Professional Documents
Culture Documents
NEMA WC 53-2008
Standard Test Methods for Extruded Dielectric Power, Control, Instrumentation, and
Portable Cables for Test
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NOTICE AND DISCLAIMER
The information in this publication was considered technically sound by the consensus of persons
engaged in the development and approval of the document at the time it was developed. Consensus does
not necessarily mean that there is unanimous agreement among every person participating in the
development of this document.
The National Electrical Manufacturers Association (NEMA) and the Insulated Cable Engineers Association
(ICEA) standards and guideline publications, of which the document contained herein is one, are
developed through a voluntary consensus standards development process. This process brings together
persons who have an interest in the topic covered by this publication. While NEMA and ICEA administers
the process and establishes rules to promote fairness in the development of consensus, they do not
independently test, evaluate, or verify the accuracy or completeness of any information or the soundness
of any judgements contained in its standards and guideline publications.
NEMA and ICEA disclaims liability for personal injury, property, or other damages of any nature
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In publishing and making this document available, NEMA and ICEA are not undertaking to render
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to perform any duty owed by any person or entity to someone else. Anyone using this document should
rely on his or her own independent judgement or, as appropriate, seek the advice of a competent
professional in determining the exercise of reasonable care in any given circumstances. Information and
other standards on the topic covered by this publication may be available from other sources, which the
user may wish to consult for additional views or information not covered by this publication.
NEMA and ICEA have no power, nor do they undertake to police or enforce compliance with the contents
of this document. NEMA and ICEA do not certify, test, or inspect products, designs, or installations for
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related information in this document shall not be attributable to NEMA and ICEA and is solely the
responsibility of the certifier or maker of the statement.
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ICEA T-27-581/NEMA WC 53-2008
Page i
CONTENTS
Page
Foreword iv
Section 1 GENERAL 1
1.1 SCOPE............................................................................................................................................. 1
1.2 REFERENCES................................................................................................................................. 1
1.2.1Normative References ............................................................................................................. 1
Section 2 ELECTRICAL METHODS 4
2.1 CONDUCTOR DC RESISTANCE.................................................................................................... 4
2.1.1Method When Sample Nominal Resistance is 1 Ohm or More ............................................... 4
2.1.2Method When Sample Nominal Resistance is Less Than 1 Ohm ........................................... 4
2.1.3Precautions for Short Sample Method ..................................................................................... 4
2.1.4Converting Measured Conductor Resistance to Resistance at 25ºC....................................... 5
2.2 VOLTAGE TESTS ON COMPLETED CABLES............................................................................... 5
2.2.1General..................................................................................................................................... 5
2.2.1.1.1 Single Conductor Cable and Assemblies without an Overall Jacket.................... 6
2.2.1.1.2 Multiple-conductor Cable with an Overall Jacket ................................................. 6
2.2.2ac Voltage Test ........................................................................................................................ 6
2.2.3dc Voltage Test ........................................................................................................................ 6
2.2.4Spark Testing ........................................................................................................................... 6
2.3 INSULATION RESISTANCE............................................................................................................ 8
2.3.1Single Conductor Cables.......................................................................................................... 8
2.3.2Multiple Conductor Cables ....................................................................................................... 8
2.3.3Method to Determine the 1°F Coefficient Factor for an Insulation ........................................... 8
2.3.4Converting Insulation Resistance to Insulation Resistance Constant ...................................... 9
2.4 DISSIPATION FACTOR (DF), CAPACITANCE (C), AND DIELECTRIC CONSTANT.................. 11
2.5 SUITABILITY OF INSULATION COMPOUNDS FOR USE ON DC CIRCUITS IN WET
LOCATIONS .................................................................................................................................. 11
2.6 ACCELERATED WATER ABSORPTION TEST, ELECTRICAL METHOD AT 60 Hz (EM-60) .... 12
2.7 DIELECTRIC CONSTANT AND VOLTAGE WITHSTAND FOR NONCONDUCTING STRESS
CONTROL LAYERS....................................................................................................................... 12
2.8 SPECIFIC SURFACE RESISTIVITY.............................................................................................. 13
2.9 U-BEND DISCHARGE RESISTANCE ........................................................................................... 13
2.10 TRACK RESISTANCE ................................................................................................................... 13
2.11 VOLUME RESISTIVITY ................................................................................................................. 14
2.11.1Conductor Stress Control..................................................................................................... 14
2.11.2Insulation Shield ................................................................................................................... 14
2.11.3Four-electrode Method ......................................................................................................... 15
2.12 SEMICONDUCTING JACKET RADIAL RESISTIVITY TEST ........................................................ 15
2.12.1Sample Preparation.............................................................................................................. 15
2.12.2Test Equipment Setup.......................................................................................................... 17
2.12.3Calculation............................................................................................................................ 17
2.13 Dry Electrical Test for Class III Insulations (Shielded Medium Voltage Only) ................ 18
2.13.1Test Samples ....................................................................................................................... 18
2.13.2Test Procedure..................................................................................................................... 18
2.13.3Electrical Measurements...................................................................................................... 18
2.14 Discharge Resistance Test for discharge resistant Insulation ....................................................... 18
2.14.1Test Specimens ................................................................................................................... 18
2.14.2Test Environment ................................................................................................................. 18
2.14.3Test Electrodes .................................................................................................................... 19
2.15 Wet Insulation Resistance Stability (600 – 2000 Volts).................................................................. 19
Section 3 DIMENSIONAL METHODS 21
3.1 CONDUCTOR CROSS-SECTIONAL AREA BY DIAMETER MEASUREMENTS......................... 21
3.2 THICKNESS OF COMPONENTS OVER A CONDUCTOR........................................................... 21
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ICEA T-27-581/NEMA WC 53-2008
Page ii
© Copyright 2008 by the National Electrical Manufacturers Association and the Insulated Cable Engineers
Association, Incorporated.
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ICEA T-27-581/NEMA WC 53-2008
Page iii
LIST OF TABLES
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Association, Incorporated.
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ICEA T-27-581/NEMA WC 53-2008
Page iv
Foreword
This Standard Test Methods Publication for Extruded Dielectric Power, Control, Instrumentation and
Portable Cables was developed by the Insulated Cable Engineers Association, Inc. (ICEA) and was
approved by the National Electrical Manufactures Association (NEMA).
ICEA/NEMA Standards are adopted in the public interest and are designed to eliminate
misunderstandings between the manufacturers and the user and to assist the user in selecting and
obtaining the proper product for his or her particular need. The user of this Standards Publication is
cautioned to observe any health or safety regulations and rules relative to the use of the test procedures
covered by this document.
Suggestions for improvements gained in the use of this publication will be welcomed by the Association.
