Professional Documents
Culture Documents
Ijar Rtfet
Ijar Rtfet
net/publication/301548013
CITATIONS READS
55 11,782
2 authors:
All content following this page was uploaded by A.K. Kureshi on 21 April 2016.
Satish M Turkane
Research Scholar, Department of Electronics & Telecommunication,
Matoshri College of Engineering & Research Centre, Nashik,
Savitribai Phule Pune University, Pune, Maharashtra, India.
A. K. Kureshi
Principal, Vishwabharti Academy’s College of Engineering, Ahmednagar,
Savitribai Phule Pune University, Pune, Maharashtra, India.
4922
International Journal of Applied Engineering Research ISSN 0973-4562 Volume 11, Number 7 (2016) pp 4922-4929
© Research India Publications. http://www.ripublication.com
and threshold voltage (VT). Where VT is a function of of its initial value which results in increase in leakage power
channel length (Lg) [3]. As can be seen, as the channel length [4].
reduces below 0. 35 um the linear dependencies between Now as technology is scaled down up to nanometers,
VDD and VT is no longer linear. For example, as if we reduce transistors count per unit chip area increases therefore its
initial value of VDD up to 1/5th then VT reduces to 50% of its leakage power constraints are also increases. Due to this its
initial value [4]. standby power consumption in the device is also gets
increases. The decrease in the VT is not the proper solution
from the above discussion [4].
In order to solve these issues, recent literatures have proposed
Tunnel FETs (TFETs). The advantages of TFET are low sub-
threshold current which leads to low leakage per device and
its high ION/IOFF ratio can be suitable for memory application,
etc. As discussed above there are limitations with VDD and VT
scaling. Fig. 2 represents the changes of leakage energy (EL)
and dynamic energy (EDYN) with supply voltage VDD for both
MOSFET and TFET [7].
4923
International Journal of Applied Engineering Research ISSN 0973-4562 Volume 11, Number 7 (2016) pp 4922-4929
© Research India Publications. http://www.ripublication.com
highly compatible for standard CMOS process flow. For junction electric field on the gate-source voltage should be
TFET optimization of the doping profile and better control of maximized [4].
one mask are important factors but these are not important for
the CMOS flow [9]. Therefore, TFET is an emerging Different Structures of TFET
alternative type for next scaling of the gate length however
which is not affected by short channel effects [10]. As the
device structure of TFET is decreased then its static power
consumption is gets reduced ultimately [9].
In the ON state of TFET, the carriers tunnel through the
barrier which is band gap between valence band and
conduction band for the flow of current from drain-to-source.
Whereas in OFF state, available barrier maintains off current
magnitude lower than that of off current magnitude of the
conventional MOSFET. The inherent properties of TFETs
make them suitable for low power digital applications [4].
Where
2𝑚.
√𝐸
3 𝑔
𝑎 = 𝐴𝑞 (7)
ђ2 𝜋 2
4924
International Journal of Applied Engineering Research ISSN 0973-4562 Volume 11, Number 7 (2016) pp 4922-4929
© Research India Publications. http://www.ripublication.com
(a)
(b)
4925
International Journal of Applied Engineering Research ISSN 0973-4562 Volume 11, Number 7 (2016) pp 4922-4929
© Research India Publications. http://www.ripublication.com
𝑐 𝑆𝑇𝑢𝑛𝑛𝑒𝑙
𝑆𝑇𝑢𝑛𝑛𝑒𝑙 ≅ 𝑑 𝐼𝑔𝑒𝑛 (11) E. Raised Buried Oxide Tunnel FET (2012)
1+𝑆𝑇𝑢𝑛𝑛𝑒𝑙 ( ) The flow of current in the tunnel FET depends on tunneling
𝑑𝑉𝐺 𝐼𝐵𝑇𝐵𝑇
probability. As it has a disadvantage of ION in large band gap
𝑑 𝐼𝑔𝑒𝑛 silicon is lower, so Raised Buried Oxide TFET is designed.
