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Magnetoresistive sensors
D.J. Mapps *
(-k'ntr~"hn Rt'~cm'dl m bt/~r, latilm Storage I-e('hm~log),. S.E.C.E.E., I~'nil~.r.~ilvo/ Pllml,uth. P(rmtmth PL4 $.4A, /_:k/
Abstract
This paper reviews magnctorcsistive sensors for detecting magnetic fields. These sensors are based on an efl~t which has been
known tot more than 11111years, but it has onl 3 come to prominence since 1971 x~,hen a thin-film magnetoresistive sensor was
shown to have good signal-to-noise performance in a field-sensing application in magnetic rccording.
A large amount of research has been ¢~lrried out to explore the limits of magnetoresistive sensors in their thin-film form and
many novel structures have been published. Despite this there are application limits relating to non-lineafity of response
characteristics, presence of demagnetising fields, hysteresis and Barkhansen noise.
The paper will presenl the basic tbeo~' of thc~e sensors a~d deal with some technical limitations. A range of magnetic biasing
techniques are discussed. The shape and structure of these sensors affects sensiti'.ily through the lorm and magnitude of the
demagnetising field. Improvements in perfnrmancc can be gained by making thinner sensor t~!ms and films with transverse
shape-anisotropy.
Research has led to a reduction in cocrcivtty of sensor film materials and a ~,x~rresponding impro'~'emenl in hysteresis.
Barkfiausen noise reduces in thinner films due to the transition from predominantly Bloch-type to predominantly N~el-type
magnetic domain walls.This paper considers n',o types of sensor application. The first is tbr general magnetic field detection and
the second, detecting magnetic fields on infommtion storage media, t: 1997 Published by Elsevier Science S.A.
&/
7. M agnetotr~ ~tivg M agne ~ z t c t
Table I
Magnetoresislis'e sensors adsautages and main application areas
,41h'anta.re.~
High sensitivity allowing operation over relatively great distano.+s
Low source resistance giving loss sensitivity to electrical inlcrli:reno:
Highqemperatum up- 151PC continuous. 175%" peak Ichip alone elm v.ithstand 175~( coniinu~:u~
eration
Opendion o~+er a wide from DC tip to :~cvcral MHz
fr,.-quen~ range
Metal film technology • gi,,ing excellent long-term slahilily
Low sensitivity to me+ Ihcilitating mounting of tile sensor and ;dlov,ing its ruse in relati'.ely rout~h environments
dmnical stress
Small size call be tS+bricated +.ilh micron dimeusiuus
.,tpplh'llthl~t aPt'us
Trul~ic control deteclion of vehicles
Low-cost navigation illlo~+~ingthe produclion of simple compax, sy:,tcms '++,ithan act:urac? of around I+ ide;d for .:tutomotP.e applica-
tions
Long-distauce metal Ibr the detection of, for example, military ~.ehlcles hy measuring dislurhanct~ in the earth's magnetic field
detection
Motion detectors by measuring position changes rdutive to the earth's magnclic fidd
Current delectiun Ibr example, earth-leakage switches
Geaeral nnlgnetic-liehl from I0 A m ~ to It) kA m i
nleasurement
Direct-currant men. St~lrlillg currents ill motor vehicles
suremcul
Angular or position scm:ing of a~:+:elerator pedal or throttle position lengine-management systemsl
measurelneut
posilion sensing in induslrlal autt~malion systems (commercial ~n~,or arrays that carl measure positions ','.ith an
accuracy of + 30 v.ml
l'on.'e acceleration pressure measuremenl using a mo',iug magnet, for example: engnle-iolake-martifold pressure
sensors, fluid-levd sensors, low-cost s~eighing s)slems gc'c.:+,onieIselsmic) seo~ors, accelerometers
Murk detection attd camshal~ or flywheel position sensors lot engine i~nition :,+',stems
counting
end-point sensors
,.,.heel-speed sensors l?,r anli-blocking ~.)stems
rpln ,.:earners ~t) to 20 kHz) for engiu¢ tachometers and for elc.,~tronic s~nchr,,mx~,h s~stems
i]t)%~ nlctCl'S
zero speed detectors rpm ctnltrnl in cleclric motors
general Jllslrart:¢mation
Magnetic recording thin, film replay heads for lape and disk s}stems S'¢+ipcreader,, I\~rcredit cards, bus tickets, door locks, etc.
where Ap is the m a x i m u m value of the magnetic field Eqs. 14) and 16) allow a relationship to be developed
related resistivity change (saturation magnetorcsis- (by eliminating #) between the fractional magnetoresis-
tance). The fractional magnetoresistance from Eq. (5)is tahoe :rod the magnitude and direction of the applied
often quoted as: field Ha, assuming the other constants are known. This
is the basis o f the thin-film magnctoresistivc sensor.