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© Copyright 2008 by the National Electrical Manufacturers Association and the Insulated Cable Engineers
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ICEA T-27-581/NEMA WC 53-2008
Page 1
Section 1
GENERAL
1.1 SCOPE
This standard applies to the testing of extruded dielectric insulated power, control, instrumentation, and
portable cables.
1.2 REFERENCES
Included in this standard are many, but not all, of the test methods to which reference is made in
ICEA/NEMA Standards for Cables. For undated references, the reference shall be to the latest issue.
Copies of the following documents may be obtained from the appropriate source as follows:
ICEA T-28-562 Measurement of Hot Creep of Polymeric Insulations, Test Methods for
ICEA T-29-520 Procedure for Conducting Vertical Cable Tray Flame Tests with a Theoretical
Heat Input Rate of 210,000 B.T.U./Hour
ICEA T-30-520 Procedure for Conducting Vertical Cable Tray Flame Tests with a Theoretical
Heat Input Rate of 70,000 B.T.U./Hour
ICEA T-24-380 Guide for Partial Discharge Test Procedure
ICEA T-25-425 Guide for Establishing Stability of Volume Resistivity of Conducting Polymeric
Component of Power Cables
ICEA T-26-465 Guide for Frequency of Sampling Extruded Dielectric Power, Control,
Instrumentation, and Portable Cables for Test
© Copyright 2008 by the National Electrical Manufacturers Association and the Insulated Cable Engineers
Association, Incorporated.
ICEA T-27-581/NEMA WC 53-2008
Page 2
Not all the tests mentioned above are relevant for a given cable design or a given application.
A few specialized test methods are described in ICEA Standard Publication S-94-649, Standard For
Concentric Neutral Cables Rated 5,000 – 46,000 Volts.
When a procedure for measuring a specified parameter is not specified, that parameter shall be
determined by any suitable means.
When another standard is referenced in this document, its title and date of issue may be found in Section
1. The reference is only to that specified document.
In this standard, temperatures are expressed in degrees Celsius, weights in grams, and metal resistivities
in nanoohm-meter. Other properties are expressed in U.S. customary units throughout this standard.
Approximate International System of Units (SI) equivalents are included for information only.
o
Room temperature is defined as 25±5 C. Where this temperature range cannot be maintained, (test)
measurements may be made at the prevailing ambient room temperature, which shall be recorded.
The Fahrenheit equivalents for Celsius degrees may be calculated by the equation
deg F = 1.8 deg C + 32
The ounce equivalents to grams may be calculated by dividing the number of grams by 28.4.
The ohm cmil per ft equivalents to nanoohm•meter may be calculated by multiplying the nanoohm•meter
value by 0.602.
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Page 3
Conductor size is expressed in cross-sectional area in thousand circular mils (kcmil). For convenience, in
the text and tables, only the equivalent AWG size is used for 211.6 kcmil (4/0 AWG) and smaller. For
kcmil values of AWG sizes see the following Table 1-1:
Table 1-1
kcmil Equivalent of AWG Conductor Sizes
AWG kcmil AWG kcmil AWG kcmil
22 0.640 13 5.18 4 41.74
21 0.812 12 6.53 3 52.62
20 1.02 11 8.23 2 66.36
19 1.29 10 10.38 1 83.69
18 1.62 9 13.09 1/0 105.6
17 2.05 8 16.51 2/0 133.1
16 2.58 7 20.82 3/0 167.8
15 3.26 6 26.24 4/0 211.6
14 4.11 5 33.09
To convert values in a non-metric unit to the approximate value in an appropriate metric unit, multiply the
value in the non-metric unit by the appropriate number from the following Table 1-2:
Table 1-2
Conversion Table
From To Multiplier
inches (in) millimeters (mm) 25.4
feet (ft) meter (m) 0.305
ohms per 1000 feet (Ω/1000 ft) milliohms per meter (mΩ/m) 3.28
2 2
square inch (in ) square millimeter (mm ) 645.0
2
thousand circular mils (kcmil) square millimeter (mm ) 0.507
kilovolts per inch or volts per mil megavolts per meter or kilovolts per millimeter 0.0394
(kV/in or V/mil) (MV/m or kV/mm)
pounds per square inch (psi) kilopascals (kPa) 6.89
pounds tension or force per inch Newtons per meter (N/m) 175.0
(lb/in)
megohms-1000 ft (MΩ-1000 ft) megohms-meter (MΩ-m) 305.0
gigaohms-1000 ft (GΩ-1000 ft) gigaohms-meter (GΩ-m) 305.0
3
liquid ounces (liq oz) cubic centimeter (cm ) 29.6
© Copyright 2008 by the National Electrical Manufacturers Association and the Insulated Cable Engineers
Association, Incorporated.
ICEA T-27-581/NEMA WC 53-2008
Page 4
Section 2
ELECTRICAL METHODS
Current contacts shall be made in such a way as to ensure essentially uniform current density among the
wires.
When potential leads are used, the distance between each potential contact and the corresponding
current contact shall be at least equal to 1.50 times the circumference of the specimen. When a Kelvin-
type bridge is used, the yoke resistance (between reference standard and test specimen) shall be
appreciably smaller than that of either the reference standard or the test specimen unless a suitable lead
compensation is used or it is known that the coil and lead ratios are sufficiently balanced so that variation
in yoke resistance will not decrease the bridge accuracy below that given as follows: .
The distance between potential electrodes shall be measured to an accuracy of ± 0.05 percent. To ensure
this accuracy in measuring the length between potential contacts, the surface in contact with the test
specimen shall be a substantially sharp knife-edge.
Resistance measurements shall be made to an accuracy of ± 0.15 percent. To ensure a correct reading,
the reference standard and the test specimen should be allowed to come to the same temperature as the
surrounding medium. (If the reference standard is made of manganin, it is possible to obtain correct
readings with the test specimen at reference temperatures other than room temperature.)
In all resistance measurements, the measuring current raises the temperature of the medium. Therefore,
the magnitude of the current shall be low and the time of its use short enough so that changes in
resistance cannot be detected with the galvanometer.
In bridge measurements, the potential contact resistance shall be as low as possible. If low contact
resistance cannot be achieved, appropriate contact-resistance corrective circuits shall be used. To
eliminate errors due to contact potential, two readings, one direct and one with current reversed, shall be
taken in direct succession. Check tests may be made by turning the specimen end for end and repeating
the test. The material used for the two potential contacts shall be the same to minimize imbalanced
contact potentials. If necessary, the contact surfaces shall be cleaned.
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Page 5
The conversion factors given in Table 2-1 are satisfactory for most applications. They are based upon
copper having 100 percent conductivity (resistivity = 17.582 nanoohm·meter at 25ºC) and aluminum
having 61 percent conductivity (resistivity = 28.834 nanoohm·meter at 25ºC ) The factors are derived from
the formulas:
259.5 253.0
R1 = R2 for copper R1 = R2 for aluminum
234.5 + T2 228.0 + T2
Where:
R1 = Resistance at 25ºC
R2 = Measured Resistance at Temperature T2
For more accurate determination of resistance, allowing for different conductivity, see Copper Wire
Tables, National Bureau of Standards, Handbook No. 100 or Aluminum Wire Tables, National Bureau of
Standards Handbook 109 and ASTM B 193.
