Professional Documents
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(IJECET)
Volume 7, Issue 1, Jan-Feb 2016, pp. 55-62, Article ID: IJECET_07_01_006
Available online at
http://www.iaeme.com/IJECETissues.asp?JType=IJECET&VType=7&IType=1
Journal Impact Factor (2016): 8.2691 (Calculated by GISI) www.jifactor.com
ISSN Print: 0976-6464 and ISSN Online: 0976-6472
IAEME Publication
1. INTRODUCTION
Metamaterials (MTM) have the capability to exhibit a state where both permittivity
and permeability are negative, resulting in extraordinary index of negative refraction
[1,2]. They consist of metal and dielectric substrate. The metamaterial structures have
helped to the miniaturization of many electromagnetic devices and have been used to
improve the performance of various RF/microwave components such as filters,
antennas, transmission lines, etc.[3-5] Although there are different structures of
metamaterial existing, now the emphasis is on planar metamaterial configuration. The
planar metamaterial structures are classified in two most important categories viz.
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Shilpa Kashyap
(a)
(b)
Figure 1 (a) Original metamaterial structure and (b) The modified proposed structure
Increasing the length of straight line, can increase the electrical length of the
structure within same volume. The resonant frequency of the proposed structure is
given by [7]:
(1)
where
is the capacitance and is inductance offered by the structure. The
capacitances are calculated with the well known formula for parallel plate capacitors
for each parallel meander line:
(2)
where
is the permittivity in free space and is the relative permittivity of the
material in between the capacitor plates,
is the area of the plates and
is the
distance between plates. For the series capacitance , the area = conductor
thickness x 0.24 P, where P is the periodicity in mm.
The inductance between cells consists of the self inductance of the straight
conductor that connects two cells. In order to increase this inductance, the proposed
change of the modification is to alter the geometry from a straight line into a meander.
The sections of the meander each have self inductance and also exhibit mutual
inductance between sections.
The total inductance is equal to the total self inductance
plus the positive
mutual inductance
and minus the negative mutual inductance
:
(3)
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(a)
(b)
Figure 2 Simulation window of Empire XCcel (a) for TEM wave generation and (b)
for the structure with microstrip line for reflection and transmission coefficient
measurement.
The P1E and P2 are the measurement and reference planes in the simulations.
The E in P1E indicates that the port is excited as it is the source. The blue crosses
(X) indicate where these ports are, while the dashed lines (---) indicate the
measurement/reference planes and in this case coincides with the port positions.
The Dump Box is used as a storage box to measure and save the values of the E
and H-fields along any path within the box at pre-defined frequencies. Figure (a)
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Shilpa Kashyap
shows the amplitudes of the three cartesian components of each of the fields at 14
GHz. For a plane wave, the E and H fields are in phase and are perpendicular to each
other and to the direction of propagation. The wave impedance, in these regions can
be readily obtained by dividing the value of the E field by that of H-filed. This has
resulted in the value near to the well-known wave impedance of free space i.e. 376.99
approximately.
(a)
(b)
Figure 3 (a) Variation of electric field components and (b) Variation of magnetic
field components with path length
From Figure 3(a), it is observed that
and
are close to zero while
94
V/m, and from Figure 3(b),
and
are zero while
0.25 A/m. So the
impedance obtained within the simulated environment is nearly equal to that of free
space impedance. Similar results are obtained at 12 GHz and 16 GHz. These values
show that the wave generated by the port is a true TEM plane.
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Figure 4 The simulated reflection and transmission coefficients in the presence of the
proposed metamaterial structure
(a)
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(b)
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Shilpa Kashyap
(c)
(d)
Figure 6 (a) Simulated reflection and transmission coefficients, (b) Simulated
reflection and transmission phase, (c) Extracted effective permeability and (d) Extracted
effective permittivity for the proposed metamaterial structure.
5. PROTOTYPING WORK
To validate the simulated results, prototyping of the proposed planar structure is done
using a CNC machine and experiment is carried out using the vector network
analyzer. Computer aided design is created with the help of EMPIRE XCcel software.