applied
":~' _ _ ~
A--Of~S~
Hb I+S 3, Temperature effects
tMd + +-+"--"-" HF '1
Like many sensors, the characteristics o f the thin+film
V ~lro~ Hk magnetoresistor are susc'eptible to temperature. If used
++-
to detect a steady m a ~ e t i c field, the output change due
to the field is indistinguMtable from that due to temper-
(.1 <b) ature drift. Temperature vs. output voltage curves for
permaUoy magnetoresistors are shown, for example, in
Fig. 2. In) Schematic diagram of a Ihiu-lilm magnetorcsistor showing
the principal dire.,:tions and quamiti++~used in the theory. Ibl Division Fig. 3. taken from Ref. [4]. T o overcome such a prob-
of the applied field into a constant bias field Ht~ and a lotalional lem, a b t i d g e circuit is often used so as to subtract the
component tl~, temperature induced error between two or four sensors
12 D.J. Mapps SenwJr.v.m/..[ cttutlor.v .4 59 ( / 997) 9. ! 9
4. Linearity
75
A summary of the limitations of magnetoresistors in
V ou[ T~ml, terms of linearity can be found in Ref. [5]. The funda-
memal characteristic is not only non-linenr but it is
(mV)~ i ' ~7~ subject to hysteresis. This relates mainly to the cosine-
squared law modified by the effects of magnetic satura-
5O Ii i~ S tion which lead to a saturation in the
I I//t magnetoresistance. The maximum value is about 2% of
i 7// the resistance change of the whole magnetoresistor but
i
! [/f1(~75°c only a fraction of this can be used because of the shape
I ///, \12soc of the curve.
25 ~--
JI ////i A method for assessing the extent of the linear region
of the response curve can be found in Ref. [5} where the
I ~ / I ..... second derivative (Q) of the curve is divided by the
i ]j/ I
, I I square of the first derivative (P)-'. If the square of the
resulting function is plotted against transverse field (see
I ..... I
t I Fig. 5), the result is a curve with the linear range clearly
o I ! identified us a line along the field axis and the non-lin-
I I ear range towards infinity.
' / ' Hysteresis can also be seen in Fig, 5 where the rising
I i and falling characteristic of 5(a) :rod 5(b) present a
I i .., I different magnetoresistor sensitivity depending on
I
which curve the measurement is being made. Such a
problem can be reduced by careful attention to the
__ I/'i/ t dimensions of the magnetoresistor (controlling the de-
yl/ t magnetising field}, the parameters controlling the film
I
coercivity and the electronic detection circuit Iwhich
controls the point of measurement),
//ll! i
........ vcc
/11 i , I I RI -5V
5k[Z
-4 -2 0 2 4
Hy (kA/m)
Fig. 3. Oulptll vohage versus transverse field H,, far several tempera-
tures {barber pule sensor) from Rer, [4],
%/'/ I L:.~==o. /
;/ "
in different arms of the bridge whilst biasing the sensors
to ensure that when the outputs are subtracted, the
usefld (field induced} signals add together. J 360 ~ / 390 kfl 2 kfl z
Such a bridge circuit is described for the Philips
magn:toresistive 'Barberpole" sensor and shown in Fig.
4. The circuit employs bilicon temperature sensors in
the feedback loop of an operational amplifier {KTY 83) Fig. 4, A typical bridge circui; Ibr two or tour maglletozesislors
which have equal and opposite temperature coefficients including temperature compensation feedback via the silicon tempera-
to the magnetoresistance sensors in the bridge. lure s~n~r KTY83 (Courtesy of Philips),
D.J. Mupps Scuaor.v uml ~lcmuror,~ .4 59 t l~)7) 9 19 13
Magnel0resi~nv¢ResFm~¢ Mr
,.I , MR cu f~r ~
USEN'S
MPS
.~ -._2.: ...... " . . . . . Fig. 7. Remancnl magneti:,ation loop shinning narkhausea's jumps.
ae t
It (O~rsl~tls) sation to lag behind the applied field, ~ving rise to the
l"ig, 5. Showing rising and lhlling pans of an M-R churaclefisti¢ with well-known phenomenon of hysteresis and coerovity.
