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Low-Power Design and Test

Logic-Level Power Estimation


Vishwani D. Agrawal Srivaths Ravi
Auburn University, USA Texas Instruments India
vagrawal@eng.auburn.edu Srivaths.ravi@ti.com

Hyderabad, July 30-31, 2007


http://www.eng.auburn.edu/~vagrawal/hyd.html

Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 1
Power Analysis
 Motivation:
 Specification
 Optimization
 Reliability
 Applications
 Design analysis and optimization
 Physical design
 Packaging
 Test

Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 2
Abstraction, Complexity, Accuracy

Abstraction level Computing resources Analysis accuracy

Algorithm Least Worst

Software and system

Hardware behavior

Register transfer

Logic

Circuit

Device Most Best

Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 3
Spice
 Circuit/device level analysis
 Circuit modeled as network of transistors, capacitors, resistors
and voltage/current sources.
 Node current equations using Kirchhoff’s current law.
 Average and instantaneous power computed from supply
voltage and device current.
 Analysis is accurate but expensive
 Used to characterize parts of a larger circuit.
 Original references:
 L. W. Nagel and D. O. Pederson, “SPICE – Simulation Program
With Integrated Circuit Emphasis,” Memo ERL-M382, EECS
Dept., University of California, Berkeley, Apr. 1973.
 L. W. Nagel, SPICE 2, A Computer program to Simulate
Semiconductor Circuits, PhD Dissertation, University of
California, Berkeley, May 1975.
Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 4
Logic Model of MOS Circuit
pMOS FETs VDD
a Da
a Dc c
Ca b Db
c
b Cc
Da and Db are
Cb nMOS interconnect or
FETs Cd propagation delays

Dc is inertial delay
Ca , Cb , Cc and Cd are of gate
node capacitances
Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 5
Spice Characterization of a 2-Input
NAND Gate
Input data pattern Delay (ps) Dynamic energy (pJ)

a=b=0→1 69 1.55

a = 1, b = 0 → 1 62 1.67

a = 0 → 1, b = 1 50 1.72

a=b=1→0 35 1.82

a = 1, b = 1 → 0 76 1.39

a = 1 → 0, b = 1 57 1.94
Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 6
Spice Characterization (Cont.)

Input data pattern Static power (pW)

a=b=0 5.05

a = 0, b = 1 13.1

a = 1, b = 0 5.10

a=b=1 28.5

Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 7
Switch-Level Partitioning
 Circuit partitioned into channel-connected components
for Spice characterization.
 Reference: R. E. Bryant, “A Switch-Level Model and
Simulator for MOS Digital Systems,” IEEE Trans.
Computers, vol. C-33, no. 2, pp. 160-177, Feb. 1984.
Internal G2
switching
nodes not
seen by
logic
simulator G1 G3

Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 8
Delay and Discrete-Event Simulation
(NAND gate)
Transient
a
region
Inputs

c (CMOS)

c (zero delay)
Logic simulation

c (unit delay)
X rise=5, fall=5
c (multiple delay)
Unknown (X)
c (minmax delay) min =2, max =5
0 5 Time units
Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 9
Event-Driven Simulation Example
Scheduled Activity
events list

a =1 e =1 t=0 c=0 d, e
c =1→0 2 1
g =1 2 d = 1, e = 0 f, g

Time stack
2 3
2
d=0 4 g=0
5
4 f =0 6 f=1 g
b =1
7
8 g=1
g
0 4 8
Time, t

Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 10
Time Wheel (Circular Stack)
Current max
time t=0
pointer Event link-list
1

4
5
6
7

Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 11
Gate-Level Power Analysis
 Pre-simulation analysis:
 Partition circuit into channel connected gate
components.
 Determine node capacitances from layout
analysis (accurate) or from wire-load model*
(approximate).
 Determine dynamic and static power from Spice
for each gate.
 Determine gate delays using Spice or Elmore
delay model.
* Wire-load model estimates capacitance of a net by its pin-count.
See Yeap, p. 39.
Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 12
Elmore Delay Model
 W. Elmore, “The Transient Response of Damped Linear Networks
with Particular Regard to Wideband Amplifiers,” J. Appl. Phys., vol.
19, no.1, pp. 55-63, Jan. 1948.
2
R2
C2
s R1 1
4
R4
C1 C4
R3
3
Shared resistance: R5
C3
R45 = R1 + R3 5
R15 = R1
R34 = R1 + R3 C5

Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 13
Elmore Delay Formula

N
Delay at node k = 0.69 Σ Cj × Rjk
j=1

where N = number of capacitive nodes in the network

Example:

Delay at node 5 = 0.69[R1 C1 + R1 C2 + (R1+R3)C3 + (R1+R3)C4


+ (R1+R3+R5)C5]

Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 14
Gate-Level Power Analysis (Cont.)
 Run discrete-event (event-driven) logic
simulation with a set of input vectors.
 Monitor the toggle count of each net and obtain
capacitive power dissipation:

Pcap = Σ Ck V 2 f
all nodes k
 Where:
 Ck is the total node capacitance being switched, as
determined by the simulator.
 V is the supply voltage.
 f is the clock frequency, i.e., the number of vectors applied
per unit time

Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 15
Gate-Level Power Analysis (Cont.)
 Monitor dynamic energy events at the
input of each gate and obtain internal
switching power dissipation:
Pint = Σ Σ E(g,e) F(g,e)
gates g events e
 Where
 E(g,e) = energy of event e of gate g, pre-
computed from Spice.
 F(g,e) = occurrence frequency of the event e at
gate g, observed by logic simulation.

Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 16
Gate-Level Power Analysis (Cont.)
 Monitor the static power dissipation state of
each gate and obtain the static power
dissipation:

Pstat = Σ Σ P(g,s) T(g,s)/ T


gates g states s
 Where
 P(g,s) = static power dissipation of gate g for state s,
obtained from Spice.
 T(g,s) = duration of state s at gate g, obtained from logic
simulation.
 T = vector period.
Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 17
Gate-Level Power Analysis
 Sum up all three components of power:

P = Pcap + Pint + Pstat


 References:
 A. Deng, “Power Analysis for CMOS/BiCMOS Circuits,” Proc.
International Workshop Low Power Design, 1994.
 J. Benkoski, A. C. Deng, C. X. Huang, S. Napper and J. Tuan,
“Simulation Algorithms, Power Estimation and Diagnostics in
PowerMill,” Proc. PATMOS, 1995.
 C. X. Huang, B. Zhang, A. C. Deng and B. Swirski, “The
Design and Implementation of PowerMill,” Proc. International
Symp. Low Power Design, 1995, pp. 105-109.

Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 18
Probabilistic Analysis
 View signals as a random processes
Prob{s(t) = 1} = p1
p0 = 1 – p1
C

0→1 transition probability = (1 – p1) p1

Power, P = (1 – p1) p1 CV2fck

Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 19
Source of Inaccuracy
p1 = 0.5 P = 0.5CV 2 fck

1/fck

p1 = 0.5 P = 0.33CV 2 fck

p1 = 0.5 P = 0.167CV 2 fck

Observe that the formula, Power, P = (1 – p1) p1 C V 2 fck , is not


Correct.

Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 20
Switching Frequency
Number of transitions per unit time:

N(t)
T = ───
t

For a continuous signal:

N(t)
T = lim ───
t→∞ t

T is defined as transition density.

Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 21
Static Signal Probabilities
 Observe signal for interval t 0 + t 1
 Signal is 1 for duration t 1
 Signal is 0 for duration t 0
 Signal probabilities:
 p 1 = t 1/(t 0 + t 1)
 p 0 = t 0/(t 0 + t 1) = 1 – p 1

Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 22
Static Transition Probabilities

 Transition probabilities:
 T 01 = p 0 Prob{signal is 1 | signal was 0} = p 0 p1
 T 10 = p 1 Prob{signal is 0 | signal was 1} = p 1 p 0
 T = T 01 + T 10 = 2 p 0 p 1 = 2 p 1 (1 – p 1)
 Transition density: T = 2 p 1 (1 – p 1)

Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 23
Static Transition Frequency

0.25
f = p1(1 – p1)

0.2

0.1

0.0
0 0.25 0.5 0.75 1.0
p1

Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 24
Inaccuracy in Transition Density
p1 = 0.5 T = 1.0

1/fck

p1 = 0.5 T = 4/6

p1 = 0.5 T = 1/6

Observe that the formula, T = 2 p1 (1 – p1), is not correct.

Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 25
Cause for Error and Correction
 Probability of transition is not independent of
the present state of the signal.
 Determine probability p 01 of a 0→1
transition.
 Recognize p 01 ≠ p 0 × p 1
 We obtain p 1 = (1 – p 1)p 01 + p 1 p 11
p 01
p 1 = ─────────
1 – p 11 + p 01
Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 26
Correction (Cont.)
 Since p 11 + p 10 = 1, i.e., given that the
signal was previously 1, its present value
can be either 1 or 0.
 Therefore,
p 01
p 1 = ──────
p 10 + p 01
This uniquely gives signal probability as a
function of transition probabilities.
Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 27
Transition and Signal Probabilities

p01 = p10 = 0.5 p1 = 0.5

1/fck

p01 = p10 = 1/3 p1 = 0.5

p01 = p10 = 1/6 p1 = 0.5

Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 28
Probabilities: p0, p1, p00, p01, p10, p11

 p 01 + p 00 =1
 p 11 + p 10 = 1
 p0=1–p1
p 01
p 1 = ───────
p 10 + p 01

Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 29
Transition Density

 T = 2 p 1 (1 – p 1) = p 0 p 01 + p 1 p 10

= 2 p 10 p 01 / (p 10 + p 01)

= 2 p 1 p 10 = 2 p 0 p 01

Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 30
Power Calculation
 Power can be estimated if transition density
is known for all signals.
 Calculation of transition density requires
 Signal probabilities
 Transition densities for primary inputs;
computed from vector statistics

Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 31
Signal Probabilities
x1
x1 x2
x2

x1
x1 + x2 – x1x2
x2

x1 1 - x1

Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 32
Signal Probabilities
0.5
x1
x1 x2

0.5 0.25 0.625


x2
x3 0.5
X1 X2 X3 Y y = 1 - (1 - x1x2) x3
0 0 0 1 = 1 - x3 + x1x2x3
0 0 1 0 = 0.625
0 1 0 1
0 1 1 0 Ref: K. P. Parker and E. J. McCluskey,
1 0 0 1 “Probabilistic Treatment of General
1 0 1 0 Combinational Networks,” IEEE Trans.
1 1 0 1 on Computers, vol. C-24, no. 6, pp. 668-
1 1 1 1 670, June 1975.

Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 33
Correlated Signal Probabilities
0.5
x1
x1 x2
0.5 0.25 0.625?
x2

y = 1 - (1 - x1x2) x2
= 1 – x2 + x1x2x2
X1 X2 Y
= 1 – x2 + x1x2
0 0 1
= 0.75 (correct value)
0 1 0
1 0 1
1 1 1

Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 34
Correlated Signal Probabilities
x1 0.5 x1 + x2 – x1x2

0.5 0.75 0.375?


x2

y = (x1 + x2 – x1x2) x2
X1 X2 Y = x1x2 + x2x2 – x1x2x2
0 0 0 = x1x2 + x2 – x1x2
0 1 1 = x2
1 0 0 = 0.5 (correct value)
1 1 1

Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 35
Observation
 Numerical computation of signal
probabilities is accurate for fanout-free
circuits.

Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 36
Remedies
 Use Shannon’s expansion theorem to
compute signal probabilities.
 Use Boolean difference formula to compute
transition densities.

Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 37
Shannon’s Expansion Theorem
 C. E. Shannon, “A Symbolic Analysis of Relay
and Switching Circuits,” Trans. AIEE, vol. 57, pp.
713-723, 1938.
 Consider:
 Boolean variables, X1, X2, . . . , Xn
 Boolean function, F(X1, X2, . . . , Xn)
 Then F = Xi F(Xi=1) + Xi’ F(Xi=0)
 Where
 Xi’ is complement of X1
 Cofactors, F(Xi=j) = F(X1, X2, . . , Xi=j, . . , Xn), j = 0 or 1
Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 38
Expansion About Two Inputs
 F = XiXj F(Xi=1, Xj=1) + XiXj’ F(Xi=1, Xj=0)
+ Xi’Xj F(Xi=0, Xj=1)
+ Xi’Xj’ F(Xi=0, Xj=0)
 In general, a Boolean function can be
expanded about any number of input
variables.
 Expansion about k variables will have 2k
terms.
Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 39
Correlated Signal Probabilities
X1
X1 X2
Y = X1 X2 + X2’

