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by Ken Wong, Senior Member IEEE R&D Principal Engineer Component Test Division Agilent Technologies, Inc.
Aerospace and Defense Symposium 2007 EuMw 2007 Agilent Workshop Objectives
Noise Figure Measurements
Y-Factor Cold source Noise Parameters Noise Wave Correcting for Source Impedance Mismatch Correcting for Receiver Mismatch and Noise
Aerospace EuMw 2007 Agilent Workshop Objectives (cont) and Defense Symposium 2007
Calibration
Noise Source Calibration (S) S-parameter Calibration (S) Noise Tuner Calibration (S)
Verification
Mismatch Line Amp Characteristics Combined S11 Combined Gain Combined Noise Figure
Aerospace EuMw 2007Days Workshop The Early Agilent and Defense Symposium 2007
Aerospace and Defense Symposium 2007 EuMw 2007 Agilent Workshop Agilents Noise Figure Legacy
340A 1958
8970 1980
85120 1999
SA with NF 2002
NFA 2000
Aerospace and Defense Symposium 2007 EuMw 2007 Agilent Workshop Definition
DEVICE
Sin Nin
Ga
Sout Nout
Sout = Ga * Sin ; N out = Ga * N in T =T + N add 0 T =T0 ( S / N )in N out N add F (noise factor) = = = 1+ Ga N in ( S / N )out Ga * N in
Ga Available Gain, NF (Noise Figure) 10*log10(F) dB
D. Vondran, Noise Figure Measurement: Corrections Related to Match and Gain, Microwave J., pp 22-38, Mar. 1999 Collantes, J. M., R. D. Pollard, et al. (2002). "Effects of DUT mismatch on the noise figure characterization: a comparative analysis of two Y-factor techniques." Instrumentation and Measurement, IEEE Transactions on 51(6): 1150-1156.
Advancements in Noise Measurement
By Ken Wong Page 6
Aerospace and Defense Symposium 2007 EuMw 2007 Agilent Workshop Definition in Terms of Noise Temperature
DEVICE
T0
Te, Ga
Nout
N in = k * T0 B ; N add = Ga * k * Te * B
T0 290 K ; B bandwidth k Boltzmann's constant = 1.380 650510-23 joule/kelvin Te effective input noise temperature of device
N out Te = 1+ F= Ga * N in T0
Aerospace and Defense EuMw 2007 Agilent Workshop Noise Figure2007 Effective Temperature Versus Symposium
1000.00
100.00
Te (K)
10.00
1.00 0.0 0.5 1.0 1.5 2.0 2.5 3.0 3.5 4.0 4.5 5.0
NF (dB)
Advancements in Noise Measurement
By Ken Wong Page 8
Aerospace and Defense Symposium EuMw 2007 Agilent Workshop Parameters 2007 Definition In Terms Of Noise
is
Ys
Noisy two-port
is
Ys
en
in
Noiseless two-port
F = Fmin
Rn + Ys Yopt Gs
= Fmin
opt s 4 Rn + Z0 1 + 2 1 opt s
)
IEEE IMS SCV Chapter Mtg May 21, 2008
IRE Subcommittee 7.9 On Noise: Representation Of Noise In Linear Two-ports, Proc. IRE, Vol. 48, Pp. 69-74, Jan. 1960
Advancements in Noise Measurement
By Ken Wong Page 9
Aerospace and Defense Symposium 2007 EuMw 2007 Agilent Definition (cont) Noise parameters Workshop
opt s 2 4 Rn Ys Yopt = Fmin + Z0 1 + 2 1 opt s
2
Rn F = Fmin + Gs
Aerospace and Defense Symposium 2007 EuMw 2007 Agilent Workshop Noise Ratio Noise Source ENR Excess
Th Tc ENR 10 log10 T0
Th = Hot Noise Temperature Tc = Cold Noise Temperature T0 = 290 K Tc = T0 when noise sources are calibrated by reference labs.
