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1 Features 3 Description
• Low offset voltage: ±0.5 mV The TLV930x family (TLV9301, TLV9302, and
• Low offset voltage drift: ±2 µV/°C TLV9304) is a family of 40-V, cost-optimized
• Low noise: 33 nV/√Hz at 1 kHz operational amplifiers. These devices offer strong
• High common-mode rejection: 110 dB general-purpose DC and AC specifications, including
• Low bias current: ±10 pA rail-to-rail output, low offset (±0.5 mV, typ), low offset
• Rail-to-rail output drift (±2 µV/°C, typ), and 1-MHz bandwidth.
• Wide bandwidth: 1-MHz GBW
Convenient features such as wide differential input-
• High slew rate: 3 V/µs
voltage range, high output current (±60 mA), and
• Low quiescent current: 150 µA per amplifier
high slew rate (3 V/µs) make the TLV930x a robust
• Wide supply: ±2.25 V to ±20 V, 4.5 V to 40 V
operational amplifier for high-voltage, cost-sensitive
• Robust EMI performance: 72 dB at 1 GHz
applications.
• MUX-friendly/comparator inputs:
– Differential and common-mode input voltage The TLV930x family of op amps is available in
range to supply rail standard packages and is specified from –40°C to
• Industry-standard packages: 125°C.
– Single in SOT-23-5 and SC70 Device Information
– Dual in SOIC-8, TSSOP-8, and VSSOP-8 PART NUMBER(1) PACKAGE BODY SIZE (NOM)
– Quad in SOIC-14 and TSSOP-14
SOT-23 (5) 2.90 mm × 1.60 mm
TLV9301
2 Applications SC70 (5) 2.00 mm × 1.25 mm
RG RF
R1 VOUT
VIN
C1
1
f-3 dB =
2pR1C1
VOUT
VIN
= 1+(RF
RG (( 1
1 + sR1C1 (
TLV930x in a Single-Pole, Low-Pass Filter
An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,
intellectual property matters and other important disclaimers. PRODUCTION DATA.
TLV9301, TLV9302, TLV9304
SBOS941D – FEBRUARY 2019 – REVISED AUGUST 2021 www.ti.com
Table of Contents
1 Features............................................................................1 7.4 Device Functional Modes..........................................24
2 Applications..................................................................... 1 8 Application and Implementation.................................. 25
3 Description.......................................................................1 8.1 Application Information............................................. 25
4 Revision History.............................................................. 2 8.2 Typical Applications.................................................. 25
5 Pin Configuration and Functions...................................3 9 Power Supply Recommendations................................27
6 Specifications.................................................................. 5 10 Layout...........................................................................27
6.1 Absolute Maximum Ratings ....................................... 5 10.1 Layout Guidelines................................................... 27
6.2 ESD Ratings .............................................................. 5 10.2 Layout Example...................................................... 27
6.3 Recommended Operating Conditions ........................5 11 Device and Documentation Support..........................30
6.4 Thermal Information for Single Channel .................... 5 11.1 Device Support........................................................30
6.5 Thermal Information for Dual Channel .......................6 11.2 Documentation Support.......................................... 30
6.6 Thermal Information for Quad Channel ..................... 6 11.3 Receiving Notification of Documentation Updates.. 30
6.7 Electrical Characteristics ............................................7 11.4 Support Resources................................................. 30
6.8 Typical Characteristics................................................ 9 11.5 Trademarks............................................................. 30
7 Detailed Description......................................................16 11.6 Electrostatic Discharge Caution.............................. 31
7.1 Overview................................................................... 16 11.7 Glossary.................................................................. 31
7.2 Functional Block Diagram......................................... 16 12 Mechanical, Packaging, and Orderable
7.3 Feature Description...................................................17 Information.................................................................... 32
4 Revision History
NOTE: Page numbers for previous revisions may differ from page numbers in the current version.
Changes from Revision C (February 2021) to Revision D (August 2021) Page
• Removed preview note and added thermal data for VSSOP-8 (DGK) package in Thermal Information for Dual
Channel.............................................................................................................................................................. 6
OUT 1 5 V+ IN+ 1 5 V+
V± 2 V± 2
Figure 5-1. TLV9301 DBV Package Figure 5-2. TLV9301 DCK Package
5-Pin SOT-23 5-Pin SC70
Top View Top View
OUT1 1 8 V+
IN1± 2 7 OUT2
IN1+ 3 6 IN2±
V± 4 5 IN2+
Not to scale
OUT1 1 14 OUT4
IN1± 2 13 IN4±
IN1+ 3 12 IN4+
V+ 4 11 V±
IN2+ 5 10 IN3+
IN2± 6 9 IN3±
OUT2 7 8 OUT3
Not to scale
6 Specifications
6.1 Absolute Maximum Ratings
over operating ambient temperature range (unless otherwise noted)(1)
MIN MAX UNIT
Supply voltage, VS = (V+) – (V–) 0 42 V
Common-mode voltage(3) (V–) – 0.5 (V+) + 0.5 V
Signal input pins Differential voltage(3) (4) VS + 0.2 V
Current(3) –10 10 mA
Output short-circuit(2) Continuous
Operating ambient temperature, TA –55 150 °C
Junction temperature, TJ 150 °C
Storage temperature, Tstg –65 150 °C
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress
ratings only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under
Recommended Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device
reliability.
