30 nA/A + 6 pA
(10 to 100) µA 20 µA/A + 0.6 nA Agilent 3458A Opt 002
1 Measure 100 µA to 1 mA 30 µA/A + 5.8 nA 8.5 Digit Multimeter
(1 to 10) mA 30 µA/A + 58 nA
DC Current (10 to 100) mA 50 µA/ A + 0.6 µA
100 mA to 1 A 0.13 mA/A + 13 µA
Agilent 3458A Opt 002
Up to 75 A 40 µA/A + 13 mA 8.5 Digit Multimeter,
(75 to 1 000) A 40 µA/A + 13 mA
Yokogawa 2215-10 Shunt
(1 to 10) mV
(1 to 40) Hz 90 µV/V + 3.6 µV
1 Measure 40 Hz to 1 kHz 80 µV/V + 1.4 µV
HP 3458A Opt 002
(1 to 20) kHz 90 µV/V + 1.4 µV
AC Voltage 8.5 Digit Multimeter
(20 to 50) kHz 0.14 mV/V + 1.4 µV
(50 to 100) kHz 0.59 mV/V + 1.4 µV
(100 to 300) kHz 4.6 mV/V + 2.4 µV

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Electrical – DC/Low Frequency
Reference Standard,
Expanded Uncertainty of
Parameter / Equipment Range Method and/or
Measurement (+/-)
Equipment
100 mV to 10 V
(1 to 40) Hz 80 µV/V + 23.2 µV
40 Hz to 1 kHz 80 µV/V + 23.2 µV
(1 to 20) kHz 80 µV/V + 23.2 µV
(20 to 50) kHz 90 µV/V + 23.2 µV
(50 to 100) kHz 0.12 mV/V + 23.2 µV
(100 to 300) kHz 0.36 mV/V + 28.9 µV
300 kHz to 1 MHz 1.2 mV/V + 28.9 µV
(1 to 2) MHz 1.7 mV/V + 28.9 µV
(10 to 100) V
1 Measure (1 to 40) Hz 30 µV/V + 4.7 µV
Agilent 3458A Opt 002
40 Hz to 1 kHz 30 µV/V + 2.4 µV
AC Voltage 8.5 Digit Multimeter
(1 to 20) kHz 30 µV/V + 2.4 µV
(20 to 50) kHz 50 µV/V + 2.4 µV
(50 to 100) kHz 0.14 mV/V + 2.4 µV
(100 to 300) kHz 0.47 mV/V + 12 µV
300 kHz to 1 MHz 1.7 mV/V + 12 µV
100 V to 1 kV
(1 to 40) Hz 50 µV/V + 24 mV
40 Hz to 1 kHz 50 µV/V + 13 mV
(1 to 20) kHz 70 µV/V + 13 mV
(20 to 50) kHz 0.14 mV/V + 13 mV
(50 to 100) kHz 0.35 mV/V + 13 mV
Up to 1 000 V 2.6 V
(1 000 to 2 000) V 4.9 V
(2 000 to 3 000) V 7.1 V
(3 000 to 4 000) V 9.4 V
1 Measure (4 000 to 5 000) V 12 V Kikusui 149-10A
AC High Voltage (5 000 to 6 000) V 14 V Voltmeter
(6 000 to 7 000) V 13 V
(7 000 to 8 000) V 17 V
(8 000 to 9 000) V 21 V
(9 000 to 10 000) V 25 V
(1 to 4) kV 59 V
(4 to 8) kV 0.23 kV
1 Measure (8 to 12) kV 0.46 kV Agilent 3458A Opt 002
(12 to 14) kV 0.81 kV 8.5 Digit Multimeter,
AC High Voltage
(14 to 16) kV 0.92 kV Fluke 80K-40
(50 to 60) Hz
(16 to 20) kV 1.2 kV High Voltage Probe
(20 to 30) kV 1.7 kV
(30 to 40) kV 2.3 kV

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Page 11 of 32
Electrical – DC/Low Frequency
Reference Standard,
Expanded Uncertainty of
Parameter / Equipment Range Method and/or
Measurement (+/-)
Equipment
Up to 100 µA
1 Measure (10 to 20) Hz 0.47 mA/A + 36 nA
(20 to 45) Hz 0.18 mA/A + 36 nA Agilent 3458A Opt 002
AC Current 8.5 Digit Multimeter
(45 to 100) Hz 0.07 mA/A + 36 nA
100 Hz to 1 kHz 0.07 mA/A + 36 nA
100 µA to 100 mA
(10 to 20) Hz 0.47 mA/A + 36 µA
(20 to 45) Hz 0.18 mA/A + 24 µA
(45 to 100) Hz 0.07 mA/A + 24 µA
100 Hz to 5 kHz 0.04 mA/A + 24 µA
(5 to 20) kHz 0.07 mA/A + 24 µA
1 Measure (20 to 50) kHz 0.47 mA/A + 47 µA
Agilent 3458A Opt 002
(50 to 100) kHz 0.64 mA/A + 0.17 mA
AC Current 8.5 Digit Multimeter
100 mA to 1 A
(10 to 20) Hz 0.47 mA/A + 0.24 mA
(20 to 45) Hz 0.19 mA/A + 0.24 mA
(45 to 100) Hz 0.1 mA/A + 0.24 mA
100 Hz to 5 kHz 0.2 mA/A + 0.24 mA
(5 to 20) kHz 0.35 mA/A + 0.24 mA
(20 to 50) kHz 1.2 mA/A + 0.47 mA
Agilent 3458A Opt 002
1 Measure (1 to 30) A
8.5 Digit Multimeter,
(50 to 60) Hz 10 µA/A + 10 µA
AC Current Agilent 34330A
(1 to 5) kHz 0.1 mA/A + 0.24 mA
Current Shunt
Agilent 3458A Opt 002
1 Measure 8.5 Digit Multimeter,
(0.1 to 50) mA 10 µA/A + 26 µA
AC Cutoff Current Fluke 289
(50 to 100) mA 10 µA/A + 63 µA
(50 to 60) Hz Digital Multimeter,
Resistance Box 83903
Up to 10 Ω 18 µΩ/Ω + 13 µΩ
(10 to 100) Ω 14 µΩ/Ω + 0.7 mΩ
(100 to 1 000) Ω 12 µΩ/Ω + 1.2 mΩ
(1 to 10) kΩ 12 µΩ/Ω + 12 mΩ
Agilent 3458A Opt 002
1 Measure Resistance (10 to 100) kΩ 12 µΩ/Ω + 0.13 Ω
8.5 Digit Multimeter
(0.1 to 1) MΩ 18 µΩ/Ω + 2.6 Ω
(1 to 10) MΩ 58 µΩ/Ω + 0.12 kΩ
(10 to 100) MΩ 0.58 mΩ/Ω + 12 kΩ
(0.1 to 1) GΩ 5.8 mΩ/Ω + 1.2 MΩ