Advancements in Noise Measurement
By Ken Wong Page 11
Aerospace and Defense Symposium 2007 EuMw 2007Method Workshop Y factor Agilent
DEVICE
Thot Tcold
Te, Ga
Pout
Pout,hot=kBGa(Thot + Te)
Y= Pout ,hot Pout ,cold
Pout,cold=kBGa(Tcold + Te)
Te = Thot YTcold Y 1
Aerospace and Defense Symposium EuMw 2007 Agilent Workshop Calibration 2007 Actual Y factor Measurement
RECEIVER
Receiver Calibration
Thot Tcold
s(hot) s(cold) i(rec)
Te(R) Ga(R)
Nout(R)
Pout
F( R )
N out ( R ) Ga ( R ) * N in
= 1+
Te ( R ) T0
Thot Y * Tcold = 1+ (Y 1) * T0
Aerospace and Defense Symposium 2007 EuMw 2007 Agilent Workshop Actual Y factor Measurement
DEVICE RECEIVER
Thot Tcold
s(hot) s(cold)
Te(D) Ga(D)
i(device)
Nout(D)
Te(R) Ga(R)
Nout(all)
Pout
o(device) i(rec)
F( all )
F( device )
Thot Y * Tcold = 1+ (Y 1) * T0
= F( all ) F( R )
o ( device )
Ga ( D )
s
IEEE IMS SCV Chapter Mtg May 21, 2008
Note that
Advancements in Noise Measurement
By Ken Wong Page 14
F( R )
o ( device )
F( R )
Aerospace and Defense Symposium EuMw 2007 Agilent Workshop Assumptions 2007 Some Y factor Measurement
s ( hot ) = s ( cold )
F( R )
o ( device )
= F( R )
Ga ( device ) =
Notes:
Ga (available gain) is a function of S11, S22 and s s source reflection of the incident signal
Aerospace and Defense Symposium EuMw Examples OfWorkshop Measurements 2007 Four 2007 Agilent Y-Factor
What you want for good NF accuracy!
Noise source
On-wafer environment
Noise source
1 3
Noise source
Noise source
Aerospace and Defense EuMwNoise Agilent Workshop 2007 Source Technique Symposium 2007 Cold
Ga
PN
FDut
Pn = 1+ kT0 BG a
Aerospace and Defense Symposium 2007 EuMwNoise Agilent Workshop 2007 Figure Cal and Measurement Cold
kGB = k Gain Bandwidth
Calibrate
PN
T ~ 10,000K
Fr =
kGB =
T = T cal
Measure
T = T meas
s
DUT
i(device) o(device) i(rec)
PN
1 Ga P n Fr + 1 kGB
IEEE IMS SCV Chapter Mtg May 21, 2008
FDut =
Aerospace EuMw 2007 Agilent Workshop Noise Parameters and Defense Symposium 2007
is
Ys
en
in
Noiseless two-port
Noise figure varies as a Noise figure varies as a function of source impedance function of source impedance
)
IEEE IMS SCV Chapter Mtg May 21, 2008
Aerospace and Defense Symposium 2007 EuMw 2007 Agilent Definition Noise parameters Workshop
Rn F = Fmin + Gs
Aerospace Definition and Defense EuMw 2007 Agilent Workshop Symposium 2007 Noise parameters
Noise Temperature
Tn = Tmin +
( RnT0 ) Ys Yopt
Gs
Aerospace and Defense Symposium 2007 EuMw 2007 Agilent Workshop Noise Parameters
Fmin at opt Plots of noise figure circles versus impedance (at one frequency) Fmin is lowest noise figure and occurs at opt F changes with F changes with device bias
Increasing noise figure
Aerospace and Defense EuMw 2007 Agilent parameters Symposium 2007 Measuring Noise Workshop
VNA
TUNER
DUT
Noise source
NFM
A. C. Davidson, B. W. Leake, et al. (1989). "Accuracy improvements in microwave noise parameter measurements." Microwave Theory and Techniques, IEEE Transactions on 37(12): 1973-1978.
