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CMOS Inverter: DC Analysis
CMOS Inverter: DC Analysis
VOH = VDD
Logic Swing
VOL = 0 V
Vin < VIL input logic LOW Vin > VIH input logic HIGH
Lecture Notes 7.3
Vin > ~Vout, Vin < VDD - |Vtp| Vin > VDD - |Vtp|
Mn in Triode, Mp in Cutoff
Mn in Triode, Mp in Saturation
Noise Margin
Input Low Voltage, VIL
Vin such that Vin < VIL = logic 0 point a on the plot where slope, Vin = 1 Vout
Vin such that Vin > VIH = logic 1 point b on the plot
Switching Threshold
Switching threshold = point on VTC where Vout = Vin Calculating VM
also called midpoint voltage, VM here, Vin = Vout = VM
at VM, both nMOS and pMOS in Saturation in an inverter, IDn = IDp, always! solve equation for VM
nCOX W
2 L (VGSn Vtn ) 2 =
I Dn =
n
2
(VGSn Vtn ) 2 =
p
2
(VSGp Vtp ) 2 = I Dp
n
2
express in terms of VM
(VM Vtn ) =
2
p
2
(VDD VM Vtp )
n p n p
solve for VM
VM =
n p
n p
nCoxn
If
since L normally min. size for all tx, can get betas equal by making Wp larger than Wn
Example
Given
kn = 140uA/V2, Vtn = 0.7V, VDD = 3V kp = 60uA/V2, Vtp = -0.7V
Find
a) tx size ratio so that VM= 1.5V b) VM if tx are same size
Vin(t), input voltage, function of time Vout(t), output voltage, function of time VDD and Ground, DC (not function of time) find Vout(t) = f(Vin(t))
Transient Parameters
Transient Response
Response to step change in input
delays in output due to parasitic R & C
Inverter RC Model
Resistances
Rn = 1/[n(VDD-Vtn)] Rp = 1/[n(VDD-|Vtp|)] + Vout CL -
Load capacitance, due to gates attached at the output Total Output Capacitance
Cout = CDn + CDp + CL
ECE 410, Prof. A. Mason
CL = 3 Cin = 3 (CGn + CGp), 3 is a typical load term fan-out describes # gates attached at output
Lecture Notes 7.9
Fall Time
Fall Time, tf
time for output to fall from 1 to 0 derivation: Vout Vout i = Cout = t Rn
initial condition, Vout(0) = VDD time constant solution t
Vout (t ) = VDD e
n = RnCout
V t = n ln DD Vout definition
tf is time to fall from 90% value [V1,tx] to 10% value
V V t = n ln DD ln DD 0.9V 0.1V DD DD
[V0,ty]
tf = 2.2 n
ECE 410, Prof. A. Mason Lecture Notes 7.10
Rise Time
Rise Time, tr
time for output to rise from 0 to 1 Vout VDD Vout derivation:
t Rp initial condition, Vout(0) = 0V solution time constant t p Vout (t ) = VDD 1 e p = RpCout
tf is time to rise from 10% value [V0,tu] to 90% value [V1,tv]
i = Cout
definition
tr = 2.2 p
Propagation Delay
Propagation Delay, tp
tp =
tf = 2.2 n, tr = 2.2 p,
n = RnCout
p = RpCout
= Cox (W/L)
if n=p=,
Rn+Rp =
Width Matched
Rn+Rp =
n p(VDD-Vt)
if Vt = Vtn = |Vtp|
n + p
Rn+Rp =
CL = 3 (CGn + CGp) = 3 Cox (WnL+WpL) CDn = Cox Wn L + Cj ADnbot + Cjsw PDnsw CDp = Cox Wp L + Cj ADpbot + Cjsw PDpsw
Cout
Cout = Cox L (Wn+Wp) + Cj 2L (Wn+Wp) + 3 Cox L (Wn+Wp)
assuming junction area ~W2L neglecting sidewall capacitance
~2L W L
Delay Cout(Rn+Rp) L W
W VDD
= L2
VDD
Lecture Notes 7.14
thus, increasing W is a good way to improve the speed within a local point But, increasing W increases chip area needed, which is bad
fast circuits need more chip area (chip real estate)
IDD DC current from power supply ideally, IDD = 0 in CMOS: ideally only current during switching action leakage currents cause IDD > 0, define quiescent leakage current, IDDQ (due largely to leakage at substrate junctions)
charge transferred during transition, Qe = Cout VDD assume each gate must transfer this charge 1x/clock cycle Paverage = VDD Qe f = Cout VDD2 f, f = frequency of signal change Power increases with Cout and frequency, and strongly with Total Power, P = IDDQ VDD + Cout VDD2 f VDD (second order).