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Electrical – DC/Low Frequency
Reference Standard,
Expanded Uncertainty of
Parameter / Equipment Range Method and/or
Measurement (+/-)
Equipment
1 pF 1.2 fF
Hewlett Packard 16380A
10 pF 12 fF
1 Source Capacitance 100 pF 0.12 pF Air Capacitor Set
consisting of 16381A,
@ 1 kHz 1 000 pF 1.2 pF
16382A, 16383A, and
10 nF 5.8 pF
16384A
100 nF 58 pF
1 Source Capacitance
Hewlett Packard 16380A
Algorithmic Deviation
Air Capacitor Set
(1 to 3) MHz 1 pF 1.2 fF
consisting of 16381A,
(1 to 13) MHz 10 pF 12 fF
16382A, 16383A, and
(1 to 13) MHz 100 pF 0.12 pF
(1 to 13) MHz 1 000 pF 1.2 pF 16384A
High Voltage Resistors
1 kΩ 2.9 Ω 3 RLAB HTE39
1 Measure 10 kΩ 29 Ω 3 RLAB HTE39
100 kΩ 0.29 kΩ 3 RLAB HTE52
Insulation
1 MΩ 2.9 kΩ 3 RLAB HTE39
(DC Voltage)
10 MΩ 29 kΩ 3 RLAB HTE39
100 V to 5 kV
100 MΩ 0.29 MΩ 3 RLAB HTE52
1 GΩ 5.8 MΩ 3 RLAB HTE72
10 GΩ 58 MΩ 3 RLAB HTE76
1 Measure 1 MΩ 6 mΩ/Ω + 59 kΩ
Surface resistivity / 5 MΩ 6 mΩ/Ω + 90 kΩ
3 RLAB
10 MΩ 6 mΩ/Ω + 0.82 MΩ
Resistance Meter / High Voltage Resistors,
20 MΩ 6 mΩ/Ω + 0.82 MΩ
Electrostatic Resistance Time Electronics 1040
50 MΩ 6 mΩ/Ω + 0.82 MΩ
(DC Voltage) Resistance Box
1 GΩ 6 mΩ/Ω + 8.2 MΩ
Up to 100 V
10 GΩ 6 mΩ/Ω + 82 MΩ
1 Measure Earth Ground 0.1 Ω 0.002 9 Ω
Continuity / Ground Bond 0.2 Ω 0.002 9Ω Standard Resistors
(Test Current max 30 A) 0.5 Ω 0.002 9 Ω
1 kΩ 12 µΩ/Ω + 1.2 mΩ
10 kΩ 14 µΩ/Ω + 1 mΩ
Fluke 5500A
1 Measure 100 kΩ 12 µΩ/Ω + 0.13 Ω
Multiproduct Calibrator,
Resistance Meter / 1 MΩ 12 µΩ/Ω + 1.2 Ω Chroma 19052
Electrostatic Resistance 10 MΩ 0.12 kΩ
Hipot Tester,
(DC Voltage) 100 MΩ 12 kΩ
Agilent 3458A Opt 002
Up to 5 kV 1 GΩ 1.2 MΩ
8.5 Digit Multimeter
10 GΩ 1.2 MΩ
20 GΩ 1.2 MΩ

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Electrical – DC/Low Frequency
Reference Standard,
Expanded Uncertainty of
Parameter / Equipment Range Method and/or
Measurement (+/-)
Equipment
Up to 10 G 0.59 G
1 Magnetic (10 to 500) G 0.6 G
North and South (500 to 1 000) G 0.6 G Standard Magnet
(1 000 to 15 000) G 4.5 G
1 Measure Winding and Tektronix P6015A
Up to 20 kV
Impulse-Surge Tester DC to 1 MHz 0.69 kV High Voltage Probe,
(DC High Voltage) Oscilloscope

Electrical - RF/Microwave
Reference Standard,
Expanded Uncertainty of
Parameter / Equipment Range Method and/or
Measurement (+/-)
Equipment
1 Measure

Amplitude Modulation
Rate: 50 Hz to 10 kHz,
HP 8902A
(5 to 99) % Depth 150 kHz to 10 MHz 2 % Depth + 1 Digit
Measuring Receiver
50 Hz to 100 kHz,
(20 to 99) % 10 MHz to 1.3 GHz 1 % Depth + 1 Digit
HP 8902A
1 Measure Measuring Receiver,
HP 11722A
RF Tuned Power 150 kHz to 1.3 GHz 0.02 dB + 0.02 dB/10 dB Step
Power Sensor,
(0 to 139) dB 100 kHz to 2.6 GHz 0.02 dB + 0.02 dB/10 dB Step
HP 8591E
Spectrum Analyzer
1 Measure

Frequency Modulation
250 kHz to 10 MHz Rate: 20 Hz to 10 kHz HP 8902A
Dev:20 Hz to 40 kHz peak 0.23 kHz + 1 Digit
Measuring Receiver
10 MHz to 1.3 GHz Rate: 50 Hz to 200 kHz
Dev:250 Hz to 400 kHz peak 1.2 kHz + 1 Digit
1 Measure

Phase Modulation
150 kHz to 10 MHz > 0.7 rad Dev. 0.1 % of reading + 0.03 rad HP 8902A
10 MHz to 1.3 GHz > 0.6 rad Dev. 0.1 % of reading + 0.03 rad Measuring Receiver
150 kHz to 10 MHz Rate: 200 Hz to 10 kHz 4 % of reading + 1 Digit
10 MHz to 1.3 GHz Rate :200 Hz to 20 kHz 3 % of reading + 1 Digit

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Electrical - RF/Microwave
Reference Standard,
Expanded Uncertainty of
Parameter / Equipment Range Method and/or
Measurement (+/-)
Equipment
1 Measure

