BAM Berlin

Computed
Computed Radiography
Radiography
--INDE
INDE2007,
2007,Kalpakkam,
Kalpakkam,India
India--

Requests
Requestsand
andinformation
informationto:
Uwe Zscherpel, Uwe Ewert Dr. U. Zscherpel / BAM
to:
Dr. U. Zscherpel / BAM
BAM Berlin, Division VIII.3 e-mail
e-mailuwez@bam.de
uwez@bam.de
1

Zscherpel, Ewert Computed Radiography April 2007

 New
NewTechnologies
Technologiesand
andFilm
FilmReplacement
Replacement

Scanner
Imaging
for Imaging
Plates
Plates

CR: Mobile Orex Scanner

Radiography
with
Imaging Plates
(CR)
Hard Copy
Grayscale
Agfa Printer

CR:FujiFilm XG1 NDT

Zscherpel, Ewert Computed Radiography April 2007

 Imaging
Imaging Plate
Plate Cycle
Cycle
Computed
ComputedRadiography
Radiography
Exposure

Read-out

Re-usage • high sensitivity

Lumisys ACR2000 • medium resolution
• high dynamic range
• re-usable

Erasure Laser

Zscherpel, Ewert Computed Radiography April 2007

 Storage
StoragePrinciple
Principleof
ofLuminescence
LuminescenceImaging
ImagingPlates
Plates

BaFCl:Eu scintillator Æ BaFBr:Eu storage phosphor

4

Zscherpel, Ewert Computed Radiography April 2007

 5

Zscherpel, Ewert Computed Radiography April 2007

 Comparison
Comparison of
of step
step
wedge
wedge exposures
exposures
BAS 2000
a)a)Imaging
Imagingplate
platesystem
systemwith
withlog.
log.
amplifier.
amplifier.
The
Thegrey
greylevel
levelisisproportional
proportionaltoto
the
thewall
wallthickness.
thickness.
IP b)b)Digitized
Digitizedfilm.
film.
The
Thegrey
greylevel
levelisisproportional
proportionaltoto
the
thelight
lightintensity
intensitybehind
behindthe
thefilm.
film.

X-ray tube

Film
Comparison:
a) Imaging plates (IP) and
b) Film
6

Zscherpel, Ewert Computed Radiography April 2007

 Image Quality Parameters

Radiographic Image Quality is the basis for all comparisons

Digital Detector

Subject Contrast Detector Contrast Noise Detector Unsharpness Projected Unsharpness

Detector Contrast: Signal

SNR for linear detectors
CNR
CNR - Contrast/Noise Ratio BSR – Basic Spatial Resolution
(effektive pixel size)
SNR - Signal/Noise Ratio
Detectors can be qualified
CNR = SNR(ITot) ⋅ Δw⋅µ/(1 + k)
and classified by its SNR
k = IScatter / I Primary and BSR values!
7

Zscherpel, Ewert Computed Radiography April 2007

 Signal/Noise Ratio
Definition of Signal/Noise Ratio and Signal proportional
Contrast/Noise Ratio to radiation dose!
D-D0

2*Noise

Signal

Contrast

Zscherpel, Ewert Computed Radiography April 2007

 Comparison
Comparison of
of Systems
Systems

Digital Industrial Radiology

Film Replacement Standards EN 14784 for CR were

developed to be comparable with
Standards, EN 444, EN 584-1, EN 462-5 !
Regulations
All film based standards require:
• Welding
• Casting • Minimum optical Density (e.g. > 2.0)
• Maximum film system class (e.g. ≤ ASTM special)
• Maximum unsharpness (> 0.1 mm, FFD/FOD)

Zscherpel, Ewert Computed Radiography April 2007

 Film replacement: What is the Optical Density ?
Film reading from light box, D=2:

Light source Film Optical Density = log (Io / I1)

Light intensity
measurement
• The opt. density is a measure of light
Sensor 6000 absorption by film
Luxmeter
Io
• No digital X-ray detector yields an
optical density