As device is operating at room temperature ( )takes a
𝑑𝑉𝐺 𝐼𝐵𝑇𝐵𝑇 Non equilibrium Green’s function formalism is used for the
𝑐
negative value then we get 𝑆𝑇𝑢𝑛𝑛𝑒𝑙 >STunnel,
which is an quantum capacitance determination. A heterogate oxide and
intrinsic disadvantage of the structure. Also we can say that on SOI structure with Raised Buried Oxide in drain is proposed
the purity of tunneling process a sharp swing is depend. Based to achieve ITRS requirement and reduced Miller capacitances.
on the gate voltage polarity, one of the issues of TFET which For reduction of parasitic bipolar current and increment of
rises is about the gate-induced transversal field which current heterogate dielectric structure is used. This proposed
increases/decreases the reverse-biased tunnel of the junction structure is used to achieve:
[16]. Maximum ION,
For TFET, if gate bias is applied then it works as a reverse Minimum IOFF,
biased pin-diode which is an advantage of the TFET. Purity of Maximum ION/ IOFF ratio,
the surface defines the static leakage current of the diode and Minimum SS and
diode reduces it by 2x of magnitude [17]. But it also has a
Reduced Miller capacitance effect.
limitation that its sharp swing is present for very thin gate
voltage range, at least up to now [16].
A low band gap material improves the tunneling probability
like Ge. Hence it has maximum ION (>1mA),
C. Feedback FET (2008)
transconductance (gm), output conductance, and dynamic
Alvaro Padilla et al. proposed the feedback FET which is
power consumption (Pdynamic) of 0. 067X10-5 watt achieved at
designed to achieve a steep swing. Its device structure is
109 ION/IOFF ratio and significantly improved overshoot and
closer to Lubistor; but it has under lapped gate electrode. It
undershoots with respect to conventional TFET. Therefore,
has gate side walls for energy barrier purpose for electrons
RBO Tunnel FET is widely used for ultra-low power digital
around n+-i junction (source junction) and for holes i-p+
applications [19].
junction (drain junction). As positive gate voltage is applied
at the source and drain junction near the gate sidewalls, some
F. Junctionless TFET (2013)
holes and electrons are trapped which lowers the potential of
The proposed JL-TFET is a Si-channel heavily n-type-doped
holes and electrons near the drain and source junction
with different isolated gates (Control-Gate, P-Gate) with
respectively. Due to this sudden decrement of barrier height
different work-functions. This is because of JL-TFET should
and an abrupt SS (~2mV/decade) occurs [16].
be similar to conventional TFET.
For transition of the OFF state to ON state it requires gate side
The subthreshold swing of JL-TFETs is lower than
wall insulator to be charged. It however not a disadvantage of
60mV/decade. These are actually quantum mechanical
the proposed device, but has some issues like:
devices which are based on band-to-band tunneling (BTBT)
1. The VT on the forward sweep and on the reverse
principle. It has higher electrical performance but lower
sweep is different.
variability than MOSFET. This happens due to absence of p-n
2. The VT always depends on the VD [16].
junctions. JL-TFET is mostly attractive because of better
tunneling current and low band-gap hetero structure channel
D. p-n-i-n TFET (2011)
[20].
Wei Cao proposed a new structure which is basically a
conventional TFET with a narrow n-layer at the tunneling
F-1. Asymmetric Junctionless
junction. It has two main advantages like higher ION and lower
For efficient ON-OFF switching, source and drain are
SS with respect to the conventional TFET. Its IV
optimized by using the asymmetric junctionless source/body
characteristics and reliability are assured. Recent researches
region and junctional drain/body region separately. Due to n-
note that reliability issue is one of the major hurdles for
drain/p+body junction, the off-state tunnel barrier can be
TFET. It happens due to near tunneling junction at the
extended into the drain due to drain/body junction. Therefore,
channel/dielectric interface, where there is strong electric field
AJ-TFET is an alternative approach for sub-10-nm region
in parallel and antiparallel directions [18].
[21].
The j (E) is tunneling current density is given by the nonlocal
model for the BTBT [18], i. e.
G. Double gate TFET (DG-TFET) (2008-2015)
j (E) = αT(E)f(Ef1, Efr)ΔE (12)
The DG-TFET has an added gate which improves or doubled
the current. Due to that it’s On current gets boosted and OFF
Here α-constant, T(E)-tunneling coefficient depended on
current gets in the range of fempto amperes or Pico amperes
energy, f(Ef1, Efr)-state occupation factor function of quasi-
or it can be increases by some factor but remains extremely
Fermi levels at the two different tunneling junction. ΔE-
low. It is a lateral n-type TFET in narrow silicon layer. The
energy range. The thin n-pocket increases the tunneling field
separation of this device layer from substrate is done by using
Ey. The increment is higher at center of body (x = Tsi/2) than
dielectric material layer. In between intrinsic and p+ region
that of the surface of Si (x = 0. 1 nm). Thus changing in
tunneling take place [22].
device process, the sensitivity of the TFET characteristics may
get improved [18].