Distortion (-80 to 0) dB HP 8903B


Rate: 20 Hz to 100 kHz 20 Hz to 20 kHz 1.2 dB Audio Analyzer
(0.001 to 100) % (20 to 100) kHz 2.3 dB
1 Measure
HP 8902A
Flatness
Measuring Receiver,
Rate: 90 Hz to 10 kHz 10 MHz to 1.3 GHz 70 Hz + 1 Digit
HP 11722A Power Sensor
(20 to 80) %
1 Source
IFR 2023B
Frequency Level Units
Signal Generator
Rate: (-140 to 13) dBm 9 kHz to 2.05 GHz 0.06 dB
HP 8902A
1,2 Source Measuring Receiver,
Power 1 mW Reference 0 dBm 1.2 % of reading HP 11722A
Power Sensor
1 Source
IFR 2023B
Frequency Modulation Rate: DC to 30 kHz 2.8 kHz
Signal Generator
9 kHz to 2.05 GHz Rate: 1kHz to 120 kHz 2.8 kHz
1 Source
Rate: 9 MHz to 2.05 GHz, IFR 2023B
Amplitude Modulation
(0 to 99.9) % Depth 1.5 % Depth Signal Generator
DC to 30 kHz
1 Source
Rate: 100 Hz to 10 kHz IFR 2023B
Phase Modulation
Rate: (0 to 90) rad 0.23 rad Signal Generator
9 kHz to 2.05 GHz
1 Source Rate: 1 kHz Rate
Frequency Modulation Max. Dev. 10 kHz 3.6 kHz
9 kHz to 2.05 GHz Max. Dev. 40 kHz 3.6 kHz IFR 2023B
Max. Dev. 80 kHz 3.6 kHz Signal Generator
Max. Dev. 3.2 MHz 3.6 kHz
Max. Dev. 12.8 MHz 3.6 kHz

Length – Dimensional Metrology


Reference Standard,
Expanded Uncertainty of
Parameter / Equipment Range Method and/or
Measurement (+/-)
Equipment
(0.1 to 0.4) mm 89 nm Calibration Method by
(0.5 to 25) mm 75 nm Comparison with Standard
Gauge Blocks (> 25 to 50) mm 77 nm Gauge Block based on ISO
(> 50 to 75) mm 79 nm 3650: 1998 and JIS B
(> 75 to 100) mm 84 nm 7506: 1997.

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Length – Dimensional Metrology
Reference Standard,
Expanded Uncertainty of
Parameter / Equipment Range Method and/or
Measurement (+/-)
Equipment
Up to 125 mm 94 nm
(125 to 150) mm 0.1 µm
(150 to 175) mm 0.11 µm Calibration Method by
Comparison with Standard
(175 to 200) mm 0.12 µm
Long Length Gauge Blocks Gauge Block, based on
(200 to 250) mm 0.14 µm
ISO 3650: 1998 and JIS B
(250 to 300) mm 0.16 µm
7506: 1997.
(300 to 400) mm 0.2 µm
(400 to 500) mm 0.25 µm
Calibration Method by
Comparison with Standard
Gauge Block Comparators Up to 100 mm 37 nm Gauge Block and
according to
EURAMET cg-02 v0.2.
Calibration Method by
Comparison with Master
Optical Flats Flat with a
Flatness Up to 10 µm 58 nm
Diameter ≤ 60 mm Monochromatic Light
Source according to
JIS B 7430: 1977.
Optical Parallels Calibration Method by
Diameter ≥ 60 mm, Comparison with Master
Up to 200 mm Flat with a
Flatness Up to 10 µm 58 nm Monochromatic Light
Source, Gauge Block
Parallelism Up to 10 µm 13 nm Comparator and
Micrometer Caliper
Thickness (12 to 12.37) mm 2.4 µm according to
JIS B 7431:1977.
Calibration Method by
Glass Hemispheres Roundness Up to 50 µm 55 nm Direct measurement with
Roundness Tester.
Calibration Method by
Surface Roughness
Up to 15 µm 63 nm Direct measurement with
Specimens
Roughness Tester.
Up to 0.5 mm 0.46 µm
(> 0.5 to 1) mm 0.48 µm Calibration Method by
Thickness Foils (> 1 to 5) mm 0.83 µm Direct measurement with
(> 5 to 10) mm 1.5 µm Linear Length Gauge.
(> 10 to 20) mm 2.8 µm

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Length – Dimensional Metrology
Reference Standard,
Expanded Uncertainty of
Parameter / Equipment Range Method and/or
Measurement (+/-)
Equipment
Up to 150 mm 6.1 µm
(>150 to 200) mm 6.4 µm
1 Caliper (> 200 to 300) mm 7 µm Comparison to
(> 300 to 400) mm 7.9 µm Gauge Block Set
(> 400 to 500) mm 8.8 µm
(> 500 to 600) mm 9.9 µm
Up to 150 mm 6.1 µm
(> 150 to 200) mm 6.4 µm
1 Depth (> 200 to 300) mm 7 µm Comparison to
Gauges
(> 300 to 400) mm 7.9 µm Gauge Block Set
(> 400 to 500) mm 8.8 µm
(> 500 to 600) mm 9.9 µm
Up to 25 mm 0.73 µm
(25 to 50) mm 0.76 µm
(> 50 to 75) mm 0.78 µm
(> 75 to 100) mm 0.8 µm
(> 100 to 125) mm 0.83 µm
(> 125 to 150) mm 0.88 µm
(> 150 to 175) mm 0.93 µm
1 Outside Comparison to
Micrometers (> 175 to 225) mm 1 µm Gauge Block Set
(> 225 to 250) mm 1.1 µm
(> 250 to 325) mm 1.2 µm
(> 325 to 350) mm 1.3 µm
(> 350 to 400) mm 1.4 µm
(> 400 to 425) mm 1.5 µm
(> 425 to 475) mm 1.6 µm
(> 475 to 500) mm 1.7 µm
Up to 25 mm 0.74 µm
1 Depth
(> 25 to 50) mm 0.76 µm Comparison to
Micrometers
(> 50 to 75) mm 0.83 µm Gauge Block Set
(> 75 to 100) mm 0.89 µm
Up to 25 mm 0.74 µm
1 Disk
(> 25 to 50) mm 0.78 µm Comparison to
Micrometers
(> 50 to 75) mm 0.83 µm Gauge Block Set
(> 75 to 100) mm 0.8 µm
Up to 25 mm 0.73 µm
1 Inside
(> 25 to 50) mm 0.76 µm Comparison to
Micrometers
(> 50 to 75) mm 0.78 µm Gauge Block Set
(> 75 to 100) mm 0.8 µm

