QUANTITATIVE MICROSCOPY 4 7 1

60
SO
40

GRAIN SIZE ANALYSrS

SALTYKOV AREA METHOD

30

a. 20
UJ

{'
ui

0.2 0.5

S
10
20 30 4 0 50 60 70 6 0
90 95
PERCENT LESS THAN STATED SIZE RANGE

98 99 99.5

99.9

Figure 6-20 Logarithmic-probability plot of corrected grain size data by the Saltykov area method.

The use of serial sectioning for determining Nv overcomes many of the

difficulties of the previously described techniques because it does not depend on
shape assumptions and is not influenced by anisotropy [58, 59]. However, these
methods have seldom been used because of the belief that great effort is required.
However, it has recently been shown that as few as 5, but generally 6 to 10,
sections are adequate for estimating Nv with acceptable accuracy [59].
6-7.4 Summary
Grain size can be measured by a number of procedures which produce equivalent
estimates of the ASTM grain size number. Comparison chart ratings have limited
accuracy but are adequate for simple screening purposes. Lineal analysis produces a better estimate of G in about the same time as needed for a good
comparison rating. Lineal analysis is considerably faster and perhaps slightly
more accurate than ratings using the Jeffries method. The intercept method has
the additional advantage that NL is directly related to the grain-boundary surface
area per unit volume (Sv). The intercept method is also better suited for
measuring the grain size of two-phase structures, duplex grain structures, or
distorted grain structures. The versatility of the intercept method is enhanced
through the application of either random (circular) or oriented test lines.
Measurement of grain size distributions and the calculation of Nv, V, or D
generally involve grain shape assumptions. These techniques provide considerable information about the grain structure but are tedious to employ without
recourse to automatic or semiautomatic devices. Several simple methods for
estimating Nv are given which are useful if the full distribution curve is not