h,'.,sleresis. {t.)P:)'- indicnles the extent of lhe linear regions of tile This is usually even more significant where the magneti-
characteristics. sation is not a single magnetic domain. For a multi-do-
main state, we can plot the rate of ehan~ of enerD"
5. flurkheusen nuise with distance mov~ of the domain wall as shown in
Fig. 6(b). This shows a series of irreversible jumps
Changing the state of magnetisation in ferromagnetic giving rise to a cocrcivity according to the equation
films is not a continuous process, especially if viewed at IdE
the mieromagnetie level Any stable magnetic slate
corresponds with it minimum in the total magnetic The irreversible jumps in ma~etisation lead to similar
energy in the material and this energy varies with, jumps in magnetoresistance and the general effect
amongst other things, a change in the direction of the known as Barkhausen noise after the name of the
magnetic vector the very thing which gives rise to the discoverer in 1917 (Ref. [6]). A ~manent magnetisation
change in electron scattering which is the basis of the loop showing Barkhaasen's jumps is shown in Fig. 7. A
magnetoresistance effect. The energy transition between raagnetoresistive response with and without
two oppositely magnetised states--Ms and + M~ is Barkhausen noise is shown in Fig. 8.
indicated in Fig. 6(a).
As can be seen, there is a general energy minimum
corresponding to the conrad demagnelised state, but
there are also a large number of small minima. These
can represent pseudo-stable states causing the magneti-
i si.~ ~Tl.l-'~--m.l--,
i I
Barkhauscn Noise
,.i I\ F :! I .o,ooom ,o
ENERGY ~ i
I , I
i i
I I .. I
-M s 0 *M s
&'~i[fle[il. eit~2f)~y V~E~LL~nl;Igll~li2;lUt)l~.
1 DISTANCE
A p'.lhed tt ~'Id
"t'
(b) magnetic energy and eluagy grldieut versus domain wall position Fig. 8, Showing Ib¢ inca:n~¢ in &irkhau~n noi~ for lhe multi-do-
sho~ing irreversible and reversible motions. main slal.a.
D.J. .tlapps St,usors am/Actua/ol;s .4 59 (19971 9.19
3I
i
explanation for the effect is in the fact that below "lbout
2.75 2,7S
40 nm the domain wall magnctisation changes from
2.5 2.5 being mostly perpendicular to the film plane (e.g. 180°
Bloeh Walls) to mostly par',dlel to the film phme (e.g.
.?.25 225 N~el Walls). As cart be seen from Fig. I l(c) and (d), the
2 N6el wall has much lower energy mid greater width at
2 .2
low film thicknesses, so the change in wall energy
~l,7S • 1.75 ~ caused by reduced volume interactions with the surface
for the N6el wall is probably lower due to the fact that
1.5 • I,S it occupies a greater span of the sttrt;ace area at any
moment.
1.25 • 1.25
The consequent change in overall wall energy due to
l, "l
an incremental change in wall position is correspond-
ingly less. This argument also applies when considering
0.7S' • O.Tfi the origin of that part ol" the coercivity which comes
from non-magnetic inclusions, as long as the inclusions
0.5. • (k5
are generally smaller in diameter than the thickness of
0.25. .0,25 the Ndel wall. For film thicknesses smaller than about 5
nm the films of Fig. 9 become discontinuous leading to
0 I I I I 1 I I t I I 0 a large increase in non-magnetic 'holes' and corre-
2.5 7.5 II1 12.5 IS 17.5 20 22.5 25 27.5 J0 sponding increase in coereivity and noise.
"lhichnos of t~:razdloy Films (nm)
From Eq. (7) it can be seen that the rate of change of Eq, (3) shows that the demagnetising field energy
energy with distance moved by the domain wall is most depends on the demagnetising factor N~ of the ferro-
important so to study the effect it is necessary to know magnetic thin-film. This is transported into Eq. (4)
how the material energies vary with domain wall posi- implying that the final relationship between the field HR
tion and especially the energy of the domain wall itself. and the fractional magnctoresistancc change (see Eq.
To this end, a large number of publications have been 15)). also depends on No.
produced and it has been shown that wall energy is a Demagnetising t:actors for a gener.'tl dlipsoidal shape
function of the volume of the material it occupies so ha,,e been calculated and may be found in recent
when part of the wall moves to a point where it
occupies less volume (e.g. when it becomes shorter
because of an edge defect in the film or when it
intersects a non-magnetic inclusion) this represents a I.I
Eq. (8) has produced good correlation with experiment Aplied Fidd (Oe)
(e.g. Ref. [7]) for thicker films but recent work has Fig. I0, Magne~oNsistanc¢ curves for tour sensors showing how the
shown that lbr films thinner than about 30 nm the thinnerfilmsc,ihibit lessuoi4e(and lesshysteresis).