4926
International Journal of Applied Engineering Research ISSN 0973-4562 Volume 11, Number 7 (2016) pp 4922-4929
© Research India Publications. http://www.ripublication.com
G-1. Dual Material DG-TFET Subthreshold Swing in upcoming days will be highly
Rajat Vishnoi et al. proposed a double material gate TFET important parameter. So we can consider that Vertical TFET
(DMG) [23]. It has lower work function for tunneling gate is useful for obtaining maximum ION/IOFF ratio. This can be
than auxiliary gate for a n-channel TFET and higher than useful for Si based devices, also could be applied to scaled
auxiliary gate for a p-channel TFET [32]. It has maximum ION devices which follow Moore's law [24].
and minimum IOFF and SS with reduced drain saturation
voltage [23]. I. Dopingless PNPN TFET (2013-2015)
I-1. PNPN TFET
G-2. Triple Metal DG-TFET In this semiconductor device gate controls, the BTBT
The main aim of the selection of three metals with different tunneling current between source and channel using
work function is to increase ON current and make a barrier in modulation due to extra n pocket. For the removal kink effect
the channel, due to that its OFF current gets reduced. The in PNPN TFET the silicon film thickness optimized [25].
surface potential (𝜙𝑠𝑛 (𝑥)) under different metals and the The PNPN Tunnel Structure (Fig. 6) has a tunneling junction
electric fields (𝐸𝑛𝑥 (𝑥), 𝐸𝑚𝑦 (𝑥)) (lateral and vertical electric formed in between the p+ source and fully depleted thin n-
field respectively) are calculated for the tunneling current layer (n-pocket) in the gate. It helps in the reduction of
value using 2-D Poisson’s equation and Kane’s model. tunneling width and it creates local band bending. Addition of
The surface potential under different metals is expressed as: thin n pocket region improves the tunneling rate, improves
𝛽 subthreshold and with the same instant of time gives
𝜙𝑠1 (𝑥) = 𝐴 𝑒𝑥𝑝(𝜂𝑥) + 𝐵 𝑒𝑥𝑝(−𝜂𝑥) − 1⁄𝛼 (13)
maximum ION with respect to conventional design of TFET
𝑓𝑜𝑟 0 ≤ 𝑥 ≤ 𝐿1 𝑢𝑛𝑑𝑒𝑟 𝑀1
[25].
𝜙𝑠2 (𝑥) = 𝐶 𝑒𝑥𝑝(𝜂(𝑥 − 𝐿1))
𝛽
+𝐷 𝑒𝑥𝑝(−𝜂(𝑥 − 𝐿1)) − 2⁄𝛼 (14)
𝑓𝑜𝑟 𝐿1 ≤ 𝑥 ≤ (𝐿1 + 𝐿2)𝑢𝑛𝑑𝑒𝑟 𝑀2
𝜙𝑠3 (𝑥) = 𝐸 𝑒𝑥𝑝(𝜂(𝑥 − 𝐿1 − 𝐿2))
𝛽
𝐹 𝑒𝑥𝑝(−𝜂(𝑥 − 𝐿1 − 𝐿2)) − 3⁄𝛼 (15)
𝑓𝑜𝑟(𝐿1 + 𝐿2) ≤ 𝑥 ≤ 𝐿𝑢𝑛𝑑𝑒𝑟 𝑀3
The expression for Electric Field is,
Figure 6: PNPN Tunnel Structure [26].
For Lateral Electric Field-
𝑑𝜙 (𝑥,𝑦)
𝐸1𝑥 (𝑥) = − 1 | = −𝐴 𝜂 𝑒𝑥𝑝(𝜂𝑥) + 𝐵 𝜂 𝑒𝑥𝑝(−𝜂𝑥)
𝑑𝑥 𝑦=0
Table I: Comparative analysis of PNPN TFET and Conv.
