N DT Abstracts
reflectance for the test element was measured as a function of temperature.
The use of the results in the design of a thin-film fibre optic temperature
sensor is discussed.
63308 Hahib, K.
Measurement of the double layer capacitance of a l u m i n i u m
samples by holographic i n t e r f e r o m e t r y
Optics and Laser Technology, Vol. 28, No. 8, pp. 579-584 (1996)
Holographic interfemmetry was utilized to measure the double layer
capacitance of aluminium samples during the initial stage of anodization
processes in an aqueous solution without any physical contact. A method of
holographic interfemmetry was used to measure the thickness of
anodization (oxide film) of the aiuminium samples in aqueous solutions.
Along with the holographic measurement, a mathematical model was
derived in order to correlate the double layer capacitance of the aluminium
samples in solutions to the thickness of the oxide film of the aluminium
samples which forms due to the chemical oxidation. Holographic
interferometry is found to be very useful for surface finish industries,
especially for monitoring the early stage of anodization processes of metals,
in which the thickness of the anodized film as well as the double layer
capacitance of the aluminium samples can be determined in situ.
63114 Boca, l.; lovan, St.
Roughness c h a r a c t e r i z a t i o n of smooth m a c h i n e d surface of
silicon by optical ellipsometry
Romanian Journal of Physics, Vol. 40, Nos. 2-3, pp. 297-308 (1995)
A search program for calculating accurately the roughness parameters as
rms values of surface roughness or and surface slopes m for a silicon and thin
film deposited on it as a function of the experimental ellipsometric
parameters A and ~P is presented. The program contains routines and
subroutines of complex functions for the calculation of the rough
parameters. The results for the silicon surfaces prepared by industrial
methods show systematic variations in the measured ellipsometric
parameters. These variations persisted even after the surface composition
was changed by oxide rising on the surfaces. The paper also discusses the
factors that limit the accuracy of the ellipsometric method.
63110 Dorighi, J.; Krishnaswamy, S.; Achenbach, J.D.
A fiber optic u l t r a s o u n d sensor for monitoring the cure of
epoxy
Proceedings of the 22nd Symposium on Quantitative
Nondestructive Evaluation, Seattle, Washington (United States), 30
Jul.=-4 Aug. 1995. Vol. 15A. Edited by D.O. Thompson and D.E.
Chimenti. pp. 657-665. Plenum Press (1996) ISBN 030645310X
We utilize a frequency stabilized embedded fiber sensor to measure the
ultrasonic attenuation and velocity during the curing o f epoxy. Both o f these
parameters are material characteristics independent of the sensor
configuration. The sensor we have used to detect ultrasound is a local
Fabry-Perot interferometer, which is stabilized by tuning the laser
frequency. Such a sensor has the ability to monitor the local state of cure in
a composite material, and when used with laser generated ultrasound can
eliminate the need for a piezoelectric transducer. Additionally, an embedded
fiber ultrasound sensor can be used for in-service monitoring of the
composite part, providing information about defects and material
degradation throughout the life of the structure.
62870 Luridiana, S.; Mioteilo, A.
S p e c t r o p h o t o m e t r i c study of oxide growth on arc evaporated
TiN a n d Z r N coatings d u r i n g hot a i r oxidation tests
Thin Solid Films, Vol. 290-291, No. pp. 289-293 (15 Dec. 1996)
Spectral reflectance, roughness and microhardness measurements have
been used to study the growth of the oxide layers formed on arc evaporated
TiN and ZrN coatings during hot air oxidation tests. After each exposure
spectral reflectance, roughness and microhardness of the coatings were
measured. The oxide thicknesses were evaluated from fittings of calculated
spectral reflectances to the measured ones and with Nuclear Reaction
Analysis techniques, obtaining consistent results. Reflectance spectra turned
out to be very sensitive to the oxide thickness, allowing to determine it with
reasonable accuracy. Roughness, microhardness and adhesion of TiN are
not modified when it is oxidized in air at 350sup(o)C up to 6 h.
62868 Jaworke, D.A.
Optical a n d calorimetric evaluation of Z-93-P a n d other
t h e r m a l control coatings
Thin Solid Films, Vol. 290-291, No. pp. 278-282 (15 Dec. 1996)
The hemispherical total emissivity of two thermal control coatings, Z-
93-P and black anodized aluminum, was calculated from hemispherical total
reflectivity measured in the wavelength range of 2 to 40 p.m. These data
130
were compared to hemispherical total emissivity values obtained on the
same samples measured in a thermal vacuum chamber with a calorimetric
technique. The comparison showed close agreement in the vicinity of room
temperature and above, with differing trends at lower temperatures.
