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Ultramicroscopy
journal homepage: www.elsevier.com/locate/ultramic
A fast algorithm for computing and correcting the CTF for tilted, thick
specimens in TEM
Lenard M. Voortman a,, Sjoerd Stallinga a, Remco H.M. Schoenmakers b, Lucas J. van Vliet a,
Bernd Rieger a,b
a
Quantitative Imaging Group, Faculty of Applied Sciences, Delft University of Technology, Lorentzweg 1, 2628 CJ Delft, The Netherlands
b
FEI Company, Achtseweg Noord 5, 5651 GG Eindhoven, The Netherlands
a r t i c l e i n f o abstract
Article history: Today, the resolution in phase-contrast cryo-electron tomography is for a significant part limited by the
Received 19 July 2010 contrast transfer function (CTF) of the microscope. The CTF is a function of defocus and thus varies
Received in revised form spatially as a result of the tilting of the specimen and the finite specimen thickness. Models that include
15 December 2010
spatial dependencies have not been adopted in daily practice because of their high computational
Accepted 1 March 2011
Available online 8 March 2011
complexity. Here we present an algorithm which reduces the processing time for computing the ‘tilted’
CTF by more than a factor 100. Our implementation of the full 3D CTF has a processing time on the
Keywords: order of a Radon transform of a full tilt-series. We derive and validate an expression for the damping
CTF envelope function describing the loss of resolution due to specimen thickness. Using simulations we
Tilted geometry
quantify the effects of specimen thickness on the accuracy of various forward models. We study the
Nonuniform fast Fourier transform
influence of spatially varying CTF correction and subsequent tomographic reconstruction by simulation
Specimen thickness
TEM and present a new approach for space-variant phase-flipping. We show that our CTF correction
Tomography strategies are successful in increasing the resolution after tomographic reconstruction.
& 2011 Elsevier B.V. Open access under CC BY-NC-ND license.
0304-3991 & 2011 Elsevier B.V. Open access under CC BY-NC-ND license.
doi:10.1016/j.ultramic.2011.03.001
1030 L.M. Voortman et al. / Ultramicroscopy 111 (2011) 1029–1036
where x ¼ ðx,yÞ and q ¼ ðqx ,qy Þ. Equivalently, we define the 2D FT Using this equation, the multiplication in Eq. (4) of the scattering
R
as f^ ðqÞ ¼ f ðxÞe2pixq dx. potential with the CTF can be written as a convolution in qz. The
We choose to fix the specimen coordinates Vðx, ~ z~ Þ and rotate integration over z is equal to evaluating for qz ¼0. Combining
the microscope coordinate system Va ðx,zÞ. The rotated coordinate these steps leads to [12]
system is defined by two variables: the tilt-angle a and the ^
IðqÞ ¼ ieiwðqÞ V^ a ðq,12 lq2 ÞieiwðqÞ V^ a ðq, 12lq2 Þ, ð6Þ
orientation of the tilt-axis (azimuth) b. Since a rotation of the
specimen in real-space corresponds to the same rotation in which we will refer to as the three-dimensional CTF (3DCTF). We
Fourier space we define1 show in the following section that Eq. (6) reduces to Eq. (3) for
infinitely thin specimens. Here we also derive the approximation
V^ a ðq,qz Þ ¼ V^ ðqx cosbcosa þ qy sinbcosa þ qz sina,
error of Eq. (3) with respect to Eq. (6).