(16)
TFET [25]
𝑓𝑜𝑟 0 ≤ 𝑥 ≤ 𝐿1
𝑑𝜙2 (𝑥, 𝑦)
𝐸2𝑥 (𝑥) = − | Lg PNPN TFET Conventional TFET
𝑑𝑥 𝑦=0 (nm) Ron SS Ion/ Ron SS Ion/
= −𝐶 𝜂 𝑒𝑥𝑝(𝜂(𝑥 − 𝐿1)) (KΩ/µm) (mV/dec) Ioff (KΩ/µm) (mV/dec) Ioff
+ 𝐷 𝜂 𝑒𝑥𝑝(−𝜂(𝑥 − 𝐿1)) (17) 30 42.6 53.1 108 64.1 93.2 105
𝑓𝑜𝑟𝐿1 ≤ 𝑥 ≤ (𝐿1 + 𝐿2)𝑢𝑛𝑑𝑒𝑟𝑀2 35 46.1 55.3 4×107 61.2 90 105
𝑑𝜙3 (𝑥, 𝑦)
𝐸3𝑥 (𝑥) = − | 40 48 62 6×107 60 91.2 0.1×106
𝑑𝑥 𝑦=0 45 48.5 65.6 4.2×107 58.6 91 0.2×106
= −𝐸 𝜂 𝑒𝑥𝑝(𝜂(𝑥 − 𝐿1 − 𝐿2)) 50 50.2 68 107 57 90 0.4×106
+𝐹 𝜂 𝑒𝑥𝑝(−𝜂(𝑥 − 𝐿1 − 𝐿2)) (18) 55 53.3 72.2 0.6×107 53.8 72 0.7×106
𝑓𝑜𝑟 (𝐿1 + 𝐿2) ≤ 𝑥 ≤ 𝐿𝑢𝑛𝑑𝑒𝑟 𝑀3 60 62 73.2 106 50 71.3 106
4927
International Journal of Applied Engineering Research ISSN 0973-4562 Volume 11, Number 7 (2016) pp 4922-4929
© Research India Publications. http://www.ripublication.com
Sub-threshold Swing of TFET, [4] Deepak Kumar's M. TECH thesis, “Tunnel FETs and
−1 Its Application to Digital Circuits,” Indian Institute
𝑙(𝑙𝑜𝑔𝐼𝑑 )
𝑆𝑇𝐹𝐸𝑇 = ( ) (25) of Technology, Kanpur, June 2015.
𝑑𝑉𝑔𝑠
[5] P. Packan, Short Course, International Electron
Sub-threshold Slope, Devices Meeting short courses (IEDM) 2007.
2
𝑉𝑔𝑠 [6] Peter Nilsson, “Arithmetic Reduction of the Static
𝑆𝑇𝐹𝐸𝑇 = ( )[mV/decade] (26)
5.75(𝑉𝑔𝑠 +𝐶𝑜𝑛𝑠𝑡) Power Consumption in Nanoscale CMOS,” 13th
IEEE International Conference on Electronics,
I-2. Dopingless PNPN Circuits and Systems, pp 656-659, Nice, 10-13
The charge plasma concept is used for the design of doping- December 2006.
less TFET designed on a narrow i-silicon layer. Due to charge [7] Adrian M. Ionescu and Heike Riel, “Tunnel field
plasma concept, doping’s are not required for source and effect transistors as energy efficient electronic
drain. Instead we choose different work functions for source, switches,” Nature 479, pp. 329-337, Nov. 2011.
drain and both metal electrodes. For fabrication of doping-less [8] Benton H. Calhoun and Anantha Chandrakasan,
TFET high-temperature doping/annealing process is not used “Characterizing and Modelling Minimum Energy
therefore ultimately it reduces the thermal budget [26]. Operation for Subthreshold Circuits,” International
Surface depletion width is given by[27], Symposium Low Power Electronics and Design,
𝑊𝑠𝑢𝑟𝑓𝑎𝑐𝑒 (𝑘, 𝑇, 𝑉𝑔 , 𝑁𝐴 ) = 𝑊𝑠𝑢𝑟𝑓𝑎𝑐𝑒 (𝑘) (27) Newport Beach, CA, USA, pp 90-95, August 2004.