The layout was exported to the GERBER file format and then imported in the PCAM
software to generate the layers of the prototype of the metamaterials structure.
PCAM software is executed to run the prototyping machine. The fabricated
metamaterial structure is shown in figure 7(a) and 7(b). The top view is showing the
copper patches and meander lines. The back view is showing the dielectric substrate.
(a)
(b)
(c)
Figure 7
(a)Top view of the fabricated MTM structure
(b)Back view of the fabricated MTM structure
(c) Prototyping machine used to fabricate the metamaterial structure
The Network Analyzer (NA) is used to measure the S-parameters. In practice, a
NA will generally measure the incident and reflected waves through a series of
couplers or bridges, referred to as directional devices [11]. The directional device is
able to separate the incident from reflected waves. Using this measurement practice,
the resulting measurements will be quantities that are subject to imperfections of the
NA, such as the coupling factor and directivity of the directional devices. Thus, more
complicated calculations are needed in order to determine calibrated S-parameters
starting from a set of raw quantities. The measured and simulated results are in
agreement. The small deviations are due to the limitations of the fixture structure used
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to hold the proposed structure. Moreover the extracted parameters from the measured
transmission and reflection coefficients are also found to be in fair agreement.
(a)
(b)
Figure 8 (a) Experimental set-up for the measurement of S-parameters of proposed
metamaterial structure and (b) Screen shot of the measured transmission and
reflection coefficients.
6. CONCLUSION
In recent years, the search for artificial materials i.e. electromagnetic structures,
specifically metamaterials has attracted world wide interest from researchers due to
their applications in radio frequency/ microwave components. So, designing a
meandered line metamaterial structure with negative permittivity and permeability is a
good attempt in this field due to ease of fabrication with the printed circuit board. The
parameters associated with the proposed metamaterial structure were retrieved from
the S-parameters. The S-parameters describe the magnitude and phase relationship
between incident and reflected waves and are numbered according to where a wave
originates from and where it propagating to.
7. ACKNOWLEDGEMENT
I would like to thank my gratitude to all those who gave me the possibility to
complete this project. I would like to take this opportunity to express my sincere
thanks to everybody that has helped and encouraged me throughout my project work.
REFERENCES
[1]
[2]
[3]
[4]
[5]
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Shilpa Kashyap
[6]
[7]
[8]
[9]
[10]
[11]
[12]
[13]
R. Coccioli, F.R. Yang, K.P. Ma, and T. Itoh, Aperture-Coupled Patch Antenna
on UCPBG substrate, IEEE Transactions on Microwave Theory and Techniques,
47(11), pp. 2123 2130, Nov. 1999.
Baljeet Singh Sinwar and Dr. Mithilesh Kumar. Design of A New Metamaterial
Structure To Enhancement The Performance of Rectangular Microstrip Patch
Antenna. International Journal of Electronics and Communication Engineering
& Technology, 4(7), 2013, pp. 60-65.
Sankul Agarwal, Amandeep Singh, Rohit Jha and Rishabh Jain. Optimization of
Rectangular Microstrip Patch Antenna Parameters in L Band by Employment of
Proposed Composite Negative Index Metamaterial Structure. International
Journal of Electronics and Communication Engineering & Technology, 4(4),
2013, pp. 176-187.
Personal communication with Conrad Bailey, Nov. - Dec. 2007
A. Taflove and S.C. Hagness, Computational Electrodynamics: The FiniteDifference Time-Domain Method, 2nd ed., Norwood, MA: Artech House, 2000
W. B. Weir, Automatic measurement of complex dielectric constant and
permeability at microwave frequencies, Proceedings of the IEEE, 62(1), pp. 33
36, 1974.
IMST GmbH, EMPIRE XCcel Manual, 2007.
gilent Network Analyzer Basics technical notes,
http://www2.ee.cityu.edu.hk/~sklmmw/apmtt/B2BJan14/day1/Agilent_VN
A_AN_Basics_5965-7917E.PDF
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