Assigment#1

Topic: Transmission Electron Microscopy (TEM)

Name: Amreen Arshad

D/O: Muhammad Arshad
Degree: M.Phil Physics
Semester: 1st (Morning)
Session: 2023-2025
Course Title: Methods of Techniques of
Experimental Physics
Course Code: PY-706
Submitted To: Dr Hafeez Anwar
 Transmission Electron Microscopy
Transmission Electron Microscopy is a technique of imaging the internal structure of solids
using a beam of high-energy electrons transmitted through the solid. This arrangement can be
compared to the basic optical microscope with transmission illumination (sometimes called a
biological microscope).

Background:
Theoretically, the maximum resolution, d, that one can obtain with a light microscope is limited
by the wavelength of the photons (λ) and the numerical aperture NA of the system.
λ λ
d= ≈
2 n sin α 2 NA
Where n is the index of refraction of the medium in which the lens is working and α is the
maximum half-angle of the cone of light that can enter the lens.Early twentieth century scientists
theorized ways of getting around the limitations of the relatively large wavelength of visible
light (wavelengths of 400–700 nanometers) by using electrons. Like all matter, electrons have
both wave and particle properties (matter wave), and their wave-like properties mean that a beam
of electrons can be focused and diffracted much like light can. The wavelength of electrons is
related to their kinetic energy via the de Broglie equation, which says that the wavelength is
inversely proportional to the momentum. Taking into account relativistic effects (as in a TEM an
electron's velocity is a substantial fraction of the speed of light, c) the wavelength is
h ❑
λ e=
√2m E
❑
eE(1+ )
2m ec2

Where, h is Planck's constant, m0 is the rest mass of an electron and E is the kinetic energy of the
accelerated electron.

Invention of Transmission Electron Microscopy

Transmission electron microscope (TEM) was invented by Ernst Ruska of Germany in the early
1930s, and the first commercial TEM was developed by Siemens in 1939. The development of
the scanning electron microscope (SEM) started around the same time as that of the TEM.
However, it was the German scientist Max Knoll who built the first “scanning microscope” in
1935 (Bogner et al. 2007; McMullan 1993). Manfred von Ardenne laid a further foundation for
the SEM as well as for the transmission electron microscope (TEM).
Working principle:
1. The TEM works with a high voltage electron beam to create the image,
2. Working on the principle of wavelength of electron.
3. Based on the transmission of the electrons through the.

Instruments:
Essential components of all the TEMs include the following:
1. An electron gun
2. Condenser system
3. Image producing system
4. Image recording system

 Ultra high voltage (approximately 20kV)

 Low pressure (10−4 pa )
 Thin layer of sample
 High vacuum
 Electromagnetic lenses

 TEMs always have electromagnetic lenses, they are not optical.

 For the focus on the beam of electrons, need very high voltage approximately 20
KV.
 Sample is not coated with gold or any other materials.
 Magnetic field help us to pull the single electron beam through vacuum chamber
 TEMs must have ultra-thin sample

The Electron gun:

The source of electrons, the cathode, is a heated V-shaped tungsten filament or, in high-
performance instruments, a sharply pointed rod of a material such as lanthanum hexaboride. The
filament is surrounded by a control grid, sometimes called a Wehnelt cylinder, with a central
aperture arranged on the axis of the column; the apex of the cathode is arranged to lie at or just
above or below this aperture. The cathode and control grid are at a negative potential equal to the
desired accelerating voltage and are insulated from the rest of the instrument. The
final electrode of the electron gun is the anode, which takes the form of a disk with an axial hole.
Electrons leave the cathode and shield, accelerate toward the anode, and, if the stabilization of
the high voltage is adequate, pass through the central aperture at a constant energy. The control
and alignment of the electron gun are critical in ensuring satisfactory operation
The Condenser System:
The intensity and angular aperture of the beam are controlled by the condenser lens system
between the gun and the specimen. A single lens may be used to converge the beam onto the
object, but, more commonly, a double condenser is employed. In this the first lens is strong and
produces a reduced image of the source, which is then imaged by the second lens onto the object.
Such an arrangement is economical of space between the electron gun and the object stage and is
more flexible, because the reduction in size of the image of the source (and hence the final size
of illuminated area on the specimen) may be varied widely by controlling the first lens. The use
of a small spot size minimizes disturbances in the specimen due to heating and irradiation

Image-producing System:
The specimen grid is carried in a small holder in a movable specimen stage. The objective lens is
usually of short focal length (1–5 mm [0.04–0.2 inch]) and produces a real intermediate image
that is further magnified by the projector lens or lenses. A single projector lens may provide a
range of magnification of 5:1, and by the use of interchangeable pole pieces in the projector a
wider range of magnifications may be obtained. For practical reasons of image stability and
brightness, the microscope is often operated to give a final magnification of 1,000–250,000× on
the screen. If a higher final magnification is required, it may be obtained by photographic or
digital enlargement. The quality of the final image in the electron microscope depends largely
upon the accuracy of the various mechanical and electrical adjustments with which the various
lenses are aligned to one another and to the illuminating system. The lenses require power
supplies of a high degree of stability; for the highest standard of resolution, electronic
stabilization to better than one part in a million is necessary.

Image Recording System:

The electron image is monochromatic and must be made visible to the eye either by allowing the
electrons to fall on a fluorescent screen fitted at the base of the microscope column or by
capturing the image digitally for display on a computer monitor. Computerized images are stored
in a format such as TIFF or JPEG and can be analyzed or image-processed prior to publication.
The identification of specific areas of an image, or pixels with specified characteristics, allows
spurious colors to be added to a monochrome image. This can be an aid to visual interpretation
and teaching and can create a visually attractive picture from the raw image.
Application:

TEM devices are applied in

 Cancer research
 Virology
 Materials science
 Nanotechnology
 Semiconductor research
 Environmental sciences
 Even paleontology and palynology.
Advantages:
 It can provide better spatial resolution
 Provide additional analytical measurements.
 Very small amount of sample required for analysis.
Disadvantages:
 Requirement of high vacuum,
 Thin sample section
 Time-consuming sample preparation