(2) Short-circuit to ground, one amplifier per package.
(3) Input pins are diode-clamped to the power-supply rails. Input signals that may swing more than 0.5 V beyond the supply rails must be
current limited to 10 mA or less.
(4) Large differential voltages applied between IN+ and IN– for extended periods of time may cause a long-term shift to the input offset
voltage. This effect increases as temperature rises above 25°C.
(1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.
(2) JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.
(1) For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application
report, SPRA953.
(1) For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application
report, SPRA953.
(1) For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application
report, SPRA953.
FREQUENCY RESPONSE
GBW Gain-bandwidth product 1 MHz
SR Slew rate VS = 40 V, G = +1, CL = 20 pF 3 V/µs
To 0.1%, VS = 40 V, VSTEP = 10 V , G = +1, CL = 20 pF 5
To 0.1%, VS = 40 V, VSTEP = 2 V , G = +1, CL = 20 pF 2.5
tS Settling time µs
To 0.01%, VS = 40 V, VSTEP = 10 V , G = +1, CL = 20 pF 6
To 0.01%, VS = 40 V, VSTEP = 2 V , G = +1, CL = 20 pF 3.5
Phase margin G = +1, RL = 10 kΩ, CL = 20 pF 60 °
Overload recovery time VIN × gain > VS 1 µs
Total harmonic distortion +
THD+N VS = 40 V, VO = 1 VRMS, G = -1, f = 1 kHz 0.003%
noise
Voltage output swing from Positive and negative rail VS = 40 V, RL = 2 kΩ 250 350
mV
rail headroom VS = 4.5 V, RL = no load 1
VS = 4.5 V, RL = 10 kΩ 20 30
VS = 4.5 V, RL = 2 kΩ 40 75
ISC Short-circuit current ±60 mA
CLOAD Capacitive load drive See Typical Characteristics
Open-loop output
ZO f = 1 MHz, IO = 0 A 600 Ω
impedance
POWER SUPPLY
25% 25%
20% 20%
Population (%)
Population (%)
15% 15%
10%
10%
5%
5%
0
0
250
500
750
1000
1250
1500
1750
2000
-2000
-1750
-1500
-1250
-1000
-750
-500
-250
0.5
1.5
2.5
3.5
4.5
5.5
6
D001
Offset Voltage (PV) Offset Voltage Drift (PV/qC) D002
TA = 25°C
Figure 6-1. Offset Voltage Production Distribution Figure 6-2. Offset Voltage Drift Distribution
1000 1200
800 900
600
600
Offset Voltage (µV)
400
Offset Voltage (µV)
300
200
0 0
-200 -300
-400
-600
-600
-900
-800
-1000 -1200
-40 -20 0 20 40 60 80 100 120 140 -40 -20 0 20 40 60 80 100 120 140
Temperature (°C) Temperature (°C) D004
D003
VCM = V+ VCM = V–
Figure 6-3. Offset Voltage vs Temperature Figure 6-4. Offset Voltage vs Temperature
800 750
600 600
450
400
Offset Voltage (µV)
300
Offset Voltage (µV)
200
150
0 0
-200 -150
-300
-400
-450
-600
-600
-800 -750
-20 -16 -12 -8 -4 0 4 8 12 16 20 0 4 8 12 16 20 24 28 32 36 40 44
Common Mode Voltage (V) D005 Supply Voltage (V) D008
TA = 25°C
Figure 6-5. Offset Voltage vs Common-Mode Voltage Figure 6-6. Offset Voltage vs Power Supply
100 150 70
Gain G=1
Phase 60 G = -1
80 125 G = 10
50
G = 100
Phase (q)
40 75 20
10
20 50
0
-10
0 25
-20
-20 0 -30
100 1k 10k 100k 1M 100 1k 10k 100k 1M
Frequency (Hz) C002
Frequency (Hz) C001
CLOAD = 15 pF
Figure 6-7. Open-Loop Gain and Phase vs Frequency Figure 6-8. Closed-Loop Gain and Phase vs Frequency
3 320
IB IB
2.5 280
IB+ IB+
Input Bias and Offset Current (pA)
2 IOS IOS
240
1.5
200
1
0.5 160
0 120
-0.5
80
-1
40
-1.5
-2 0
-2.5 -40
-20 -16 -12 -8 -4 0 4 8 12 16 20 -40 -20 0 20 40 60 80 100 120 140
Common Mode Voltage (V) D010 Temperature (°C) D011
Figure 6-9. Input Bias Current vs Common-Mode Voltage Figure 6-10. Input Bias Current vs Temperature
V+ V + 10 V
-40°C
V+ 1V V +9V 25°C
V+ 2V V +8V 85°C
125°C
V+ 3V V +7V
Output Voltage (V)
V+ 4V V +6V
V+ 5V V +5V
V+ 6V V +4V
V+ 7V V +3V
-40°C
V+ 8V 25°C V +2V
V+ 9V 85°C V +1V
125°C
V+ 10 V V
0 10 20 30 40 50 60 70 80 90 100 0 10 20 30 40 50 60 70 80 90 100
Output Current (mA) D012
Output Current (mA) D012
Figure 6-11. Output Voltage Swing vs Output Current (Sourcing) Figure 6-12. Output Voltage Swing vs Output Current (Sinking)
5 5
4.5 -40qC 4.5
4 4
3.5 3.5
Output Voltage (V)
VS = 5 V VS = 5 V
Figure 6-13. Output Voltage Swing vs Output Current (Sourcing) Figure 6-14. Output Voltage Swing vs Output Current (Sinking)
