rel 650 setting pezu from Omicron test universe:

Test Object - Distance Settings

System parameters:
Line length: 12.66 Ω Line angle: 80.91 °
PT connection: at line CT starpoint: Dir. line
Impedance correction no
1A/I nom:
Impedances in primary yes
values:

Tolerances:
Tol. T rel.: 2.000 %
Tol. T abs. +: 25.00 ms Tol. T abs. -: 25.00 ms
Tol. Z rel.: 2.000 % Tol. Z abs.: 0.00 Ω

Grounding factor:
kL mag.: 0.000000 kL angle: 0.000000°
Separate arc no
resistance:

Zone Settings:
 Tol. T Tol. T
Label Type Fault loop Trip time Tol. T rel Tol. Z rel. Tol. Z abs
abs+ abs-
Z non trip. All n/a n/a n/a n/a 2.000 % 1.386 Ω
Non-
Tripping
Forward
Z non trip. All n/a n/a n/a n/a 2.000 % 1.386 Ω
Non-
Tripping
Reverse
Z non trip. All n/a n/a n/a n/a 0.00 % 8.544 Ω
Non-
Tripping
Start
Z Tripping Tripping L-L 24.00 ms 2.000 % 25.00 ms 25.00 ms 2.000 % 718.3 mΩ
1 LL Quad
Z Tripping Tripping L-E 24.00 ms 2.000 % 25.00 ms 25.00 ms 2.000 % 2.417 Ω
1 LE Quad
Z Tripping Tripping L-L 424.0 ms 2.000 % 25.00 ms 25.00 ms 2.000 % 906.6 mΩ
2 LL Quad
Z Tripping Tripping L-E 424.0 ms 2.000 % 25.00 ms 25.00 ms 2.000 % 2.582 Ω
2 LE Quad
Z Tripping Tripping L-L 824.0 ms 2.000 % 25.00 ms 25.00 ms 2.000 % 906.6 mΩ
3 LL Quad
Z Tripping Tripping L-E 824.0 ms 2.000 % 25.00 ms 25.00 ms 2.000 % 2.582 Ω
3 LE Quad
Z Tripping Tripping L-L 1.224 s 2.000 % 25.00 ms 25.00 ms 2.000 % 906.6 mΩ
4 LL Quad
Z Tripping Tripping L-E 1.224 s 2.000 % 25.00 ms 25.00 ms 2.000 % 2.582 Ω
4 LE Quad
Z Tripping Tripping L-L 1.624 s 2.000 % 25.00 ms 25.00 ms 2.000 % 906.6 mΩ
5 LL Quad
Z Tripping Tripping L-E 1.624 s 2.000 % 25.00 ms 25.00 ms 2.000 % 2.582 Ω
5 LE Quad
Z Tripping Tripping L-L 24.00 ms 2.000 % 25.00 ms 25.00 ms 2.000 % 906.5 mΩ
RV LL
Quad
Z Tripping Tripping L-E 24.00 ms 2.000 % 25.00 ms 25.00 ms 2.000 % 2.582 Ω
RV LE
Quad
Z Tripping Tripping L-L 2.024 s 2.000 % 25.00 ms 25.00 ms 2.000 % 906.6 mΩ
BU LL
Quad
Z Tripping Tripping L-E 2.024 s 2.000 % 25.00 ms 25.00 ms 2.000 % 2.582 Ω
BU LE
Quad
 X/Ω

300

200

100

-100

-200

-300

-400

-500 -400 -300 -200 -100 0 100 200 300 400

R/Ω

Test Module
Name: OMICRON Distance Version: 4.31
Test Start: 16-Dec-2023 11:07:34 Test End: 16-Dec-2023 11:07:42
User Name: Manager:
Company:

Test Settings

Test model:
Test model: Constant test current ITest: 2.000 A
Allow reduction of No
ITest/VTest:

Fault Inception:
Mode: Random Angle: n/a
DC-offset: No

Times:
Prefault: 1.000 s Max. fault: 6.000 s
Postfault: 500.0 ms Time reference: Fault inception

Other:
CB simulation: Off Extended zones: Not active
Switch off at zero Yes
crossing:

Test Results
Shot Test: Fault Type L1-E
|Z| Phi t nom t act. Dev. ITest Result
22.13 Ω -99.09 ° 24.00 ms 46.65 ms 94.37 % 2.000 A Passed
20.31 Ω 80.91 ° 24.00 ms 26.50 ms 10.42 % 2.000 A Passed
34.29 Ω 60.00 ° 24.00 ms 34.57 ms 44.04 % 2.000 A Passed
48.71 Ω -120.00 ° 24.00 ms n/a n/a 2.000 A Out of range
62.65 Ω 130.00 ° 424.0 ms n/a n/a 2.000 A Out of range
29.34 Ω -170.00 ° 24.00 ms 22.27 ms -7.191 % 2.000 A Passed
82.50 Ω -150.00 ° 24.00 ms n/a n/a 2.000 A Out of range

Shot Test: Fault Type L2-E

|Z| Phi t nom t act. Dev. ITest Result
37.91 Ω 30.00 ° 24.00 ms 48.30 ms 101.3 % 2.000 A Passed
37.91 Ω 30.00 ° 24.00 ms 12.00 ms -50 % 2.000 A Passed
32.56 Ω -140.00 ° 24.00 ms 9.367 ms -60.97 % 2.000 A Passed
70.18 Ω 10.00 ° no trip n/a n/a 2.000 A Out of range
28.97 Ω 110.00 ° 24.00 ms 2.617 ms -89.1 % 2.000 A Passed
44.79 Ω -10.00 ° 24.00 ms n/a n/a 2.000 A Out of range

Shot Test: Fault Type L1-L2

|Z| Phi t nom t act. Dev. ITest Result
70.28 Ω 70.00 ° no trip n/a n/a 2.000 A Out of range
10.44 Ω 80.91 ° 24.00 ms 40.96 ms 70.67 % 2.000 A Passed
22.13 Ω -99.09 ° 24.00 ms 9.862 ms -58.91 % 2.000 A Passed
22.13 Ω -99.09 ° 24.00 ms 18.48 ms -23 % 2.000 A Passed

Shot Test: Fault Type L1-L2-L3

|Z| Phi t nom t act. Dev. ITest Result
10.44 Ω 80.91 ° 24.00 ms n/a n/a 2.000 A Not tested

Test State:
Test passed (partially executed)
Test performed offline: Test results are simulated!