[9] Thomas Nirschl, Stephan Henzler, Christian Pacha,
Dopingless TFET is candidate for low-power and low-cost Peng-Fei Wang, Walter Hansch, Georg Georgakos
applications in the future [28]. It shows promising switching and Dons Schmitt-Landsiedel, “The Tunneling Field
behaviour and quite decrement in PVT variations on Effect Transistor (TFET) used in a Single-Event-
subthreshold swing and drive current than that of Upset (SEU) insensitive 6 transistor SRAM cell in
conventional-TFET [29]. Now doping-less TFET shows very ultra-low voltage applications,” 4th IEEE Conference
good electrostatic control over the channel with reduced on Nanotechnology, pp 402-405, 2004.
thermal budget and process complexity. [10] Th. Nirschl, P. F. Wang, C. Weber, J. Sedlmeii, R.
Heinrich, R. Kakoschke, K. Schriife, J. Holz, C.
Pacha, T. Schulz, M. Ostermayr, A. Olbrich, G.
Conclusion Georgakos, E. Ruderer, W. Hansch and D. Schmitt-
This paper explains different types of TFET from initial stages Landsiedell, “The tunneling field effect transistor
of its inception to till recent. Surface Tunnel Transistor is first (TFET) used in a single-eventupset (SEU) insensitive
tunnel transistor deals with speed, power and IOFF/ION ratio. 6 transistor SRAM cell in ultra-low voltage
Then first TFET basic p-i-n structure is invented which deals applications,”4th IEEE Conference on
with speed, power, IOFF/ION, tuning range etc. After that Nanotechnology, 2004.
feedback TFET, p-n-i-n TFET, NEMFET, Raised Buried [11] S. M. Sze, “Physics of Semiconductor Devices, ” 2nd
Oxide TFET, Junctionless TFET, Double gate TFET (DG- edition (New York: John Wiley and Sons, Inc.,
TFET), Vertical TFET, Dopingless PNPN TFET are studied. 1981).
Along with these different structures of TFET DG-TFET, [12] Q. Zhang. “Low-Subthreshold-Swing Tunnel
Dopingless PNPN TFET and Vertical DG-TFET shows Transistors,” IEEE Electron Device Letters, April
superior performance than other studied. 2006.
[13] T. Baba, “Proposal for Surface Tunnel Transistors, ”
Jpn. J. Appl. Phys., Vol. 31, no. 4B, pp. L455-L457,
References 1992.
[14] T. Uemura and T. Baba, “Direct Gate-controlled
[1] Alan Seabaugh, “Quantum tunneling is a limitation NDR Characteristics in Surface Tunnel Transistor, ”
in today’s transistors, but could be the key to future 1996.
devices, ” IEEE spectrum, 30th September, 2013. [15] T. Baba and T. Uemura, “Development of InGaAs
[2] Aswathy, M., Nitha M. Biju, and Rama Komaragiri., based multiple-junction surface tunnel transistors for
“Comparison of a 30nm Tunnel Field Effect multiple-valued logic circuits”, Proc. 28th Int. Symp.
Transistor and CMOS Inverter Characteristics,” 3rd Multiple-Valued Logic, Fukuoka, Japan, pp. 7-12,
International Conference on Advances in Computing 1998.
and Communications, Cochin, pp 149-152, Aug. [16] Yasuhisa Omura, “SoiLubistors: Lateral,
2013. Unidirectional, Bipolar-Type Insulated-Gate
[3] R. Dennard, F. Gaensslen, H.-N. Yu, V. Rideout, E. Transistors,” John Wiley & Sons, Singapore Pte.
Bassous, and A. LeBlanc, “Design of Ion-Implanted Ltd., Part seven, chapter 23, pp 247-260, 2013.
MOSFETs with Very Small Physical Dimensions,” [17] Thomas Nirschl, Peng-Fei Wang, Walter Hansch and
IEEE J. Solid-State Circuits, vol. 9, no. 5, pp. 256- Doris Schmitt-Landsiedel, “The tunneling field effect
268, October 1974. transistor (TFET): the temperature dependence, the
simulation model, and its application,” International
4928
International Journal of Applied Engineering Research ISSN 0973-4562 Volume 11, Number 7 (2016) pp 4922-4929
© Research India Publications. http://www.ripublication.com
4929