ECE 410, Prof. A. Mason Lecture Notes 7.16
Series Transistors
increases effective L
effective
Parallel Transistors
increases effective W
effective
2
ECE 410, Prof. A. Mason Lecture Notes 7.18
NAND: DC Analysis
Multiple Inputs Multiple Transitions Multiple VTCs
n p
n p
series nMOS means more resistance to output falling, shifts VTC to right to balance this effect and set VM to VDD/2, can increase by increasing Wn
n p
n p
NOR: DC Analysis
Similar Analysis to NAND Critical Transition
0,0 to 1,1 when all transistors change
VM for NOR2 critical transition if WpA=WpB and WnA=WnB parallel nMOS, n 2 n series pMOS, p p
VDD Vtp + 2Vtn VM = 1+ 2
n p
n p
n p
n p
series pMOS resistance means slower rise VTC shifted to the left to set VM to VDD/2, increase Wp this will increase p
ECE 410, Prof. A. Mason Lecture Notes 7.21
for NOR2
for NOR-N
Rise Time, tr
tr = 2.2 p
p = Rp Cout
Fall Time, tf
Discharge Circuit
2 series nMOS, Rn 2Rn must account for internal cap, Cx
tf = 2.2 n
n = Cout (2 Rn ) + Cx Rn
ECE 410, Prof. A. Mason
Cx = CSn + CDn
Lecture Notes 7.22
Fall Time, tf
tf = 2.2 n
n = Rn Cout
Rise Time, tr
Charge Circuit
2 series pMOS, Rp 2Rp must account for internal cap, Cy
Cy = CSp + CDp
tr = 2.2 p
p = Cout (2 Rp ) + Cy Rp
ECE 410, Prof. A. Mason Lecture Notes 7.23
NAND/NOR Performance
Inverter: symmetry (VM=VDD/2), n = p (W/L)p = n/p (W/L)n Match INV performance with NAND pMOS, P = p, same as inverter nMOS, N = 2n, to balance for 2 series nMOS Match INV performance with NOR pMOS, P = 2 p, to balance for 2 series pMOS nMOS, N = n, same as inverter NAND and NOR will still be slower due to larger Cout This can be extended to 3, 4, N input NAND/NOR gates
ECE 410, Prof. A. Mason Lecture Notes 7.24
Tx Sizing Considerations
when all series transistor go from OFF to ON and all internal caps have to be
Performance Considerations
Speed based on n, p and parasitic caps DC performance (VM, noise) based on n/p Design for speed not necessarily provide good DC performance Generally set tx size to optimize speed and then test DC characteristics to ensure adequate noise immunity Review Inverter: Our performance reference point for symmetry (VM=VDD/2), n = p Use inverter as reference point for more complex gates Apply slowest arriving inputs to series node closest to output output slower
let faster signals begin to charge/discharge nodes closer to VDD and Ground
ECE 410, Prof. A. Mason
power supply
size vs. tx speed considerations Wnx Rn but Cout and Cn Wny Cn but Rn Wpz Rp but Cout and Cp Wpx no effect on critical path
Lecture Notes 7.27
pMOS
These large transistors will increase capacitance and layout area and may only give a small increase in speed
Advanced logic structures are best way to improve speed
ECE 410, Prof. A. Mason Lecture Notes 7.28
AB 0 0 0 0 0 0
CD 0 0 0 1 1 0
F 0 0 1
C C D B
Critical Path
1 0 0 0 0 1 1 0 0 1
1 1 1 1 1 longest delay through a circuit block largest sum of delays, from input to output intuitive analysis: signal that passes through most gates
path through most gates critical path if delay due to D input is very slow
Multi-Input Gates
same DC component as inverter, PDC = VDDIDDQ for dynamic power, need to estimate activity of the gate, how often will the output be switching NOR NAND Pdyn = aCoutV2DDf, a = activity coefficient estimate activity from truth table
a = p0p1
p0 = prob. output is at 0 p1 = prob. of transition to 1
larger W will decrease R but increase Cin Note: no connections to VDD-Ground. Input signal, Vin, must drive TG output; TG just adds extra delay
ECE 410, Prof. A. Mason Lecture Notes 7.31
Pass Transistor
Single nMOS or pMOS tx Often used in place of TGs
less area and wiring cant pull to both VDD and Ground typically use nMOS for better speed
=1 time x=0 ID time x=1 y=1 0 =1 y=0 1