Ieee 80 Tiuch and Step Volt - Full Calc

FICHTNER INDIA
STANDARD CALCULATIONS
DOC. NO.
FOR
REV. NO.
SIZING OF EARTHING GRID
1 of 22
DATE
(IEEE METHOD)
PAGE NO.
EARTHINGCALCULATIONS
1.0 INPUTDATA
1.1 FaultCurrent
If
kA
31.5
1.2 DurationofFaultcurrent
tc
secs.
kA
31.5
0.6
kA
secs.
forconductorsizing
1.3 TotalFaultCurrentconsideredfor
kA
Step&Touchpotential
1.4 RatioofSoilreturncurrentto
Ig / I
Faultcurrent(assumed)
1.5 Faultreturncurrentthrough
Ig
kA
18.9
kA
ts
secs.
0.5
secs.
1.7 Lengthofareatobeearthed
150
1.8 Breadthofareatobeearthed
65
1.9 SoilResistivityofupperlayer
50
1.10 SoilResistivityoflowerlayer
50
1.11 SurfaceSoilResistivity
3000
1.12 Designambienttemperature
Ta
45
1.13 Depthofburialofconductor
0.6
Ap
M2
9750
actualEarth
1.6 Durationofshockcurrentfor
potentialgradientcalculations
1.14 AreaofPlot
211527577.xls
FICHTNER INDIA
DOC. NO.
FOR
REV. NO.

(IEEE METHOD)
211527577.xls
DATE
PAGE NO.
2 of 22
FICHTNER INDIA
DOC. NO.
FOR
REV. NO.
2.1 Materialofconductor
2.2 Typeofconductor
2.3 Typeofjoint
2.4
2.5
2.6
2.7
Conductorresistivity
ConductorDensity
Specificheat
Thermalcoefficientof
resistivityattemp.Tr
2.8 Referencetemp.for
materialconstant
2.9 Maximumallowabletemp.
PAGE NO.
/cm3
= MS
= ROD
= WELDING
=
15 /cm3
SW
SH
gm/cm3
Cal/gm/0C
=
=
r
Tr
Tm
=
C
0
C
0
DATE
(IEEE METHOD)
2.0 CONDUCTORSIZING
3 of 22
=
=
7.86 gm/cm3
0.114 Cal/gm/0C
0.00423
20 0C
620 0C
2.10 Conductorcrosssection,Ainmm2
A=
If*
where
and
tc*r*r*104
TCAP
ln 1+ Tm-Ta
Ko+Ta
TCAP =
Ko =
4.184*SW*SH
1/r - Tr
Therefore,
A
ConsideringCorrosionAllowanceof
Areaofcrosssectionrequiredis
ConductorSizechosenis
211527577.xls
--As per IEEE 80, eqn.33
J/cm3/0C
=
=
3.749
216.407
= 658.1586 mm2
30 %
855.6062

--As per IEEE 80, page 65
--As per CBIP Tech.

report no. 5
33.0059 mmdiaMSStrip
FICHTNER INDIA
DOC. NO.
FOR
REV. NO.

(IEEE METHOD)
Actualconductorcrosssectionarea
Therefored=conductordiameterinM
211527577.xls
DATE
PAGE NO.
= 1017.876 mm2
=
0.036 M
4 of 22
FICHTNER INDIA
DOC. NO.
FOR
REV. NO.

