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Ab initio Calculation for Photocurrent in Silicon p-n Junction:

the First-Order Perturbation Theory


Majid Ghandchi 1, Hossein Fazlalipour 2
1. Department of Electrical Engineering. Ahar Branch, Islamic Azad University, Ahar, Iran
Email: majid.ghandchi@iau-ahar.ac.ir (Corresponding author)
2. Department of Electrical Engineering. Ahar Branch, Islamic Azad University, Ahar, Iran,
Email: h-fazlalipour@ iau-ahar.ac.ir

Abstract

A computational study based on first-principles calculations by supercomputers for


nanoelectronic devices sometimes leads to results that can rarely be obtained in experimental
laboratories with measuring tolerances. In this paper, therefore, we obtained the electronic,
electrical, and optoelectrical properties of silicon p-n junction nanostructures by solving Non-
Equilibrium Green’s Function (NEGF) using the first-order perturbation theory. We extracted
the density of states (DOS), quantum carrier transport coefficient, IV-curve, and
optoelectrical behavior by calculating the photocurrent and then plotted the light absorption
spectrum. In the studied silicon nanostructure, light absorption is negligible for incident
photon energy below 1 eV, and peak absorption occurs at 4 eV. In this research, the
developed computational model paves the way for the study of nano-opto-electronic devices.

Keywords: Photocurrent, Non-equilibrium Green's function (NEGF), density functional theory


(DFT), IV characteristics.

1. Introduction emphasis on silicon and other


semiconductor materials, we introduce five
The conversion of optical energy into common physical mechanisms in the
electrical energy is important from two following: (i) In the photovoltaic effect
aspects. First, solar cells and the use of [4], we observe the generation of
sunlight energy to generate electricity is a photocurrent resulting from the separation
very attractive field for researchers and of electron-hole pairs by the built-in
industries related to solar cells [1]. The electric field in the p-n metallurgical
second aspect concerns the use of junction. (ii) In photothermoelectric
photodetectors not only in fiber optic (PTE), the generation of hot electrons
communication [2] but also for imaging in produces a VPTE voltage based on the
various fields, including medical Seebeck effect [5]. (iii) The bolometer
engineering [3]. All these cases indicate method refers to changing the electrical
that appropriate models with sufficient conductance and carrier transport
accuracy to extract the optical behavior of properties of an illuminated material due
nano-devices by involving all quantum to absorption heat [6] This type of
effects without applying common photodetection considers the thermal
approximations to the bulk condition resistance of Rh and ΔR creation by ΔT.
should be developed to study the optical (iv) The photogating method [7] with light
behavior of nanostructures. illumination results in the creation of Δn,
The photocurrent is produced by and the photogenerated electron-hole
various mechanisms. After photon energy pair density and trapping of one type of
absorption in a structure, an electrical these carriers under the light-sensitive
signal is generated from this absorbed layer provide the channel required for
energy in different means. With an carrier recirculation under an external bias
voltage. (v) The latest method is the Equation (2) can be used to calculate the
plasma wave-assisted photodetection, potential vector [11]:
which is used in the modulation-doped
ħ √~
μr ~ϵ r
( )
1/ 2
field effect transistor (MODFET) that has
× (b e +b e )(2)
− jωt † jωt
A=e ∙F ,
a two-dimensional electron gas (2DEG) 2 N ω~ ϵc
channel. The electron gas layer acts as a
cavity for the excited plasma wave in the where µr and ɛr are respectively relative
metal-semiconductor interface by light permeability and relative permittivity
incidence, making a resonance regime. coefficients, ω is the incident light
Dyakonov and Shur [8, 9] presented frequency, F is the incident photon flux,
evidence that the response of this and b and b† are the bosonic generation
resonance regime with plasmon standing and annihilation operators. Moreover, the
wave is a DC photovoltaic that can be unit vector e indicates the polarization of
measured on both sides of the source and incident light, through which we can
drain of the MODFET. involve polarization effect in the
In this paper, we studied the simulation of optical properties.
photovoltaic optical behavior of silicon p-n Based on the standard Meir-Wingreen
junction in quantum dimensions by the formulas [12], and if we include only the
photovoltaic method and solved Green's first order experssion in the calculation of
functions in non-equilibrium conditions by photon flux, we obtain a equation similar
performing first-principles calculations. to the Fermi golden rule for the
Moreover, we obtained the electronic photocurrent calculation [13]. This electric
properties, dark current, and photocurrent current flows due to light absorption from
characteristics of the studied structure. The the left terminal (L) to the right terminal
results correspond to those previously (R) and is expressed by the following
reported by other researchers in similar formulas [14]:
cases [10].

q
2. Theory and Methods I α= ∫ ¿ ¿
h −∞
In the photocurrent calculation, we (3)
†~
−¿ ( E ) =N Tr { M Aα (E )M A β (E−ħω) } ,¿ (4)
consider light incidence as the first-order T α,β
perturbation on the studied nanostructured ~
+¿ ( E ) =N Tr { M A α (E )M A β (E+ ħω)} . ¿