Table 2-1
FACTORS FOR CONVERTING MEASURED DC RESISTANCE OF CONDUCTORS TO 25ºC
o
Temperature C Multiplying Factor for Multiplying Factor for
Copper Aluminum
0 1.107 1.110
5 1.084 1.085
10 1.061 1.063
15 1.040 1.041
20 1.020 1.020
25 1.000 1.000
30 0.981 0.981
35 0.963 0.962
40 0.945 0.944
45 0.928 0.927
50 0.912 0.910
55 0.896 0.894
60 0.881 0.878
65 0.866 0.863
70 0.852 0.849
75 0.838 0.835
80 0.825 0.821
85 0.812 0.808
90 0.800 0.796
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Page 6
testing (see 2.2.1.1.1). After the overall jacket is applied, each insulated conductor shall be tested against
all other conductors connected to ground. Immersion in water is not required.
The initially applied ac test voltage shall be not greater than the rated ac voltage of the cable under test.
The initially applied dc voltage shall be not greater than 3.0 times the rated ac voltage of the cable.
The duration of the dc voltage test shall be 15 minutes for cables with insulation shield and 5 minutes for
cables without insulation shield.
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ICEA T-27-581/NEMA WC 53-2008
Page 7
2.2.4.1 Equipment
A spark tester shall include a suitable source of ac or dc potential, an electrode, a voltmeter, a
fault-signal device or system, and the necessary electrical connections.
Under all normal conditions of leakage current, the potential source of a spark tester shall maintain the
specified test voltage between the electrode and ground. The core of a transformer as well as one end of
its secondary winding shall be reliably connected to ground (earth). A potential source shall not be
connected to more than one electrode.
The electrode shall be of the link- or bead-chain or other type capable of maintaining contact throughout
its length with the periphery of the cable being tested. The bottom of the metal electrode enclosure shall
be U or V shaped, the chains shall have a length appreciably greater than the depth of the enclosure, and
the width of the trough shall be approximately 1.5 in (38.1 mm). greater than the diameter of the largest
size of wire that is tested.
If a bead-chain electrode is used, the beads shall have a diameter of 3/16 in. (4.8 mm). The longitudinal
spacing of the chains shall not be more than ½ inch. The transverse spacing of the chains shall not be
more than 3/8 in. (9.5 mm) but a spacing of ½ inch is acceptable if the transverse rows of chain are
staggered.
The electrode shall be provided with a grounded (earthed) metal screen or an equivalent guard to prevent
persons from touching the electrode.
The voltmeter shall be connected in the circuit to indicate the actual test potential at all times.
The equipment shall include a light, counter, or other device or system that gives a visible signal in the
event of a fault. When a fault is detected, the signal shall be maintained until the indicator is reset
manually.
2.2.4.2 Procedure
The length of the electrode is not specified, but the rate of speed at which the wire travels through the
electrode shall ensure that any point on the wire is in contact with the electrode for not less than 0.05
seconds with dc or 9 cycles with ac.
The electrode shall make contact with the entire exposed surface of a single-conductor cable and of an
assembly of twisted single-conductor cables.
Where an assembly of twisted single-conductor cables is subjected to the ac or dc spark test, the
individual conductors shall be similarly tested prior to assembly.
The conductor, cable shield, sheath or armor, as applicable, of the cable shall be connected to ground
(earthed) during the spark test. A ground (earth) connection shall be made at both the pay-off and take-up
reels except that, if the conductor, cable shield, sheath or armor was tested for continuity prior to
conducting of the spark test and found to be of one integral length, the ground (earth) connection need be
made at only one point-at either the take-up or pay-off reel. In any case, a reel at which a ground (earth)
connection is made shall be bonded directly to the ground (earth) on the potential source of the spark
tester.
The maximum speed of the cable under ac spark test may be determined in either U.S. customary units or
in metric equivalents as follows:
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Page 8
MS =
5
(F )(EL )
9
Where:
MS = Maximum speed in ft per minute
F = Frequency in Hertz
EL = Electrode length in inches
MS =
1
(F )(EL )
50
Where:
MS = Maximum speed in meters per minute
F = Frequency in Hertz
EL = Electrode length in mm
2.2.4.3 Failure
Measurements shall be taken between each conductor and all other conductors connected to ground.
The three samples shall be immersed in a water bath equipped with heating, cooling, and circulating
facilities, with the ends of the samples extended at least 2 ft (0.609 m) above the surface of the water and
properly prepared for minimum leakage. The samples shall be left in the water at room temperature for 16
hours before adjusting the bath temperature to 10ºC or before transferring the samples to 10ºC test
temperature bath.
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Page 9
The resistance of the conductor shall be measured at suitable intervals until it remains unchanged for at
least 5 minutes. The insulation will then be at the temperature of the bath as read on the bath
thermometer. Insulation resistance shall then be measured in accordance with 2.3.
Each of the three samples shall be exposed to successive water temperature of 10, 16, 22, 28, and 35ºC
and, returning, 28, 22, 16, and 10ºC. Insulation resistance readings shall be taken at each temperature
after equilibrium has been established.
The two sets of readings taken at the same temperature shall be averaged and, together with the reading
at 35ºC plotted on semi-log paper with temperature along the linear axis. The insulation resistance value
at 15.6ºC (60ºF) shall be read from the plot.
The 1ºF coefficient shall be calculated by dividing the insulation resistance at 15.6ºC (60ºF) by that at
16.1ºC (61ºF).
The resistivity coefficient, CIR, rounded off to two decimal places, shall be used to enter the appropriate
column in Table 2-2 in order to find the factor for converting to insulation resistance at 15.6ºC (60ºF) the
insulation resistance measured at the temperature, t, of the production or shipping length.
2.3.4 Converting Insulation Resistance to Insulation Resistance Constant
The measured insulation resistance (IR) converted to resistance at 15.6ºC (60ºF), shall be converted to
insulation resistance constant (IRK) by use of measured diameters and the following equation:
IR (TCF )
IRK =
D
log10
d
Where:
IRK = Insulation resistance constant in megohms-1000 ft
IR = Insulation resistance in megohms-1000 ft, at 15.6ºC
TCF = Temperature correction factor for converting insulation resistance to 15.6ºC
D = Diameter over the insulation in inches
d = Diameter over conductor stress control layer, when present, or over conductor, in
inches
NOTE—It may be more convenient, at times, to express IR and IRK in gigaohms- or teraohms-1000 ft. A gigaohm equals 109ohms,
a teraohm equals 1012 ohms, while a megohm equals 106ohms.