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Length – Dimensional Metrology
Reference Standard,
Expanded Uncertainty of
Parameter / Equipment Range Method and/or
Measurement (+/-)
Equipment
Up to 25 mm 0.65 µm
1 Dial
Gauge (> 25 to 50) mm 0.89 µm Comparison to
Thickness Gauge (> 50 to 75) mm 1.2 µm Gauge Block Set
(> 75 to 100) mm 1.5 µm
Up to 25 mm 0.5 µm
1 Digital
(> 25 to 50) mm 0.55 µm Comparison to
Linear Gauges
(> 50 to 75) mm 0.63 µm Gauge Block Set
(> 75 to 100) mm 0.72 µm
Up to 25 mm 0.67 µm
1 CaliperGauges (> 25 to 50) mm 0.89 µm Comparison to
(Internal and External) (> 50 to 75) mm 1.2 µm Gauge Block Set
(> 75 to 100) mm 1.5 µm
Up to 150 mm 1.1 µm
(> 150 to 200) mm 1.3 µm
(> 200 to 300) mm 1.8 µm
1 Height (> 300 to 600) mm 3.4 µm Comparison to
Gauges
(> 600 to 700) mm 4 µm Gauge Block Set
(> 700 to 800) mm 4.5 µm
(> 800 to 900) mm 5.1 µm
(> 900 to 1 000) mm 5.6 µm
Up to 150 mm 0.97 µm
(> 150 to 200) mm 1.2 µm
(> 200 to 300) mm 1.7 µm
1 Precision (> 300 to 600) mm 3.3 µm Comparison to
Height Gauges
(> 600 to 700) mm 4 µm Gauge Block Set
(> 700 to 800) mm 4.5 µm
(> 800 to 900) mm 5.1 µm
(> 900 to 1 000) mm 5.6 µm
≤ 1 600 mm x 1 600 mm 1 µm
≤ 1 800 mm x 1 800 mm 1 µm
≤ 2 600 mm x 2 600 mm 1.1 µm Straightedge,
1 Surface Plates ≤ 2 800 mm x 2 800 mm 1.1 µm
Dial Comparator
≤ 3 000 mm x 3 000 mm 1.1 µm
≤ 4 000 mm x 4 000 mm 1.3 µm
≤ 5 000 mm x 5 000 mm 1.6 µm
Rulers Up to 2 000 mm 27 µm Visual Measuring Machine

Radius Gauges (> 0.5 to 100) mm 1.5 µm Visual Measuring Machine

Pitch Gauges (> 0.1 to 10) mm 0.6 µm Visual Measuring Machine

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Length – Dimensional Metrology
Reference Standard,
Expanded Uncertainty of
Parameter / Equipment Range Method and/or
Measurement (+/-)
Equipment
Up to 100 mm (0.6 + 0.018L) µm
1,2 Working (> 100 to 300) mm (0.7 + 0.018L) µm
Standard Scales, (> 300 to 400) mm (0.8 + 0.018L) µm Laser Interferometer
Glass Scales
(> 400 to 500) mm (0.9 + 0.018L) µm
(> 500 to 600) mm (1 + 0.018L) µm
Up to 10) mm 0.46 µm
(> 10 to 50) mm 0.49 µm
(> 50 to 75) mm 0.53 µm
(> 75 to 100) mm 0.57 µm
(> 100 to 150) mm 0.73 µm
(> 150 to 200) mm 0.87 µm
1 Caliper (> 200 to 300) mm 1.2 µm Comparison to
Checker
(> 300 to 400) mm 1.5 µm Gauge Block Set
(> 400 to 500) mm 1.8 µm
(> 500 to 600) mm 2.2 µm
(> 600 to 700) mm 2.4 µm
(> 700 to 800) mm 2.7 µm
(> 800 to 900) mm 2.9 µm
(> 900 to 1 000) mm 3.2 µm
Up to 20 mm 0.64 µm
(> 20 to 25) mm 0.67 µm
1 Ultrasonic (> 25 to 50) mm 0.89 µm Comparison to
Thickness Gages
(> 50 to 75) mm 1.2 µm Gauge Block Set
(> 75 to 100) mm 1.5 µm
(> 100 to 150) mm 2.1 µm
24 µm 0.7 µm
52 µm 0.7 µm
1 Coating Thickness Gauge 129 µm 0.7 µm Thickness Standards
256 µm 0.7 µm
517 µm 0.7 µm
Stage Micrometers, Up to 30 mm 0.6 µm
Visual Measuring Machine
Scale Lupe (> 30 to 100) mm 0.71 µm
Digital Micrometer
1 Shims/Feeler Gages Up to 25 mm 0.7 µm
(High Accuracy)
(> 25 to 125) mm 0.65 µm
1 Micrometer Standards, (> 125 to 200) mm 0.87 µm Gauge Block Set,
Length Gauges (> 200 to 400) mm 1.5 µm Dial Comparator
(> 400 to 500) mm 1.8 µm

