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Journal scientific and applied research, vol.

3, 203
Association Scientific and Applied Research
International Journal

Original Contribution ISSN 3-2

METHODS FOR DETERMINING THE AMOUNT OF MULTI-


ELECTRONIC SCINTILLATIONS ON THE SCREEN OF ELECTRO –
OPTIC TRANSFORMER OF IMAGES
Zhivko Zhekov

KONSTANTIN PRESLAVSKY UNIVERSITY SHUMEN;  INIVERSITETSKA STR.


2 SHUMEN;

ABSTRACT: One of the basic requirements when using electro – optical transformer (EOT) of images in space
research is the low level of bright light flashes on the screen, called multi – electronic scintillations.
The experimental research of number and brightness of scintillations show that the distribution of the multi
– electronic scintillations’ number across the screen’s diameter could be approximated by a normal law.
The analysis of multi – electronic scintillations amplitude spectrum shows, that in the center of the EOT’s
screen, the number of scintillations with greater amplitude is significantly greater in comparison with those at
the end of the active surface of the screen.

KEY WORDS: electro – optical transformer , multi – electronic scintillations.

One of the basic requirements distribution parameters for a certain


when using electro – optical EOT, it is a matter of simpler methods
transformer (EOT) of images in space required for the scintillation
research [, 2, , , ] is the low level evaluation without the need for
of bright light flashes on the screen, development of complex scanning
called multi – electronic scintillations. devices. The current research is about
The existence of multi – electronic evaluating the law of scintillations’
scintillations leads to significant amount distribution over the active
expansion of the possibility for surface of the screen, evaluation of
diminishing the utmost sensitivity of their amplitude spectrum and
the EOT [, , , and 0]. The development of method for defining
definition of the amount of the amount of multi – electronic
scintillations per definite time could scintillations over the active surface
be done with the help of the method of the EOT’s screen.
for scintillations’ calculation while
using photo – electronic multiplier METHOD FOR DEFINING
[3]. If the number of scintillations’ THE DISTRIBUTION OF
distribution over the active surface of SCINTILLATIONS NUMBER
the screen is determined and OVER THE ACTIVE SURFACE
experimentally are evaluated the OF THE EOT.

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A certain device [3] is used in consecutive account is being taken
order to define the distribution of the after every diaphragm’s movement on
scintillations number over the screen. every 2 mm from the center across the
The measurement of scintillations is EOT’s screen radius toward the
made as in [3], from the surface o the periphery. The received experimental
EOT’s screen, with the help of mobile data serves for setting up a
diaphragm, 2 mm in diameter, and dependency between scintillations’
optic system for transferring the amplitude spectrum and their integral
image to the photo – electronic number across the screen’s diameter.
multiplier. The light source secures The measurements show that the
monochromatic adjustable infrared distribution is asymmetric, which
radiation, hitting the photo cathode of allows simplification of the method
the EOT. The method for and evaluation of the scintillations’
measurement is based on evaluation distribution only in dependence with
of average amplitude of scintillations, the screen’s radius.
invoked by single electrons, hitting
the EOT’s photo cathode, the MEASUREMENT –
amplitude distribution of scintillations RESULTS AND ANALYSIS
and their integral number. The Figure  shows experimental
measurements are taken in dark, in data for the distribution number of
light, on background 0- cd/m2, in dark scintillations on the EOT’s
adjustable shine of EOT’s photo screen with background brightness 0-

cathode by the light source. А cd/m2.

,0
Scintillations amount,
Relative units

0, 3

 2

0 2    0 r
Screen radius, mm

Figure . Distribution of dark scintillations number


across the EOT’s screen radius: 1 – when  = 2,; 2 – when  =  and 3 – when
 = 0.

Figure 2 shows the distribution EOT’s screen radius with background


of background scintillations across the brightness 0- cd/m2.

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,0

Scintillations number
Relative units
0,

2
Screen radius, mm 

0 2    0 r

Figure 2. Distribution of background scintillations number


across the EOT’s screen radius:  – when  = 2,3 and 2 – when  = .

The experimental data is comparison of experimental data with


compared to a normal distribution normal distribution law shows good
law. The values of mean quadratic coordination. It could be considered
aberration  are shown in the figures. that the possibility for appearance of
The values show, that the scintillations across the EOT’s screen
scintillations are concentrated mainly diameter is similar to the normal
in the center of the screen. As it is distribution law (Figure , Figure 2),
observed in the figures, the describable with the formulae:
r2
  2
y e 2 , ()
2

where: r – EOT’s screen radius.

The definition of scintillations’ scintillations’ number N c across the


number over the active surface of the co-ordinate rn . The mean quadratic
EOT’s screen could be done in the aberration  in normal distribution
following sequence. By following that could be defined by the formulae:
method could be defined the

rn (2)
 .
,

Having in mind the values of  scintillations number N for the entire


and N c , we could define the active surface of the screen:

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V (3)
N  Nc ,
Vc

where: V c - the volume of a body, restricted by the surface in rotation of the


curve y 2  f (r ) across the analyzed surface of the screen S,

definable by Vc  S.y2 , where y 2  ;
2
V - the volume of a body, restricted by the surface in rotation of the
curve y  f (r ) across the working surface of the screen:
y2 ()
V  S    r 2 dy ,
y

r2
  k2
y  e 2 ;
2

rk - radius of the screen working surface.


