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April, 2007
Ultrasonic test instruments have been used in industrial applications for more than sixty years. Since the 1940s, the laws of physics that govern the propagation of high frequency sound waves through solid materials have been used to detect hidden cracks, voids, porosity, and other internal discontinuities in metals, composites, plastics, and ceramics, as well as to measure thickness and analyze material properties.
Sound waves are simply organized mechanical vibrations traveling through a medium. These waves will travel through a given medium at a specific speed or velocity, in a predictable direction, and when they encounter a boundary with a different medium they will be reflected or transmitted according to simple rules.
With a conventional UT probe, a single piezoelectric element converts an electrical signal into a mechanical vibration.
is like having many small conventional UT probes integrated inside a single probe.
128 elements !
PA probes are based on composite technology. The signal-to-noise ratio obtained from composite transducers is typically 10 to 30 dB greater compared with piezoceramic probes. A metallic layer is deposited on the piezocomposite. This metallic layer conforms to the element pattern and provides electrical contacts for each element.
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Ultrasonic phased arrays consist of a series of individual elements, each with its own connector, time delay circuit, and A/D converter. Elements are acoustically insulated from each other. Elements are pulsed in groups with precalculated time delays for each element (i.e., phasing).
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Appropriate
delays introduced electronically during emission to generate a specific beam Beam forming requires precise pulsing and time delays Acoustic beam generated by Huyghens principle
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Receiving
is the opposite of pulsing. Appropriate delays are introduced electronically during reception. Only signals satisfying the delay law shall be in phase and generate a significant signal after summation.
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Beam Forming
When no time delay is applied between each element (elements in the array are yellow and the delay applied to each element is in green), a PA probe becomes like a conventional UT probe.
Conventional UT probe (contact probe) Phased array probe (simulating a conv. UT contact probe)
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Beam Steering
Provides the capability to modify the refracted angle of the beam generated by the array probe. Allows for multiple angle inspections, using a single probe Applies symmetrical (e.g., linear) focal laws.
Conventional UT probe (angle beam probe) Phased array probe (simulating a conv. UT angle beam probe)
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Beam Focusing
Provides the capability to converge the acoustic energy onto a small focal spot. Allows for focusing at several depths, using a single probe. Applies a symmetrical (e.g., parabolic) focal law for a normal beam.
Conventional UT probe (Focused probe) Phased array probe (simulating a conv. UT focused probe)
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By combining both steering and focusing focal laws (delay applied to each element is in green), the focal point can be angled.
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Using a single group of elements, on the same probe, different beam configurations can be performed:
No time delay Steering Focusing Steering + focusing
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The movement of the acoustic beam is along the axis of the array, without any mechanical movement. The beam movement is performed by time multiplexing of the active elements. Arrays are multiplexed using the same focal law.
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Sectorial Scan
The ability to scan a complete sector of volume without any probe movement. Useful for inspection of complex geometries, or geometries with space restrictions. Combines the advantages of a wide beam and/or multiple focused probes in a single phased array probe.
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Instead of requiring one focal law for each depth position, the DDF (dynamic depth focusing) algorithm allows the use of a single pulsed focal law by dynamically changing the focusing depth at reception of the signal. DDF is an excellent way of inspecting thick components with a single pulse.
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pulsing and receiving allows a great variety of scan patterns using the same probe.
Linear Electronic Scan Sectorial Scan Depth Focusing Scan
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Conventional UT A-Scan
An A-scan is a simple RF waveform representation showing the time and amplitude of an ultrasonic signal, as commonly provided by conventional ultrasonic flaw detectors. An A-scan waveform represents the reflections from one sound beam position in the test piece.
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Additional imaging capability is provided for the rectified A-scan signal by color encoding the amplitude. This allows the representation of various phased array views, which is to be explained in later slides.
83% = Red
50% = Green
20% = Blue
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By using the electronic scanning capability of the phased array technology, imaging d becomes possible without mechanical movement. Arrays are multiplexed using the same focal law and the resulting Ascan of each beam is color-encoded and displayed in a linear Sscan.
Beams 1 2 3 4 5 6 7 8 9 10 1112 13
Beams 1 2 3 4 5 6 7 8 9 10 1112 13 26
Because of the short distance between each element in a phased array probe, the electronic scan resolution is very precise.
Linear S-scan
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A linear electronic scan can also be performed with a steering angle (15 in the image below).
Linear Angle S-scan
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A typical Sectorial Scan sweeps through a range of angles using the same focal distance and elements.
4 3 Beams 1 2 Beams 1 2 3
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Using a small angle step value, the sectorial scan resolution is very precise.
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Thank you!