qx sinb þ qy cosb,
qx cosbsinaqy sinbsina þ qz cosaÞ: ð1Þ
2.3. Thickness induced damping envelope
Hence, for b ¼ 0 the tilt-axis is the y-axis, which we will assume in
the remainder of this article. One very common assumption in Cryo-ET is that the 3D
Since scattering in biological specimens is usually very weak, it scattering potential can be approximated by a 2D projected
is common to use the weak-phase approximation [2]. We will use scattering potential. The TCTF (Eq. (3)) is an approximation to
this approximation throughout this article and thus the FT of the the 3DCTF (Eq. (6)) for thin specimens. We will quantify the
recorded intensity is expressed as [17] correctness of this approximation as a function of the specimen
^
IðqÞ ¼ 2sinðwðqÞÞV^ a ðq,0Þ, ð2Þ thickness. In order to show the relation between these two
4 4 2
equations, we first ideally describe a specimen with limited
with wðqÞ ¼ ð2p =lÞð14
Cs l q þ 12Df l q2 Þ
the aberration function, Cs thickness as
is the spherical aberration, Df is the defocus at z¼0, l is the
electron wavelength and q ¼ JqJ. We use the convention that 1 z~
Vðx, ~ z~ Þ rect
~ z~ Þ ¼ V1 ðx, , ð7Þ
underfocus implies Df o 0. The projected scattering potential t t
V^ a ðq,0Þ is equivalent (using the projection slice theorem [18]) to where V1 ðx,~ z~ Þ is a theoretical specimen with infinite thickness, t
R
the FT of Va ðx,zÞ dz. is the thickness of the real specimen Vðx, ~ z~ Þ and ð1=tÞrectðz~ =tÞ is a
We ignore amplitude contrast in Eq. (2) to keep the following normalized block function of unity area. A multiplication with the
derivations short and to improve the readability. In practice, block function in Eq. (7) is equivalent to
amplitude contrast can be incorporated simply as an additional
phase-shift [2]. ~ q~z Þ ¼ V^ 1 ðq,
V^ ðq, ~ q~z Þ%sincðt q~z Þ, ð8Þ
Note that Eq. (2) is an approximation to the full contrast where % is the convolution operator in q~z and sincðtq~z Þ is the
transfer function as the defocus is assumed to be constant for the normalized sinc function. For infinitely thin specimens, V^ ðq,
~ q~z Þ is
whole specimen. We will refer to Eq. (2) as CTF0. independent of q~z .
Revisiting the TCTF (Eq. (3)) and the 3DCTF (Eq. (6)) we see
2.1. Tilted, thin specimens that the scattering potential V^ a is sampled, in the microscope
coordinates, at ðq 8 12lq2 btana,0Þ and ðq, 8 12lq2 Þ, respectively. For
To allow for tilted geometries Philippsen et al. [6] derived an a graphical representation see Fig. 1. From this figure (or from
extension to the CTF0. We will refer to this function (which they Eq. (1)) we see that the lateral (in the specimen coordinates)
called the tilted contrast-imaging function) as the tilted CTF spatial frequency axes ðq~x , q~y Þ coincide. Along the axial spatial
(TCTF). The FT of the recorded image intensity for tilted, thin frequency, however, there is a discrepancy of
1 2 1 1
Dq~z ¼ lq ðsinatana þcosaÞ ¼ lq2 :
1
We implicitly define V^ ðq~x , q~y , q~z Þ ¼ V^ ðq,
~ q~z Þ. 2 2 cosa
L.M. Voortman et al. / Ultramicroscopy 111 (2011) 1029–1036 1031
In combination with Eq. (8) we conclude that the fraction of the 3.1. Nonuniform fast Fourier transform
transferred signal is given by
One way of implementing the TCTF (Eq. (3)) is to revert to a set
1 2 t
Et, a ðqÞ ¼ sinc lq , ð9Þ of linear equations similar to Eq. (13) with Eq. (12) as a transfer
2 cosa
function (as done by Philippsen et al. [6]). We developed an
if instead of sampling V^ ðq,~ q~z Þ we sample V^ ðq,
~ q~z þ Dq~z Þ. This algorithm which results in a substantially faster implementation.
function can be used to estimate the overall loss of resolution when The TCTF of Eq. (3) is presented as two separate terms each
a specimen with thickness t is approximated by an infinitely thin sampling the FT of the scattering potential at slightly different
specimen. Neglecting the thickness produces the effect of a damping points. Computing the Fourier transform of a nonuniform grid of
envelope, similar to the spatial and temporal damping envelopes points is, however, not straightforward. We propose to compute
[17, Section 6.4.2]. this Fourier transform by using the nonuniform fast Fourier
From Eq. (9) we also see that in the limit of an infinitely thin transform (NUFFT) (also called gridding) [20,21]. Here we have
specimen (t-0), Eq. (3) can be used instead of Eq. (6) without loss used a specific implementation which uses a Gaussian kernel [22].
of transfer. The fact that the CTF for tilted (TCTF, Eq. (3)) and/or thick (3DCTF,
Eq. (6)) specimens can be computed by nonuniform sampling in the
Fourier domain is a result of the particular (oscillating) cos-like
3. Algorithmic improvements dependence of the CTF as a function of defocus and not a general
property of spatially varying transfer functions. For example, this
The effects of tilting and/or specimen thickness on the CTF does not work for the finite source-size envelope because the FT in
have not been widely adopted in reconstruction or forward the axial direction does not result in a (finite) set of d-functions.
modeling due to the large burden they pose on processing times.