110 120
PSRR+
100 Common-Mode Rejection Ratio (dB)
PSRR-
90 CMRR 115
PSRR and CMRR (dB)
80
110
70
60
105
50
40
100
30
20 95
10
0 90
100 1k 10k 100k 1M 10M -40 -20 0 20 40 60 80 100 120 140
Frequency (Hz) C003
Temperature (°C) D015
f = 0 Hz
Figure 6-15. CMRR and PSRR vs Frequency Figure 6-16. CMRR vs Temperature (dB)
2
Power Supply Rejection Ratio (µV/V)
1.8
1.6
1.4
Voltage (1uV/div)
1.2
1
0.8
0.6
0.4
0.2
0
-40 -20 0 20 40 60 80 100 120 140 Time (1s/Div)
Temperature (°C) D016 C015
f = 0 Hz
Figure 6-17. PSRR vs Temperature (dB) Figure 6-18. 0.1-Hz to 10-Hz Noise
120 -40
RL = 10 k:
110
-50 RL = 2 k:
100 RL = 600 :
90 RL = 128 :
-60
80
THD+N (dB)
70 -70
60
50 -80
40
-90
30
20 -100
10
0 -110
10 100 1k 10k 100k 100 1k 10k
Frequency (Hz) Frequency (Hz) C012
C017
BW = 80 kHz, VOUT = 3.5 VRMS
Figure 6-19. Input Voltage Noise Spectral Density vs Frequency Figure 6-20. THD+N Ratio vs Frequency
-30 150
-40 145
140
Quiescent current (µA)
-50
THD+N (dB)
135
-60
130
-70
125
-80
RL = 10 k: 120
RL = 2 k:
-90 RL = 549 : 115
RL = 128 :
-100 110
0.001 0.01 0.1 1 10 20 0 4 8 12 16 20 24 28 32 36 40
Amplitude (VRMS) C023 Supply Voltage (V) D021
BW = 80 kHz, f = 1 kHz
Figure 6-21. THD+N vs Output Amplitude Figure 6-22. Quiescent Current vs Supply Voltage
150 152
148
Open Loop Voltage Gain (dB)
145 144
Quiescent current (µA)
140
140 136
132
135 128
124
130 120
-40 -20 0 20 40 60 80 100 120 140 -40 -20 0 20 40 60 80 100 120 140
Temperature (°C) D022
Temperature (°C) D023
Figure 6-23. Quiescent Current vs Temperature Figure 6-24. Open-Loop Voltage Gain vs Temperature (dB)
780 33
720 30
Open Loop Output Impedance (:)
660 27
600 24
Overshoot (%)
540
21
480
18
420
15
360
12
300
RISO = 0 :, Positive Overshoot
9 RISO = 0 :, Negative Overshoot
240
6 RISO = 50 :, Positive Overshoot
180 RISO = 50 :, Negative Overshoot
120 3
100 1k 10k 100k 1M 10M 0 40 80 120 160 200 240 280 320 360
Frequency (Hz) Cap Load (pF) C007
C013
G = –1, 100-mV output step
Figure 6-25. Open-Loop Output Impedance vs Frequency Figure 6-26. Small-Signal Overshoot vs Capacitive Load
55 64
50 60
45 56
40 52
Phase Margin (q)
Overshoot (%)
48
35
44
30
40
25
36
20
RISO = 0 :, Positive Overshoot 32
15 RISO = 0 :, Negative Overshoot 28
10 RISO = 50 :, Positive Overshoot
RISO = 50 :, Negative Overshoot 24
5 20
0 40 80 120 160 200 240 280 320 360 0 100 200 300 400 500 600 700 800 900 1000
Cap Load (pF) C008 Cap Load (pF) C009
G = 1, 100-mV output step G = –1, 100-mV output step
Figure 6-27. Small-Signal Overshoot vs Capacitive Load Figure 6-28. Small-Signal Overshoot vs Capacitive Load
Input
Output
Amplitude (2V/div)
Voltage (5V/div)
Input
Output
G = –10
Figure 6-29. No Phase Reversal Figure 6-30. Positive Overload Recovery
Input
Output
Amplitude (5mV/div)
Voltage (5V/div)
Input
Output
Input
Output
Amplitude (5mV/div)
Amplitude (2V/div)
Input
Output
Input
Amplitude (2V/div)
Output
Input
Output
CL = 20 pF, G = 1 CL = 10 pF, G = –1
Figure 6-35. Large-Signal Step Response (Rising) Figure 6-36. Large-Signal Step Response
100 45
VS = 40 V
80 40 VS = 30 V
60 VS = 15 V
35
40
30
20
Sourcing 25
0 Sinking
20
-20
-40 15
-60 10
-80 5
-100 0
-40 -20 0 20 40 60 80 100 120 140 1k 10k 100k 1M 10M
Temperature (°C) D038 Frequency (Hz) C020
Figure 6-37. Short-Circuit Current vs Temperature Figure 6-38. Maximum Output Voltage vs Frequency
-60 100
-70 90
Channel Seperation (dB)
-80 80
EMIRR (dB)
-90 70
-100 60
-110 50
-120 40
-130 30
100 1k 10k 100k 1M 10M 1M 10M 100M 1G
Frequency (Hz) C014 Frequency (Hz) C004
Figure 6-39. Channel Separation vs Frequency Figure 6-40. EMIRR (Electromagnetic Interference Rejection
Ratio) vs Frequency
7 Detailed Description
7.1 Overview
The TLV930x family (TLV9301, TLV9302, and TLV9304) is a family of 40-V, cost-optimized operational
amplifiers. These devices offer strong general-purpose DC and AC specifications, including rail-to-rail output,
low offset (±0.5 mV, typ), low offset drift (±2 µV/°C, typ), and 1-MHz bandwidth.