The value of r 2 could be defined by the equation ():

   ()
r 2   ln  ln y 2 2 .
 2 

By replacing equation () in equation (), after integration we get:

V  2 2 ( y2  y )(ln y2  )  y2 ln y2  y ln y   Sy . ()

,0
Scintillations number
Relative units

0,


2
3

0 0 0 30 20 0
Screen scintillations amplitude, mV

Figure 3. Amplitude distribution of dark scintillations:  – measured in


the center of EOT’s screen; 2 – measured at distance of 3 mm from the center of
the screen; 3 – measured at distance of 7 mm from the center of the EOT’
screen.

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,0

Scintillations number
Relative units 0,0

2
3

0 0 0 30 20 0

Screen scintillations amplitude, mV

Figure . Amplitude distribution of background scintillations:  –


measured in the center of EOT’s screen; 2 – measured at distance of 3 mm from
the center of the screen; 3 – measured at distance of  mm from the center of the
EOT’ screen.

The definition of the center (scheme ) and in distance of 3


scintillations number across the mm (scheme 2),  mm (scheme 3) and
working surface of the EOT’s screen 0 mm (scheme ) from the center
is made with the help of measurement with background brightness – full
of scintillations number in circular darkness - 0- cd/m2, created in front
areas of the screen and calculation of of the EOT’s photo cathode, and at
their whole number with the background brightness 0- cd/m2.
suggested method for approximation Variations in amplitude
of scintillations number distribution distribution are observed. A
across the screen surface with a significant contribution to the
normal distribution law. Figure 3 and amplitude distribution in the screen
figure  show amplitude distributions center brings the scintillations with
of scintillations, measured in the greater amplitude.

CONCLUSION scintillations number across the active


The experimental research of surface of the EOT’s screen.
number and brightness of The analysis of multi –
scintillations show that the electronic scintillations amplitude
distribution of the multi – electronic spectrum shows, that in the center of
scintillations’ number across the the EOT’s screen, the number of
screen’s diameter could be scintillations with greater amplitude is
approximated by a normal law. This significantly greater in comparison
allows the application of the with those at the end of the active
suggested method for measuring of surface of the screen.

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These multi – electronic scintillations number across the active
scintillations could invoke the surface of the screen is necessary to
registration of non – existing signal, be made measurement and accounting
because of which along with the of the amplitude spectrum of
enumeration of multi – electronic scintillations across the EOT’s screen.

LITERATURE:
[.] Gecov P. S. Kosmos, ekologiia, na zamyrsiavaneto na prirodnata
sigurnost. Nov bylgarski universitet, sreda. Sbornik dokladi "30 godini
Sofiia, 2002, 2 s. organizirani kosmicheski izsledvaniia
[2.] Gecov P. S. Nauchno - v Bylgaiia" IKI - BAN, Sofiia, 2000,
tehnicheska programa na vtoriia str. 0 - .
bylgaro - ruski kosmicheski polet [.] Stoianov S. J., Mardirosian G.
proekt "Shipka" - osnovni celi, H. Analiz na syshtestvuvashti metodi
zadachi i rezultati. Sbornik dokladi i sredstva za izsledvane obshtoto
"0 godini kosmicheski proekt sydyrjanie na atmosferen ozon i
"Shipka", Institut za kosmicheski negovoto vertikalno razpredelenie.
izslevaniia - BAN, Sofiia, , str. Godishnik na Tehnicheski
 - 22. Universitet, Varna,_ISSN 3-H,
[3.] Jekov J. S. Aparatura i 200, str. 0 - .
metodika za obektivna ocenka na [.]Hodgson R. M., Beurle R. L.
harakteristikite na elektronno - Image intensifier noise and its effects
optichni preobrazuvateli. Vtora on visual pattern detection. Photo –
nacionalna konferenciia po optika i electronic image devices. Proc. of -
lazerna tehnika. "Optika ", Varna, th symposium . London, . p.
 g. .
[.] Iliev I. C. Spektrometrichna [.]Pollehn H. K. Noise in second
sistema za slynchevi i atmosferni generation image intensifier tubes.
izsledvaniia. Sp. "Elektronika i Proceedings of the technical
elektrotehnika"_N3-, 2000, str. 3 - programe. Electro – optical systems
. design conference, New York, 002, p.
[.] Mardirosian G. H. 23.
Aerokosmicheski metodi v [0.]Sanders A. A. Modulation
ekologiiata i prouchvaneto na Transfer Function Measurements for
okolnata sreda. Chast_I. Infrared Systems. The George
Akademichno izdatelstvo "Marin Washington University, Washington
Drinov", Sofiia, 2003, str. 20. DC, 2000.
[.] Petrov P., Iordanov D., [.]Tatian B. Method for obtaining
Lukarski Hr., Matrapov I., Fotev Sv. the transfer function from the edge
Spektrometrichna sistema za response function, JOSA, ,  –
prilojeniiata v oblastta na monitoring , .

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