Aerospace and Defense Symposium 2007 EuMw 2007 Agilent Workshop S-parameters Noise wave representation
bn2
a1 b1
bn1
[S]
b2 a2
b1 s11 = b2 s 21
s12 a1 bn1 + s 22 a 2 bn 2
P. Penfield, Jr "Wave Representation of Amplifier Noise." IRE Transactions On Circuit Theory: Mach (1962) pp. 84-86 K. Hartmann, Noise Characterization of Linear Circuits, IEEE Transactions on Circuits and Systems, Vol. cAS-23, No. 10, Oct. 1976, pp. 581-590 R.P. Meys, A Wave Approach to the Noise Properties of Linar Microwave Devices, IEEE Transactions on Microwave Theory and Techniques, Vol. MTT-26, No. 1, Jan. 1978, pp 34-37 S. W. Wedg ,and D. B. Rutledge (1992). "Wave techniques for noise modeling and measurement." Microwave Theory and Techniques, IEEE Transactions on 40(11): 2004-2012.
Aerospace and Defense Symposium EuMw 2007 Agilent Workshop correlation 2007 Measurement using (S) noise matrix
Noise output power from two-port is
X 1 = bn1 = cs11 ,
2
X2 =
bn 2 S 21
2 2
cs22 S 21
2
* bn1bn 2 cs12 X 12 = * = * S 21 S 21
J. Randa, W. Wiatr, Conte Carlo Estimation of Noise Parameter Uncertainties, IEE Proc. Sci. Meas. Technology, Vol. 149, No. 6, Nov. 2002, pp. 333-337
Aerospace and Defense Symposium 2007 EuMw 2007 Agilent Workshop Noise correlation matrix (CS) in terms of noise parameters
2 1 s11 opt 4 Rn opt (1 s11 opt ) F 1 s 2 1 + 4 Rn s21 ( Fmin 1) s11 2 2 ( min ) 11 Z0 1 + Z 0 1 + opt opt Cs = 2 4 Rn opt (1 s11 opt ) 4 Rn opt 2 s21 ( Fmin 1) s11 s21 Fmin 1 2 2 Z 0 1 + opt Z 0 1 + opt
Aerospace and Defense Symposium 2007 EuMw NoiseAgilent Workshop 2007 Measurement System New
Noise Tuner
DUT
Noise Source
Advancements in Noise Measurement
By Ken Wong Page 27
ADAPTER
IEEE IMS SCV Chapter Mtg May 21, 2008
Aerospace and EuMw as Noise Tuner Defense Symposium 2007 2007 Agilent Workshop ECal
PNA-X varies source match around 50 ohms using an ECal module ECal can provide 7 impedance states
Aerospace and Defense Symposium 2007 EuMw 2007 Agilent Workshop Noise Figure in PNA contributions
Speed and accuracy
Single Connection S-parameters and Noise Figure Fast Step Frequency Sweep Complete Mismatch Correction
Use of ECal or Compatible Impedance Tuner Embedding and De-embedding of Probes in OnWafer Noise Measurements Can Accommodate Coax Noise Source for On-Wafer Noise Measurements
Aerospace and Defense Symposium 2007 EuMw 2007 Agilent Workshop Calibration of the receiver
1 2 T + 2 X + kB S s s s 1 21 Pout = 2 2 * 1 s S11 1 S X + 2 Re (1 S ) X s 11 s 11 s 2 21
2
i
Aerospace and Calibration of receiver Defense Symposium 2007 EuMw 2007 Agilent Workshop - solution of equations
Require Minimum Of 5 Equations To Solve Can Be Over-determined At Least One Measurement Must Be Made With Different Source Temperature Use Noise Source (Known ENR, Measure Cold, Hot) ECal Module Provides 7 Terminations
Aerospace and Defense Symposium 2007 EuMw 2007 Agilent Workshop Noise Figure Mode Instrument Default Settings
S-parameter Mode Source Power Noise RF BW Noise IF BW 4 MHz 2 MHz Point to Point (1 = 10K) 30 dB ON -30 dBm
Noise Averaging
Aerospace and Defense Symposium 2007 EuMw 2007 Agilent Workshop Noise Figure Measurement Instrument Setup
Aerospace and Defense EuMw 2007 Agilent Workshop Noise Measurement Softkeys Symposium 2007
Aerospace and Defense Symposium 2007 EuMw 2007 Agilent Workshop Noise Set Up
Aerospace and Defense Symposium 2007 EuMw 2007 Up Noise Set Agilent Workshop
Aerospace and Defense Symposium 2007 EuMw 2007 Agilent Workshop Calibration Noise Figure Measurement
Aerospace and Defense Symposium 2007 EuMw 2007 Agilent Workshop Noise Cal
Aerospace and Defense Symposium 2007 EuMw 2007 Agilent Workshop S-parameters and Noise Calibrations
Noise Tuner
ADAPTER
Noise Source
Ph, Pc, h, c
Aerospace and Defense Symposium 2007 EuMw 2007 Agilent Workshop S-parameters and Noise Calibrations
Noise Tuner
This step provides the rest of measurements required to calibrate the noise receiver.