(IEEE METHOD)
hs =
K = -s
3.3
Cs =
DATE
PAGE NO.
3.0 TOLERABLESTEPANDTOUCHPOTENTIAL
3.1
3.2
5 of 22
0
--depends on thickness of crushed gravel spreaded throughout the plot
-0.96721 --As per IEEE-80 page 40
+s
0.55
--As per Fig.-8 / page 41 of IEEE-80
3.4 TolEstep
(1000+6*s*Cs)*0.116/sqrt(ts)
--As per IEEE 80, eqn.24 for average

human weight of 50kg
3.5 TolEtouch
(1000+1.5*s*Cs)*0.116/sqrt(ts)

Therefore,
4.0 INITIALDESIGN
TolerableEstep
Volts
= 1788.132 V
TolerableEtouch
Volts
= 570.0695 V
4.1 Lengthofareaconsidered
4.2 Breadthofareaconsidered
4.3 Spacingbetweenconductors
No. of conductors on either direction
D
na
nb
M
M
=
=
150 M
65 M
5M
=
=
31
14
4115 M
M
M
=
=
=
4.4 Total Length of buried conductor

4.5 Totalno.ofearthingpits
Roddepth
ThereforeRodLength
211527577.xls
Lc
Np
dr
Lr
25 Nos.
3M
75 M

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DOC. NO.
FOR
REV. NO.
6 of 22
DATE
(IEEE METHOD)
PAGE NO.
4.6 Total Length

TL=Lc+1.15Lr
4201.25 M
0.235
-As per IEEE 80, page 114 & page 115
5.0 GRIDRESISTANCE
5.1 Grid resistance Rg=
1+ 1
1+ 1
TL 20Ap
1+h20/Ap
6.0 CALCULATIONOFMESHANDSTEP(ATTAINABLE)VOLTAGES
6.2 Es
= *g*Ks*Ki
TL
= *g*Km*Ki
TL
= 519.5815 V
1788.132
= 506.3446 V
570.0695
0.375934
where,
Kii for grids with ground rods / earth pits
predominantly along the perimeter
1
ho(reference depth of burial)
=
1 M (assumed)
Spacing between conductors 'D' in M =
5 M
n = na*nb
= 20.8326667
(1+h/ho)
Kh
=
= 1.26491106
n-2
Ks
=1
1 + 1 + 1 (1-0.5 )
= 0.385761
6.1 Em
where,
Km
Tolerable
Tolerable
=1 ( ln D2 + (D+2h)2 - h ) + Kii ln ( 8
))
(
2
16hd
8Dd
4d
Kh
(2n-1)
2h
Ki
=
where, nx = max(na,nb)
211527577.xls
D+h
D
0.656+.172nx
5.988
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DOC. NO.
FOR
REV. NO.

(IEEE METHOD)
211527577.xls
DATE
PAGE NO.
7 of 22
FICHTNER INDIA
DOC. NO.
FOR
REV. NO.
8 of 22
DATE
(IEEE METHOD)
PAGE NO.
1.0 INPUTDATA
1.1 FaultCurrent
If
kA
3.18
kA
tc
secs.
0.5
secs.
kA
3.18
kA
0.6
forconductorsizing
Step&Touchpotential
Ig / I
Ig
kA
1.908
kA
ts
secs.
0.5
secs.
70
70
400
400
2500
Ta
40
0.5
Ap
M2
4900
actualEarth
1.14 AreaofPlot
211527577.xls
FICHTNER INDIA
DOC. NO.
FOR
REV. NO.

(IEEE METHOD)
211527577.xls
DATE
PAGE NO.
9 of 22
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DOC. NO.
FOR
REV. NO.
2.2 Typeofconductor
2.3 Typeofjoint
DATE
(IEEE METHOD)
2.0 CONDUCTORSIZING
10 of 22
PAGE NO.
= MS
= ROD
= WELDING
2.4
2.5
2.6
2.7
ConductorDensity
Specificheat
materialconstant
/cm3
SW
SH
gm/cm3
Cal/gm/0C
r
Tr
Tm
=
=
=
=
C
0
C
0
=
=
15 /cm3
7.86 gm/cm3
0.114 Cal/gm/0C
0.00423
20 0C
620 0C
A=
If*
where
and
tc*r*r*104
TCAP
ln 1+ Tm-Ta
Ko+Ta
TCAP =
Ko =
4.184*SW*SH
1/r - Tr
Therefore,
A
211527577.xls
J/cm3/0C
=
=
3.749
216.407
26.902665 mm2
30 %
34.973465

--As per CBIP Tech.

report no. 5
FICHTNER INDIA
DOC. NO.
FOR
REV. NO.
DATE
(IEEE METHOD)
211527577.xls
11 of 22
PAGE NO.
=
=
34 mm2
0.01 M
FICHTNER INDIA
DOC. NO.
FOR
REV. NO.

