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Product Portfolio EM Sample Preparation Brochure EN
Product Portfolio EM Sample Preparation Brochure EN
CHALLENGES OF
EM SAMPLE PREPARATION
THE LEICA EM SAMPLE PREPARATION
PRODUCT PORTFOLIO
SAMPLE PREPARATION
WITH LEICA MICROSYSTEMS –
THE PORTFOLIO THAT GIVES YOU
SUCCESS FOR YOUR APPLICATION
TISSUE PROCESSING EM TP
CONTRASTING EM AC20
Cover images: top: Nematode Eubostrichus dianae with ectosymbiotic bacteria layer, critical point dried with the EM CPD300 (source: Mag. N. Leisch, University of
Vienna, Austria); bottom left: Clawed frog (Xenopus laevis), nuclear pores (source: Dr. Martin Goldberg and Christine Richardson, University of Durham, UK); bottom
middle: cross section of abrasive paper, prepared with the EM TIC 3X (source: Wolfgang Grünewald, TU Chemnitz, Germany); bottom right: cross-section of a Nb3Sn
superconductor, prepared with the EM TXP and EM TIC 3X (source: Wolfang Grünewald, TU Chemnitz, Germany).
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TRIMMING & EM TXP > Allows for very fine polishing of surfaces,
EM TXP is Leica’s dedicated tool revealing buried features
MECHANICAL designed for precise mechanical target > Accurate preparation of barely visible targets
PREPARATION preparation for a broad range of light > In-situ stereomicroscope observation
and electron microscopy applications.
CLEM & Coral Life > Investigation of dynamic events with nanometer
Correlative live-cell and electron microscopy workflow resolution.
CRYO CLEM > Combination of fluorescence dynamic data with
precisely timed EM analysis.
STELLARIS 5/8 Cryo > Superresolved images for precise and reliable
Confocal cryo light microscope with targeting
a dedicated cryo objective and a cryo > Monitoring of ice thickness
imaging chamber. > Access to advanced information by fluorescence
life time (TauSense).
Cryo Microscopy Kit > Full visibility during intuitive loading of grids
Cryo transfer shuttle and cryo stage under gaseous nitrogen.
for loading, transfer, and imaging > Overpressured stage to avoid contamination
under vitreous conditions. > Software-embedded temperature control
Cryo CLEM
Correlative 2D cryo light microscopy to support cryo-electron tomography
and cryo-TEM approaches.
THUNDER Imager EM Cryo CLEM > Blur-free, fast cryo imaging (THUNDER
Camera-based cryo light microscope technology)
with a dedicated cryo objective. > Optimal cryo conditions during loading, transfer,
Imaging chamber and shuttle enable and imaging
sample quality check and 2D targeting > Image data and coordinates provided in open
under vitreous conditions. formats for coordinate retrieval in EM
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EM CTD > Combines heated air flow and heating plate for
Cryo tool dryer de-icing
> Maximum temperature +50 °C
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Key features
> Leica Team: 500+ Service & Application experts
> Leica Training: 4-level factory certification program
> Leica Logistics: 5 regional hubs for genuine parts
> Leica OneCall : PhD-level hotline assistance
Subject to modifications. LEICA and the Leica Logo are registered trademarks of Leica Microsystems IR GmbH.
MC-0005277 Copyright © by Leica Microsystems CMS GmbH, Wetzlar, Germany, 2023
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