Convenient features such as wide differential input-voltage range, high output current (±60 mA), and high slew
rate (3 V/µs) make the TLV930x a robust operational amplifier for high-voltage, cost-sensitive applications.
The TLV930x family of op amps is available in standard packages and is specified from –40°C to 125°C.
7.2 Functional Block Diagram
V+ V+
VIN+ VIN+
VOUT VOUT
40 V TLV930x ~0.7 V
VIN VIN
V V
TLV930x Provides Full 40-V Conventional Input Protection
Differential Input Range Limits Differential Input Range
Figure 7-1. TLV930x Input Protection Does Not Limit Differential Input Capability
Ron_mux 1
Vn = 10 V RFILT 10 V Sn 1 2
D
10 V ~±9.3 V
CFILT CS
CD
2 VIN±
Vn+1 = ±10 V RFILT ±10 V Sn+1 Ron_mux
~0.7 V
CFILT CS Idiode_transient VOUT
VIN+
±10 V
The TLV930x family of operational amplifiers provides a true high-impedance differential input capability for high-
voltage applications. This patented input protection architecture does not introduce additional signal distortion or
delayed settling time, making the device an optimal op amp for multichannel, high-switched, input applications.
The TLV930x tolerates a maximum differential swing (voltage between inverting and noninverting pins of the op
amp) of up to 40 V, making the device suitable for use as a comparator or in applications with fast-ramping input
signals.
90
80
EMIRR (dB)
70
60
50
40
30
1M 10M 100M 1G
Frequency (Hz) C004
Input
Output
Amplitude (2V/div)
Time (20µs/Div)
C016
3V
30 V TA = 65°C
PD = 0.81W
JA = 138.7°C/W 0V
TJ = 138.7°C/W × 0.81W + 65°C
TJ = 177.3°C (expected)
150°C
TLV9301
140ºC
Temperature
IOUT = 30 mA +
RL 3V
+ VIN 100 Ÿ ±
± 3V
55 33
50 30
45 27
40 24
Overshoot (%)
Overshoot (%)
35 21
30 18
25 15
20 12
RISO = 0 :, Positive Overshoot RISO = 0 :, Positive Overshoot
15 RISO = 0 :, Negative Overshoot 9 RISO = 0 :, Negative Overshoot
10 RISO = 50 :, Positive Overshoot 6 RISO = 50 :, Positive Overshoot
RISO = 50 :, Negative Overshoot RISO = 50 :, Negative Overshoot
5 3
0 40 80 120 160 200 240 280 320 360 0 40 80 120 160 200 240 280 320 360
Cap Load (pF) C008
Cap Load (pF) C007
Figure 7-6. Small-Signal Overshoot vs Capacitive Figure 7-7. Small-Signal Overshoot vs Capacitive
Load (100-mV Output Step, G = 1) Load (100-mV Output Step, G = –1)
For additional drive capability in unity-gain configurations, improve capacitive load drive by inserting a small (10
Ω to 20 Ω) resistor, RISO, in series with the output, as shown in Figure 7-8. This resistor significantly reduces
ringing and maintains DC performance for purely capacitive loads. However, if a resistive load is in parallel
with the capacitive load, then a voltage divider is created, thus introducing a gain error at the output and
slightly reducing the output swing. The error introduced is proportional to the ratio RISO / RL, and is generally
negligible at low output levels. A high capacitive load drive makes the TLV930x well suited for applications such
as reference buffers, MOSFET gate drives, and cable-shield drives. The circuit shown in Figure 7-8 uses an
isolation resistor, RISO, to stabilize the output of an op amp. RISO modifies the open-loop gain of the system for
increased phase margin. For additional information on techniques to optimize and design using this circuit, TI
Precision Design TIDU032 details complete design goals, simulation, and test results.
