IC Tester

Submitted by:Mann Dutiya

ELECTRONICS DEPARTMENT

MODELCOLLEGE
Certificate
This is to certify that the project IS Tester Contains the bonafied works of

Mann Dutiya Who has worked on the projectand completed the same In the

academic year 2020-21.

His/ Her project work is in Electronics Discipline as per

The Maharashtra State Board of Secondary &Higher Secondary Education.

INTERNAL EXTERNAL. CO-ORDINATOR

 ACKNOWLEDGEMENT

It adds to my pleasure to acknowledge the persons who have helped

Me while the project work was in progress! First of all I am thankful to
Akshata.S. Kuppagaddi mam , Soorya Nair mam, our Project Guide,
who has helped us in bringing out this project in present status! Our Co
ordinator
Mr. Goswami Sir , who has also encouraged us and helped us during the
completion of this project, for which we are also thankful to him. I am also
deeply grateful to our Hon’ble In-charge Principal, Dr. CA Ravindra
Bambardekar, whose discipline has created regularity in us, so as to
complete the project in time. Last but not the least; I am thankful to all the
teachers and my friends for helping us in this project work.

Signature of the student

 INTRODUCTION
IC Tester (Logic Gates)

The main purpose of this project is to check logic gate IC, whether the
IC is working properly or not. The checking of the IC will be done using
Arduino old Nano. The main IC that are going to be checked are OR
(7432), AND (7408), NAND (7400), EXOR (7486) and EXNOR (747266)

COMPONENTS LIST
 Ardino old nano x1

 LED x5

 Resistor 220ohm x5

 Jumper wire x 30

 Breadboard x2

CIRCUIT DIAGRAM
 WORKING OF THE PROJECT

As you can see, I defined the input values and their expected result for the AND gate test
using a two-dimensional array. The first two entries in each row define the input variable
values, and the third entry represents the expected result. So, for example, the first line in
the matrix states that both inputs are zero, and the desired outcome is also zero. You can
create as many of these arrays as you like for different logic functions.

Next, the setup ()-method initializes the pins that control the buttons and the LEDs. It then
sets all logic I/O lines before turning off all LEDs. The in it Positive Four Gate Test () and in
it Negative Four Gate Test () helper functions reconfigure the digital I/O pins of the Arduino
according to the I/O lines of the connected logic IC.

The test Two Input Gate () and do Four Gate Test () methods implement the actual testing
part of the program. The test Two Input Gate () function iterates over all the multi-
dimensional array entries that encode the test cases. It inspects whether the observed
output matches the expected value for the defined input variable values. Therefore, this
method tests all possible combinations of one gate of the IC. However, these ICs typically
contain multiple gates in a single package. The do Four Gate Test () function calls the test
Two Input Gate () helper method for each of the four gates on the IC. It then returns either
true or false depending on the test result.

wires_5 

This image illustrates how you can lay out the wires coming from the IC and the
components to achieve a more clean-looking build on a breadboard. Note that I removed
the Arduino to highlight the breadboard connections.

Lastly, the loop () method checks whether the user pressed one of the two buttons, and
then it runs one of the two test-cases according to the button input. Then, it calls a helper
method to display the test result using the two LEDs. I used the built-in Millis() function to
implement a simple debounce delay. You can learn more about that method in another
article.
 APPLICATIONS OF PROJECT

 It tests ICs

 ICs THAT CAN BE TESTED

 4069-Hex Inverter (NOT Gate)

 4081- Quad 2-Input AND Gate

 4071- Quad 2-Input OR Gate

 4001- Quad 2-Input NOR Gate

 4011- Quad 2-Input NAND Gate

 4070- Quad 2-Input Exclusive OR Gate

 7266- Quad 2-Input Exclusive NOR Gate

 4073- Triple 3-Input AND Gate

 4075- Triple 3-Input OR Gate

 4029- Up Down Counter

 4052- 4 X 2 Multiplexe

 4051- 8 X 1 Multiplexer

 7485- 4 bit binary comparator

 4013- Dual Delay Flip Flop

 74194- 4 bit bidirectional Shift Register


 BIBLIOGRAPHY
 https://www.youtube.com/watch?v=xECD79ppGds

  http://www.computernerdkev.heliohost.org/ictesters/index.htm

 http://electrofriends.com/projects/microcontrollers/digital-ic-tester/