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Lab 5: Receiver Yield Analysis
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Lab 5: Receiver Yield Analysis
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Lab 5: Receiver Yield Analysis
13.1 Objectives:
- “AC” controller
5. Add a “Term” item (to ground) to the input port (RF port). Set its parameters:
Num to 1
Num to 2
S-parameter analysis with frequency conversion requires a V_1Tone source for the local
oscillator (P_1Tone is considered a port for S parameters calculations, so it would increase
the S matrix dimensions with 1, from 2x2 to 3x3).
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Lab 5: Receiver Yield Analysis
Insert the S-parameter controller from the “Simulation-S_Param” library. Set the parameters:
The statistical analysis requires setting up statistical variables and measurements. The simple
case of a single statistical variable and a single yield specification is not very common in real
life, and hence not that useful in day by day engineering practice. But this case will be used
to show the basic concepts and steps needed to perform this type of analysis:
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Lab 5: Receiver Yield Analysis
1. Edit the parameters of the component LNA (double click on it, for example).
2. Select the “NF” parameter and select the “Optimization/Statistics Setup” button.
The LNA noise figure may vary between 2.0 and 3.0 dB, with all values in that range being
equally probable. To specify this condition set the following parameters:
Type to Uniform
Format to min/max
4. Click OK in the setup box and OK in the main dialog box. The newly edited
component should appear as shown below.
Amplifie r
LNA
S 21=dbpola r(12,0)
S 11=pola r(0,0)
S 22=0+j*0
S 12=0.
NF=2.5 dB s ta t{ uniform 2 dB to 3 dB }
Save the design (it should already have the name “b_rcvr_yld_basics”).
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Lab 5: Receiver Yield Analysis
Insert the “YieldSpec” component from the “Optim/Stat/Yield” component library. Set the
yield specification parameters as follows:
Expr to nf(2)
Max to 5 _dB
Leave the remaining fields blank. Be sure to add the yield specification item to the
schematic.
1. Place a “Yield” element from the “Optim/Stat/Yield” library. Edit the parameters of the
Yield Controller:
Click on the arrow in the field at the right of the dialog box. Below the Edit text,
select “Spec1” and select the “Add” or “Set” button to specify the instance name
“Spec1”.
5. Verify that the completed YieldSpec and Yield items appear as shown.
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Lab 5: Receiver Yield Analysis
Before running a yield analysis on the receiver, it would be desirable to perform a single-
point simulation and observe the noise figure.
a. Open a new DDS window and select the default dataset “b_rcvr_yld_basics”.
b. Insert a “List” with the measurement “nf(2)” and check the “Suppress Table
Format” box under the “Plot Options” tab in the “Plot Traces and Attributes”
window.
fre q nf(2)
836.5MHz 5.199
4. Record the receiver noise figure below and check its value against the receiver
budget noise figure computed in Lab 2.
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Lab 5: Receiver Yield Analysis
Save the data display with the new name “b_rcvr_yld_basics” (“Save As…”).
Yield analysis will be performed with the LNA noise figure being randomly perturbed for
each of the 100 iterations. Look at the text in the Status window as the yield analysis is
running.
When the simulation is finished, find the Current Yield expressed in percent (this is actually
the final yield) and record the yield below:
The yield value can be displayed in the data display window. Use the same data display
window (named “b_rcvr_yld_basics”). Bring in a “List” item and display the variable named
“YIELD” (it usually appears near the end of the list of variables).
Yie ld
17.000
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Lab 5: Receiver Yield Analysis
In the “b_rcvr_yld_basics” data display window look at the “List” item displaying the
variable nf(2). Check the “Transpose Data” box under the “Plot Options” tab. Click on the
lower right corner of the list bounding box and drag it downward until the first five trials
appear. The list should look similar to the figure shown:
nf(2)
mcTrial
fre q=836500000.000
0 5.199
1 4.976
2 5.197
3 4.947
4 5.307
Note a new parameter called mcTrial (Monte Carlo trial) which appears in the list.
QUESTION: Note the random variation of the noise figure over the first five trials of yield
analysis. What is the yield value for those first five trials?
1. The DDS equation feature allows the dataset contents to be post-processed per the
user’s requirements. One such application is viewing performance (in this case -
noise figure) vs. yield analysis trial on a grid. Write the following equation in a DDS
window:
nf_vs_trial = nf(2)[::,0]
NOTE about syntax: As a general rule, a dataset contains multi-dimensional data, i.e. data
that is a function of several independent parameters. If only a subset of data is desired for
display, indices must be used to specify the data subset. (Please review the Data Indexing,
the “::” operator in Lab. 2, if needed.) Wildcards are supported when an entire subset is
desired using the following syntax:
[::,0] - The first argument indicates the yield analysis trials. If all the data for all trials is
desired, the :: wildcard is used. If the data for just the 7th trial was desired, the :: would be
replaced by 7. The second argument is the frequency index. Since there is just one input
frequency (RF frequency = 836.5 MHz), its index is “0”.
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Lab 5: Receiver Yield Analysis
2. Add the equation to a rectangular plot. The plot should look similar to the one
pictured below:
5.6
5.4
nf_vs _tria l
5.2
5.0
4.8
0 20 40 60 80 100
mcTrial
Note the random appearance of the noise figure data as a function of yield analysis trial.
This is due to the uniform variation of the LNA noise figure and the random nature of the
Monte Carlo process.
3. Another way to display this is described here. Open a new “Rectangular Plot”
item. Use the “Add Vs…” button to plot the “nf(2)” as a function of
“YIELD.mcTrial”. The plot should look like this:
5.6
5.4
nf(2)
5.2
5.0
4.8
0 20 40 60 80 100
YIELD.mcTrial
Note the plots in the last two steps are identical (they represent the same function). The last
two steps show two different ways to display the same thing.