Even though Eq. (2) of the CTF0 and Eq. (3) of the TCTF look very 3.2. Taylor expansion of transfer functions
similar, their discrete counterparts highlight some challenging
differences. The function V^ a ðq,0Þ in Eq. (2) can be discretized by In order to speed up the calculation of those space-variant
sampling on a regular grid. This results in a discrete Fourier transfer functions for which the FT does not result in a finite set of
transform (DFT) which can be computed by a standard fast d-functions, we propose a Taylor series approximation. The Taylor
Fourier transform (FFT). In contrast, the samples of V^ a in Eq. (3) series of Tðq,xÞ in x combined with Eq. (13) yields
do not form a regular grid (q 8 12lq2 btana). These sample points
nmax ðnÞ
X T ðq,0Þ
do not coincide (in general) with the discretized spatial frequen- ^
IðqÞ ¼ F x ½xn VðxÞþ Oðnmax þ 1Þ, ð14Þ
cies of the DFT. As a result the FFT cannot be used to compute V^ a . n¼0
n!
Let us first consider the general case of spatially varying
with T ðnÞ ðq,0Þ ¼ @n Tðq,xÞ=@xn jx ¼ 0 and nmax the order at which the
filtering
Z Taylor series is truncated. The derivatives of Tðq,xÞ can be derived
IðxÞ ¼ VðsÞhðxs,sÞ ds, ð10Þ analytically which make their implementation straightforward. At
the expense of a summation over nmax þ1 terms, Eq. (14) can now
where hðx,sÞ is a spatially varying point-spread function corre- be implemented using the FFT. Fortunately, when the spatial
sponding to the input (object) V at location s. We can relate the dependence is weak, the Taylor series can be truncated after a
point-spread function to a transfer function Tðq,sÞ in the Fourier relatively small number of terms.
domain by In Appendix A we present an implementation for the finite
Z source-size envelope in the form of Eq. (14) as well as an illustrative
hðx,sÞ ¼ Tðq,sÞe2piqx dq: ð11Þ example.
The processing time for Eq. (14) depends linearly on the
For example, the transfer function corresponding to the CTF0 is number of terms. The approximation error of the expansion can
simply TCTF ðq,xÞ ¼ 2sinðwðqÞÞ. The extension to a spatially varying be estimated from Taylor series theory. To achieve a certain
1032 L.M. Voortman et al. / Ultramicroscopy 111 (2011) 1029–1036
5. CTF correction where V 0 ðxÞ is an estimate of VðxÞ and sgnðxÞ is the sign function.
When we compare the result of CTF0 phase-flipping in Fig. 3A
Next to forward modeling of the CTF, one ultimately wants to with the result of TCTF phase-flipping of Eq. (16) in Fig. 3B we see
correct for these effects in order to reconstruct an unambiguous a dramatic increase in resolution at the edges of the specimen
(without phase-reversals) estimate of the specimen under (x ¼ 7 500 nm). Around the tilt-axis (x ¼ 0 nm) the difference
1034 L.M. Voortman et al. / Ultramicroscopy 111 (2011) 1029–1036
0.1 increasing the total dose. The dose available for a certain tilt-angle is
distributed over the defocus-series. Note that this does not influence
0.05
the signal-to-noise (SNR) ratio of the estimate V 0 ðxÞ [30]. It will,
0 NFC = 0.01
however, result in lower SNR per recording which might hamper the
NFC = 0.055
NFC NFC = 0.1 alignment procedure in practice. Assuming that a perfect alignment
CTF0 correction exists, we investigated whether a defocus-series will result in an
2 increased resolution.
We simulated a defocus-series of three different average
defocus values: 0.5, 1 and 1:5 mm, at each tilt-angle. This
1.5
choice was made to properly correct for the first zero-crossing
qz (nm-1)
where the summation runs over the different defocus values and
1.5 0
V^ i ðqÞ is the FT of
qz (nm-1)
Z
1 Vi 0 ðxÞ ¼ I^i ðqÞTi ðq,xÞe2piqx dq:
NFC
0.02 0.02
0.01 0.01
0 0
−200 −100 0 100 200 0 100 200
systematic defocus error (nm) stochastic defocus error (nm)
Fig. 4. Averaged NFC values as seen in Fig. 3 using the discussed CTF correction methods but with an erroneous defocus for the CTF correction step. Systematic defocus
error for all projections (A). Positive values are closer to focus. Normal distributed defocus error for each projection (B).