(IEEE METHOD)
hs =
K = -s
3.3
Cs =
DATE
PAGE NO.
3.1
3.2
12 of 22
0.102
-0.72414 --As per IEEE-80 page 40
+s
0.74
3.4 TolEstep
(1000+6*s*Cs)*0.157/sqrt(ts)

3.5 TolEtouch
(1000+1.5*s*Cs)*0.157/sqrt(ts)

Therefore,
4.0 INITIALDESIGN
TolerableEstep
Volts
2686.5815 V
TolerableEtouch
Volts
838.16902 V
M
M
=
=
70 M
70 M
7M
D
na
nb
=
=
11
11
1540 M
M
M
=
=
=

Roddepth
ThereforeRodLength
211527577.xls
Lc
Np
dr
Lr
0 Nos.
3M
0M

FICHTNER INDIA
DOC. NO.
FOR
REV. NO.
13 of 22
DATE
(IEEE METHOD)
PAGE NO.
4.6 Total Length

TL=Lc+Lr
1540 M
2.776
5.0 GRIDRESISTANCE
1+ 1
1+ 1
TL 20Ap
1+h20/Ap
Ground Potential Rise
5296.02351 Volt
6.2 Es
6.1 Em
where,
Km
= *g*Ks*Ki
TL
= *g*Km*Ki
TL
Actual
Tolerable
Actual
Tolerable
=1 ( ln D2 + (D+2h)2 - h ) + Kii ln ( 8
))
(
2
16hd
8Dd
4d
Kh
(2n-1)
=
=
457.29519 V
2686.5815
1001.6143 V
838.16902 NOT OK, NEED TO ADD RODS AROUD PERIPHERY
SEE NEXT SHEET
0.88955859
where,
0.5700634
Without Ground Rods, Kii is not 1, use formula
=
1 M (assumed)
7 M
n = na*nb
=
11
(1+h/ho)
Kh
=
= 1.22474487
Ks
= 0.40613523
=1
1 + 1 + 1 (1-0.5n-2)
211527577.xls
2h
D+h
FICHTNER INDIA
DOC. NO.
FOR
REV. NO.
Ki
211527577.xls
(IEEE METHOD)
0.644+.148n
14 of 22
DATE
PAGE NO.
2.272
FICHTNER INDIA
DOC. NO.
FOR
REV. NO.
15 of 22
DATE
(IEEE METHOD)
PAGE NO.
1.0 INPUTDATA
1.1 FaultCurrent
If
kA
3.18
kA
tc
secs.
0.5
secs.
kA
3.18
kA
0.6
forconductorsizing
Step&Touchpotential
Ig / I
Ig
kA
1.908
kA
ts
secs.
0.5
secs.
70
70
400
400
2500
Ta
40
0.5
Ap
M2
4900
actualEarth
1.14 AreaofPlot
211527577.xls
FICHTNER INDIA
DOC. NO.
FOR
REV. NO.

