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𝜕ℰ𝑥 𝜕ℬ𝑦
=−
𝜕𝑧 𝜕𝑡
𝜕ℬ𝑦 𝜕ℰ𝑥
− = 𝜇0 𝜖0 𝜖𝑟 Poynting flux: 𝑰 = 𝓔 × 𝓗
𝜕𝑧 𝜕𝑡
Solutions: ℰ𝑥 𝑧, 𝑡 = ℰ𝑥0 cos 𝑘𝑧 − 𝜔𝑡 + 𝜑 , ℬ𝑦 𝑧, 𝑡 = ℬ𝑦0 cos 𝑘𝑧 − 𝜔𝑡 + 𝜑
where, ℰ𝑥0 , ℬ𝑦0 are the amplitudes of the electric and magnetic fields
respectively, 𝜑 is the optical phase, and 𝑘 is the wavenumber given by:
𝑘 = 𝑛𝜔 𝑐
𝜇0
ℋ𝑦0 = ℰ𝑥0 𝑍, where, 𝑍 = (≈ 377Ω in free space) is the wave impedance.
𝜖0 𝜖𝑟
BOUNDARY CONDITIONS
THE SPHERICAL WAVE
POLARIZATION OF LIGHT
Linear
Circular
Elliptical
DEVICES BASED ON THE
POLARIZATION OF LIGHT
Birefringent Devices separate arbitrarily polarized
beams into 2 orthogonally-polarized beams known as
the ordinary (o) and extraordinary (e) rays.
Each of these rays experiences a different index of
refraction, typically denoted 𝑛𝑜 and 𝑛𝑒 , or 𝑛∥ and 𝑛⊥
relative to the optical axis (OA) of the device.
This index-difference is converted
to a phase-change:
𝜋 𝑜𝑟 3𝜋 , 𝐼 = 2𝐼0
- For 𝜑 = 2 2
• The strong dependence of the intensity 𝐼 on the phase-
difference 𝜑 permits the measurement of phase-differences
by measuring light intensities. This principle is used in
numerous optical systems.
• Interference is not observed under ordinary lighting
conditions, because the random fluctuations in phases
causes the phase-difference to assume random values, and
the interference term “washes-out”.
INTERFEROMETRY
Fourier
Transform
Interferometer
TWO-BEAM INTERFERENCE
THE MICHELSON
INTERFEROMETER
DIFFRACTION
DIFFRACTION
FAR-FIELD (FRAUNHOFER)
DIFFRACTION
FAR-FIELD DIFFRACTION AND
ANGULAR RESOLUTION
FAR-FIELD DIFFRACTION AND
ANGULAR RESOLUTION