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Page 10
Table 2-2
TEMPERATURE CORRECTION FACTORS (TCF) FOR CONVERTING INSULATION RESISTANCE
TO 15.6ºC
(t-60)
*Calculated from the following formula: TCF=CIR where CIR is determined in accordance with 2.3.3 and t is the cable
temperature in degrees Fahrenheit
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Incorporated.
ICEA T-27-581/NEMA WC 53-2008
Page 11
C and DF shall be determined at the specified frequency and temperature, using a suitable ac bridge, e.g.,
a Schering or a Transformer-Ratio-Arm bridge. The measurements shall be made at Vg (the voltage
between conductor and ground of a three-phase system). Vg is the rated phase to phase voltage divided
by the square root of three. The measured capacitance shall be length adjusted to picofarads per ft, using
the measured length of cable between electrodes.
The equivalent geometric capacitance (C0), shall be calculated from the formula:
7.354
C0 =
D
log10
d
Where:
C0 = Equivalent geometric capacitance, in picofarads per ft
D = Diameter over insulation, in inches
d = Diameter over conductor stress control layer, when present, or over conductor, in inches
The ratio of the measured capacitance divided by the geometric capacitance (C/C0) shall be the Dielectric
Constant of the sample.
b. Three identical specimens shall be used. The center 10 ft (2.54 m) section of each specimen
shall be immersed in water with adequate end sections at least 12 in. (305 mm) long. These
three specimens shall be immersed in the same or identical glass containers (bath).
Water Bath: The water bath (test tank) shall be made of glass and maintained at the specified
temperature ± 1ºC, and shall contain tap water with a pH of 6.0 to 8.0. The water bath shall be connected
to ground to serve as the grounded electrode. Only bare copper electrodes shall be used. A suitable cover
shall be placed over the water bath and the water maintained at a constant level flush with the surface of
the cover.
Test Potential: A negative dc potential of 600 volts shall be applied to the conductors of the three test
specimens immediately after immersion and shall be so maintained for the duration of the test except
during the measuring intervals. The positive electrode shall be connected to the water bath and ground.
Test Period: Method EM-60 ac measurements in accordance with 2.6 shall be made on each test
specimen after a total immersion period of 1 day, 1 week, 2 weeks, and each 2 week period thereafter for
a total period of 16 weeks unless sample failure occurs before this period. Immediately previous to the
above measurements, a 60 Hz test potential of 5000 volts for 5 minutes is to be applied to each specimen
at each measuring interval. The stability factor for each measuring method shall be in accordance with
Section 2.6.
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Page 12
Capacitance. The capacitance of the insulation shall be determined at an average stress of 80 kV/in (3.2
kV/mm) at approximately 60 Hz after 1, 7, and 14 days immersion. The increase in capacitance from 1 to
14 days and from 7 to 14 days shall be expressed as a percentage of the 1 and 7 day values, respectively.
The dissipation factor of the insulation at an average stress of 80 kV/in (3.2 kV/mm) and 40 kV/in (1.6
kV/mm) shall be determined after 1 and 14 days immersion. The dissipation factor shall be expressed to
the nearest 0.001.
Stability Factor. The stability factor is 100 times the difference between dissipation factor at 80 kV/in (3.2
kV/mm) and 40 kV/in (1.6 kV/mm) after the test specimen has been immersed in water at the specified
test temperature for the specified time. The alternate to the stability factor is the stability factor at the
specified time minus stability factor at one day.
Dielectric Constant Calculation. The dielectric constant of the insulation at 60 Hz shall be calculated as
follows:
D
Dielectric Constant = 13600 C log10
d
Where:
C = Capacitance in microfarads of the 10 ft (3.05 meter) section.
D = Diameter over the insulation
d = Diameter under the insulation
The sample shall be a (18 ± 1) inch [(457 ± 25.4) mm] long conductor over which (0.015-0.030) inch
[(0.381 - 0.762) mm] of nonconducting stress control material has been extruded. The central (12 ± 1)
inch [(305 ± 25.4) mm] length shall be shielded using a silver-painted electrode or equivalent applied to
the stress control layer surface. The dielectric constant of the layer shall be determined at the required
temperatures in accordance with 2.4 except that a low voltage 60-Hz capacitance bridge shall be used.
Following the dielectric constant determination and while the specimen is kept at the specified
temperature, a 60-Hz ac potential shall be applied between the conductor and the grounded shield
(painted electrode) with a rate of rise not in excess of 100 volts per second until dielectric failure occurs.
The dielectric withstand stress shall be calculated as follows:
2V
S=
D−d
Where:
S = Dielectric withstand stress, in kV/ in.
V = Actual breakdown level, in kilovolts
D = Diameter over stress control layer, in inches
d = Diameter under stress control layer, in inches
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Page 13
P = 0.524 R (D)
Where:
P = Specific surface resistivity, in megohm
R = Measured resistance in megohm per 6 in. spacing
D =Cable diameter in inches
The bent sample after removal from the mandrel shall be mounted with the apex of the U above and in
contact with a smooth metal plate and with the legs of the U perpendicular to the plate. After not less than
30 minutes nor more than 45 minutes following the bending, a source of 49-61-Hz ac potential at the
specified voltage shall be applied between the conductor and the metal plate continuously for the specified
time and temperature.
Method A. The track resistance shall be determined in accordance with ASTM D 2132 modified as
followed:
a. Three test specimens of insulated conductor, each 5 ½ in. (140 mm) long, shall be used.
b. Seven electrodes shall be applied to each test specimen, with a ¾ inch (19 mm) minimum
space between each electrode. Each electrode shall consist of at least one turn of a 12 AWG
coated copper wire wrapped tightly around the specimen.
c. Three test specimens shall be placed horizontally in the test chamber at right angles to the axis
of the spray and equidistant from the nozzle. The upper half of each specimen shall be dusted.
The dust shall then be removed for approximately a 0.05 in. (1.27 mm) width immediately
adjacent to both sides of the three electrodes that are to be energized.
d. The end electrodes, each alternate electrode and the conductor in each test specimen shall be
grounded. A 60-Hz potential shall be applied to the remaining three electrodes of each
specimen.
e. The test potential shall be raised to 1500 volts and the fog deposit adjusted to give a current
between 4 and 10 milliamperes. Failure occurs when the circuit breaker trips.
NOTE—For further information see IEEE Transactions on Power Apparatus and Systems, Volume 84, 1965, page 815 (paper 31
TP 6), Discharge Resistant Characteristics of Polyethylenes for Wire and Cable by E. K. Duffy, S. Jovanovitch, and I. J. Marwick.
