Electron spectroscopy for Chemical analysys

Specification:- It is linked to the area of Materials

Characterization

and

Microstructural

Characterization.
Range & Resolution:- XPS energy resolution; 0.85
eV for Al K-alpha , 1.00 eV for Mg Kalpha and 1.4 eV
for Ag K-alpha , minimum element detection limit is
0.5% using XPS, energy resolution of UPS is131
meV.

The high resolution and high temperature

X-ray diffractometer equipped with reflectometry at
NML was installed in the year 2008. The main
important feature of the system is its high resolution
Equipment location:- MST
Make & Model:- M/s SPECS, Germany
Application:- Identification of elements, oxidation
states of elements, band gap, Valence electron
density and element distribution as a function of

capabilities.
Apart from the routine quality & quantitative
phase analysis, the available software, TOPAS, can
be used to determine micros strain and crystallite
size. The reflectometry attachment along with the
LEPTOS

depth size.

software

can

be

used

for

the

characterization of thin films. The high temperature

camera (up to 1600 degree C) with facilities to
Contact:-

Contact ID:-

operate under controlled atmosphere and vacuum is

Director , National Metallurgical

Laboratory, Jamshedpur

used for high temperature phase transformation

director@nmlindia.org

studies. The Euclerian Cradle available with the

diffratometer

Contact No:-

0657- 2345202/28

gives

it

addition

capability

crystallographic texture measurements.

for