D J . ,Ihtpp~ .%m,)r~ am/Actuators A : 9 (lOt~7) 9 19 15
(era)
','vail ener]y
(a)
I i0-¢
I
I I I o_q
r ~°-~ r- i IO0 I000 I~0~1 I0~0~0
I I Film I~)¢krez.%
()) ~,,)
Componoa~ ol maonotizalion
normal ~ ~lant. of wall t
i
i
,tl ! .1~ 1
~ F o o i
I o_j m4~.Ir
14- £
I n
I t =
I ] ,,~
i ,\\>./,
V
I
1~rotJ~h Iho ~,~11
G)
~e Ned *~,dl; ( ) ib~tt~. (]il Nid'l i,l~p,ol,,,i,a:.,,i
Fig. I I. (a) Sltucture of a alodl ~'all in a thin-lihn: Ill stricllv lib N&:l's approximation. (b) Slruclure of a N&'I wall: {i) strictly: (ii) N~l's
approximation. It) Bloch willl t~llcr~/yand tlfickncss plotted against film thk:kncss. (d) as tbr Ic) but data Ibr a N,~'el '.,,all.
papers, but the original work was produced by Oshorn have b~om¢ thinner in order to preserve sensitivity in
(ReF. [8]), D¢magnctising factors lbr non-dlipsoidal a smaller sensor, A thickness of 12 nm has been re-
shapes vary from point to point in the volume of the ported recently by IBM in a prototype magnetic disk
material (e.g. Ballistic Demagnetising Factors) and head (Ref. 191).
those for multi-domain systems are very difficult to Clearly another option to increase sensitivity is to
compute. increase the effective height (or width) and this can be
Most size effects in maguetoresistors have been done selectively by forming the thin-film in a castellated
analysed on the basis of a single domain model and structure (~'e Ref. [10]) as shown in Fig. 12(a). This
making various assumptions about linearity (see Ret: produces a magnetoresistor with several magnetic do-
[3]). In general, the sensitivity of a reetanguhtr thin-film mains arranged as shown in Fig. 12(b). The transverse
magnetorefistor when an in-plane field is ,'~pplied in a shape-anisotropy imparted by the castdlations (or 'fins')
direction transverse to its long axis depends inversely on and the greater mobility of the domain walls compared
the quantity t/h (or t/w) which is the approximate value with rotational magnetic vector changes cause the trans-
of its demagnetising factor in this direction. Therefore, verse magnetoresistive sensitivity to be much higher as
any attempt to reduce its size (h or w) in the plamLr shown by the loop comparisons of Fig, 13. Analysis of
direction meets with a corresponding increase in the such magnetoresistors is complex and designing for low
demagnetising field and a reduction in sensitivity. Con- noise is a non-trivial task although much can be
sequently, in recent times, thin-film magnetorcsistors achieved with suitable electronic drive circuitry.
D,J. ,llapp~ ,Scnsor.~uml AiTttnmr,~ A 59 (19971 9 Iq
Castellated Structure
Effect of
Ilema~tleliled Stale Transverse Field
ii /
i l~" 1, i Fig. 14, T w o 3fifi* magnetoresistor otapnls and a .single d i f f m ' n t i a l
output I~r a doubk,,-bitilar magneloresistor with two serpenlines
It~ '-- ?~!! J :,¢quentially biased in oppt~site directions.
~
increase is due to the increasing use of thin-film magne- 1Gbhn2
~_ tM (Demonstrall~l)
toresistors in replay heads detecting recorded magnetic
changes in the disk coating at track widths approaching
w PRML
1 pro.
A basic magnetoresistive replay sensor is shown in 100K Tl'anF~ D MRHe~ls
w DiSk
Fig. 16. Its magnetisation is usually constrained along n,
the long axis of the stripe using :m inducing axial
f~in Film
m,'tgnctie field daring film deposition. The relationship 10K Heads
between magnetoresist:mce and magnetisation angle 0
is as d':fined in Eq. 16). If, in Fig, 2, the anisotropy HK year~
is fixed parallel to the film long axis. 7= zero. Also, if lO hm~/lo vear~
hath the bias field and the signal field from the disk tar I I I
1970 1980 1990 2000 2010
tape) is transverse to the film long axis then :~= [;
YEAR
90". Substituting in Eq. (4) gives,
Fig. 16. Trend of the areal density or computer hard disk systems
Hvsin(90-d)-½H~sin20-½Ns.M~2#=O (10) sho~dng the change in slope of the trend with the introd~tion of
magnctorcsisti~eplaybackheads.
which reduces to:
and is the same as the well-known result o f Hunt (Ref.