© Copyright 2008 by the National Electrical Manufacturers Association and the Insulated Cable Engineers
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ICEA T-27-581/NEMA WC 53-2008
Page 14
Method B. The track resistance shall be determined in accordance with the following:
a. The test specimen shall be a strip 2 in. (50.8 mm) long and at least 0.060 in. (1.52 mm) thick
and shall be taken from the outside of the insulation. The conductor stress control layer shall
be removed.
b. An electrode shall be attached near one end of the specimen and to the surface that was the
outside surface of the insulation.
c. The specimen shall be immersed in a 0.1 percent solution of ammonium chloride at ground
potential until the electrode contacts the surface of the solution and then withdrawn 1 inch
(25.4 mm) of its immersed length. This procedure shall be repeated four times per minute of a
minimum of 10 cycles and a maximum of 50 cycles or until failure occurs. Failure occurs
when an arc is maintained for two successive cycles between the electrode and solution
across 1 in. (25.4 mm) of specimen.
d. A 60-Hz test potential shall be applied to the electrode attached to the specimen. The tracking
voltage is the voltage at which no failures occur on five consecutive test specimens.
NOTE—For further information, see IEEE Transactions on Electrical Insulation, December 1967, Vol. El-2, No. 3, Page 137 (Paper
31 TP66-360), Dip-Track Test by C. F. Wallace and C. A. Bailey.
R ( D2 - d 2 )
ρ=
100L
Where:
ρ = Volume resistivity in ohm-meters.
R = Measured resistance in ohms.
D = Diameter over the conductor stress control layer in inches.
d = Diameter over the conductor in inches.
L = Distance between potential electrodes in inches.
Two silver-painted electrodes shall be applied to the insulation shield spaced at least 2 in. (50.8 mm) apart.
Connect the electrodes to an ohmmeter. The energy released in the conducting component shall not exceed
100 milli-watts. The resistance of the conducting component between the electrodes shall be determined at
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Page 15
the specified temperature. A convection-type forced-draft, circulating air oven, shall be utilized capable of
maintaining any constant ± 1ºC temperature up to 140ºC.
2R ( D 2 - d 2 )
ρ=
100L
Where:
ρ = Volume resistivity in ohm-meters.
R = Measured resistance in ohms.
D = Diameter over the insulation shield layer in inches.
d = Diameter over the insulation in inches.
L = Distance between potential electrodes in inches.
Conductor shield: The samples shall be cut in half longitudinally and the conductor removed. Four silver-
painted electrodes shall be applied to the conductor shield. The two potential electrodes (inner) shall be at
least 2 in. (50.8 mm) apart. A current electrode shall be placed at least 1 in. (25.4 mm) beyond each
potential electrode.
Insulation shield: Four annular-ring electrodes shall be applied to the surface of the insulation shield layer.
The two potential electrodes (inner) shall be at least 2 in. (50.8 mm) apart. A current electrode shall be
placed at least 1 in. (25.4 mm) beyond each potential electrode.
Connect the two outer electrodes (current) in series with the current source and an ammeter or the current
leads of a bridge. Connect the two inner electrodes (potential) to potentiometer leads of a bridge or to a
voltmeter. A dc or 60 Hz ac source can be used.
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Page 16
Electrode G G
Semi- Electrode
Conducting
Jacket 2.0"
Concentric
Neutral 0.125" 0.5"
Electrode E1 E2
Figure 2-1
SAMPLE PREPARATION FOR RADIAL RESISTIVITY MEASUREMENT OF SEMI-CONDUCTING
JACKETS
Legend:
E1 - Measuring electrode, conducting paint on the surface of the jacket
E2 - Measuring electrode, metallic tape shield, lead sheath or wires tied together
G - Guard electrode, conducting paint on the surface of the jacket
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ICEA T-27-581/NEMA WC 53-2008
Page 17
Adjustable resistor Rc is used to control the potential of the guard electrodes to the same value as E1. This is
done to prevent surface current from affecting the measurement. As it is adjusted, the measured voltage V1
may go through a minimum point. The voltage V2 and current measurements shall be made with Rc adjusted
such that V1 is as close to zero as possible.
G E1 G E2
Power
Supply
Return
A V
2
Ammeter
Volt
Meters
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RC Guard V1
Figure 2-2
CIRCUIT FOR RADIAL RESISTIVITY MEASUREMENT OF SEMI-CONDUCTING JACKETS
Legend: E1, E2 and G are the same notations used in Figure 2-1.
2.12.3 Calculation
Calculate the resistance R of the cable jacket from the measurements of voltage V2 and current obtained
using the circuit in Figure 2-2 (R = V2/I). Using the value R and the appropriate dimensions of the cable
sample, calculate the apparent resistivity as follows:
R x 2π x L
ρv =
D
ln
d
Where:
ρv = apparent resistivity in ohm-meters
R = calculated resistance in ohms
L = electrode length in meters
D = diameter over the semiconducting jacket in mm
d = pitch diameter* of the wires with out separator tape or mean diameter of corrugated tape or
corrugated sheath or the diameter over the separator tape, smooth metallic sheath or flat tape in mm.
*The pitch diameter d is measured from center to center of two concentric wires which are diametrically
opposite from each other.
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ICEA T-27-581/NEMA WC 53-2008
Page 18
2.13 DRY ELECTRICAL TEST FOR CLASS III INSULATIONS (SHIELDED MEDIUM VOLTAGE
ONLY)
2.13.1 Test Samples
At least three samples shall be tested. A sample shall consist of a 1/0 AWG aluminum or copper 15kV cable
utilizing a 100% insulation level (nominal 175 mil )wall thickness along with a conductor shield and an outer
insulation shield with any suitable metallic shield. The samples shall be 30 ft (9.1 m) long.
Where:
DFn = the last dissipation factor measurement (average of the three samples).
The partial discharge shall be measured and recorded on the initial specimens and after the current loading
test has been completed.
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Page 19
The insulated test specimen shall be no larger than a 1/0 AWG. The specimen shall be placed in a
water bath and water maintained at the insulation rated temperature ±2ºC. The test specimens
shall be energized continuously at a test potential of 600 volt ac except during test measurement.
Measurements shall be taken between the conductor and water with a megohmeter or megohm
bridge. The insulation resistance of the test specimen shall be read after a 60 second application of
dc voltage of 100 to 500 volts between the conductor and water.
The insulation resistance of each specimen shall be measured after 1, 7, and 14 days and at each
weekly interval thereafter over an immersion period of 12 weeks or more. The period of immersion
over which the insulation resistance stabilizes shall be known as the insulation resistance
stabilization period and its duration shall be determined from Table 2-3.
Table 2-3
Insulation Resistance Stabilization Period
Immersion Time Stabilization Period
(Weeks) Minimum(Weeks)
12 6
14 to 24 ½ the Immersion Time
26 or More 12
If at all times the insulation resistance is higher than 10.0 megohms-1000 feet, the immersion time
shall be 12 weeks or more. If at any time the insulation resistance is 10.0 megohms-1000 feet or
less, the time of immersion shall be 24 to 36 weeks.
