This document discusses several techniques for characterizing membranes, including scanning electron microscopy (SEM), atomic force microscopy (AFM), Fourier-transform infrared spectroscopy (FTIR), contact angle measurement, thermogravimetric analysis (TGA), differential scanning calorimetry (DSC), and field emission scanning electron microscopy (FESEM). Each technique is briefly described in one or two paragraphs explaining what type of information it provides about membrane surface topography, composition, thermal properties, or structural characteristics.
This document discusses several techniques for characterizing membranes, including scanning electron microscopy (SEM), atomic force microscopy (AFM), Fourier-transform infrared spectroscopy (FTIR), contact angle measurement, thermogravimetric analysis (TGA), differential scanning calorimetry (DSC), and field emission scanning electron microscopy (FESEM). Each technique is briefly described in one or two paragraphs explaining what type of information it provides about membrane surface topography, composition, thermal properties, or structural characteristics.
This document discusses several techniques for characterizing membranes, including scanning electron microscopy (SEM), atomic force microscopy (AFM), Fourier-transform infrared spectroscopy (FTIR), contact angle measurement, thermogravimetric analysis (TGA), differential scanning calorimetry (DSC), and field emission scanning electron microscopy (FESEM). Each technique is briefly described in one or two paragraphs explaining what type of information it provides about membrane surface topography, composition, thermal properties, or structural characteristics.
SEM A scanning electron microscope (SEM) is a type of electron microscope that produces images of a sample by scanning the surface with a focused beam of electrons. The electrons interact with atoms in the sample, producing various signals that contain information about the surface topography and composition of the sample. The electron beam is scanned in a raster scan pattern, and the position of the beam is combined with the intensity of the detected signal to produce an image.
Membrane Technology @ FKKSA, UMP
SEM
Membrane Technology @ FKKSA, UMP
AFM Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very- high-resolution type of scanning probe microscopy (SPM), with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit. the AFM provides a three- dimensional surface profile.
Membrane Technology @ FKKSA, UMP
AFM
Membrane Technology @ FKKSA, UMP
FTIR Fourier-transform infrared spectroscopy (FTIR) is a technique used to obtain an infrared spectrum of absorption or emission of a solid, liquid, or gas. An FTIR spectrometer simultaneously collects high-resolution spectral data over a wide spectral range. This confers a significant advantage over a dispersive spectrometer, which measures intensity over a narrow range of wavelengths at a time. The term Fourier-transform infrared spectroscopy originates from the fact that a Fourier transform (a mathematical process) is required to convert the raw data into the actual spectrum. Membrane Technology @ FKKSA, UMP CONTACT ANGLE The contact angle is the angle, conventionally measured through the liquid, where a liquid–vapor interface meets a solid surface. It quantifies the wettability of a solid surface by a liquid via the Young equation. The contact angle depends upon the medium above the free surface of the liquid, and the nature of the liquid and solid in contact. It is independent of the inclination of the solid to the liquid surface. It changes with surface tension and hence with the temperature and purity of the liquid.
Membrane Technology @ FKKSA, UMP
Schematic of a liquid drop showing the quantities in the Young equation.
Membrane Technology @ FKKSA, UMP
Membrane Technology @ FKKSA, UMP Membrane Technology @ FKKSA, UMP TGA Thermogravimetric analysis or thermal gravimetric analysis (TGA) is a method of thermal analysis in which the mass of a sample is measured over time as the temperature changes.
This measurement provides information about physical phenomena, such as
phase transitions, absorption, adsorption and desorption; as well as chemical phenomena including chemisorptions, thermal decomposition, and solid-gas reactions (e.g., oxidation or reduction).
A TGA can be used for materials characterization through analysis of characteristic
decomposition patterns. It is an especially useful technique for the study of polymeric materials, including thermoplastics, thermosets, elastomers, composites, plastic films, fibers, coatings, paints, and fuels. Membrane Technology @ FKKSA, UMP Membrane Technology @ FKKSA, UMP Membrane Technology @ FKKSA, UMP Membrane Technology @ FKKSA, UMP DSC Differential scanning calorimetry (DSC) is a thermoanalytical technique in which the difference in the amount of heat required to increase the temperature of a sample and reference is measured as a function of temperature. Both the sample and reference are maintained at nearly the same temperature throughout the experiment. Generally, the temperature program for a DSC analysis is designed such that the sample holder temperature increases linearly as a function of time.
Membrane Technology @ FKKSA, UMP
Membrane Technology @ FKKSA, UMP DSC Thermal transitions in (A) amorphous and (B) semicrystalline polymers. As the temperature increases, both amorphous and semicrystalline polymers go through the glass transition (Tg). Amorphous polymers (A) do not exhibit other phase transitions. However, semicrystalline polymers (B) undergo crystallization and melting (at temperatures Tc and Tm, respectively). DSC X-Ray diffraction analysis (XRD) is a nondestructive technique that provides detailed information about the crystallographic structure, chemical composition, and physical properties of a material. It is based on the constructive interference of monochromatic X- rays and a crystalline sample.
Enhancement of Output Power Density in A Modified Polytetrafluoroethylene Surface Using A Sequential O2Ar Plasma Etching For Triboelectric Nanogenerator Applications