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Length – Dimensional Metrology
Reference Standard,
Expanded Uncertainty of
Parameter / Equipment Range Method and/or
Measurement (+/-)
Equipment
Up to 25 mm 0.45 µm
(> 25 to 50) mm 0.47 µm
1 Length Measuring Machine (> 50 to 75) mm 0.49 µm Comparison to Master
(> 75 to 100) mm 0.53 µm Gauge Block Set
(> 100 to 200) mm 0.76 µm
(> 200 to 300) mm 1.8 µm
(> 25 to 125) mm 0.65 µm
1 Industrial Length (> 125 to 200) mm 0.87 µm
Comparison to Master
Measurement Standards (> 200 to 400) mm 1.5 µm
Gauge Block Set
(Length Bars, Wires, Cables) (> 400 to 500) mm 1.8 µm
(> 500 to 600) mm 2.2 µm
(>0.05 to 10) mm 0.6 µm
Test Sieves (>10 to 25) mm 0.7 µm Visual Measuring Machine
(>25 to 50) mm 1 µm
X Axis, Y Axis
Up to 50 mm 0.6 µm
(> 50 to 100) mm 0.61 µm
(> 100 to 150) mm 0.71 µm
1 Measuring Microscopes (> 150 to 200) mm 0.81 µm Standard Scale
(> 200 to 300) mm 0.73 µm
(> 300 to 350) mm 0.84 µm
(> 350 to 400) mm 0.85 µm
(> 400 to 500) mm 0.96 µm
X Axis, Y Axis
Up to 50 mm 0.6 µm
(> 50 to 100) mm 0.61 µm
(> 100 to 150) mm 0.71 µm
1 Profile Projector (> 150 to 200) mm 0.72 µm Standard Scale
(> 200 to 300) mm 0.73 µm
(> 300 to 350) mm 0.84 µm
(> 350 to 400) mm 0.85 µm
(> 400 to 500) mm 0.96 µm
1 Can Seam Micrometer Up to 13 mm 0.73 µm Gauge Blocks
2 Protractors (0.1 to 360) ° 18ʺ Visual Measuring Machine
Up to 100 mm 1.5 µm
Inclinometer Length (> 100 to 200) mm 2.8 µm Visual Measuring Machine
(> 200 to 300) mm 4.1 µm
2 Inclinometer Angle Up to 360 ° 18ʺ Digital Angle Protractors

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Length – Dimensional Metrology
Reference Standard,
Expanded Uncertainty of
Parameter / Equipment Range Method and/or
Measurement (+/-)
Equipment
2.95 µm Ra 53 nm
1 Roughness 3.05 µm Ra 53 nm
Testers Roughness Standards
9.5 µm Rz 0.45 µm
9.7 µm Rz 0.47 µm
Glass
1 Roundness Testers Up to 1 000 µm 90 nm
Hemisphere Standard
1 Dial Gauge Up to 25 mm 1 µm Calibration Tester
1 Dial Test Indicator Up to 1 mm 0.59 µm Calibration Tester
Up to 10 µm 0.006 µm
1 Air (> 10 to 100) µm 0.006 µm
Micrometer Calibration Tester
(> 100 to 1 000) µm 0.059 µm
(> 1 000 to 10 000) µm 0.14 µm
1 Plain
Plug Gauge, (0.1 to 3) mm 0.5 µm
Pin Gauges, (3 to 5) mm 0.51 µm Laser Scan
Three Wires, (5 to 10) mm 0.52 µm (Diameter)
T-probe (10 to 15) mm 0.54 µm
Up to 25 mm 0.45 µm
(25 to 50) mm 0.47 µm
(50 to 75) mm 0.49 µm Comparison to Master
1 Universal Length Machine (75 to 100) mm 0.53 µm
Gauge Block Set
(100 to 200) mm 0.76 µm
(200 to 300) mm 1 µm
(300 to 600) mm 1.8 µm
Up to 15 mm 0.48 µm
(15 to 25) mm 0.5 µm
(25 to 50) mm 0.55 µm
(50 to 75) mm 0.63 µm Comparison to
1 Height Master (75 to 100) mm 0.72 µm
Gauge Blocks
(100 to 150) mm 0.97 µm
(150 to 200) mm 1.2 µm
(200 to 300) mm 1.7 µm
(300 to 600) mm 3.3 µm

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Length – Dimensional Metrology
Reference Standard,
Expanded Uncertainty of
Parameter / Equipment Range Method and/or
Measurement (+/-)
Equipment
Up to 25 mm 33 nm
(25 to 50) mm 66 nm
(50 to 75) mm 0.1 µm
(75 to 100) mm 0.13 µm
1 Universal Length Machine (100 to 200) mm 0.27 µm Laser Interferometer
(200 to 300) mm 0.4 µm
(300 to 600) mm 0.8 µm
(600 to 800) mm 1.1 µm
(800 to 1 000) mm 1.3 µm
Up to 50 mm 66 nm
(50 to 100) mm 85 nm
(100 to 200) mm 0.14 µm
(200 to 300) mm 0.2 µm
1 LinearMeasurement (300 to 400) mm 0.26 µm
Laser Interferometer
Axis (X, Y, Z) (400 to 500) mm 0.32 µm
(500 to 600) mm 0.38 µm
(600 to 700) mm 0.44 µm
(700 to 800) mm 0.5 µm
(800 to 900) mm 0.57 µm
(900 to 1 000) mm 0.63 µm
(1 000 to 1 500) mm 0.94 µm
(1 500 to 2 000) mm 1.3 µm
1 Linear (2 000 to 2 500) mm 1.6 µm
Measurement
(2 500 to 3 000) mm 1.9 µm Laser Interferometer
Axis (X, Y, Z)
(3 000 to 3 500) mm 2.2 µm
(3 500 to 4 000) mm 2.5 µm
(4 000 to 4 500) mm 2.8 µm
(4 500 to 5 000) mm 3.1 µm
Up to 100 mm 1 µm
(100 to 200) mm 3 µm
(100 to 300) mm 4 µm
(100 to 400) mm 5 µm
Steel Tape, (100 to 500) mm 7 µm
Visual Measuring Machine
Textile Tape (100 to 600) mm 8 µm
(100 to 700) mm 9 µm
(100 to 800) mm 11 µm
(100 to 900) mm 12 µm
(100 to 1 000) mm 13 µm

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Length – Dimensional Metrology
Reference Standard,
Expanded Uncertainty of
Parameter / Equipment Range Method and/or
Measurement (+/-)
Equipment
(100 to 1 500) mm 20 µm
(100 to 2 000) mm 27 µm
(100 to 3 000) mm 40 µm
Steel Tape, (100 to 6 000) mm 80 µm
Visual Measuring Machine
Textile Tape (100 to 8 000) mm 0.11 mm
(100 to 30 000) mm 0.4 mm
(100 to 40 000) mm 0.53 mm
(100 to 50 000) mm 0.66 mm
Slope/Length Digital Dial Indicator,
Precision Level
(0 to 0.24) mm/m 3.4 µm/m Small Angle Generator
X Axis, Z Axis
Up to 2 mm 0.58 µm
(2 to 5) mm 0.59 µm
1 Contour (5 to 10) mm 0.6 µm
Measurement Gauge Blocks,
(10 to 20) mm 0.64 µm
Machine Pin Gauges
(20 to 50) mm 0.89 µm
(50 to 100) mm 1.5 µm
Radius
Up to 5 mm 0.79 µm
Up to 1 mm 58 nm
1 Calibration Laser Interferometer,
Tester Up to 25 mm 58 nm
Optical Flats
Up to 100 mm 59 nm
(3 to 20) mm 0.9 µm
(20 to 50) mm 1 µm
1 Holtest Comparison to
(50 to 70) mm 1 µm
Ring Gauges
(70 to 80) mm 1 µm
(80 to 125) mm 2 µm
(1 to 25) mm 1.5 µm
(> 25 to 50) mm 1.6 µm Standard Micrometer,
Thread Plug Gauges
(> 50 to 75) mm 1.7 µm Three Wire Set
(> 75 to 100) mm 1.8 µm