IR = Rm(L/1000)
Where:
IR = Insulation resistance measured at rated normal service operation temperature,
megohms-1000 feet.
Rm = Measured resistance, megohms
L = length of test specimum
The maximum rate of decrease in the insulation resistance per week shall not be more than 4% if
the immersion period is terminated after 12 weeks and not more than 2% if the required immersion
period is 24 or 36 weeks. The maximum decrease shall be determined for a linear regression
curve of the actual values. If the test is terminated after 12 weeks, the ratio of the values
determined from the curve for week 7 to that of week 12 shall not be more than 1.23:1. If the test is
terminated after 24 weeks, the ratio of the values determined from the linear regression curve for
© Copyright 2008 by the National Electrical Manufacturers Association and the Insulated Cable Engineers
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week 19 to that of week 24 shall not be more than 1.11:1. If the test is terminated after 36 weeks
the ratio from the linear regression curve for week 31 to that for week 36 shall not be more than
1.11:1.
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ICEA T-27-581/NEMA WC 53-2008
Page 21
Section 3
DIMENSIONAL METHODS
3.1 CONDUCTOR CROSS-SECTIONAL AREA BY DIAMETER MEASUREMENTS
The cross-sectional area of a conductor shall be calculated as follows:
n
A =10 − 3 ∑ d i2
i =1
Where:
A = Cross-section in kcmil
di = Diameter of the ith wire in 0.001 in. units (mils) determined according to the micrometer
method for conductor diameter
n = Total number of wires in conductor When n = 1, the average of three measurements of
diameter shall be used for d.
3.2.4 Tape
Thickness shall be the average of five readings taken at different points of the tape after removal of the
tape from at least 6 in. of the cable. The micrometer shall be designed for the tape type as follows:
Shall be measured with a presser foot (0.25 ± 0.01) in. [(6.35 ± 0.254) mm] in diameter and exerting a
total force of 85 ± 3 grams, the load being applied by means of a weight.
Shall be measured with a micrometer having flat surfaces on both the anvil and the end of the spindle.
The sample shall be taken from at least 6 in. of core or cable.
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Page 22
3.2.5 Sheath
Thickness shall be the average of 10 measurements, five of which were made approximately equally
spaced around the circumference of a sample [at least 3 in. (76.2 mm) long] cut perpendicular to the cable
axis at one end of the cable length, the other five being made similarly on a sample from the other end.
Exception: For solid conductors, the diameter measurements shall be made at each end of the sample
and one near the middle of the sample. The average of the three measurements shall be taken as the
diameter.
3.3.3 Tape Method for Any Component Having a Diameter 0.750 inch (19.1 mm) or Greater
o
A diameter tape graduated with at least 0.01 in. (0.254) divisions shall be wrapped one turn (360 ) around
the circumference of the component, tightly and perpendicular to the axis of the component. The average
diameter of the component shall be read directly from the diameter tape.
3.4 PROTRUSION AND CONVOLUTION MEASUREMENT
To measure the size of protrusions, and conductor shield convolutions in wafers, the wafers shall be
viewed in an optical comparator or similar device which displays the wafer so that a straight edge can be
used to facilitate the measurement or may be accomplished through digital imaging and computer
programming. Protrusion shall be measured as shown in Figure 3-1. Conductor shield convolutions shall
be measured as shown in Figure 3-2. This procedure is used on cable wafers with the conductor, jacket
and metallic shield removed.
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Insulation
Shield
Insulation
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Shield Protrusion of
Insulation Protrusion
shield into of
Insulation shield into
insulation
Conductor insulation
Shield
Conductor
Shield
Figure 3-1
PROCEDURE TO MEASURE PROTRUSIONS AND INDENTATIONS
Convolutions
Insulation
Shield
Insulation
Conductor
Shield
Figure 3-2
PROCEDURE TO MEASURE CONVOLUTIONS
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ICEA T-27-581/NEMA WC 53-2008
Page 24
Section 4
PHYSICAL METHODS
Starting at one end of the sample, make two parallel longitudinal cuts, 1/2 in. (12.7 mm) apart and not less
than 12 in. (305 mm) long, through the insulation shield. The specimen shall be rotated 180 degrees, and
two identical cuts shall be made starting from the same end. Each 1/2 in. (12.7 mm) strip shall be peeled
back from the cut end for a distance of 2 in. (50.8 mm).
The specimen shall be held securely at each end. The 2 in. (50.8 mm) end of the peeled strip shall be
gripped in such a manner that it can be pulled at an angle of 90 degrees to the cable axis.
Each strip shall be peeled from the cable at approximately 1/2 in. (12.7 mm) per second for a distance of
not less than 10 in. (254 mm). The angle of pull shall be maintained as close to 90 degrees as possible
throughout the test.
The force necessary to remove the strip shall be monitored continuously, and the minimum and maximum
value shall be recorded.
4.2 COLD BEND
To determine compliance with a cold bend withstand requirement, a sample of completed cable of the
specified length shall be subjected to the specified temperature for 1 hour and then bent 180 degrees
around a mandrel of the specified diameter immediately upon its removal from the cooling chamber. The
bend shall be made at a uniform rate, and the time required to remove the sample from the cooling
chamber and complete the test shall not exceed 1 minute.
a. Insulated Conductors 4/0 AWG and smaller. The initial diameter of a 1 in. (25.4 mm) long
specimen of the insulated conductor shall be measured with a micrometer caliper having a flat
surface on both the anvil and spindle. The diameter of the uninsulated conductor shall be
measured also. The thickness, T1, shall be calculated as follows:
D −C
T1 =
2
Where:
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b. Insulated Conductors larger than 4/0 AWG. A sample of insulation approximately 8 in. (203
mm) long shall be prepared to have a thickness of (0.05 ±0.01) in. [(1.27 ±0.254) mm] and
smooth surfaces. From this sample, test specimens 1 in. (25.4 mm) long and (9/16 ±1/16) in.
[(14.3 ± 1.6) mm] wide shall be prepared. The thickness of the specimen, T1, shall be
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ICEA T-27-581/NEMA WC 53-2008
Page 25
measured with a Randall & Stickney, or equivalent, gauge having a 3/8 in. (9.5 mm) diameter
foot with no loading other than the 85 grams of the gauge.
The following steps shall be completed in 3 hours. A Randall & Stickney, or equivalent, gauge with a load
as indicated in Table 4-1 on the foot, shall be placed in an oven that is preheated to the specified
temperature. At the end of 1 hour, the test specimen shall be placed in the oven, and both the gauge and
the test specimen shall remain in the oven for 1 hour. At the end of this 1 hour period, the specimen shall
be placed directly under the foot of the gauge and allowed to remain in the oven under load for 1 hour at
the specified temperature.