+Vs
Vout
Riso
+
+ Cload
Vin -Vs
±
TVS
RF
+
±
+VS
VDD
TLV930x
R1 100 Ÿ
IN±
±
RS IN+ 100 Ÿ
+
Power Supply RL
ID ESD Cell
+
VIN
±
VSS
+
±
±VS
TVS
Figure 7-9. Equivalent Internal ESD Circuitry Relative to a Typical Circuit Application
An ESD event is very short in duration and very high voltage (for example, 1 kV, 100 ns), whereas an EOS event
is long duration and lower voltage (for example, 50 V, 100 ms). The ESD diodes are designed for out-of-circuit
ESD protection (that is, during assembly, test, and storage of the device before being soldered to the PCB).
During an ESD event, the ESD signal is passed through the ESD steering diodes to an absorption circuit
(labeled ESD power-supply circuit). The ESD absorption circuit clamps the supplies to a safe level.
Although this behavior is necessary for out-of-circuit protection, excessive current and damage is caused if
activated in-circuit. A transient voltage suppressors (TVS) can be used to prevent against damage caused by
turning on the ESD absorption circuit during an in-circuit ESD event. Using the appropriate current limiting
resistors and TVS diodes allows for the use of device ESD diodes to protect against EOS events.
0.00002% 0.00312% 0.13185% 2.145% 13.59% 34.13% 34.13% 13.59% 2.145% 0.13185% 0.00312% 0.00002%
1 1 1 1 1 1 1 1 1 1 1 1
-61 -51 -41 -31 -21 -1 +1 +21 +31 +41 +51 +61
Figure 7-10 shows an example distribution, where µ, or mu, is the mean of the distribution, and where σ,
or sigma, is the standard deviation of a system. For a specification that exhibits this kind of distribution,
approximately two-thirds (68.26%) of all units can be expected to have a value within one standard deviation, or
one sigma, of the mean (from µ–σ to µ+σ).
Depending on the specification, values listed in the typical column in Section 6.7 are represented in different
ways. As a general rule of thumb, if a specification naturally has a nonzero mean (for example, like gain
bandwidth), then the typical value is equal to the mean (µ). However, if a specification naturally has a mean near
zero (like input offset voltage), then the typical value is equal to the mean plus one standard deviation (µ + σ) in
order to most accurately represent the typical value.
You can use this chart to calculate approximate probability of a specification in a unit; for example, for TLV930x,
the typical input voltage offset is 500 µV, so 68.2% of all TLV930x devices are expected to have an offset from
–500 µV to +500 µV. At 4 σ (±2000 µV), 99.9937% of the distribution has an offset voltage less than ±2000 µV,
which means 0.0063% of the population is outside of these limits, which corresponds to about 1 in 15,873 units.
Specifications with a value in the minimum or maximum column are assured by TI, and units outside these limits
will be removed from production material. For example, the TLV930x family has a maximum offset voltage of 2.5
mV at 125°C, and even though this corresponds to 5 σ (≈1 in 1.7 million units), which is extremely unlikely, TI
assures that any unit with larger offset than 2.5 mV will be removed from production material.
For specifications with no value in the minimum or maximum column, consider selecting a sigma value of
sufficient guardband for your application, and design worst-case conditions using this value. For example, the 6σ
value corresponds to about 1 in 500 million units, which is an extremely unlikely chance, and could be an option
as a wide guardband to design a system around. In this case, the TLV930x family does not have a maximum or
minimum for offset voltage drift, but based on Figure 6-2 and the typical value of 2 µV/°C in Section 6.7, it can
be calculated that the 6-σ value for offset voltage drift is about 12 µV/°C. When designing for worst-case system
conditions, this value can be used to estimate the worst possible offset across temperature without having an
actual minimum or maximum value.
However, process variation and adjustments over time can shift typical means and standard deviations, and
unless there is a value in the minimum or maximum specification column, TI cannot assure the performance of a
device. This information should be used only to estimate the performance of a device.
7.4 Device Functional Modes
The TLV930x has a single functional mode and is operational when the power-supply voltage is greater than 4.5
V (±2.25 V). The maximum power supply voltage for the TLV930x is 40 V (±20 V).
+
VIN VOUT
V+ VTH
R1 R2
R2
VTH uV
R1 R2
(1)
25
20
15
10
5
0
-5
0 0.2 0.4 0.6 0.8 1 1.2 1.4 1.6 1.8 2
Time (ms) comp
CAUTION
Supply voltages larger than 40 V can permanently damage the device; see the Absolute Maximum
Ratings table.
Place 0.1-µF bypass capacitors close to the power-supply pins to reduce errors coupling in from noisy or
high-impedance power supplies. For more detailed information on bypass capacitor placement, refer to Section
10.
10 Layout
10.1 Layout Guidelines
For best operational performance of the device, use good PCB layout practices, including:
• Noise can propagate into analog circuitry through the power pins of the circuit as a whole and op amp itself.
Bypass capacitors are used to reduce the coupled noise by providing low-impedance power sources local to
the analog circuitry.
– Connect low-ESR, 0.1-µF ceramic bypass capacitors between each supply pin and ground, placed as
close to the device as possible. A single bypass capacitor from V+ to ground is applicable for single-
supply applications.
• Separate grounding for analog and digital portions of circuitry is one of the simplest and most-effective
methods of noise suppression. One or more layers on multilayer PCBs are usually devoted to ground planes.
A ground plane helps distribute heat and reduces EMI noise pickup. Make sure to physically separate digital
and analog grounds paying attention to the flow of the ground current.