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Lab 5: Receiver Yield Analysis
In the DDS window, insert a new “Rectangular Plot” and display the “NF” variable.
3.0
2.8
NF 2.6
2.4
2.2
2.0
0 20 40 60 80 100
mcTria l
The histogram is built in the data display window, using the “histogram” function.
Add two “Rectangular Plot”’s and display the two previously defined equations (scroll down
to the “Equations” position). The results should look like the one in the figure.
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Lab 5: Receiver Yield Analysis
20
15
his t_NF
10
0
2.0 2.2 2.4 2.6 2.8 3.0 3.2
indep(his t_NF)
20
15
his t_nf2
10
0
4.8 4.9 5.0 5.1 5.2 5.3 5.4 5.5 5.6 5.7
indep(his t_nf2)
In real life, there are multiple stochastic variables that contribute to the overall statistical
distribution, not only one. Also, there are multiple “objectives”, identified by yield
specifications that define the pass/fail test of a product.
As an example, the case of two statistical variables and two yield specifications is shown.
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Lab 5: Receiver Yield Analysis
The Edit Parameters window can be used, or the information can be typed in directly on the
schematic (use the stat function and curly braces):
Statstics to Enabled
Type to Gaussian
Delta % to 5
Expr to “dB(S21)”
Min to 25 _dB
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Lab 5: Receiver Yield Analysis
3. In the Yield controller, go to the Setup tab add Spec2 to the Yield Specs field.
Yie ld
Yie ld1
NumIte rs =100
P P T_Mode =none
S ha dowMode lType =none
S e e d=
S a ve S olns =ye s
S a ve Ra ndVa rs =ye s
S a ve S pe cs =ye s
Yie ldS pe cNa me [1]="S pe c2"
Yie ldS pe cNa me [2]="S pe c1"
S ta tus Le ve l=2
Note the final yield in the Status window and record the yield value:
Yield = _____ %
QUESTION: Why has the yield decreased from the yield found in the previous yield
analysis?
_______________________________________________________________________
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Lab 5: Receiver Yield Analysis
13.4.3.1 Yield:
1. Open a new data display window. Make sure the default data set is “c_rcvr_yld”
and save the window with the name “c_rcvr_yld”.
Yie ld
29.000
- the variables: - NF
- lna_gain
- receiver gain
These plots can be used to identify, if necessary, the value combinations of the statistical
variables that generate the worst-cases performance parameter values. It would be necessary
to zoom in the graphics to make a more accurate determination in the case of a large number
of trials.
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Lab 5: Receiver Yield Analysis
Yie ld
27.000
3.0
NF
2.5
2.0
14
13
lna _ga in
12
11
10
6.0
nf_vs _tria l
5.5
5.0
4.5
27
ga in_vs _tria l
26
25
24
0 20 40 60 80 100
mcTria l
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Lab 5: Receiver Yield Analysis
13.4.3.3 Histograms:
20 30
15
20
his t_nf2
his t_NF
10
10
5
0 0
2.0 2.2 2.4 2.6 2.8 3.0 3.2 4.4 4.6 4.8 5.0 5.2 5.4 5.6 5.8 6.0
20
20
his t_lna_gain
his t_rx_gain
15 15
10 10
5 5
0 0
10.5 11.0 11 .5 12.0 12.5 13.0 13.5 14 .0 24.0 24 .5 25.0 25.5 26.0 26 .5 27.0 27.5
indep(his t_lna _ga in) indep(his t_rx_gain)
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Lab 5: Receiver Yield Analysis
The gaussian distribution of lna_gain can be seen by a scatter plot. In the DDS window, use
Add Vs to plot mcTrial on the y axis vs. lna_gain on the x axis. Select the measurement,
and press the Trace Options button. Select the Trace Type tab, and specify a Scatter plot.
The graph should appear similar to the one below:
100
80
YIELD.mcTria l
60
40
20
0
10.0 10.5 11.0 11.5 12.0 12.5 13.0 13.5
lna _ga in
QUESTION: The gaussian nature of lna_gain can be discerned from the plot. What type
of appearance would the plot have if a uniform distribution was specified for lna_gain?
The results of statistical measurements in real-life are meaningful for large enough lots.
Consequently, the statistical analysis simulations must run for a sufficiently high number of
trials in order for the results to have statistical meaning. This is equivalent with a large real-
life lot of products.
The previous simulations used only 100 trials, which is not enough. In the schematic window
increase the number of trials (specified in the “Yield” controller) to 1000 trials. Re-run the
simulation and look at the results in the data display window.
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Lab 5: Receiver Yield Analysis
Note the noise figure histogram is looking “almost” flat. This is consistent with the definition
of the NF statistical variable, which is defined as having a uniform distribution. Hence, its
histogram should look as a constant (if the number of trials is sufficiently large).
As opposed to NF, the histogram of the lna_gain looks like a Gaussian distribution, which
exactly the distribution assigned to this variable.
As expected, the results are more “meaningful” from the statistical point of view.
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Lab 5: Receiver Yield Analysis
In this lab, yield analysis was performed to observe the system performance as parameter
values were randomly varied with a defined probability distribution function. Yield
specifications were defined to reflect the system specification for noise figure and gain of the
receiver. The yield performance was observed relative to the yield specifications defined.
This is a useful tool for evaluating the worst case performance of a system. It is also very
useful for evaluating the statistical performance of the system before the design goes into
production. Performing statistical analysis in the design stage can be very cost effective
relative to modifying a design after it has already gone to production.
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