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Vnq660sp ST
Vnq660sp ST
■ PROTECTION AGAINST:
■ REVERSE BATTERY PROTECTION (**) inductive loads with one side connected to ground.
This device has four independent channels. Built-
in thermal shut down and output current limitation
DESCRIPTION protect the chip from over temperature and short
The VNQ660SP is a monolithic device made by circuit.
ABSOLUTE MAXIMUM RATING
Symbol Parameter Value Unit
VCC Supply voltage (continuous) 41 V
-VCC Reverse supply voltage (continuous) -0.3 V
IOUT Output current (continuous), per each channel Internally limited A
IR Reverse output current (continuous), per each channel -15 A
IIN Input current +/- 10 mA
ISTAT Status current +/- 10 mA
IGND Ground current at TC<25°C (continuous) -200 mA
Electrostatic Discharge (Human Body Model: R=1.5KΩ; C=100pF)
- INPUT 4000 V
VESD - STATUS 4000 V
- OUTPUT 5000 V
- VCC 5000 V
Maximum Switching Energy
EMAX 101 mJ
(L=1.46mH; RL=0Ω; Vbat=13.5V; Tjstart=150ºC; IL=10A)
Ptot Power dissipation at TC=25°C 113.6 W
Tj Junction operating temperature -40 to 150 °C
Tstg Storage temperature -65 to 150 °C
EC Non repetitive clamping energy at TC=25°C 150 mJ
Rev. 2
July 2004 1/19
VNQ660SP
BLOCK DIAGRAM
VCC
OVERVOLTAGE
UNDERVOLTAGE
DEMAG 1
DRIVER 1
OUTPUT 1
ILIM1
INPUT 1
DEMAG 2
INPUT 2 DRIVER 2
OUTPUT 2
ILIM2
INPUT 3 LOGIC
DEMAG 3
INPUT 4 DRIVER 3
OUTPUT 3
ILIM3
STATUS STATUS
DEMAG 4
DRIVER 4
OVERTEMP. 1 OUTPUT 4
ILIM4
OVERTEMP. 2
GND
VF1 (*)
IIN1 IOUT1 VCC
INPUT 1 VCC OUTPUT 1
IIN2 IOUT2 VOUT1
VIN1
INPUT 2 OUTPUT 2
VIN2 IIN3 IOUT3 VOUT2
INPUT 3 OUTPUT 3
VOUT3
VIN3 IIN4 IOUT4
INPUT 4 OUTPUT 4
VIN4 STATUS GND VOUT4
2/19
VNQ660SP
CONFIGURATION DIAGRAM (TOP VIEW) & SUGGESTED CONNECTIONS FOR UNUSED AND N.C.
PINS
STATUS 6 5 GND
INPUT 4 7 4 OUTPUT 4
INPUT 3 8 3 OUTPUT 3
INPUT 2 9 2 OUTPUT 2
INPUT 1 10 OUTPUT 1
1
11
VCC
THERMAL DATA
Symbol Parameter Value Unit
Rthj-case Thermal resistance junction-case (MAX) (all channels on) 1.1 (1) 52 (2) °C/W
Rthj-amb Thermal resistance junction-ambient (MAX) 51.1 (1) 33 (2) °C/W
(1)
When mounted on a standard single-sided FR-4 board with 1cm² of Cu (at least 35 µm thick). Horizontal mounting and no artificial air flow.
(2)
When mounted on a standard single-sided FR-4 board with 6cm² of Cu (at least 35 µm thick). Horizontal mounting and no artificial air flow.