• In order to reduce parasitic coupling, run the input traces as far away from the supply or output traces as
possible. If these traces cannot be kept separate, crossing the sensitive trace perpendicular is much better as
opposed to in parallel with the noisy trace.
• Place the external components as close to the device as possible. As illustrated in Figure 10-2, keeping RF
and RG close to the inverting input minimizes parasitic capacitance.
• Keep the length of input traces as short as possible. Always remember that the input traces are the most
sensitive part of the circuit.
• Consider a driven, low-impedance guard ring around the critical traces. A guard ring can significantly reduce
leakage currents from nearby traces that are at different potentials.
• Cleaning the PCB following board assembly is recommended for best performance.
• Any precision integrated circuit may experience performance shifts due to moisture ingress into the plastic
package. Following any aqueous PCB cleaning process, baking the PCB assembly is recommended to
remove moisture introduced into the device packaging during the cleaning process. A low temperature, post
cleaning bake at 85°C for 30 minutes is sufficient for most circumstances.
10.2 Layout Example
VIN +
RG VOUT
RF
NC NC
Use a low-ESR,
RG
ceramic bypass
GND ±IN V+ capacitor
V± NC GND
VS± GND
VOUT
Ground (GND) plane on another layer
Use low-ESR,
ceramic bypass
capacitor
V+
GND GND
OUT
V-
GND
OUTPUT A
GND GND GND
V+
INPUT A
OUTPUT B
INPUT B
V-
Note
These files require that either the TINA software (from DesignSoft™) or TINA-TI software be installed.
Download the free TINA-TI software from the TINA-TI folder.
11.7 Glossary
TI Glossary This glossary lists and explains terms, acronyms, and definitions.
www.ti.com 17-Aug-2023
PACKAGING INFORMATION
Orderable Device Status Package Type Package Pins Package Eco Plan Lead finish/ MSL Peak Temp Op Temp (°C) Device Marking Samples
(1) Drawing Qty (2) Ball material (3) (4/5)
(6)
TLV9301IDBVR ACTIVE SOT-23 DBV 5 3000 RoHS & Green NIPDAU | SN Level-1-260C-UNLIM -40 to 125 T93V Samples
TLV9301IDCKR ACTIVE SC70 DCK 5 3000 RoHS & Green SN Level-2-260C-1 YEAR -40 to 125 1FN Samples
TLV9302IDDFR ACTIVE SOT-23-THIN DDF 8 3000 RoHS & Green NIPDAU Level-1-260C-UNLIM -40 to 125 T93F Samples
TLV9302IDGKR ACTIVE VSSOP DGK 8 2500 RoHS & Green SN Level-1-260C-UNLIM -40 to 125 2HAT Samples
TLV9302IDR ACTIVE SOIC D 8 2500 RoHS & Green NIPDAU Level-1-260C-UNLIM -40 to 125 T9302D Samples
TLV9302IPWR ACTIVE TSSOP PW 8 2000 RoHS & Green NIPDAU Level-1-260C-UNLIM -40 to 125 T9302P Samples
TLV9304IDR ACTIVE SOIC D 14 2500 RoHS & Green NIPDAU Level-1-260C-UNLIM -40 to 125 TLV9304D Samples
TLV9304IPWR ACTIVE TSSOP PW 14 2000 RoHS & Green SN Level-2-260C-1 YEAR -40 to 125 (PTL93PW, T9304PW) Samples
(1)
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2)
RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance
do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may
reference these types of products as "Pb-Free".
RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption.
Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of <=1000ppm threshold. Antimony trioxide based
flame retardants must also meet the <=1000ppm threshold requirement.
(3)
MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.
(4)
There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device.
(5)
Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation
of the previous line and the two combined represent the entire Device Marking for that device.
Addendum-Page 1
PACKAGE OPTION ADDENDUM
www.ti.com 17-Aug-2023
(6)
Lead finish/Ball material - Orderable Devices may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead finish/Ball material values may wrap to two
lines if the finish value exceeds the maximum column width.
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.
Addendum-Page 2
PACKAGE MATERIALS INFORMATION
www.ti.com 12-Oct-2023
B0 W
Reel
Diameter
Cavity A0
A0 Dimension designed to accommodate the component width
B0 Dimension designed to accommodate the component length
K0 Dimension designed to accommodate the component thickness
W Overall width of the carrier tape
P1 Pitch between successive cavity centers
Sprocket Holes
Q1 Q2 Q1 Q2
Pocket Quadrants
Pack Materials-Page 1
PACKAGE MATERIALS INFORMATION
www.ti.com 12-Oct-2023
Width (mm)
H
W
Pack Materials-Page 2
PACKAGE OUTLINE
DDF0008A SCALE 4.000
SOT-23 - 1.1 mm max height
PLASTIC SMALL OUTLINE
C
2.95 SEATING PLANE
TYP
2.65
A PIN 1 ID 0.1 C
AREA
6X 0.65
8
1
2.95
2.85 2X
NOTE 3 1.95
4
5
0.38
8X
0.22
1.65 0.1 C A B
B 1.1 MAX
1.55
0.20
TYP
0.08
SEE DETAIL A
0.25
GAGE PLANE
0.1
0 -8 0.6 0.0
0.3
DETAIL A
TYPICAL
4222047/C 10/2022
NOTES:
1. All linear dimensions are in millimeters. Any dimensions in parenthesis are for reference only. Dimensioning and tolerancing
per ASME Y14.5M.