(IEEE METHOD)
211527577.xls
DATE
PAGE NO.
16 of 22
FICHTNER INDIA
DOC. NO.
FOR
REV. NO.
2.2 Typeofconductor
2.3 Typeofjoint
DATE
(IEEE METHOD)
2.0 CONDUCTORSIZING
17 of 22
PAGE NO.
= MS
= ROD
= WELDING
2.4
2.5
2.6
2.7
ConductorDensity
Specificheat
materialconstant
/cm3
SW
SH
gm/cm3
Cal/gm/0C
r
Tr
Tm
=
=
=
=
C
0
C
0
=
=
15 /cm3
7.86 gm/cm3
0.114 Cal/gm/0C
0.00423
20 0C
620 0C
A=
If*
where
and
tc*r*r*104
TCAP
ln 1+ Tm-Ta
Ko+Ta
TCAP =
Ko =
4.184*SW*SH
1/r - Tr
Therefore,
A
211527577.xls
J/cm3/0C
=
=
3.749
216.407
26.902665 mm2
30 %
34.973465

--As per CBIP Tech.

report no. 5
FICHTNER INDIA
DOC. NO.
FOR
REV. NO.
DATE
(IEEE METHOD)
211527577.xls
18 of 22
PAGE NO.
=
=
34 mm2
0.01 M
FICHTNER INDIA
DOC. NO.
FOR
REV. NO.

(IEEE METHOD)
hs =
K = -s
3.3
Cs =
DATE
PAGE NO.
3.1
3.2
19 of 22
0.102
-0.72414 --As per IEEE-80 page 40
+s
0.74
3.4 TolEstep
(1000+6*s*Cs)*0.157/sqrt(ts)

3.5 TolEtouch
(1000+1.5*s*Cs)*0.157/sqrt(ts)

Therefore,
4.0 INITIALDESIGN
TolerableEstep
Volts
2686.5815 V
TolerableEtouch
Volts
838.16902 V
M
M
=
=
70 M
70 M
7M
D
na
nb
=
=
11
11
M
M
=
=
=
1540
280
20
7.5
150


Roddepth
ThereforeRodLength
211527577.xls
Lc
Lp
Np
dr
Lr
M
M
Nos.
M
M
FICHTNER INDIA
DOC. NO.
FOR
REV. NO.
20 of 22
DATE
(IEEE METHOD)
PAGE NO.
4.6 Total Length

TL=Lc+Lr
1690 M
2.753
5.0 GRIDRESISTANCE
1+ 1
1+ 1
TL 20Ap
1+h20/Ap
Ground Potential Rise
5252.03673 Volt
6.2 Es
6.1 Em
where,
Km
= *g*Ks*Ki
TL
= *g*Km*Ki
TL
Actual
Tolerable
Actual
Tolerable
=
=
549.11079 V
2686.5815
749.05861 V
838.16902

1786.364343674 0.41932
=1 ( ln D2 + (D+2h)2 - h ) + Kii ln ( 8
))
(
2
16hd
8Dd
4d
Kh
(2n-1)
0.77168339
where,
1
Without Rods, Kii is set to unity = 1
=
1 M (assumed)
7 M
n = na*nb
=
11
(1+h/ho)
Kh
=
= 1.22474487
Ks
= 0.40613523
=1
1 + 1 + 1 (1-0.5n-2)
211527577.xls
2h
D+h
FICHTNER INDIA
DOC. NO.
FOR
REV. NO.
Ki
211527577.xls
(IEEE METHOD)
0.644+.148n
21 of 22
DATE
PAGE NO.
2.272
Schwarz's Formula
R1*R2 - R12
R1 + R2 - 2*R12
#NAME?
R1 =
[/(*LC)]*[ln(2*LC/h') + K1*(LC/A) - K2]
#NAME?
R2 =
[a/(2*n**dr)]*[ln(8*dr/d2) - 1 + 2*K1*(dr/A)*(n - 1)]
#NAME?
R12 =
[a/(*LC)]*[ln(2*LC/dr) + K1*(LC/A) - K2 + 1]
#NAME?
Rg =
where,
=
Soil Resistivity
#NAME?
a = Apparent soil resistivity as seen by a ground rod in -m
#NAME?
dr*(1*2) / [2*H + 1(dr - H)]
---- for rods penetrating
#NAME?
to 2 layers
dr*(1*2) / [2*(H-h) + 1(dr + h - H)] ---- for rods and grid conductors
#NAME?
in the same layer
1 = 2
---- for uniform soil
1 =
#NAME?
2 =
50
where,
H is the upper layer thickness
LC = Total Length of buried conductor

