EE 765: Assignment 3, Total Marks: 50, Due Date: Sunday, October 20, 4:00 PM

Instructions:

 Go to http://10.107.32.38/assn3 to download the datasets for the problems in this assignment. It

is critical that you write your roll number accurately. If there are any letters in the roll number,
use CAPITALS. The dataset has information about the failure time (in hours) for various labelled
samples.
 This assignment is part of the Virtual Lab which we have created for you with an intention to give
you a feel of real life reliability data. Therefore, every individual will get a different dataset when
they use their unique roll numbers to download the data. Moreover, in real life, when you repeat
the experiment, you don’t again get the same data. Therefore, even when you download the data
by entering your (same) roll number again, you will get a different dataset! You are encouraged
to try this out to verify that this is indeed the case.
 Goes without saying, there’s no point comparing your answers with others for this assignment.
 You have to do Weibull fit to the datasets (unless otherwise explicitly stated – like in Problem 1).
You need to report the α and β and other parameters derived from them with 95% confidence
interval. The instructions to derive these uncertainty estimates are uploaded along with a Python
code on Moodle. TA (Ritesh) has discussed this methodology with you in one of the classes.
 If you want to use OriginLab to solve these problems, you need to go to the computer center
website https://www.cc.iitb.ac.in/ and go to Services  Software  Technical Software and
download OriginLab. The software checks for IITB academic license, so it may not work for more
than 5 minutes when you are outside the IITB network.
 While using Origin, you need to put the X and Y data in a new workbook and then go to Analysis
 Fitting  Linear Fit  Open Dialog to get a linear fit with appropriate confidence bounds on
the slope and the intercept.
 You must upload the code and / or Origin screenshots along with your solution in order to get
credit. Without these, you will get zero credit for the question. You must clearly specify the steps
/ equations used to arrive at the results supplemented with the figures wherever necessary. You
can upload the excel sheets (if you used them) with formulae along with pdf of your solution in a
zip file.
 You must submit a typed response. Hand-written and scanned responses will not be accepted.
 Whenever you fit a straight line, you should mention the upper and lower bounds on slope and
intercept with 95% confidence, R2, as well as produce a graph that shows data points and best fit
line.
 It’s a good idea to use Bernard’s approximation for calculating CDFs.
 In order to get credit, you must compile and tabulate the results in a table at the end of each
question like following:
Question Answer
1A abc
1B def
1C ghi
 EE 765: Assignment 3, Total Marks: 50, Due Date: Sunday, October 20, 4:00 PM

Problem 1: The high temperature operating life testing data of IGBT samples are provided.

A) What are the α and β values for this Weibull distribution (at 95% Confidence Level)? [2]
B) Plot CDF (in %) on Y axis and time (hours) on X-axis for the Weibull Distribution. Use Log (base
10) scale on both Y and X axes. [2]
C) After how much time the reliability of the IGBTs would become 5% assuming the Weibull
Distribution? [2]
D) Now fit a Lognormal distribution to the same data and report the values of two parameters μ’ and
σ’ (at 95% Confidence Level). [2]
E) Plot CDF (in %) on Y axis and time (hours) on X-axis for the Lognormal Distribution. Use Log (base
10) scale on both Y and X axes. [2]
F) After how much time the reliability of the IGBTs would become 5% assuming the Lognormal
Distribution? [2]
G) Assume that due to resource constraints you are only able to acquire failure data for first 25
samples. (Use only first 25 failure data points for problems 1 G and 1 H). Fit a Weibull distribution
and answer questions A, B and C for this Weibull distribution based on first 25 data points. [4]
H) Assume that due to resource constraints you are only able to acquire failure data for first 25
samples. (Use only first 25 failure data points for problems 1 G and 1 H). Fit a Lognormal
distribution and answer questions A, B and C for this Lognormal distribution based on first 25 data
points. [4]
I) What’s the takeaway message from this problem? [2]

Problem 2: A company suspects that one of its suppliers of diodes is mixing some inferior types of diodes
in the lot sold to this company. In order to investigate this further, they perform high temperature forward
bias testing on 1000 samples and the failure data are provided.

A) What are the α and β values for this Weibull distribution considering all samples together? [2]
B) Plot CDF (in %) on Y axis and time (hours) on X-axis. Use Log (base 10) scale on both Y and X
axes. [2]
C) Do you suspect that the supplier is mixing two different kinds of diodes? Why? [2]
D) If the answer to ‘C’ is yes, calculate the α and β values for the two different types of diodes
provided by the supplier. [4]
E) What’s the takeaway message from this problem? [2]

Problem 3: High temperature operating life test was performed on 300 devices at three different
temperatures (80 oC, 100 oC and 120 oC) so that at each temperature you have 100 devices. The samples
were numbered 1 to 100 before testing and the failure data were recorded. (However note that sample
‘1’ at 80 oC, 100 oC and 120 oC are essentially 3 different samples and they have nothing to do with each
other, except that their serial number in each test being equal to ‘1’. Ideally, they should have been named
as Sample_1_80oC, Sample_1_100oC, Sample_1_120oC etc. to indicate that the failure times belong to 3
different samples in 3 different tests). Assume Arrhenius-Weibull relationship to explain the failure data.
 EE 765: Assignment 3, Total Marks: 50, Due Date: Sunday, October 20, 4:00 PM

A) Calculate the value of Activation Energy in eV for this failure mechanism with appropriate
uncertainty. [4]
B) Calculate the constant ‘A’ for this failure mechanism with appropriate uncertainty. [4]
C) If the test were to be performed at 110 oC, after how much time, the reliability would become
5%? [4]
D) If the test were to be performed at 130 oC, after how much time, the reliability would become
5%? State your answer by clearly mentioning the underlying assumptions [4]

Problem 4: How much time it took for you to solve this assignment? [2]