Mass and Mass Related


Reference Standard,
Expanded Uncertainty of
Parameter / Equipment Range Method and/or
Measurement (+/-)
Equipment
1 mg 13 µg
2 mg 13 µg Electronic Balances,
Mass Determination
5 mg 13 µg Master Weights
10 mg 13 µg

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Mass and Mass Related
Reference Standard,
Expanded Uncertainty of
Parameter / Equipment Range Method and/or
Measurement (+/-)
Equipment
20 mg 14 µg
50 mg 14 µg
100 mg 15 µg
200 mg 16 µg
500 mg 18 µg
1g 0.12 mg
2g 0.12 mg
5g 0.12 mg
10 g 0.12 mg
Electronic Balances,
Mass Determination 20 g 0.13 mg
Master Weights
50 g 0.14 mg
100 g 0.2 mg
200 g 0.31 mg
500 g 0.4 mg
1 kg 0.71 mg
2 kg 29 mg
5 kg 29 mg
10 kg 29 mg
20 kg 29 mg
Up to 300 g 0.45 mg
300 g to 1.2 kg 2 mg Master Weights and
1,4 Scalesand Balances, (1.2 to 2) kg 3 mg internal calibration
(2 to 12) kg 20 mg procedure utilized in
Load Cells
(12 to 20) kg 29 mg the calibration of the
(20 to 300) kg 6g weighing device.
(300 to 500) kg 6g
(0.1 to 100) N 0.11 % of reading
1 Universal
Testing Machine (0.1 to 1) kN 0.11 % of reading
Force Transducers
(Tension and Compression) (1 to 10) kN 0.07 % of reading
(10 to 100) kN 0.14 % of reading
1 Force Gauge,
(0.1 to 100) N 0.11 % of reading Weight Set
Push-Pull
1 Force (0.1 to 1 kN 0.11 % of reading
Gauge,
(1 to 10) kN 0.07 % of reading Force Transducers
Push-Pull
(10 to 100) kN 0.14 % of reading
1 Rockwell Hardness

Testing Machine (10 to 150) kgf 0.13 % of reading Force Transducer


(Force Measurement)

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Mass and Mass Related
Reference Standard,
Expanded Uncertainty of
Parameter / Equipment Range Method and/or
Measurement (+/-)
Equipment
25.74 HRC 0.41 HRC
45.33 HRC 0.42 HRC
59.91 HRC 0.41 HRC

1 Rockwell Hardness Testing 82.3 HRA 0.72 HRA Indirect Verification using
Machine Test Blocks
33.87 HRBW 0.7 HRBW
53.84 HRBW 0.7 HRBW
86.73 HRBW 0.7 HRBW
95.1 HRBW 0.81 HRBW
1 Hardness

Durometer Force
Up to 90 Duro 0.16 Duro Force Transducer
Types A, B, E, O, C, D, DO,
M, and FO
Up to 0.2 N⋅m 0.006 N⋅m
(0.2 to 1) N⋅m 0.006 N⋅m
(1 to 5) N⋅m 0.1 N⋅m
1 Hand Torque Tool, Torque (5 to 10) N⋅m 0.12 N⋅m
Wrench, Torque Driver, (10 to 150) N⋅m 0.46 N⋅m Torque Transducer
Electronic Torque (150 to 250) N⋅m 1 N⋅m
(250 to 350) N⋅m 1.4 N⋅m
(350 to 500) N⋅m 5 N⋅m
(500 to 1 000) N⋅m 10 N⋅m
(0.2 to 2) N∙m 0.92 % of reading
(2 to 4) N⋅m 0.46 % of reading
(4 to 6) N⋅m 0.31 % of reading
1 Torque
(6 to 8) N⋅m 0.23 % of reading Weights,
Transducer
(8 to 10) N⋅m 0.18 % of reading 500 mm Calibration Arm
(10 to 20) N⋅m 0.1 % of reading
(20 to 40) N⋅m 0.06 % of reading
(40 to 1 500) N⋅m 0.04 % of reading
1 Pressure Gauge (Pneumatic
&Hydraulic), Digital Pressure
Gauge, Pressure Transducer, Up to 300 psi 0.033 psi
Differential Pressure Gauge, Pressure Calibrator
Pressure Transmitter, Up to 70 000 kPa 12 kPa
Manometer,
Pressure Switch
1 Vacuum Gauge (-15 to 0) psi 0.022 psi Pressure Calibrator

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Mass and Mass Related
Reference Standard,
Expanded Uncertainty of
Parameter / Equipment Range Method and/or
Measurement (+/-)
Equipment
Up to 20 lpm 0.003 lpm
1 Flow (20 to 40) lpm 0.004 lpm
Meter (40 to 60) lpm 0.006 lpm Digital Pressure
(Air Flow) Loop Calibrator
(60 to 80) lpm 3 lpm
(80 to 100) lpm 8 lpm
1 Air Velocity Up to 15 m/s 0.18 m/s Anemometer
Electronic Balance per
Hydrometer (0.6 to 2) g/cm3 0.000 4 g/cm3
Cuckow Method.
Up to 1 ml 0.74 µl
(> 1 to 5) ml 3.4 µl
Volumetric Flask, Graduated
(> 5 to 10) ml 6.7 µl Electronic Balance per
Cylinder, Beaker, Erlenmeyer
(> 10 to 20) ml 14 µl ASTM E542-01
Flask
(> 20 to 50) ml 34 µl
(> 50 to 100) ml 67 µl
Up to 100 μl 67 µl
Electronic Balance per
Micropipette (> 100 to 500) μl 0.34 μl
ASTM E542-01
(> 500 to 1 000) μl 0.67 μl
Kinematic Viscosity
23.36 mm²/s (cSt) 0.32 % of reading
67.27 mm²/s (cSt) 0.38 % of reading
115.7 mm²/s (cSt) 0.47 % of reading
1 Rotational Viscometer Viscosity
560.2 mm²/s (cSt) 0.47 % of reading
Reference Standard
1 249 mm²/s (cSt) 0.66 % of reading
6 972 mm²/s (cSt) 0.66 % of reading
18490 mm²/s (cSt) 0.54 % of reading
76430 mm²/s (cSt) 0.54 % of reading
Dynamic Viscosity
20 mPa·s (cP) 0.32 % of reading
56 mPa·s (cP) 0.39 % of reading
1,3 Ford and Zahn Viscosity 104 mPa·s (cP) 0.47 % of reading Viscosity
480 mPa·s (cP) 0.47 % of reading Reference Standard,
Cups
1 100 mPa·s (cP) 0.66 % of reading Stopwatch
6 000 mPa·s (cP) 0.66 % of reading
16 000 mPa·s (cP) 0.54 % of reading
71 000 mPa·s (cP) 0.54 % of reading