At the end of this period, the dial of the gauge shall be read for one of the following:
a. The value of F for insulated conductors 4/0 AWG and smaller. The thickness, T2, shall then
be calculated as follows:
F −C
T2 =
2
Where:
T2 = Thickness after the heat distortion test.
F = Final outside diameter as read from the gauge.
C = Diameter of the uninsulated conductor.
T1 − T2
Deformation Percent = 100
T1
Table 4-1
Load VS. Conductor Size In Heat Deformation Test
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Where the diameter of the cable does not permit the preparation of a specimen 9/16 in. (14.3 mm) wide, a
molded sheet of the same compound may be used.
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The thickness of the specimen, T1, shall be measured at room temperature with a Randall & Stickney, or
equivalent, gauge having a 3/8 in. (9.5 mm) diameter foot with no loading other than the 85 grams of the
gauge.
The Randall & Stickney, or equivalent, gauge with a load of 2000 grams on the foot shall be placed in an
oven which is preheated to the specified temperature. At the end of 1 hour, the test specimen shall be
placed in the oven, and both the gauge and the test specimen shall remain in the oven for 1 hour. At the
end of this 1 hour period, the specimen shall be placed directly under the foot of the gauge and allowed to
remain in the oven under the load for 1 hour at the specified temperature. At the end of this period, the
thickness, T2, shall be read on the dial of the gauge.
The two halves of the split end of the test specimen shall be placed in the jaws of the testing machine and
the jaws separated at the rate of (20 ±2) in. [(508 ± 50.8) mm] per minute. The tear resistance shall be
determined by dividing the load in pounds required to tear the section by the thickness of the test
specimen in inches.
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Figure 4-1
TEST SPECIMEN FOR TEAR TEST
The surface of the sample shall be cleaned by scrubbing with a lintless cloth moistened with water, dried
for 48 hours in a vacuum of 5 mm of mercury or less over calcium chloride at (70 ±2) ºC, and then
weighed to the nearest milligram, Weight A.
The surface area, S, shall be the number of square in. immersed in water in a 10 in (254 mm) length of a
covered wire or the total area in square in. immersed in water of other samples.
A covered wire sample shall be bent in the shape of a U around a mandrel having a diameter not less than
three times the diameter of the sample. The ends shall be inserted in tightly fitting holes in the cover of a
16-oz (liquid) jar so that 10 in. (254 mm) of the sample will be immersed when the jar is completely filled
with water and the cover applied.
Using freshly boiled distilled water, which has been cooled and maintained to the specified temperature ±
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1ºC, immerse the sample for 168 hours. The level of the water shall be maintained flush with the
undersurface of the cover during the soaking period. After 168 hours, the water shall be cooled to room
temperature. The sample shall be removed and the adhering water shaken off. It shall be blotted lightly
with a lintless cloth and weighed within 3 minutes to the nearest milligram, Weight B.
The sample shall be dried in a vacuum of 5 mm of mercury or less over calcium chloride at 70±2ºC for 48
hours and then weighed to the nearest milligram, Weight C.
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Page 28
The water absorption shall be calculated in terms of milligrams per square inch of surface as follows:
B −C
Water Absorption (if C is less than A) =
S
B−A
Water Absorption (if C is greater than A) =
S
Where:
A = Weight of the sample in milligrams before immersion.
B = Weight of the sample in milligrams after immersion.
C = Weight of the sample in milligrams after drying in vacuum.
S = Total immersed area in square in. of the sample.
4.7 DIRECTION AND LENGTH OF LAY
Direction of lay - The direction of lay shall be determined visually. When looking along the axis of a
conductor, member or cable assembly, a right-hand lay recedes from the observer in clockwise rotation;
left-hand recedes in a counterclockwise rotation.
Length of lay - The lay length shall be determined by measuring the axial length of one turn of the helix of
a wire, or member of an assembly. The lay length shall be measured using a straight specimen or section
with any suitable scale or instrument to an accuracy of 0.1 in. (2.54 mm) or better.
The equipment and procedure for methods B and C shall be in accordance with 2.2.4, Spark Testing.
Methods B and C are appropriate only when a metallic component, suitable for the spark test ground
(earth) connection, is present under the jacket.
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Table 4-2
JACKET IRREGULARITY INSPECTION
Specified Minimum Method B Method C
Thickness of Jacket Method A
ac Spark Test Voltage
mils mm kV kV
35 and less 0.9 and less Visual Inspection 1.5 3.5
36 - 45 0.91 – 1.14 “ 2.0 4.5
46 - 55 1.15 – 1.40 “ 2.5 6.0
56 - 65 1.41 – 1.65 “ 3.0 7.0
66 - 75 1.66 – 1.90 “ 3.5 7.5
76 - 86 1.91 – 2.18 “ 4.0 8.5
87 - 100 2.19 – 2.54 “ 4.5 10.0
101 125 2.55 – 3.18 “ 5.5 12.5
The function of Methods B and C is to ensure against jacket mechanical defects. Inspection for such
defects should be conducted by Method A if:
a. Spark test voltage levels will cause breakdown due to the intrinsic dielectric strength of the
jacket material.
b. The insulating quality of an underlying tape will prohibit detection of defects at the applicable
spark test voltage level.
The 210,000 BTU vertical tray flame test shall be performed in accordance with ICEA T-29-520.
4.11 PHYSICAL AND AGING TESTS FOR INSULATION, JACKETS, AND NONMETALLIC
CONDUCTING MATERIALS
4.11.1 Sampling
4.11.1.1 Insulations
Samples shall be taken after vulcanization and prior to the application of any covering except those
applied before vulcanization. Cable tapes applied prior to vulcanization shall be removed from the
samples prior to testing.
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4.11.1.2 Jackets
No tests shall be made on jackets less than 30 mils (0.76mm) in thickness.
When one sample is selected in accordance with 4.11.1, all three test specimens shall be tested and the
results averaged. When additional samples are required only one test specimen out of three for each
additional sample shall be tested and the other two specimens held in reserve.
Specimens for tests on jacket compounds shall be taken from the completed wire or cable and cut parallel
to the axis of the wire or cable. The test specimen shall be a segment cut with a sharp knife, or a shaped
specimen cut out with a die, and shall have a cross-sectional area not greater than 0.025 square inch
2
(16mm ) after irregularities corrugations, and reinforcing cords or wires have been removed.
Where jackets are bonded to the insulation, separate smoothed samples of the insulation and jacket shall
be prepared. Test specimens shall be die-cut from the samples after they have been allowed to recover
for at least 30 minutes.
