Texas Instruments held an innovation challenge in India in 2015 where students from VIT University in Vellore participated by developing a low cost self learning PCB tester and submitting a project report. The students - Shrey Ostwal, Sarthak Agarwal, Harshal Nasery, Ayush Jain, and Sachit Mahajan - received a certificate of participation signed by the director of university programs at Texas Instruments India.
Texas Instruments held an innovation challenge in India in 2015 where students from VIT University in Vellore participated by developing a low cost self learning PCB tester and submitting a project report. The students - Shrey Ostwal, Sarthak Agarwal, Harshal Nasery, Ayush Jain, and Sachit Mahajan - received a certificate of participation signed by the director of university programs at Texas Instruments India.
Texas Instruments held an innovation challenge in India in 2015 where students from VIT University in Vellore participated by developing a low cost self learning PCB tester and submitting a project report. The students - Shrey Ostwal, Sarthak Agarwal, Harshal Nasery, Ayush Jain, and Sachit Mahajan - received a certificate of participation signed by the director of university programs at Texas Instruments India.
Certificate of Participation This is to certify that Shrey Ostwal, Sarthak Agarwal, Harshal Nasery, Ayush Jain, Sachit Mahajan from VIT University, Vellore successfully implemented the Low Cost Self Learning Pcb Tester and submitted the project report to Texas Instruments Innovation India Design Contest 2015.
Sanjay Srivastava Director, University Program Texas Instruments India
Vinit Kumar Gunjan, Vicente Garcia Diaz, Manuel Cardona, Vijender Kumar Solanki, K. V. N. Sunitha - ICICCT 2019 – System Reliability, Quality Control, Safety, Maintenance and Management_ Applications .pdf