L = Length of plot plan
B = Breadth of plot plan
h' = sqrt(d1*h) or [0.5*d1 if h = 0]
where,
h = Depth of burial of conductor
d1 = dia of the grid conductors in m
A = Area of Plot
K1 = -0.04*L / W + 1.41
-0.05*L / W + 1.2
-0.05*L / W + 1.13
---- for h = 0
---- for h / A = 0.1
---- for h / A = 0.16667
K2 = 0.15*L / W + 5.5
0.10*L / W + 4.68
-0.05*L / W + 4.4
---- for h = 0
---- for h / A = 0.1
---- for h / A = 0.16667
n = no. of ground rods

dr = Roddepth
d2 = diaofthegroundrodsinm
211527577.xls
-m
-m
-m
-m
-m
-m
2 m
#NAME? m
#NAME? m
#NAME? m
#NAME?
#NAME? m
#NAME? m
#NAME? m
h/A = #NAME?
#NAME?
#NAME?
#NAME?
#NAME? m
#NAME? m

Ieee 80 Tiuch and Step Volt - Full Calc

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FICHTNER INDIA

SIZING OF EARTHING GRID

SIZING OF EARTHING GRID

SIZING OF EARTHING GRID

--As per IEEE 80, eqn.33

--As per IEEE 80, eqn.32

--As per CBIP Tech.

SIZING OF EARTHING GRID

SIZING OF EARTHING GRID

--As per Fig.-8 / page 41 of IEEE-80

--As per IEEE 80, eqn.24 for average

--As per IEEE 80, eqn.26 for average

4.4 Total Length of buried conductor

--As per IEEE 80, page 41

SIZING OF EARTHING GRID

4.6 Total Length

-As per IEEE 80, page 114 & page 115

--As per IEEE 80, eqn.40

--As per IEEE 80, eqn.73

--As per IEEE 80, eqn.68

--As per IEEE 80, eqn.74

--As per IEEE 80, eqn.71

--As per IEEE 80, eqn.69

SIZING OF EARTHING GRID

SIZING OF EARTHING GRID

SIZING OF EARTHING GRID

SIZING OF EARTHING GRID

--As per IEEE 80, eqn.33

--As per IEEE 80, eqn.32

--As per CBIP Tech.

SIZING OF EARTHING GRID

SIZING OF EARTHING GRID

--As per Fig.-8 / page 41 of IEEE-80

--As per IEEE 80, eqn.24 for average

--As per IEEE 80, eqn.26 for average

4.4 Total Length of buried conductor

--As per IEEE 80, page 41

SIZING OF EARTHING GRID

4.6 Total Length

-As per IEEE 80, page 114 & page 115

Ground Potential Rise

--As per IEEE 80, eqn.40

--As per IEEE 80, eqn.68

SIZING OF EARTHING GRID

--As per IEEE 80, eqn.69

SIZING OF EARTHING GRID

SIZING OF EARTHING GRID

SIZING OF EARTHING GRID

--As per IEEE 80, eqn.33

--As per IEEE 80, eqn.32

--As per CBIP Tech.

SIZING OF EARTHING GRID

SIZING OF EARTHING GRID

--As per Fig.-8 / page 41 of IEEE-80

--As per IEEE 80, eqn.24 for average

--As per IEEE 80, eqn.26 for average

--As per IEEE 80, page 41

4.4 Total Length of buried conductor

SIZING OF EARTHING GRID

4.6 Total Length

-As per IEEE 80, page 114 & page 115

Ground Potential Rise

--As per IEEE 80, eqn.40

[/(LC)][ln(2LC/h') + K1(LC/A) - K2]

[a/(2*n**dr)][ln(8dr/d2) - 1 + 2K1(dr/A)*(n - 1)]