ELECTRICAL CHARACTERISTICS (V CC=6V up to 24V; -40°C<Tj<150°C unless otherwise specified)
POWER (per each channel)
Symbol Parameter Test Conditions Min Typ Max Unit
VCC (**) Operating supply voltage 6 13 36 V
VUSD (**) Undervoltage shutdown 3.5 4.6 6 V
VUVhyst (**) Undervoltage hysteresis 0.2 1 V
VOV (**) Overvoltage shutdown 36 V
VOVhyst (**) Overvoltage hysteresis 0.25 V
Off state; Input=0V; VCC=13.5V 12 40 µA
Off state; Input=0V; VCC=13.5V
IS (**) Supply current
Tj=25°C 12 25 µA
On state Input=3.25V; 9V<VCC<18V 6 12 mA
IOUT=1A; Tj=25°C; 9V<VCC<18V 40 50 mΩ
RDS(on) On state resistance IOUT=1A, Tj=150°C; 9V<VCC<18V 85 100 mΩ
IOUT=1A; VCC=6V 130 mΩ
IL(off1) Off state output current VIN=VOUT =0V 0 50 µA
IL(off2) Off State Output Current VIN=0V; VOUT =3.5V -75 0 µA
IL(off3) Off State Output Current VIN=VOUT =0V; VCC=13V; Tj =125°C 5 µA
IL(off4) Off State Output Current VIN=VOUT =0V; VCC=13V; Tj =25°C 3 µA
3/19
VNQ660SP
Note 1: To ensure long term reliability under heavy overload or short circuit conditions, protection and related diagnostic signals must be used
together with a proper software strategy. If the device is subjected to abnormal conditions, this software must limit the duration and number
of activation cycles.
LOGIC INPUT (per each channel)
Symbol Parameter Test Conditions Min Typ Max Unit
VIL Input Low Level Voltage 1.25 V
VIH Input High Level Voltage 3.25 V
VHYST Input Hysteresis Voltage 0.5 V
IIH Input high level voltage VIN=3.25V 10 µA
IIL Input Current VIN=1.25V 1 µA
CIN Input Capacitance 40 pF
Input Clamp Voltage IIN=1mA 6 6.8 8 V
VICL
IIN=-1mA -0.7 V
4/19
VNQ660SP
Class Contents
C All functions of the device are performed as designed after exposure to disturbance.
One or more functions of the device is not performed as designed after exposure and cannot be
E
returned to proper operation without replacing the device.
SWITCHING CHARACTERISTICS
VLOAD
90%
80%
dVOUT/dt(on) dVOUT/dt(off)
10%
t
VIN
td(on) tr td(off)
5/19
1
VNQ660SP
VIN
VIN
VSTAT
VSTAT
tDOL tSDL tSDL tSDL
6/19
2
VNQ660SP
Figure 2: Waveforms
NORMAL OPERATION
INPUTn
LOAD VOLTAGEn
STATUS
UNDERVOLTAGE
VCC VUSDhyst
VUSD
INPUTn
LOAD VOLTAGEn
STATUSn undefined
OVERVOLTAGE
VCC<VOV VCC>VOV
VCC
INPUTn
LOAD VOLTAGEn
STATUSn
INPUTn
LOAD VOLTAGEn
VOL
STATUSn
tDOL tDOL
OVERTEMPERATURE
Tj TTSD
TR
INPUTn
LOAD CURRENTn
STATUSn
7/19
VNQ660SP
APPLICATION SCHEMATIC
+5V +5V
VCC1,2
Rprot
STATUS
Dld
Rprot INPUT1
OUTPUT1
µC
Rprot INPUT2
OUTPUT2
Rprot
INPUT3 OUTPUT3
Rprot
INPUT4 OUTPUT4
GND
RGND
VGND DGND
Note: Channels 3 & 4 have the same internal circuit as channel 1 & 2.
GND PROTECTION NETWORK AGAINST produce a shift (IS(on)max * RGND) in the input thresholds
REVERSE BATTERY and the status output values. This shift will vary
depending on how many devices are ON in the case of
Solution 1: Resistor in the ground line (RGND only). This several high side drivers sharing the same RGND.
can be used with any type of load.
If the calculated power dissipation leads to a large resistor
The following is an indication on how to dimension the or several devices have to share the same resistor then
RGND resistor. the ST suggests to utilize Solution 2 (see below).
1) RGND ≤ 600mV / (IS(on)max). Solution 2: A diode (DGND) in the ground line.