Advancements in Noise Measurement
By Ken Wong Page 40
ADAPTER
nr
Pnt(i), nt(i)
Aerospace and Defense Symposium 2007 EuMw 2007 Agilent Workshop S-parameters and Noise Calibrations
Noise Tuner
Aerospace and Defense Symposium 2007 EuMw 2007 Agilent Workshop Measurement of DUT
Known from Measured S-parameters
1 2 T + 2 X + kB S s s s 1 21 Pout = 2 2 * 1 s S11 1 S X + 2 Re (1 S ) X s 11 s 11 s 2 21
2
Aerospace EuMwS-parameters and Defense Symposium 2007 2007 Agilent Workshop Measurement DUT and Noise
Noise Tuner
DUT
Meas S-parameters Pout(i) @ each nt(i)
Aerospace and Defense Symposium 2007 EuMw 2007 Agilent Workshop With On-Wafer Noise Measurement System Probes
Noise Tuner
4
1-port Cal
Noise Source
Advancements in Noise Measurement
By Ken Wong Page 44
Aerospace and Defense Symposium 2007 EuMw 2007 Agilent Workshop 60 m FET
Data sets offset by 1dB
N8975 Y-factor cold corrected
F (1 dB per division) 0
10
15
20
25
Frequency (GHz)
Aerospace and Defense Symposium 2007 EuMw 2007 Agilent Workshop Measurements Compared
10 20 18 8 16 14 Gain (dB) NF (dB) 6 12 10 4 NFA PNA/NF 0 1 2 3 4 5 6 Frequency (GHz)
Advancements in Noise Measurement
By Ken Wong Page 46
8 6
4 2 0
Aerospace and Defense Symposium 2007 EuMw 2007 Agilent Workshop Noise Figure Uncertainty Example (ATE Setup)
4.500
Amplifier:
Gain = 15 dB Input/output match = 10 dB NF = 3 dB Gamma opt = 0.268 0o Fmin = 1.87 dB Rn = 12 33
4.000
0.75 dB
3.500 NF (dB)
0.5 dB
3.000
PNA-X
0.2 dB
2.500
2.000 0.5 2.5 4.5 6.5 8.5 10.5 12.5 GHz 14.5 16.5 18.5 20.5 22.5 24.5 26.5
Aerospace and Defense Symposium 2007 EuMw 2007 Agilent Workshop Noise Figure Uncertainty Example (Wafer Setup)
Amplifier:
4.500
1.1 dB
4.000
Y-factor with noise source Y-factor with noise source connected connected to DUT via switch matrix to probe via switch matrix
3.500 NF (dB)
Y-factor with noise source connected to DUT input Y-factor with noise source 0.75 dB connected to probe input PNA-X PNA-X
0.3 dB
3.000
Amplifier:
2.500
Gain = 15 dB Input/output match = 10 dB NF = 3 dB Gamma opt = 0.268 0o Fmin = 1.87 dB Rn = 12 33 Wave model correlation = 50%
2.000 0.5 2.5 4.5 6.5 8.5 10.5 12.5 GHz 14.5 16.5 18.5 20.5 22.5 24.5 26.5
Aerospace and Defense Symposium 2007 EuMw 2007 Agilent Workshop Verification approach
Need To Avoid Using An Active Device
Cannot Guarantee Behavior Over Time Dependence On Temperature Noise May Be Injected Through Bias Supply
Aerospace and Defense Symposium 2007 EuMw 2007Transmission Line Characteristics Mismatch Agilent Workshop
Aerospace and Defense Symposium 2007 EuMw 2007 Agilent Workshop Noise wave representations
50 25 50
AMP
[TL], [CL]
anL a1L b1L bnL
[TA], [CA]
anA b2L a1A a2L b1A bnA
[TL]
a 2 nL CtL = b a* nL nL
[TA]
* anAbnA 2 bnA
b2A a2A
* a 2 anLbnL ; C = nA tA 2 b a* bnL nA nA
