Host Specifications Yusuke Suga Sysmex Corporation Agenda • Format – XN-L format – Compatible format • Parameters • Tips
XN-L Training & SSGM 2014 2
XN-L format • Only two XN-L formats are available – Standard format – ASTM format • ASTM E1381-02 mode(w ENQ) • ASTM E1381-95 mode
No DPS format on XN-L any more
XN-L Training & SSGM 2014 3
Compatible format • Compatible formats are available XN-L XS series XN XN series Used N/A - XE-5000 N/A N/A Used XE-2100 N/A N/A Used XT-4000 Used N/A Used XT-1800/2000 Used Used Used XS series Used - Used SF-3000 N/A Used Used NE series N/A Used N/A SE-9000 N/A Used N/A RAM-1 N/A Used N/A K-1000 N/A Used N/A K-4500 N/A Used N/A NE-1500 N/A Used N/A
XN-L Training & SSGM 2014 4
Parameters • XN-L host interface specification is not different from XN except for parameters – From XN, some orders are missing • NRBC%/# • PLT-F • WPC – Some reportable parameters are missing • NRBC%/#, HPC%/#, RBC-HE, DELTA-HE, NEUT-RI/GI – Some parameters are added • HFLC%/#
XN-L Training & SSGM 2014 5
Parameters – Some IP message are missing • NRBC present • Blast? • Abn_Lympho
– One IP message is added
• NRBC?
XN-L Training & SSGM 2014 6
Tips Q: How to tell whether the sample result is final? A: Cannot tell 100% from format
• Initial or reflex/rerun can be identified
• Rerun/Reflex cannot be identified
Measure Send results with
• Initial or 2nd analysis
• Rule check results
XN-L Training & SSGM 2014 7
Tips • Initial or reflex/rerun can be identified – “Action code” and “Report type” combination on Analysis Order Record • Action code – M: Manual, initial – A: Rerun, reflex – Q: QC • Report type – F: Manual analysis or other than repeat – I: Repeat analysis
“M” and “F” means initial analysis
XN-L Training & SSGM 2014 8
Tips • Reflex/Rerun cannot be identified – “Result Status” on Result Record • F: None • I: Repeat • P: Rerun/Reflex • N: Query to host
• Two cases are not unmatched with situation
– Query to host cannot guarantee next analysis if no order exist for reflex/rerun – Reflex cannot guarantee next analysis if additional order was already measured in initial analysis