Australian Standard TM

Site testing of protective coatings

Method 5: Determination of surface profile

PREFACE
This Standard was prepared by the Australian members of the Joint Standards
Australia/Standards New Zealand Committee CH-003, Paints and Related Materials, to
supersede AS/NZS 3894.5:1995. After consultation with stakeholders in both countries,
Standards Australia and Standards New Zealand decided to develop this Standard as an
Australian Standard rather than an Australian/New Zealand Standard.

FOREWORD
A record of the range of the surface profile present on a prepared metal surface, to which a
protective coating will be applied, will assist in controlling the quality of the coating
operation. Coating manufacturers normally specify a range of surface profile readings
required to achieve the desired performance for the coating.
As the average surface profile, when numerically expressed, will vary from spot to spot on
the prepared surface of a structure or structural unit, it may be necessary to record the range
and the mean of surface profile readings.
A round robin was performed on test panels that had been prepared by abrasive blasting
with ilmenite, garnet, zinc slag, copper slag, chilled grit and steel shot using the test
methods described in this Standard. Although the tests gave consistent results for a
particular method, it was demonstrated that a direct comparison of results obtained using
alternative methods was not appropriate.

METHOD
1 SCOPE
This Standard provides practical procedures for use in the field, to evaluate the surface
profile of a prepared metal substrate to which a protective coating is to be applied.
This Method is applicable to surfaces that have been prepared by abrasive blast cleaning in
accordance with AS 1627.4.
Four methods are described for assessing surface profile.
NOTES:
1 Results obtained using different methods are not necessarily comparable.
2 Surface profile does not play any part in surface cleanliness.


2 REFERENCED DOCUMENTS
The following documents are referred to in this Standard:
AS
1199 Sampling procedures and tables for inspection by attributes
1 627 Metal finishing Preparation and pretreatment of surfaces
1627.4 Part 4: Abrasive blast cleaning
1627.9 Part 9: Pictorial surface preparation standards for painting steel surfaces
AS/NZS
2310 Glossary of paint and painting terms
3894 Site testing of protective coatings
3894.3 Method 3: Determination of dry film thickness
3 DEFINITIONS
For the purpose of this Standard, the definitions of AS/NZS 2310 and that below apply.
3.1 Surface profile
The measured peak-to-valley height occurring within a test area of the substrate.
4 GENERAL
4.1 Choice of method
A number of methods are available for the determination of surface profile. However, it has
been demonstrated that there is not a high degree of consistency when results obtained by
using different methods are compared.
Prior to commencement of work, the method adopted for determination of the surface
profile shall be nominated, the test area for evaluation shall be specified and the test
procedure validated.
Although these methods are directly applicable to A Grade and B Grade steel specified in
AS 1627.9, they may also be used on Grade C and Grade D steel provided a non-pitted area
of surface is selected for evaluation.
NOTE: For practical purposes, the comparator method (Method B) is the preferred method.
4.2 Preliminary work
A preliminary inspection should be undertaken to ensure that the prepared surface is dust-
free and free from loose particles and other contaminants.
The inspection procedures should utilize appropriate methods for the assessment of surface
contamination.
A record of observations made during inspection should be provided. It should describe
areas of the surface, which are visually rougher or smoother in profile than the main body
of the surface.
Such preliminary work should be undertaken at an appropriate time after which further
weathering or surface contamination will not occur before application of the coating.
4.3 Low profile measurements
Where the surface profile is below 75 pm, it shall be measured using the method described
in Clause 5, Clause 6, Clause 7 or Clause 8.
Where the profile measurement obtained is less than 100 pm, it shall be recorded as being
in one of the ranges shown in Table 1.
4.4 Very coarse profile measurements
Where the surface profile exceeds 100 µm, it shall be measured using the method described
in either Clause 7 or Clause 8.
4.5 Sampling procedure
The tests in Clauses 5, 6 and 7 should be conducted in accordance with an agreed sampling
plan. AS 1199 provides guidance on the selection of sampling plans.
NOTES:
1 It is recommended that at least one evaluation be performed at each 50 m'` of surface area,
with a minimum of three readings for any job.
2 The selection of the appropriate sampling plan should be agreed prior to commencement of
the project.
5 METHOD A-PROFILE REPLICATING TAPE
5.1 Principle
A composite plastic tape is impressed into the substrate profile using a burnishing tool so
that a reverse replica of the profile is produced. The replica is then removed and the profile
height measured using a spring-loaded micrometer.

TABLE 1
DESIGNATION OF PROFILE GRADES

Measured mean Reported as

Grade profile nominally
(µm) (µm)
Fine <20 12
20-30 25
30-44 38
Medium 45-55 50
55-70 62

Coarse 70-80 75
80-100 88

Very coarse >100 >100

NOTE: The reproducibility of results for these methods

i s such that although the average of a number of
readings may consistently fall within a specified range,
isolated individual readings may lie in an adjoining
range.