2) RGND ≥ (−VCC) / (-IGND) A resistor (RGND=1kΩ) should be inserted in parallel to
where -IGND is the DC reverse ground pin current and can DGND if the device will be driving an inductive load.
be found in the absolute maximum rating section of the This small signal diode can be safely shared amongst
device’s datasheet. several different HSD. Also in this case, the presence of
Power Dissipation in RGND (when VCC<0: during reverse the ground network will produce a shift (j600mV) in the
battery situations) is: input threshold and the status output values if the
PD= (-VCC)2/RGND microprocessor ground is not common with the device
ground. This shift will not vary if more than one HSD
This resistor can be shared amongst several different shares the same diode/resistor network.
HSD. Please note that the value of this resistor should be
calculated with formula (1) where IS(on)max becomes the Series resistor in INPUT and STATUS lines are also
sum of the maximum on-state currents of the different required to prevent that, during battery voltage transient,
devices. the current exceeds the Absolute Maximum Rating.
Please note that if the microprocessor ground is not Safest configuration for unused INPUT and STATUS pin
common with the device ground then the RGND will is to leave them unconnected.
8/19
VNQ660SP
LOAD DUMP PROTECTION The value of these resistors is a compromise between the
Dld is necessary (Voltage Transient Suppressor) if the leakage current of µC and the current required by the
load dump peak voltage exceeds VCC max DC rating. The HSD I/Os (Input levels compatibility) with the latch-up limit
same applies if the device will be subject to transients on of µC I/Os.
the VCC line that are greater than the ones shown in the -VCCpeak/Ilatchup ≤ Rprot ≤ (VOHµC-VIH-VGND) / IIHmax
ISO T/R 7637/1 table. Calculation example:
µC I/Os PROTECTION: For VCCpeak= - 100V and Ilatchup ≥ 20mA; VOHµC ≥ 4.5V
If a ground protection network is used and negative 5kΩ ≤ Rprot ≤ 65kΩ.
transient are present on the VCC line, the control pins will Recommended Rprot value is 10kΩ.
be pulled negative. ST suggests to insert a resistor (Rprot)
in line to prevent the µC I/Os pins to latch-up.
9/19
VNQ660SP
9
Off state 6
8 Vcc=24V Vin=3.25V
Vout=0V 5
7
6
4
5
3
4
3 2
2
1
1
0 0
-50 -25 0 25 50 75 100 125 150 175 -50 -25 0 25 50 75 100 125 150 175
Tc (ºC) Tc (ºC)
7.8
3.4
Iin=1mA
7.6
3.2
7.4
3
7.2
7 2.8
6.8
2.6
6.6
2.4
6.4
2.2
6.2
6 2
-50 -25 0 25 50 75 100 125 150 175 -50 -25 0 25 50 75 100 125 150 175
Tc (ºC) Tc (ºC)
2.6 1.8
1.6
2.4
1.4
2.2
1.2
2
1
1.8
0.8
1.6
0.6
1.4
0.4
1.2 0.2
1 0
-50 -25 0 25 50 75 100 125 150 175 -50 -25 0 25 50 75 100 125 150 175
Tc (ºC) Tc (ºC)
10/19
VNQ660SP
52
17.5
50
15
48
12.5
46
44 10
42
7.5
40
5
38
2.5
36
34 0
-50 -25 0 25 50 75 100 125 150 175 -50 -25 0 25 50 75 100 125 150 175
Tc (ºC) Tc (ºC)
450
600
400 Vcc=13V Vcc=13V
Rl=13Ohm Rl=13Ohm
350 500
300
400
250
300
200
150 200
100
100
50
0 0
-50 -25 0 25 50 75 100 125 150 175 -50 -25 0 25 50 75 100 125 150 175
Tc (ºC) Tc (ºC)
90 90
Iout=1A Iout=1A Tc=150ºC
80 80
Vcc=9V; 13V; 18V
70 70
60 60
50 50
Tc=25ºC
40 40
30 30 Tc= - 40ºC
20 20
10 10
0 0
-50 -25 0 25 50 75 100 125 150 175 8 9 10 11 12 13 14 15 16 17 18 19 20
Tc (ºC) Vcc (V)
11/19
VNQ660SP
7.8 0.045
Istat=1mA Vstat=5V
7.6 0.04
7.4 0.035
7.2 0.03
7 0.025
6.8 0.02
6.6 0.015
6.4 0.01
6.2 0.005
6 0
-50 -25 0 25 50 75 100 125 150 175 -50 -25 0 25 50 75 100 125 150 175
Tc (ºC) Tc (ºC)
Status Low Output Voltage Open Load Off State Voltage Detection Threshold
4.5
0.525
Vin=0V
Istat=1.6mA 4
0.45
3.5
0.375
3
0.3 2.5
2
0.225
1.5
0.15
1
0.075
0.5
0 0
-50 -25 0 25 50 75 100 125 150 175 -50 -25 0 25 50 75 100 125 150 175
Tc (ºC) Tc (ºC)
12/19
VNQ660SP
ILM AX (A)
100
10
B
C
1
0.01 0.1 1 10 100
L(mH )
Conditions:
VCC=13.5V
Values are generated with R L=0Ω
In case of repetitive pulses, Tjstart (at beginning of each demagnetization) of every pulse must not exceed
the temperature specified above for curves B and C.