62667 Claridge,J.
Finding internal defects t h r o u g h coating flaws
Glass International, Vol. 19, No. 4, pp. 51-52 (Dec. 1996)
An automatic laser system capable of inspecting coated float glass was
the culmination of 12 months' intensive development is described. A system
capable of finding flaws in the reflective coating while still detecting tiny
defects within the body of the ribbon has been developed.
62664 Cunningham, A.
In search of zero defects
Glass International, Vol. 19, No. 4, pp. 37-38 (Dec. 1996)
The constant need to increase productivity provides glassmakers with
another reason for improving the quality of production.
62649 Yang,X.M.; Tryk, D.A.; Hasimoto, K.; Fujishima, A.
Surface e n h a n c e d R a m a n imaging of a patterned self-
assembled monolayer formed by m i c r o c o n t a c t p r i n t i n g on a
silver film
Applied Physics Letters, Vol. 69, No. 26, pp. 4020-4022 (23 Dec.
1996)
The surface enhanced Raman scattering effect was used in conjunction
with a micm-Raman system to produce an image of a pattern, on a
evaporated silver surface, formed by microcontact printing of p-
nitrothiophenol (PNTP). This surface is characterized by roughness on the
scale of 50-100 nm. It was confirmed that this type of printing technique
forms a self-assembled monolayer with PNTP. Even without roughening of
the silver surface, the surface enhancement provided a high contrast image.
The resolution of the resulting imaging was approximately 1 p.m.
62648 Christensen,RJ.; Lipkin, D.M.; Clarke, D.R.; Murphy, K.
Nondestructive evaluation of the oxidation stresses t h r o u g h
t h e r m a l b a r r i e r coatings using C r piezospectroscopy
Applied Physics Letters, Vol. 69, No. 24, pp. 3754-3756 (9 Dec.
1996)
The stresses in the aluminum oxide formed during high-temperature
oxidation of a bond-coated superalloy are shown to be measurable through
zirconia thermal barrier coatings. The basis for the measurements is the
piezospectroscopic shift in the R-line fluorescence (pbotoluminescence)
from Crsup(3+) impurities incorporated into the growing aluminum oxide
scale. Measurements through the thermal barrier coatings are feasible
because (partially stabilized) zirconia coatings have some transparency at
both the excitation and at fluorescence frequencies.
62451 Ghaffari, K.; Wang, B.; Danyluk, S.; Billone, M.; Pharr,
G.
Optical interferometric d e t e r m i n a t i o n of in-plane residual
stresses in SiO films on silicon s u b s t r a t e s
Materials Evaluation, Vol. 54, No. 10, pp. 1167-1170 (Oct. 1996)
Shadow moire interferometry was used to measure the out-of-plane
deflections in 100 mm (4 in.) diameter, 0.5 mm (0.02 in.) thick, (100) p-type
silicon wafers that contained thin rf-sputtered SiOsub(2) films deposited on
one side of the wafer. These deflections were used to calculate in-plane
residual stresses over a large spatial area of the wafers. Residual stress maps
were produced from these measurements.
61791 Rogers, J.A.; Nelson, K,4.
Dis-bond detection a n d the possibility of interracial stiffness
m e a s u r e m e n t s with real-time impulsive stimulated t h e r m a l
scattering
Journal of Adhesion, Vol. 50, No. 1, pp. 1-24 (1995)
We describe a new, real-time, noninvasive method for dis-bond
(delamination) detection which is based on a technique known as impulsive
stimulated thermal scattering (IS'IS), We first explain the ISTS technique
and compare data from polyimide films tightly bound to silicon substrates
with data from unsupported polyimide films. The observed differences in
the data from these two cases are readily understandable and offer an
unmistakeable signature for delaminadons. We demonstrate ISTS dis-bond
detection by locating and mapping out randomly-distributed and spatially-
fine regions of delamination in a polyimide film-silicon substrate system.
Finally, we present two simple physical models of the interfagial region
which comprehensively describe acoustic data from the tighdy-bound and
the unsupported samples.