2. This drawing is subject to change without notice.
3. This dimension does not include mold flash, protrusions, or gate burrs. Mold flash, protrusions, or gate burrs shall not
exceed 0.15 mm per side.
www.ti.com
EXAMPLE BOARD LAYOUT
DDF0008A SOT-23 - 1.1 mm max height
PLASTIC SMALL OUTLINE
8X (1.05)
SYMM
1
8
8X (0.45)
SYMM
6X (0.65)
5
4
(R0.05)
TYP (2.6)
4222047/C 10/2022
NOTES: (continued)
www.ti.com
EXAMPLE STENCIL DESIGN
DDF0008A SOT-23 - 1.1 mm max height
PLASTIC SMALL OUTLINE
8X (1.05) SYMM
(R0.05) TYP
1
8
8X (0.45)
SYMM
6X (0.65)
5
4
(2.6)
4222047/C 10/2022
NOTES: (continued)
6. Laser cutting apertures with trapezoidal walls and rounded corners may offer better paste release. IPC-7525 may have alternate
design recommendations.
7. Board assembly site may have different recommendations for stencil design.
www.ti.com
PACKAGE OUTLINE
DBV0005A SCALE 4.000
SOT-23 - 1.45 mm max height
SMALL OUTLINE TRANSISTOR
3.0 C
2.6
1.75 0.1 C
B A
1.45
PIN 1
INDEX AREA
1 5
2X 0.95 (0.1)
3.05
2.75
1.9 1.9
2
(0.15)
4
3
0.5
5X
0.3
0.15
0.2 C A B NOTE 5 (1.1) TYP
0.00
1.45
0.90
0.25
GAGE PLANE 0.22
TYP
0.08
8
TYP 0.6
0 TYP SEATING PLANE
0.3
4214839/J 02/2024
NOTES:
1. All linear dimensions are in millimeters. Any dimensions in parenthesis are for reference only. Dimensioning and tolerancing
per ASME Y14.5M.
2. This drawing is subject to change without notice.
3. Refernce JEDEC MO-178.
4. Body dimensions do not include mold flash, protrusions, or gate burrs. Mold flash, protrusions, or gate burrs shall not
exceed 0.25 mm per side.
5. Support pin may differ or may not be present.
www.ti.com
EXAMPLE BOARD LAYOUT
DBV0005A SOT-23 - 1.45 mm max height
SMALL OUTLINE TRANSISTOR
PKG
5X (1.1)
1
5
5X (0.6)
SYMM
(1.9)
2
2X (0.95)
3 4
SOLDER MASK
SOLDER MASK METAL METAL UNDER OPENING
OPENING SOLDER MASK
4214839/J 02/2024
NOTES: (continued)
www.ti.com
EXAMPLE STENCIL DESIGN
DBV0005A SOT-23 - 1.45 mm max height
SMALL OUTLINE TRANSISTOR
PKG
5X (1.1)
1
5
5X (0.6)
SYMM
2 (1.9)
2X(0.95)
3 4
(R0.05) TYP
(2.6)
4214839/J 02/2024
NOTES: (continued)
8. Laser cutting apertures with trapezoidal walls and rounded corners may offer better paste release. IPC-7525 may have alternate
design recommendations.
9. Board assembly site may have different recommendations for stencil design.
www.ti.com
PACKAGE OUTLINE
DCK0005A SCALE 5.600
SOT - 1.1 max height
SMALL OUTLINE TRANSISTOR
C
2.4
1.8 0.1 C
1.4
B A 1.1 MAX
PIN 1 1.1
INDEX AREA
1 5
2X 0.65 NOTE 4
2.15
1.3 (0.15) 1.3
2 1.85
(0.1)
4
0.33 3
5X
0.15
0.1
0.1 C A B (0.9) TYP
0.0
NOTE 5
0.15
GAGE PLANE 0.22
TYP
0.08
8 0.46
TYP TYP
0 0.26
SEATING PLANE
4214834/D 07/2023
NOTES:
1. All linear dimensions are in millimeters. Any dimensions in parenthesis are for reference only. Dimensioning and tolerancing
per ASME Y14.5M.
2. This drawing is subject to change without notice.
3. Refernce JEDEC MO-203.
4. Support pin may differ or may not be present.
5. Lead width does not comply with JEDEC.
www.ti.com
EXAMPLE BOARD LAYOUT
DCK0005A SOT - 1.1 max height
SMALL OUTLINE TRANSISTOR
PKG
5X (0.95)
1
5
5X (0.4)
SYMM
(1.3)
2
2X (0.65)
3 4
SOLDER MASK
SOLDER MASK METAL METAL UNDER OPENING
OPENING SOLDER MASK
4214834/D 07/2023
NOTES: (continued)
www.ti.com
EXAMPLE STENCIL DESIGN
DCK0005A SOT - 1.1 max height
SMALL OUTLINE TRANSISTOR
PKG
5X (0.95)
1
5
5X (0.4)
SYMM
(1.3)
2
2X(0.65)
3 4
(R0.05) TYP
(2.2)
4214834/D 07/2023
NOTES: (continued)
8. Laser cutting apertures with trapezoidal walls and rounded corners may offer better paste release. IPC-7525 may have alternate
design recommendations.