• There exist software on the market

which provides wrong equivalent
60
I1 values for the optical density of
Luxmeter
CR or DR systems!
10

Zscherpel, Ewert Computed Radiography April 2007

NDT
NDTfilm
filmas
aslinear
linearradiation
radiationdetector (D-D00))∝∝K:
detector(D-D K:

steel, 160 kV

11

Zscherpel, Ewert Computed Radiography April 2007

Film all NDT film systems
Film system
system classes
classes have
have of all vendors
different
different SNR
SNR values
values atat along one line!
opt.
opt. density
density == 22 for
for AGFA films 2002 -2004
different
different dose
dose values
values In mixed systems
(EN
(EN 584-1,
584-1, ASTM
ASTM EE 1815)
1815)

∝√(D-D )
film ∝√(D-D00)
SNR
SNRfilm

SNR
SNRMax (class C , D<4.5)
Max(class Cxx, D<4.5)

square root (dose / mGy)

12

Zscherpel, Ewert Computed Radiography April 2007

Film
Film System
System Classes
Classes are
are the
the Basis
Basis for
for CR
CR Classification
Classification
and
and all
all Digital
Digital Detectors
Detectors
Tab. 1: Overview about the film system classes SNR = log(e) ⋅ (G2/σD)
in different standards and for linear detectors only
the corresponding SNR values and G2/σD values.

Minimum gradient-
System class noise ratio at
Signal to Noise Ratio

USA D=2 above D 0 D=2 above D 0

W orld Europe Japan
ASTM
ISO 11699-1 CEN 584-1 K7627-97
E1815-01 G 2 /σ D SNR
C1 Special 300 130
T1
C2 T1 270 230! 117 100!
C3 I 180 78
T2
C4 T2 150 65
T3 C5 II T3 120 52
T4 C6 III T4 100 43
W -A W -A 135
W -B W -B 110
W -C W -C 80

EN 14784 Part 1: Classification of Systems

13

Zscherpel, Ewert Computed Radiography April 2007

Classification by
- SNR and
CR
CR System
System classes
classes
- Spatial resolution
e.g.: IP-3/200

Table 1: IP-scanner system classes in

dependence on the minimum SNR
IP System classes
System class System class System class Minimum
CEN ISO ASTM Signal-noise ratio
New table 1
IP 1 IP-AS Special 130
IP 2 IP-T 1 117 with 6 classes!
IP 3 78
IP 4 IP-T2 IP-AS 1 65
IP 5 IP-T3 IP-AS 2 52
IP 6 IP-T4 IP-AS 3 43

NOTE:The SNR-values of table 1 are equivalent to EN 584-1, ISO 11699-1, ASTM E 1815-96
They are calculated by: SNR = log (e) · (Gradient/Granularity) of table 1 of the corresponding
standards and up-rounded. The calculation of measured SNR values shall be performed from
dose proportional data. Part 1: Classification of Systems
14

Zscherpel, Ewert Computed Radiography April 2007

 FUJI XG-1 CR System Classification (BSR = 130 µm)

CR problem:
SNR limited by structure noise
of imaging plates!

SNR 0.1mm Pb f&b versus SQRT(Dose/mGy)

SNR
180,00

160,00
y = -0,7114x 4 + 11,315x 3 - 63,635x 2 + 159x
R2 = 0,9974
140,00

120,00

100,00

80,00

60,00

01Pb f&b 130µm

40,00
Polynomisch (01Pb f&b 130µm)
20,00

0,00
0,0 0,2 0,4 0,6 0,8 1,0 1,2 1,4 1,6 1,8

Wurzel (Dosis)
15

Zscherpel, Ewert Computed Radiography April 2007

BAM 5 test weld, 8 mm Steel, 120 kV, different exposure time:
Exp. Time 1x Exp. Time 4.3x Exp. Time 43x

magnification CR-System: FujiFilm DynamiX (XG 1)

