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Irfz46n PDF
Irfz46n PDF
IRFZ46N
HEXFET Power MOSFET
l Advanced Process Technology D
l Ultra Low On-Resistance VDSS = 55V
l Dynamic dv/dt Rating
l 175C Operating Temperature RDS(on) = 16.5m
l Fast Switching G
l Fully Avalanche Rated ID = 53A
S
Description
Advanced HEXFET Power MOSFETs from International
Rectifier utilize advanced processing techniques to achieve
extremely low on-resistance per silicon area. This benefit,
combined with the fast switching speed and ruggedized
device design that HEXFET power MOSFETs are well
known for, provides the designer with an extremely efficient
and reliable device for use in a wide variety of applications.
Thermal Resistance
Parameter Typ. Max. Units
RJC Junction-to-Case 1.4
RCS Case-to-Sink, Flat, Greased Surface 0.50 C/W
RJA Junction-to-Ambient 62
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IRFZ46N
Electrical Characteristics @ TJ = 25C (unless otherwise specified)
Parameter Min. Typ. Max. Units Conditions
V(BR)DSS Drain-to-Source Breakdown Voltage 55 V VGS = 0V, ID = 250A
V(BR)DSS/TJ Breakdown Voltage Temp. Coefficient 0.057 V/C Reference to 25C, ID = 1mA
RDS(on) Static Drain-to-Source On-Resistance 16.5 m VGS = 10V, ID = 28A
VGS(th) Gate Threshold Voltage 2.0 4.0 V VDS = VGS, ID = 250A
gfs Forward Transconductance 19 S VDS = 25V, ID = 28A
25 VDS = 55V, VGS = 0V
IDSS Drain-to-Source Leakage Current A
250 VDS = 44V, VGS = 0V, TJ = 150C
Gate-to-Source Forward Leakage 100 VGS = 20V
IGSS nA
Gate-to-Source Reverse Leakage -100 VGS = -20V
Qg Total Gate Charge 72 ID = 28A
Q gs Gate-to-Source Charge 11 nC VDS = 44V
Qgd Gate-to-Drain ("Miller") Charge 26 VGS = 10V, See Fig. 6 and 13
td(on) Turn-On Delay Time 14 VDD = 28V
tr Rise Time 76 ID = 28A
ns
td(off) Turn-Off Delay Time 52 RG = 12
tf Fall Time 57 VGS = 10V, See Fig. 10
Between lead, D
LD Internal Drain Inductance 4.5
6mm (0.25in.)
nH G
from package
LS Internal Source Inductance 7.5
and center of die contact S
180
(Body Diode) p-n junction diode. S
Notes:
Repetitive rating; pulse width limited by Pulse width 400s; duty cycle 2%.
max. junction temperature. ( See fig. 11 ). This is a typical value at device destruction and represents
Starting TJ = 25C, L = 389H operation outside rated limits.
RG = 25, IAS = 28A. (See Figure 12). This is a calculated value limited to TJ = 175C.
ISD 28A, di/dt 220A/s, VDD V(BR)DSS, Calculated continuous current based on maximum allowable
TJ 175C. junction temperature. Package limitation current is 39A.
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IRFZ46N
1000 VGS
1000 VGS
TOP 15V TOP 15V
I D , Drain-to-Source Current (A)
10V 10V
4.5V
10 10
4.5V
1000 3.0
ID = 53A
RDS(on) , Drain-to-Source On Resistance
I D , Drain-to-Source Current (A)
2.5
TJ = 25 C
100 2.0
(Normalized)
TJ = 175 C
1.5
10 1.0
0.5
V DS= 25V
20s PULSE WIDTH VGS = 10V
1 0.0
4 5 6 7 8 9 10 11 -60 -40 -20 0 20 40 60 80 100 120 140 160 180
VGS , Gate-to-Source Voltage (V) TJ , Junction Temperature ( C)
3000 20
VGS = 0V, f = 1MHz ID = 28A
Ciss = Cgs + Cgd , Cds SHORTED V DS= 44V
Ciss
2000
12
1500
Coss
8
1000
Crss 4
500
1000 1000
OPERATION IN THIS AREA
LIMITED BY RDS (on)
ISD , Reverse Drain Current (A)
100 100
TJ = 175 C
100sec
10 10
TJ = 25 C 1msec
1 1
10msec
Tc = 25C
Tj = 175C
V GS = 0 V Single Pulse
0.1 0.1
0.2 0.7 1.2 1.7 2.2 1 10 100
VSD ,Source-to-Drain Voltage (V)
VDS , Drain-toSource Voltage (V)
60
RD
LIMITED BY PACKAGE VDS
50 VGS
D.U.T.
RG
ID , Drain Current (A)
+
40 -VDD
V GS
30 Pulse Width 1 s
Duty Factor 0.1 %
20
Fig 10a. Switching Time Test Circuit
10 VDS
90%
0
25 50 75 100 125 150 175
TC , Case Temperature ( C)
10%
VGS
Fig 9. Maximum Drain Current Vs.
td(on) tr t d(off) tf
Case Temperature
Fig 10b. Switching Time Waveforms
10
Thermal Response(Z thJC )
1
D = 0.50
0.20
0.10
PDM
0.1 0.05
t1
0.02 SINGLE PULSE
0.01 (THERMAL RESPONSE) t2
Notes:
1. Duty factor D = t 1 / t 2
2. Peak TJ = P DM x Z thJC + TC
0.01
0.00001 0.0001 0.001 0.01 0.1 1
t1 , Rectangular Pulse Duration (sec)
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IRFZ46N
RG D.U.T +
V
200
- DD
IAS A
20V
tp 0.01 150
V(BR)DSS 50
tp
0
25 50 75 100 125 150 175
Starting TJ , Junction Temperature( C)
50K
12V .2F
QG .3F
VGS +
V
D.U.T. - DS
QGS QGD
VGS
VG 3mA
IG ID
Charge Current Sampling Resistors
Fig 13a. Basic Gate Charge Waveform Fig 13b. Gate Charge Test Circuit
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IRFZ46N
Peak Diode Recovery dv/dt Test Circuit
+
- +
-
RG dv/dt controlled by RG +
ISD controlled by Duty Factor "D" VDD
-
D.U.T. - Device Under Test
VGS
[VGS=10V ] ***
Reverse
Recovery Body Diode Forward
Current Current
di/dt
D.U.T. VDS Waveform
Diode Recovery
dv/dt
[VDD]
Re-Applied
Voltage Body Diode Forward Drop
Inductor Curent
Ripple 5% [ISD ]
IR WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105
TAC Fax: (310) 252-7903
Visit us at www.irf.com for sales contact information.7/02
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Note: For the most current drawings please refer to the IR website at:
http://www.irf.com/package/