Where a slice cut from the insulation by a knife held tangent to the wire is used and when the cross-
section of the slice is the cross-section of a segment of a circle, the area shall be calculated as that of the
segment of a circle whose diameter is that of the insulation. The height of the segment is the wall of
insulation on the side from which the slice is taken [The values may be obtained from a table giving the
areas of segments of a unit circle for the ratio of the height of the segment to the diameter of the circle].
When the cross-section of the slice is not a segment of a circle, the area shall be calculated from a direct
measurement of the volume or from the specific gravity and the weight of a known length of the specimen
having a uniform cross-section.
When the conductor is large and the insulation thin and when a portion of a sector of a circle has to be
taken, the area shall be calculated as the thickness times the width. This applies either to a straight test
piece or to one stamped out with a die and assumes that corrugations have been removed.
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Page 31
When the conductor is large and the insulation thick and when a portion of a sector of a circle has to be
taken, the area shall be calculated as the proportional part of the area of the total cross-section.
The dimensions of specimens to be aged shall be determined before the aging test.
4.11.6 Retests
If any specimen fails to meet the requirements of any test, either before or after aging, that test shall be
repeated on two additional specimens taken from the sample. Failure of either of the additional
specimens shall indicate failure of the sample to conform to this standard.
When ten or more samples are selected from any single lot, all coils or reels shall be considered as not
conforming to this standard if more than 10 percent of the samples fail to meet the requirements. If 10%
or less fail, each coil or reel shall be tested and shall be judged upon the results of such individual tests.
Where the number of samples selected in any single lot is less than ten, all coils or reels shall be
considered as not conforming to this standard if more than 20 percent of the samples fail. If 20 percent or
less fail, each coil, reel, or length shall be tested and shall be judged upon the results of such individual
tests.
accordance with ASTM D 412, using only those specimens which break between the gauge marks. The
tensile strength shall be calculated on the area of the unstretched specimen.
The tensile and elongation determinations for compounds for which the compound manufacturer certifies
that the base resin content is more than 50 percent by weight of high density polyethylene (having a
3
density of 0.926 mg/m or greater) or total base polyethylene resin content (having a density of 0.926
3
mg/m or greater) shall be permitted to be tested at a jaw separation rate of 2 in. per minute (51 mm per
minute) as an alternate to 20 in. per minute (508 mm per minute).
Specimen length gauge mark distance and jaw speed shall be recorded with the results.
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The elongation shall be taken as the distance between the gauge marks at rupture less the original gauge
length marked on the specimen. The percentage of elongation at rupture is the elongation divided by the
original gauge length and multiplied by 100. Specimen length, gauge mark distance, and jaw speed shall
be reported with the results.
When the entire cross-section of insulation is used, the insulation shall be subjected to the aging condition
with the conductor removed and each end of the specimen suitably plugged.
Die-cut specimens shall be smoothed before being subjected to the accelerated aging test when the
thickness of the specimens is 90 mils (2.29 mm) or greater before smoothing.
The test specimens shall be suspended vertically in such a manner that they are not in contact with each
other or with the sides of the container.
The aged specimens shall have a rest period of not less than 16 hours nor more than 96 hours between
the completion of the aging tests and the determination of tensile strength and elongation.
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The calculations for tensile strength shall be based on the cross-sectional area of the specimen obtained
before immersion in oil. The elongation shall be based on gauge marks applied to the specimen before
immersion in oil.
The calculation for tensile strength shall be based on the cross-sectional area of the specimen obtained
before immersion in oil. The elongation shall be based on the gauge marks applied to the specimen
before immersion in the oil.
4.11.12 Physical Tests for Nonmetallic Conducting Materials Intended for Extrusion
4.11.12.1 Test Sample
See 4.11.1.3
4.11.12.3 Elongation
Elongation shall be determined in accordance with Sections 4.11.9 and 4.11.11.
4.11.12.4 Brittleness
Brittleness shall be determined in accordance with ASTM D 746, using Specimen A.
Table 4-3
Mandrel size for Heat Shock Test
Outside Diameter of Wire or Cable Diameter of Mandrel
--``,``,```,``,```,,,,`,```,,,,,-`-`,,`,,`,`,,`---
as
Number of Adjacent Multiple of outside
in. mm Turns Diameter of Cable
0-0.750 0-19.05 6 3
0.751-1.500 19.08-38.10 180-degree bend 8
1.501 and larger 38.13 and larger 180-degree bend 12
© Copyright 2008 by the National Electrical Manufacturers Association and the Insulated Cable Engineers
Association, Incorporated.
ICEA T-27-581/NEMA WC 53-2008
Page 34
The heating and cooling cycle shall be performed three times, if required.
© Copyright 2008 by the National Electrical Manufacturers Association and the Insulated Cable Engineers
--``,``,```,``,```,,,,`,```,,,,,-`-`,,`,,`,`,,`--- Association, Incorporated.
ICEA T-27-581/NEMA WC 53-2008
Page 35
least 25 mils (0.64 mm) thick. The wafer may be further separated into concentric rings by careful
separation of the shield from the insulation. This may include the use of a punch to separate the
conductor shield or insulation shield from most of the insulation.
The resulting wafer(s) or rings shall then be immersed in boiling decahydronaphthalene with 1 percent by
weight Antioxdant 2246 (or other reagents specified in ASTM D 2765, such as xylene) for 5 hours using
the equipment specified in ASTM D 2765. (This solution may be reused for subsequent tests provided
that it works as effectively as a fresh solution.) The wafer(s) shall then be removed from the solvent and
examined for shield/insulation interface continuity with a minimum 15-power magnification.
Total or partial separation of the semiconducting shields from the insulation is permissible. Partial loss of
the shields is also permissible provided each shield is a continuous ring.
cable axis. The scoring tool shall be set at a depth not to exceed 1 mil (0.03 mm) less than the specified
minimum point thickness of the insulation shield. The cuts may be made before the samples are
temperature conditioned in order to maintain the specified test temperatures. Pulling force measurements
are not required for this test. The insulation shield strip shall be removed by pulling the insulation shield
away form the insulation at a speed of approximately 0.5 in. (12.7 mm) per second. The entire pull shall
be made at an angle of approximately 90º to the cable axis. The total length of the pull shall be a
minimum of 12 inches. One test specimen shall be used for each temperature conditions of -10 ± 3ºC
and 40 ± 3ºC
To achieve the required temperature, the test specimen shall be in a compartment (such as a oven or
freezer) at the required temperature. The test specimen shall remain in the compartment until the entire
sample is at the desired temperature. The test specimen is then removed for the conditioning
compartment. The test shall begin within 30 seconds of removal from the compartment and shall be
completed as soon a possible after beginning.
© Copyright 2008 by the National Electrical Manufacturers Association and the Insulated Cable Engineers
Association, Incorporated.
ICEA T-27-581/NEMA WC 53-2008
Page 36
© Copyright 2008 by the National Electrical Manufacturers Association and the Insulated Cable Engineers
Association, Incorporated.