OC:

Test Object - Overcurrent Parameters

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General - Values:
TimeTolAbs:
TimeTolRel:
CurrentTolAbs:
CurrentTolRel:
Directional:

0.04 s
5.00 %
0.05 Iref
2.00 %
No

VT connection:
CT starpoint connection:

At protected object
To protected object

.
Elements - Phase:
Active
Yes
Yes

Name
I #1 Phase
I #2 Phase

Tripping characteristic
IEC Very Inverse
IEC Definite Time

I Pick-up
0.50 Iref
2.00 Iref

Time
0.05
0.05 s

Reset Ratio
0.95
0.95

Test Settings:
.
Fault Model:
Time reference:
Load current:
Load angle:
Prefault time:
Abs. max time:
Post fault time:
Rel. max time:
Enable voltage output:
Fault voltage LN (for all but two phase faults):
Fault voltage LL (for two phase faults):
Decaying DC active:
Time constant:
CB char min time:
Thermal reset active:
Thermal reset method:
Thermal reset message:

Fault inception
0.00 A
0.00
0.10 s
240.00 s
0.50 s
100.00 %
No
30.00 V
51.96 V
No
0.05 s
0.05 s
No
Manual
Please reset the Thermal Memory of the device under
test before continuing.

.
Shot Test:
Type
L1-E
L1-E
L1-E

Relative To
(---)
(---)
(---)

Factor
n/a
n/a
n/a

.
Binary Outputs:
Name
Bin. out 1
Bin. out 2
Bin. out 3
Bin. out 4

Binary Inputs:

State
0
0
0
0

Magnitude
2.25 A
2.98 A
0.73 A

Angle
n/a
n/a
n/a

tnom
50.00 ms
50.00 ms
1.474 s

tmin
10.00 ms
10.00 ms
1.149 s

tmax
90.00 ms
90.00 ms
1.980 s

Direction
Non Directional
Non Directional

Trigger Logic:

And

Name
Trip
Start

Trigger State
1
X

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Shot Test Results:
Type
L1-E
L1-E
L1-E

Relative To
(---)
(---)
(---)

Factor
n/a
n/a
n/a

Magnitude
2.25 A
2.98 A
0.73 A

Angle
n/a
n/a
n/a

tnom
50.00 ms
50.00 ms
1.474 s

tact
80.40 ms
73.50 ms
1.697 s

Overload
No
No
No

Result
Passed
Passed
Passed

.
Charts for Fault
Types:

t/s

Type
L1-E

Angle
n/a

10000.000
1000.000
100.000
10.000
1.000
0.100
0.010
0.5

0.7

1.0

2.0

3.0
I/A

.
State:
3 out of 3 points tested.
3 points passed.
0 points failed.
General Assessment: Test passed!

5.0

7.0

10.0

20.0