9. Board assembly site may have different recommendations for stencil design.
www.ti.com
PACKAGE OUTLINE
D0008A SCALE 2.800
SOIC - 1.75 mm max height
SMALL OUTLINE INTEGRATED CIRCUIT
SEATING PLANE
.228-.244 TYP
[5.80-6.19]
.004 [0.1] C
A PIN 1 ID AREA
6X .050
[1.27]
8
1
.189-.197 2X
[4.81-5.00] .150
NOTE 3 [3.81]
4X (0 -15 )
4
5
8X .012-.020
B .150-.157 [0.31-0.51]
.069 MAX
[3.81-3.98] .010 [0.25] C A B [1.75]
NOTE 4
.005-.010 TYP
[0.13-0.25]
4X (0 -15 )
SEE DETAIL A
.010
[0.25]
.004-.010
0 -8 [0.11-0.25]
.016-.050
[0.41-1.27] DETAIL A
(.041) TYPICAL
[1.04]
4214825/C 02/2019
NOTES:
1. Linear dimensions are in inches [millimeters]. Dimensions in parenthesis are for reference only. Controlling dimensions are in inches.
Dimensioning and tolerancing per ASME Y14.5M.
2. This drawing is subject to change without notice.
3. This dimension does not include mold flash, protrusions, or gate burrs. Mold flash, protrusions, or gate burrs shall not
exceed .006 [0.15] per side.
4. This dimension does not include interlead flash.
5. Reference JEDEC registration MS-012, variation AA.
www.ti.com
EXAMPLE BOARD LAYOUT
D0008A SOIC - 1.75 mm max height
SMALL OUTLINE INTEGRATED CIRCUIT
8X (.061 )
[1.55]
SYMM SEE
DETAILS
1
8
8X (.024)
[0.6] SYMM
(R.002 ) TYP
[0.05]
5
4
6X (.050 )
[1.27]
(.213)
[5.4]
EXPOSED
METAL EXPOSED
METAL
.0028 MAX .0028 MIN
[0.07] [0.07]
ALL AROUND ALL AROUND
4214825/C 02/2019
NOTES: (continued)
www.ti.com
EXAMPLE STENCIL DESIGN
D0008A SOIC - 1.75 mm max height
SMALL OUTLINE INTEGRATED CIRCUIT
8X (.061 )
[1.55] SYMM
1
8
8X (.024)
[0.6] SYMM
(R.002 ) TYP
5 [0.05]
4
6X (.050 )
[1.27]
(.213)
[5.4]
4214825/C 02/2019
NOTES: (continued)
8. Laser cutting apertures with trapezoidal walls and rounded corners may offer better paste release. IPC-7525 may have alternate
design recommendations.
9. Board assembly site may have different recommendations for stencil design.
www.ti.com
PACKAGE OUTLINE
PW0008A SCALE 2.800
TSSOP - 1.2 mm max height
SMALL OUTLINE PACKAGE
C
6.6 SEATING PLANE
TYP
6.2
A PIN 1 ID 0.1 C
AREA
6X 0.65
8
1
3.1 2X
2.9
NOTE 3 1.95
4
5
0.30
8X
0.19
4.5 1.2 MAX
B 0.1 C A B
4.3
NOTE 4
(0.15) TYP
SEE DETAIL A
0.25
GAGE PLANE
0.75 0.15
0 -8 0.05
0.50
DETAIL A
TYPICAL
4221848/A 02/2015
NOTES:
1. All linear dimensions are in millimeters. Any dimensions in parenthesis are for reference only. Dimensioning and tolerancing
per ASME Y14.5M.
2. This drawing is subject to change without notice.
3. This dimension does not include mold flash, protrusions, or gate burrs. Mold flash, protrusions, or gate burrs shall not
exceed 0.15 mm per side.
4. This dimension does not include interlead flash. Interlead flash shall not exceed 0.25 mm per side.
5. Reference JEDEC registration MO-153, variation AA.
www.ti.com
EXAMPLE BOARD LAYOUT
PW0008A TSSOP - 1.2 mm max height
SMALL OUTLINE PACKAGE
8X (1.5)
8X (0.45) SYMM
(R0.05)
1 TYP
8
SYMM
6X (0.65)
5
4
(5.8)
4221848/A 02/2015
NOTES: (continued)
www.ti.com
EXAMPLE STENCIL DESIGN
PW0008A TSSOP - 1.2 mm max height
SMALL OUTLINE PACKAGE
8X (1.5)
SYMM (R0.05) TYP
8X (0.45)
1
8
SYMM
6X (0.65)
5
4
(5.8)
4221848/A 02/2015
NOTES: (continued)
8. Laser cutting apertures with trapezoidal walls and rounded corners may offer better paste release. IPC-7525 may have alternate
design recommendations.
9. Board assembly site may have different recommendations for stencil design.
www.ti.com
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