5i0 0 H¥ (11 t
H~ + N~Ms 121)
Substituting cos" 0 as I - sin-" O in Eq. (6) gives the
fractional maggetoresistanec as:
,- , _bias condudor . . . . . [sig ( Hh - lk ~
h, - - ~ : ~'differenliol !J~:cow.'non
"--, jW/ . / H - R senses %~ :
,n : ::::::::::::::::::::::::::: "
i;: . : - , ; :! ~r2:: :! ::"'I and if H¥is made up a linear sum of a bias field Hh and
a signal field, h:,
( Hb+h,
(,,, - ~,,,1 a~, = I - \ ~ / (1:3)
do' d -
x ~'~//vohs (14) fit I #i ~ J
The art of using such sensors in practice involves t % ,_~
paying attention to such things as Barkhausen noise.
temperature drift and biasing methods. In particular.
there have been many bias schemes devised for use of I~tw~n
l shieMs
the sensors in magnetic recording. Some of these are layer
shown in Fig. 18.
An inter-digitated scheme has also been devised and
patented (see Ref. [1211 as shown in Fig. 19. This
differential scheme achieves increased output, tempera. /
lure correction and integral self-biasing for numbers of
sensors placed on top of each other from two upwards. IJatberpolc
A &element so-called inter-digitated sensor was fab-
ricated and found to have superior output magnitude in
a magnetic recording application, The two-element ver- 1 I •
sion of this system is not receiving new interest as a
replay head for computer disks. NiVe gl~l
ek menUinler.di~ila/ed
0- ~ po~,,0¢i.n,ctioa
Hb
resistivity varialion
/ ] \'x experimental
t~pe
H r= Ho
"1signal field
from tape
Fig. 19. An interdigitated replay head structure for two or more (6
Fig. 17. The magnetoresistlvetransfer characteristic used in magnetic are shown) magnetoresistivethin-films which self-bias to reduce tem-
rccordlng. perature drd't and improve output magnitude.
D.J. Uapps Sensars and :ft n~ztors :[ 59 0997) 9 19
Acknowledgements [7] D.J. Mapps, M.A. Akhter and G. Pan. Co~'att niobh=m iron
soft magneticback layersfor glass comput,.,rdisks, Am. J. AppL
P/l:'.,:.. 69(g) (19~1) 5178 518[i.
Thanks is extended to the University of Plymouth [8] J+A. Osbom, Dt.~la~mctisingI'acto~ of the general ellipsoid,
and researchers at the Centre for Research in Informa- Ph):~. Rt,r., 67 ( I 1,12)(1945) ?lSI-.357.
tion Storage Technology. in particular, Mr. Nick Fry 19] C, T~mg, H. Santini, D, Mf.Ce,wn, J, Lo and R, Leg,3 Gb i n ='
and Mrs. Yongqin Ma Tan for technical contributions recordingdemonstration~',ithdual elementht~.dsand thin film
and Mrs. S. Hicks for typing the manuscript. disks, IEEE Trans..llagn.. 32 1I) 119961 7 12,
[llJI D.J. Mapp~. I.:.K. Patent Nu. 21694)4. 20 Sept. (19991.
[11] D.J. Mapps. U.K. Patent No. 220263:~, 8Nor. 119911.
[121 D.J. Mapps, U.K Patent .\)J, 214307L 2,~ Oct, 11997),
References
[I] J.E. Lenz, A reviewof magnetic sensors. Pr,c IEEE. 78 (hi B~a~ies
(1990) 973 989.
[2] R,P. tlunt, A magnetorcsisti~ereadout Irlmsducer,Prm'. IEEE
D.J. Mapps is Professor of Information Storage En-
Trims, ,thigh,,Mag - 7 ( I } ( 19711.
[3] D.J. Mapps. Magnetoresistance.in Applied Ma~.neti,~m, ISBN gineering at the University of Plymouth, U.K. He has
0-7923-2622-9, Kluwer, Dordrccht, 1994. authored or co-authored more than 100 publications as
[4] Philips El,.'ctronicComponemsand MaterialsTechnicalPublica- well as a book chapter on Magnctoresistance. He is
tion No. 268. currently head of the Centre for Research ~n Informa-
[~] D.J, Mapps. N. Fry and D, Smith, Non-linear magnetoresis-
hlnce, N~mli,car Eh'c'trrmlugm'tic' Srstcm.~. Vol. I0, lOS Press. tion Storage Technology at Plymouth. He is a Fellow
1996. ISBN ~1 5199 251 3. of the U.K. Institution of Electrical Engineers and the
[6] H Barkhansen, Phys. Zeits, 20(19191411[-403. U.K. Institute of Physics.