Uploads by aniruddh singh

Cadence Modus DFT Software Solution _ Cadence

shantagiri2018

For cone partioning knowledge

Using Multiple Expansion Ratios and Dependancy Analysis to improve Test Compression.

Test_time_reduction_through_minimum_execution_of_tester-hardware_setting_instructions

Testing of Digital Systems by N. K. Jha, S. Gupta (Z-lib.org)

VIRTUAL SCAN A New compressed scan Technology for test cost Reduction

Low power programmable PRPG with Test Compression Capabilities

li2017

Convolutional Compaction of test Responses

opmisr-the-foundation-for-compressed-atpg-vectors

Imp_A_Real_Case_of_Significant_Scan_Test_Cost_Reduction

Cost_reduction_of_system-level_tests_with_stressed_structural_tests_and_SVM

High_speed_ring_generators_and_compactors_of_test_data_logic_IC_test (For ring generator)

CooLBIST_An_Effective_Approach_of_Test_Power_Reduction_for_LBIST

zhang2018

Designs for Reducing Test Time of Distributed Small Embedded SRAMs