5.2 Equipment
5.2.1 Profile replicating tape
A special tape consisting of a replication material, capable of being impressed into the
substrate profile and attached to a non-compressible plastic film, which is applicable to the
profile being measured.
NOTE: Two grades of tape, coarse and extra coarse, are available.
5.2.2 Burnishing tool
To impress the replication material into the substrate to form a reverse replica of the
profile.


5.2.3 Spring-loaded micrometer

Fitted with a suitable probe to measure the profile height.
5.3 Procedure
The procedure shall be as follows:
(a) Clean the anvils of the spring micrometer and adjust the dial gauge to read 50 um less
than zero with the anvils shut.
(b) Locate a representative surface area of the substrate.
(c) Select the correct range of profile-replica ting tape appropriate to the profile depth.
Peel off the plastic backing film and apply the replication material to the selected
target area of the prepared surface.
(d) Rub the burnish tool over the flexible tape. The flexible tape will darken as the
profile is replicated. Ensure that the entire circular area has uniformly darkened.
(e) Remove the replicated profiled tape carefully and place it between the anvils of the
micrometer, ensuring that the replica is centred.
(f) Read the micrometer and record the result.
5.4 Report
The test report shall include the following information:
(a) Full identification of the substrate tested.
(b) The testing equipment used.
(c) Number and date of test.
(d) The name of the testing authority.
(e) The abrasive medium used to prepare the substrate.
(f) The measured profile height in micrometres for readings in excess of 100 µm. For
profile heights below 100 µm, report the nominal profile height (see Clause 4.3).
(g) Reference to this Australian/New Zealand Standard, i.e. . AS/NZS 3894.5, Method A.
(h) Any deviations from this test method.
6 METHOD B-PROFILE COMPARATOR
6.1 Principle
The test substrate is visually compared to comparator standards prepared with various
profile depths and characteristics. The comparison may be made with or without
magnification of the surface.
6.2 Equipment
6.2.1 Profile comparator
Consisting of a number of reference surfaces, with a different profile or anchor pattern
depth, marked to show the nominal profile depth in micrometers.
6.2.2 Viewing instrument
Providing up to 10X magnification of the surfaces.


7.3 Procedure
The procedure shall be as follows:
(a) Locate a representative area of the substrate.
(b) Place the depth micrometer on a plate glass surface. Adjust the gauge of the
micrometer to zero while firmly holding the base of the instrument and the probe in
contact with the glass.
(c) Place the depth micrometer on the substrate surface.
(d) Hold the instrument base firmly against the test substrate and normal to the surface.
Do not drag the spring-loaded tip over the surface between readings.
NOTE: The spring-loaded tip will become rounded or deformed if dragged over the surface.
(e) At each location measured make 10 readings; discard the five lowest readings and
determine the mean of the remaining five readings.
(f) Repeat Step (d) at a further 4 locations on the substrate.
7.4 Report
The test report shall include the following information:
(a) A full identification of the substrate tested.
(b) Details of the test equipment used.
(c) The number and date of the test.
(d) The name of the testing authority.
(e) The abrasive medium used to prepare the substrate.
(f) The average profile height measured in micrometres for readings in excess of
100 µm. For profile heights below 100 µm, report the nominal profile height (see
Clause 4.3).
(g) Reference to this Australian/New Zealand Standard, i.e. . AS/NZS 3894.5, Method C.
(h) Any deviations from this test method.
8 METHOD D-MAGNETIC-TYPE THICKNESS GAUGE
8.1 Principle
An estimation of the surface profile on an abrasive blast-cleaned mild steel surface is made
with a magnetic type dry film thickness instrument.
NOTES:
1 This Method provides a guide only and is applicable to mild steel that has been prepared by
abrasive blast cleaning.
2 These instruments are not recommended for use within 25 mm of an edge and not closer than
75 mm to another mass of metal.
3 See AS 3894.3 for limitations on the use of magnetic instruments.
8.2 Equipment
A magnetic type dry film thickness instrument, of permanent magnet or electromagnetic
induction type.


8.3 Procedure
The procedure shall be as follows:
(a) Calibrate the dry film thickness instrument in accordance with AS 3894.3 using a
smooth surface as the reference substrate.
(b) Locate a representative area of the substrate to be assessed.
(c) Perform the assessment at a minimum of five locations per 10 m' of substrate, and
calculate the average value (T) in micrometers.
(d) Calculate the approximate surface profile, using one of the following equations
appropriate to abrasive blast material employed to prepare the surface:
(i) For angular abrasive (grit) blast material
Surface profile = T x 3.
(ii) For shot blast medium
Surface profile = T x 2.
8.4 Report
The test report shall include the following information:
(a) Full identification of the substrate tested.
(b) The testing equipment used.
(c) Number and date of test.
(d) The name of the testing authority.
(e) The abrasive medium used to prepare the substrate.
(f) The estimated surface profile expressed in micrometers.
(g) Reference to this Australian/New Zealand Standard, i.e. . AS/NZS 3894.5, Method D.
(h) Any deviations from this test method.