Aerospace and Defense Symposium 2007 EuMw 2007 S-parameters of Amplifier Measured Agilent Workshop
Aerospace and Defense Symposium EuMw 2007 Agilent Workshop Calculated vs. Measured Combined |S11| 2007
Aerospace and Defense Symposium EuMw 2007 Agilent Workshop Calculated vs. Measured Combined Gain 2007
Aerospace and Defense Symposium 2007 EuMw 2007 Agilent Workshop Calculated vs. Measured Combined Noise Figure
Aerospace and Defense Symposium 2007 EuMw 2007 Agilent Workshop Additional References:
[1] D. Vondran, Noise Figure Measurement: Corrections Related to Match and Gain, Microwave J., pp 22-38, Mar. 1999 [2] Collantes, J. M., R. D. Pollard, et al. (2002). "Effects of DUT mismatch on the noise figure characterization: a comparative analysis of two Y-factor techniques." Instrumentation and Measurement, IEEE Transactions on 51(6): 1150-1156. [3] Fundamentals of RF and Microwave Noise Figure Measurements, Hewlett-Packard Application Note 571, Palo Alto, CA July 1983 [4] IRE Subcommittee 7.9 On Noise: Representation Of Noise In Linear Two-ports, Proc. IRE, Vol. 48, Pp. 69-74, Jan. 1960 [4] A. C. Davidson, B. W. Leake, et al. (1989). "Accuracy improvements in microwave noise parameter measurements." Microwave Theory and Techniques, IEEE Transactions on 37(12): 1973-1978. [5] R.Q. Lane, The Determination of Device Noise Parameters, Proceedings of the IEEE, Aug. 1969, pp. 1461-1462 [6] P. Penfield, Jr "Wave Representation of Amplifier Noise." IRE Transactions On Circuit Theory: Mach (1962) pp. 84-86 [7] K. Hartmann, Noise Characterization of Linear Circuits, IEEE Transactions on Circuits and Systems, Vol. cAS-23, No. 10, Oct. 1976, pp. 581-590 [8] R.P. Meys, A Wave Approach to the Noise Properties of Linar Microwave Devices, IEEE Transactions on Microwave Theory and Techniques, Vol. MTT-26, No. 1, Jan. 1978, pp 34-37 [9] S. W. Wedg ,and D. B. Rutledge (1992). "Wave techniques for noise modeling and measurement." Microwave Theory and Techniques, IEEE Transactions on 40(11): 2004-2012. [10] J. Randa, W. Wiatr, Conte Carlo Estimation of Noise Parameter Uncertainties, IEE Proc. Sci. Meas. Technology, Vol. 149, No. 6, Nov. 2002, pp. 333-337 [11] E.C. Valk, D. Routledge, J.F. Vaneldik, T.L. Landecker, De-Embedding Two-Port Noise Parameters Using a Noise Wave Model, IEEE Transactions on Instrumentation and Measurement, vol. 37, no. 2, June 1988, pp 195-200
Advancements in Noise Measurement
By Ken Wong Page 56
Aerospace and Defense EuMw 2007 Agilent Workshop Noise Option Block Diagram Symposium 2007
Source 1
OUT 1 OUT 2 OUT 1
Source 2
OUT 2
24V DC
R1 A
35 dB 65 dB 65 dB
10 MHz 3 GHz
3 - 26.5 GHz
R2 B
35 dB
Test port 1
Source 2 Output 1
DU T
Source 2 Output 2
Test port 2
Noise Source
Advancements in Noise Measurement
By Ken Wong Page 57