X2

X1 X2 Y
Shannon expansion about the
0 0 1
reconverging input, X2:
0 1 0
1 0 1
Y = X2 Y(X2 = 1) + X2’ Y(X2 = 0)
1 1 1
= X2 (X1) + X2’ (1)

Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 40
Correlated Signals
 When the output function is expanded about all
reconverging input variables,
 All cofactors correspond to fanout-free circuits.
 Signal probabilities for cofactor outputs can be calculated
without error.
 A weighted sum of cofactor probabilities gives the correct
probability of the output.
 For two reconverging inputs:
f = xixj f(Xi=1, Xj=1) + xi(1-xj) f(Xi=1, Xj=0)
+ (1-xi)xj f(Xi=0, Xj=1) + (1-xi)(1-xj) f(Xi=0, Xj=0)

Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 41
Correlated Signal Probabilities
X1
X1 X2
Y = X1 X2 + X2’

X2

X1 X2 Y Shannon expansion about the


0 0 1 reconverging input, X2:
0 1 0
1 0 1 Y = X2 Y(X2=1) + X2’ Y(X2=0)
1 1 1 = X2 (X1) + X2’ (1)

y = x2 (0.5) + (1-x2) (1)


= 0.5 (0.5) + (1-0.5) (1)
= 0.75

Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 42
Example
0.5 Supergate
0.25
0.5 0.5 0.5
Point of
0.0 1.0
1 reconv.
0
0.0 0.5 0.375
1.0
0.5

Reconv. Signal probability for supergate output


signal = 0.5 Prob{rec. signal = 1} + 1.0 Prob{rec. signal = 0}
= 0.5 × 0.5 + 1.0 × 0.5 = 0.75
S. C. Seth and V. D. Agrawal, “A New Model for Computation of
Probabilistic Testability in Combinational Circuits,” Integration, the VLSI
Journal, vol. 7, no. 1, pp. 49-75, April 1989.
Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 43
Probability Calculation Algorithm
 Partition circuit into supergates.
 Definition: A supergate is a circuit partition with a single output
such that all fanouts that reconverge at the output are contained
within the supergate.
 Identify reconverging and non-reconverging inputs
of each supergate.
 Compute signal probabilities from PI to PO:
 For a supergate whose input probabilities are known
 Enumerate reconverging input states
 For each input state do gate by gate probability computation
 Sum up corresponding signal probabilities, weighted by state
probabilities

Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 44
Calculating Transition Density

1
..
x1, T1

.. Boolean y, T(Y) = ?

. n
function

xn, Tn

Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 45
Boolean Difference
∂Y
Boolean diff(Y, Xi) = ── = Y(Xi=1) ⊕ Y(Xi=0)
∂Xi
 Boolean diff(Y, Xi) = 1 means that a path is sensitized from input Xi
to output Y.
 Prob(Boolean diff(Y, Xi) = 1) is the probability of transmitting a
toggle from Xi to Y.
 Probability of Boolean difference is determined from the probabilities
of cofactors of Y with respect to Xi.

F. F. Sellers, M. Y. Hsiao and L. W. Bearnson, “Analyzing Errors with


the Boolean Difference,” IEEE Trans. on Computers, vol. C-17, no. 7,
pp. 676-683, July 1968.

Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 46
Transition Density

n
T(y) = Σ T(Xi) Prob(Boolean diff(Y, Xi) = 1)
i=1

F. Najm, “Transition Density: A New Measure of Activity in Digital


Circuits,” IEEE Trans. CAD, vol. 12, pp. 310-323, Feb. 1993.

Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 47
Power Computation
 For each primary input, determine signal probability and
transition density for given vectors.
 For each internal node and primary output Y, find the
transition density T(Y), using supergate partitioning and
the Boolean difference formula.
 Compute power,

Σ P=
0.5CY V2 T(Y)
all Y
where CY is the capacitance of node Y and V is supply
voltage.

Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 48
Transition Density and Power
0.2, 1
X1 0.06, 0.7

0.3, 2 Ci 0.436, 3.24


X2
0.4, 3 Y CY
X3

Transition density
Signal probability

Power = 0.5 V 2 (0.7Ci + 3.24CY)

Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 49
Prob. Method vs. Logic Sim.
No. of Probability method Logic Simulation Error
Circuit
gates Av. density CPU s* Av. density CPU s* %
C432 160 3.46 0.52 3.39 63 +2.1
C499 202 11.36 0.58 8.57 241 +29.8
C880 383 2.78 1.06 3.25 132 -14.5
C1355 346 4.19 1.39 6.18 408 -32.2
C1908 880 2.97 2.00 5.01 464 -40.7
C2670 1193 3.50 3.45 4.00 619 -12.5
C3540 1669 4.47 3.77 4.49 1082 -0.4
C5315 2307 3.52 6.41 4.79 1616 -26.5
C6288 2406 25.10 5.67 34.17 31057 -26.5
C7552 3512 3.83 9.85 5.08 2713 -24.2
* CONVEX c240
Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 50
Probability Waveform Methods
 F. Najm, R. Burch, P. Yang and I. Hajj, “CREST – A
Current Estimator for CMOS Circuits,” Proc. IEEE Int.
Conf. on CAD, Nov. 1988, pp. 204-207.
 C.-S. Ding, et al., “Gate-Level Power Estimation using
Tagged Probabilistic Simulation,” IEEE Trans. on CAD, vol.
17, no. 11, pp. 1099-1107, Nov. 1998.
 F. Hu and V. D. Agrawal, “Dual-Transition Glitch Filtering
in Probabilistic Waveform Power Estimation,” Proc. IEEE
Great Lakes Symp. VLSI, Apr. 2005, pp. 357-360.
 F. Hu and V. D. Agrawal, “Enhanced Dual-Transition
Probabilistic Power Estimation with Selective Supergate
Analysis,” Proc. IEEE Int. Conf. Computer Design, Oct.
2005. pp. 366-369.

Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 51
Problem 1
For equiprobable inputs analyze the 0→1 transition probabilities of all
gates in the two implementations of a four-input AND gate shown
below. Assuming that the gates have zero delays, which
implementation will consume less average dynamic power?

A E A E
B F B G
C G
D C
D F

Chain structure Tree structure

Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 52
Problem 1 Solution
Given the primary input probabilities, P(A) = P(B) = P(C) = P(D) = 0.5,
signal and transition (0→1) probabilities are as follows:

Signal Chain Tree


name Prob(sig.= 1) Prob(0→1) Prob(sig.=1) Prob(0→1)
E 0.2500 0.1875 0.2500 0.1875
F 0.1250 0.1094 0.2500 0.1875
G 0.0625 0.0586 0.0625 0.0586
Total 0.3555 0.4336
transitions/vector

The tree implementation consumes 100×(0.4336 – 0.3555)/0.3555 = 22%


more average dynamic power. This advantage of the chain structure may
be somewhat reduced because of glitches caused by unbalanced path
delays.
Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 53
Problem 2
Assume that the two-input AND gates in Problem 1 each has one unit
of delay. Find input vector pairs for each implementation that will
consume the peak dynamic power. Which implementation consumes
less peak dynamic power?

A E A E
B F B G
C G
D C
D F

Chain structure Tree structure

Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 54
Problem 2 Solution
For the chain structure, a vector pair {A B C D} = {1110},{1011} will
produce four gate transitions as shown below.
A E
F
B G
C
D

A=11

B=10

E=10

C=11

F=10

D=01

G=00

Time units
0 1 2 3

Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 55
Problem 2 Solution (Cont.)
The tree structure has balanced delay paths. So it cannot make more
than 3 gate transitions. A vector pair {ABCD} = {1111},{1010} will
produce three transitions as shown below.
A E
B
G
C
D F

A=11

B=10 Therefore, just counting the gate


E=10
transitions, we find that the chain
consumes 100(4 – 3)/3 = 33%
C=11
higher peak power than the tree.
D=10

F=10

G=10
Time units
0 1 2 3
Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 56

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