VIN, IL
Demagnetization Demagnetization Demagnetization
13/19
VNQ660SP
PowerSO-10™ PC Board
Layout condition of Rth and Zth measurements (PCB FR4 area= 58mm x 58mm, PCB thickness=2mm,
Cu thickness=35µm, Copper areas: from minimum pad lay-out to 8cm2).
Rthj-amb Vs. PCB copper area in open box free air condition
RTHjamb (ºC/W)
55
50
45
40
35
30
25
20
0 2 4 6 8 10
PCB Cu heatsink area (cm^2)
14/19
VNQ660SP
ZT H (°C /W)
1000
0.5 cm2
100
2 cm2
4 cm2
10 8 cm 2
0.1
0.0001 0.001 0.01 0.1 1 10 100 1000
T ime (s)
15/19
VNQ660SP
0.10 A B
10
H E E2 E E4
1
SEATING
PLANE
e B DETAIL "A"
A
0.25
C
D
h = D1 =
= =
SEATING
PLANE
A
F
A1
A1
L
DETAIL "A"
α
P095A
16/19
1
VNQ660SP
A C
A
0.67 - 0.73
B
1 10 0.54 - 0.6
2 9
REEL DIMENSIONS
Base Q.ty 600
Bulk Q.ty 600
A (max) 330
B (min) 1.5
C (± 0.2) 13
F 20.2
G (+ 2 / -0) 24.4
N (min) 60
T (max) 30.4
TAPE DIMENSIONS
According to Electronic Industries Association
(EIA) Standard 481 rev. A, Feb. 1986
Tape width W 24
Tape Hole Spacing P0 (± 0.1) 4
Component Spacing P 24
Hole Diameter D (± 0.1/-0) 1.5
Hole Diameter D1 (min) 1.5
Hole Position F (± 0.05) 11.5
Compartment Depth K (max) 6.5
Hole Spacing P1 (± 0.1) 2
Start
17/19
1
VNQ660SP
REVISION HISTORY
Date Revision Description of Changes
- Minor changes
- Current and voltage convention update (page 2).
- “Configuration diagram (top view) & suggested connections for unused and n.c.
pins” insertion (page 3).
Jul 2004 1 - 6 cm2 Cu condition insertion in Thermal Data table (page 3).
- VCC - OUTPUT DIODE section update (page 3).
- PROTECTIONS note insertion (page 4)
- Revision History table insertion (page 18).
- Disclaimers update (page 19).
Jul 2004 2 - Disclaimers update (page 19).
18/19
1
VNQ660SP
Information furnished is believed to be accurate and reliable. However, STMicroelectronics assumes no responsibility for the consequences
of use of such information nor for any infringement of patents or other rights of third parties which may results from its use. No license is
granted by implication or otherwise under any patent or patent rights of STMicroelectronics. Specifications mentioned in this publication are
subject to change without notice. This publication supersedes and replaces all information previously supplied. STMicroelectronics products
are not authorized for use as critical components in life support devices or systems without express written approval of STMicroelectronics.
19/19