Scribd Logo
Upload

Welcome to Scribd!

  • 15-4 (8040)

    Uploaded by

    劉力瑋
    3 views2 pages

    Copyright

    © © All Rights Reserved

    Available Formats

    PDF or read online from Scribd

    Did you find this document useful?

    Is this content inappropriate?

    Report this Document

    Copyright:

    © All Rights Reserved
    Download as PDF or read online from Scribd
    Flag for inappropriate content
    3 views2 pages

    15-4 (8040)

    Uploaded by

    劉力瑋

    Copyright:

    © All Rights Reserved
    Download as PDF or read online from Scribd
    Flag for inappropriate content
    of 2
    15-4 040) IEEE Asian Solid-State Circuits Conference November 5-7, 2018/Taman, Taiwan A Fully Standard-Cell Based On-Chip BTI and HCI Monitor with 6.2x BTI sensitivity and 3.6x HCI sensitivity at 7 nm Fin-FET Process Mitsuhiko Igarashi, Yuuki Uchida, Yoshio Takazawa, Yasumasa Tsukamoto, Koji Shibutani and Koji Nii Design Platform Business Dep., Renesas Electronics Corporation, Tokyo, Japan Milsuhiko.igarashi.xw@renesas.com Tn autonomous driving era, itis inevitable to pursue higher performance for automotive LSIs such as advanced driver- assistance systems (ADAS) and so on. This should be achieved under limited power budget at high temperature condition of the car. Therefore, requirement of higher performance and higher ‘energy efficiency are one of the key challenges and motivations to apply cutting-edge process technologies such as 7 nm Fine FET process [1] and so on, On the other band, as process technology is scaled down, device reliability such as bias temperature instability (BTD) and hot cartier injection (HCD) are becoming more important because of decreasing design margin with supply voltage (Vdd) scaling [2]. Moreover, an annual mileage of the car is expected to be increased in autonomous

    You might also like