(5)
electronic system. This perturbation occurs T α,β
due to the interaction of the weak
electromagnetic field of the incident light. In these formulas, the α index replaces
The interaction of photons with electrons letters L and R to show the corresponding
is described by the Hamiltonian equation relationships between the left and right
(1): terminals, respectively (α ∈ L, R). Besides,
the function fα is the Fermi-Dirac
q distribution function of the α terminal. Aα
' (1)
H= × A . P, and Ãα represent the spectral function and
m0
the spectral reverse time function of the α
terminal, respectively. Formula (6)
where A and P are the potential vector and describes the electron-photo coupling
the momentum operator, respectively. matrix:
Also the q is electron charge and m0 is the
mass of electron. Assuming that the ~~
(
q ħ √ μr ϵ r
)
1/ 2
incident light source is monochromatic and M ml= ∙F × ( e ∙ P ml ) (6)
propagated only in the fundamental mode. m0 2 N ω ~
ϵc
By following the above steps, the
overall photocurrent of the nanodevice is
finally calculated from the current
difference between the left and right
terminals: IPh=IL-IR. In these calculations, ,
G and G† functions are respectively
advanced and retarded Green's function,
Γα is the spectral broadening function of
each nanodevice terminal, and P is the
momentum operator, all of which result
from solving the Hamiltonian DFT-NEGF
self-consistently. In this article, we Fig. 1 Atomic nanostraucture of studied p-n
implemented the above mentioned junction based on Si.
numerical analysis using the quantum .
ATK software package [15] developed
based on python programming language 3. Results and discussion
[16]. In this method, we first create the
atomic structure of the p-n junction as Understanding the electronic structure
shown in Fig. 1. The definitions of positive of nanodevices is the first step in their
(p) and negative (n) impurities are computational study. Fig. 2 depicts the
important challenges in atomic simulations electronic density of states (DOS)
and first-principles calculations, which are spectrum of the studied device obtained
resolved in ATK software. Impurity from solving its DFT-NEGF Hamiltonian.
density is considered 2×10+20 (#/cm3) for The high peak with an amplitude of
junction sides. In this simulator, a solution 25 eV−1 at an E energy of about 0.60 eV
for the computerized study of adding refers to the highest available DOS. In
impurity atoms is as to apply an external negative energies, a high peak is also seen
compensation potential, which recreates for DOS occurring with an amplitude of 23
the potential effect of electrons related to eV−1 and in an E energy of about −0.55
the ionization of impurity atoms in a real eV. Calculating the distance between the
structure. Depending on the types of two peaks opens a 1.15 eV bandgap
impurity atoms selected for the energy.
compensation electric field based on Fig. 3 illustrates the quantum
electron or holes injected from these transmission coefficient spectrum in
impurity atoms, donor or acceptor unbiased conditions. This coefficient is
impurity is included in the calculation related to nanodevice electrical
process. Impurity inclusion is defined in conductance. The presence of almost 1.15
one of ATK software engineering tools in eV bandgap energy in this spectrum
the Builder environment. confirms the semiconductor behavior of
Table 1 represents the technical this nanostructure.
specifications of the designed silicon Although the transmission coefficient
nanostructure, including the cross-section typically represents the probability of
of the current (14.75 Å2), and the direction electron transport, and our expectation of
of the current is along with the Miller the probability number is a value less than
index <100>. one, Fig. 3 shows that the quantum
transmission coefficient reaches values of
3 and 2 in negative and positive energies,
respectively.
Table 1 Studied Si p-n nano-device atomic The diode behavior of the silicon p-n
configuration junction in its IV-curve characteristic is
evident in Fig. 4.

Fig. 3 Quantum transmission coefficient


spectrum at zero bias condition

Fig. 2 Device Density of state (DDOS) that


display the energy bandgap of two probe
nanodevice
Fig. 4 IV-characteristics of Si p-n junction that
The physical reason for this event is the represent the dark current
calculation of the total transmission
coefficient for all quantum channels The near-zero current in reverse bias and
between two electrodes of the device, the exponential increase in the current of
leading to a result beyond the one. the device for exceeding the forward bias
of 0.55V indicate the diode nature of this
nanostructure. In Fig. 4, the vertical axis is
based on nano-amps, and the effective analysis solely by describing the atomic
cross-section area for the current transfer structure and determining the electrical
is involved in calculating this values. and magnetic fields applied from the
In this study, the key result is outside related to light incidence to extract
photocurrent response obtained from light photoelectrical results. Wavelengths,
incidence in a relatively broad frequency amplitude intensity, and polarization can
spectrum of 5 eV. Fig. 5 shows the light be determined for incident light in the
absorption spectrum of the present numerical analysis process. Conventional
nanostructure obtained by calculating the approximations in the bulk device are not
photocurrent per incident light with accountable in the study of nanodevices,
different frequencies. In Fig. 5, the vertical necessitating the use of Ab initio
axis is based on photocurrent density on a calculations. The results in this paper are
logarithmic scale. This spectrum indicates in line with previous reliable reports of
that the photocurrent is zero up to an scientists who worked with an
energy of about 1.15 eV. This zero current experimental or computational approach.
in photon energies below 1.15 eV Therefore, this developed numerical model
corresponds to the bandgap energy is valid for nanostructures with quantum
observed in the nanodevice electronic confinement.
structure, which confirms the accuracy of
the results obtained for the optical
behavior of the device. 5. References

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