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Mass and Mass Related
Reference Standard,
Expanded Uncertainty of
Parameter / Equipment Range Method and/or
Measurement (+/-)
Equipment
Kinematic Viscosity
23.36 mm²/s (cSt) 0.32 % of reading
67.27 mm²/s (cSt) 0.38 % of reading
1 Ford 115.7 mm²/s (cSt) 0.47 % of reading Viscosity
and Zahn Viscosity
560.2 mm²/s (cSt) 0.47 % of reading Reference Standard,
Cups
1 249 mm²/s (cSt) 0.66 % of reading Stopwatch
6 972 mm²/s (cSt) 0.66 % of reading
18 490 mm²/s (cSt) 0.54 % of reading
76 430 mm²/s (cSt) 0.54 % of reading
408 HV 12.1 HV Indirect Verification using
1 Vickers 710.6 HV 3.8 HV Test Blocks
Hardness Testers
Direct Verification using
(10 to 150) kgf 0.13 % of reading
Force Transducer
12 % Moisture Content 0.35 % Moisture Content
CRM Moisture Content
Rice Moisture Meter 14 % Moisture Content 0.35 % Moisture Content
in Rice
16 % Moisture Content 0.35 % Moisture Content
12 % Moisture Content 0.53 % Moisture Content
CRM Moisture Content
Paddy Moisture Meter 14 % Moisture Content 0.44 % Moisture Content
in Paddy
16 % Moisture Content 0.44 % Moisture Content

Photometry and Radiometry


Reference Standard,
Expanded Uncertainty of
Parameter / Equipment Range Method and/or
Measurement (+/-)
Equipment
1 Source, (0.01 to 2.5) W 3.3 % of reading
Measure
(2.5 to 10) W 6.2 % of reading Laser Power Meter
Laser Power Meter
(10 to 100) W 6.5 % of reading
1 UV Meter
(UVA) Up to 10 000 mJ/cm2 2.3 % of reading UV Meter STD
(UVC) Up to 500 mW/cm² 2.4 % of reading
1,2 Gloss Meter Gloss Tile
20° 89.8 GU 0.7 GU AMECaL/GT-HG3
60° 94.5 GU 0.7 GU Gloss Meter
85° 99.5 GU 0.9 GU JEDTO/GM-268
1 Lux 0 lx 0.058 lx Digital Light Meter
Meter
(>0 to 5 000) lx 0.016 lx/lx LX-91

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Photometry and Radiometry
Reference Standard,
Expanded Uncertainty of
Parameter / Equipment Range Method and/or
Measurement (+/-)
Equipment
White
L* 0.63 % of reading
1 Color a* 0.29 % of reading
Meter
b* 0.1 % of reading Glossy Tile
Color Reader
Y 0.04 % of reading
x 0.2 % of reading
y 0.25 % of reading
Black
L* 0.62 % of reading
1 Color a* 0.37 % of reading
Meter
b* 0.42 % of reading Glossy Tile
Color Reader Y 0.04 % of reading
x 0.37 % of reading
y 0.42 % of reading
White
L* 0.24
a* 0.26
b* 0.2
Y 0.26
x 0.009 3 Color Meter,
y 0.009 3
Color Plate 5 Standard Color
Black
Glossy Tile
L* 0.01
a* 0.01
b* 0.01
Y 0.01
x 0.009 3
y 0.009 3
Total solar irradiance
Indoor calibration
Pyrheliometer
Reference Pyranometer
Reference Pyranometer
Pyranometer 2.5 % of reading Pyranometer Standard
Pyranometer
Sensitivity
(9.51 µV/Wm-2 )
Outdoor calibration
Pyranometer
Solar Power Meter Up to 140 mV Solar Power
(Input Voltage) Up to 3 200 W/m2 0.25 W/m2 Meter Standard

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Thermodynamic
Reference Standard,
Expanded Uncertainty of
Parameter / Equipment Range Method and/or
Measurement (+/-)
Equipment
1 Thermo-Hygrometer

Temperature (10 to 40) °C 0.33 °C

Humidity (20 to 40) %RH 1.5 %RH Temp/Humidity Standard


(40 to 60) %RH 1.7 %RH
(60 to 85) %RH 1.8 %RH
(85 to 95) %RH 1.9 %RH
1 Air
Temperature Controlled
Chamber 50 °C 0.34 °C
Hot Air Oven (50 to 100) °C 0.39 °C
(100 to 200) °C 0.41 °C
Agilent 34970A
Incubator (10 to 50) °C 0.3 °C Datalogger with
Thermocouple
Refrigerator (0 to 10) °C 0.3 °C