We derived an analytical expression for the loss of resolution As an illustrative example we have worked out the first three
by using the projection assumption, i.e. ignoring the actual terms of Eq. (14) using the TTCTF (Eq. (12)) as a transfer function:
thickness of the specimen Eq. (9). This estimated loss of resolution
was verified by the simulation of projections at different tilt- ^
IðqÞ ¼ 2sinðwðqÞÞF x ½VðxÞ
angles and specimen thicknesses. Eq. (9) can now be used as a
rule-of-thumb for estimating whether the projection assumption 2cosðwðqÞÞðplq2 tanaÞF x ½ðx bÞVðxÞ
is sufficient to image at a certain resolution, or alternatively to sinðwðqÞÞðplq2 tanaÞ2 F x ½ðx bÞ2 VðxÞ þ : ðA:1Þ
estimate up to which resolution the TCTF is a good approximation Notice that Eq. (A.1) is merely meant as an example to illustrate
to the 3DCTF. For actual acquisitions of a specimen with a certain how Eq. (14) should be interpreted. The TCTF can be implemented
thickness the transfer beyond a certain spatial frequency is using the much faster NUFFT algorithm described earlier.
severely damped. With the help of Eq. (9) the signal-to-noise In order to accurately describe the imaging model for thick
ratio of each projection can now be increased by insertion of the tilted specimens, the finite source-size envelope needs to be
correct objective aperture that blocks the scattered waves above reconsidered. As derived by [17, Section 6.4.2] the envelope
this frequency. function belonging to the effects of the finite source-size is
We successfully reduced the processing time required for
!
computing the TCTF by more than a factor 100. The processing ðrwðqÞÞ2 H2
time of the 3DCTF is reduced to the time it takes to compute one Ks ðqÞ ¼ exp
4ln2
Radon transform. We anticipate that this reduction of processing
!
time will commence the development of new iterative recon- 2
ðpCs l q3 pDfqÞ2 a2i
struction algorithms which incorporate these models to improve ¼ exp ,
ln2
the resolution of reconstructed tomograms.
We used simulations to quantify the effects of the specimen where rwðqÞ is the gradient of the aberration function, H ¼ ai =l,
thickness on the accuracy of the TCTF and CTF0. This yields a first and ai is the convergence angle. Since this envelope depends on Df ,
indication of the applicability of the TCTF for specimens of finite it must be reconsidered for thick and/or tilted specimens. We
thickness. In contrast to [6], who used a direct inversion of define the spatially varying finite source-size envelope as
projections simulated by the TCTF, we applied TCTF correction !
to projections simulated by the 3DCTF. This approach is much ðrwðqÞplzqÞ2 H2
Ks,z ðq,zÞ ¼ exp ,
closer to reality and therefore provides a better view on the 4ln2
applicability of the TCTF for CTF correction. where z is the deviation from the average defocus. Applying
The approach taken by [6,8] for CTF correction is based on the Eq. (14) leads to
direct inversion of the TCTF operator, without regularization and
with truncated singular value decomposition, respectively.
nmax
X ðnÞ
Ks,z ðq,0Þ
I^ Ks ðqÞ ¼ F x ½ðx btanaÞn IðxÞ, ðA:2Þ
We proposed a new method for TCTF correction which resembles n¼0
n!
phase-flipping of the CTF0. It does not require regularization
where
and cannot amplify noise. Furthermore, we also described a
ðnÞ
phase-flipping-like TCTF correction method for defocus-series. Ks,z ðq,0Þ @n Ks,z ðq,zÞ 1
¼
Finally we showed that these CTF correction strategies are n! @zn z ¼ 0 n!
successful in increasing the resolution after tomographic Xn k þ n
H
reconstruction. ¼ Ks ðqÞ An,k ðrwðqÞÞk pffiffiffiffiffiffiffiffi ,
k¼0 2 ln2
and with
8
Acknowledgment >
> 2k
>
< ð1Þ
ððnkÞ=2Þ
if nk is even and ko n,
nk
An,k ¼ !k!
>
> 2
L.M. Voortman was financially supported by the FOM Indus- >
:
trial Partnership program No. 07.0599. 0 otherwise:
1036 L.M. Voortman et al. / Ultramicroscopy 111 (2011) 1029–1036
For the spatially variant envelope equation (A.2) we found that [14] I.G. Kazantsev, J. Klukowska, G.T. Herman, L. Cernetic, Fully three-dimen-
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