Freezer (-80 to 0) °C 0.3 °C


(-80 to 200) °C 0.04 °C
1 Dial (200 to 300) °C 0.065 °C
Thermometer
(300 to 400) °C 0.075 °C
(400 to 600) °C 0.084 °C
(-80 to 200) °C 0.04 °C
1 Thermocouple Sensor Types (200 to 300) °C 0.065 °C
K, J, E, T, N, R, S (300 to 400) °C 0.075 °C
(400 to 600) °C 0.084 °C
(-80 to 200) °C 0.032 °C
1 Sensor (200 to 300) °C 0.061 °C
Type RTD
(300 to 400) °C 0.071 °C Temp Indicator,
(400 to 600) °C 0.081 °C PRT Standard
1 Digital (-80 to 200) °C 0.032 °C
Thermometer with
(200 to 300) °C 0.061 °C
Thermocouple Sensor Types
(300 to 400) °C 0.071 °C
K, J, E, T, N, R, S
(400 to 600) °C 0.081 °C
(-80 to 200) °C 0.032 °C
1 Digital Thermometer with (200 to 300) °C 0.061 °C
Sensor Type RTD (300 to 400) °C 0.071 °C
(400 to 600) °C 0.081 °C
1 Dry
Block, (-80 to 400) °C 0.31 °C
Temp Bath (400 to 600) °C 0.32 °C
1 Autoclave Agilent 34970A
(110 to 135) °C 0.3 °C
Datalogger

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Thermodynamic
Reference Standard,
Expanded Uncertainty of
Parameter / Equipment Range Method and/or
Measurement (+/-)
Equipment
(-80 to 200) °C 0.04 °C
1 Liquid (200 to 300) °C 0.065 °C Temp Indicator,
in Glass (300 to 400) °C 0.075 °C PRT Standard
(400 to 600) °C 0.084 °C
1 Liquid Agilent 34970A
Bath (5 to 100) °C 0.081 °C
Datalogger
1 Temperature/Humidity (10 to 40) °C 0.65 °C Master Temp/Humidity
Chamber (20 to 85) %RH 1.8 %RH Standard

Time and Frequency


Reference Standard,
Expanded Uncertainty of
Parameter / Equipment Range Method and/or
Measurement (+/-)
Equipment
1 Measure
30 Hz to 5 GHz 50 pHz
Frequency HP 53131A opt 050
1 Stopwatch, Universal Counter
Up to 3 600 s 1.7 ms
Timers
Up to 10 rpm 0.002 9 rpm
(> 10 to 100) rpm 0.002 9 rpm
1 Stroboscopes (> 100 to 1 000) rpm 0.003 rpm
(> 1 000 to 10 000) rpm 0.005 rpm
(> 10 000 to 100 000) rpm 0.03 rpm Comparison to HP 33120A
Up to 10 rpm 0.002 9 rpm Function Generator
1 Measure (> 10 to 100) rpm 0.002 9 rpm
RPM
(> 100 to 1 000) rpm 0.003 rpm
(Non-Contact)
(> 1 000 to 10 000) rpm 0.005 rpm
(> 10 000 to 100 000) rpm 0.035 rpm
Up to 10 m/s 0.14 m/s
(> 10 to 50) m/s 0.65 m/s
Velocity Chronograph (> 50 to 100) m/s 1.3 m/s Picoscope
(> 100 to 500) m/s 6.6 m/s
Comparison to
Velocity Speed Gun Up to 120 km/h 0.82 km/h
Master Tachometer

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DIMENSIONAL MEASUREMENT

1 Dimensional
Reference Standard,
Specific Tests and / or Expanded Uncertainty of
Range Method and/or
Properties Measured Measurement (+/-)
Equipment
Up to 5 mm 0.63 µm
(5 to 10) mm 0.64 µm
(10 to 20) mm 0.67 µm
(20 to 30) mm 0.73 µm
(30 to 40) mm 0.81 µm Vision Measuring Machine
(40 to 50) mm 1 µm
1D Measurement – Length (50 to 100) mm 1.6 µm
(100 to 200) mm 2.8 µm
(200 to 250) mm 3.5 µm
Up to 200 mm 12 nm Digital Vernier Caliper
Up to 25 mm 1.3 µm Digital Outside Micrometer

2 Dimensional
Reference Standard,
Specific Tests and / or Expanded Uncertainty of
Range Method and/or
Properties Measured Measurement (+/-)
Equipment
2 Angle (0.1 to 360) ° 18ʺ Vision Measuring Machine

3 Dimensional
Reference Standard,
Specific Tests and / or Expanded Uncertainty of
Range Method and/or
Properties Measured Measurement (+/-)
Equipment
1 Handheld Up to 500 mm L; Uncertainty values of the Metal Testing Method by Direct
Metal Detector
Up to 100 mm W; object detection size and weight measurement with Standard
Up to 60 mm T; for testing is equal to Metal Detect and according
Metal Object Detection Up to 1 kg ± 0.06 mm and ± 0.003 kg to NIJ Standard–0602.02
1 Walk-Through Up to 200 cm H;
Metal Testing Method by Direct
Up to 100 cm W; Uncertainty value of the Metal
Detectors measurement with Standard
Up to 70 cm T object detection size for testing is Metal Detect and according
(Distance for test: equal to ± 0.62 mm
Metal Object Detection to NIJ Standard-0601.02
0.178 mm)

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TESTING

Mechanical
Reference Standard,
Specific Tests and / or Expanded Uncertainty of
Range Method and/or
Properties Measured Measurement (+/-)
Equipment
Up to 300 g 0.4 mg
300 g to 1.2 kg 58 mg
Weight (1.2 to 2) kg 58 mg Electronic Balance
(2 to 12) kg 61 mg
(12 to 20) kg 83 mg
3-AXIS G Force
Electronic Part, Acceleration (RMS)
Data Logger,
Industrial Part Up to 68 m/s² 0.27 % of reading
Vibration Shaker
Calibration and Measurement Capability (CMC) is expressed in terms of the measurement parameter, measurement range, expanded uncertainty of measurement and
reference standard, method, and/or equipment. The expanded uncertainty of measurement is expressed as the standard uncertainty of the measurement multiplied by a
coverage factor of 2 (k=2), corresponding to a confidence level of approximately 95%.
Notes:
1. On-site calibration service is available for this parameter, since on-site conditions are typically more variable than those in the laboratory, larger measurement
uncertainties are expected on-site than what is reported on the accredited scope
2. L = length of scale; ʺ = arc-second; GU = gloss unit.
3. Reference standard values are approximate values.
4. The CMC for scales and balances is highly dependent upon the resolution of the unit under test. The CMC presented here does not include the resolution of the unit
under test. The resolution will be included in the reported measurement uncertainty at the time of calibration.
5. Unitless measurement.
6. This scope is formatted as part of a single document including Certificate of Accreditation No. AC-2487.

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