16

Zscherpel, Ewert Computed Radiography April 2007

 Basic
Basic differences
differences
Film
Film –– Imaging
Imaging Plate:
Plate:
• Film systems are characterized by sensitivity
(speed) and the SNR at D=2. The spatial
resolution is high, rarely used and typically
limited by geometrical unsharpness of exposure
set-up (shortest exposure time!).
• Digital detectors have a higher dynamic range, the
SNR depends on exposure. The spatial resolution
is limited (digital file size!).
17

Zscherpel, Ewert Computed Radiography April 2007

Status and Situation for CR: CR
CR Procedure
Procedure
CEN
CENEN
EN14784-2
14784-2
- 2005: Computed Radiology standards were ASTM
ASTMEE2033
2033
completed and published in USA and Europe!
- The CR procedure is different from the film radiography procedure
- The optical impression of digital radiographic images is not different from
film images in its structure (if not digitally processed, except brightness and
contrast control)
- RT-trained personal can interpret digital images in analogy to film
- Digital images need a PC for presentation and may be altered by specialized
image processing
- A basic training in image processing is essential to avoid miss interpretation
- Quantitative assessment of flaw sizes is improved by digital processing but
the results may differ from those ones of film interpretation
- Electronic reference catalogues may support correct image assessment
18

Zscherpel, Ewert Computed Radiography April 2007

 19

Zscherpel, Ewert Computed Radiography April 2007

 2005

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Zscherpel, Ewert Computed Radiography April 2007

 Achievable Contrast Sensitivity and Exposure Time

- The contrast sensitivity improves with the increasing exposure time (better
SNR, weaker details becomes visible!)
- The structural noise of the IPs limits the max. achievable SNR
- Step hole, plate hole and wire image quality indicators measure the increase of
CNR and improvement of contrast sensitivity
- Unsharp imaging plates achieve a higher max. SNR and need less exposure
time
- The normalized SNRN (with BSR) is independent on the unsharpness, but
depends on the efficiency and plate homogeneity
- Only unsharp IPs for radiography with higher energy (about > 250 keV) yield
a considerable reduction of exposure time in comparison to film.

21

Zscherpel, Ewert Computed Radiography April 2007

 Required Image Quality Indicators for CR

See also ASTM E747-97 Both

BothIQI’s
IQI’sare
arerequired
required
→ but different to EN 462 for
forCR!
CR!
Description of Wire -IQI
For
Forunsharpness
unsharpnessonly
only!!
For
Forcontrast
contrastonly
only!!

Wire IQI
EN 462-1

Lead marks Plastic

Step-Hole IQI
EN 462-2

Duplex wire IQI / EN 462-5 / ASTM

E 2002
22

Zscherpel, Ewert Computed Radiography April 2007

 CR
System Selection

European Standard
EN 14784-2

23

Zscherpel, Ewert Computed Radiography April 2007

 EN 14784-224
Zscherpel, Ewert Computed Radiography April 2007
FujiFilm NDT Correct IP-Type X-ray
X-raytube:
tube:Seifert
SeifertIsovolt
Isovolt320
320
100
100kV,
kV,11mA,
mA,11min,
min,small
smallfocus
focus
SDD
SDD==1000
1000mm
mm

Agfa NDT

Agfa Prototype
(blue) 8 9 10 11 12 13

digitised grey values

scanning: Agfa DPS,
pixel distance: 28.2 µm (900 dpi)
8 9 10 11 12 13 double wire
0.32 0.25 0.20 0.16 0.13 0.10 mm unsharpness

25

Zscherpel, Ewert Computed Radiography April 2007

 High
HighDefinition
DefinitionCR
CR
––Dürr
DürrGermany
Germany--

Important Advantages:
- flexible imaging plates (IP) in
direct contact with inner canister wall
- arbitrary formats possible (length not
limited, width max. 14“ (35cm)
- could even be tried with existing set-
up (colimator, rotating canister)
- small Laser spot (8 µm) allows
small BSR for high resolution plates scan direction

Flexible IP (14“x17“) on mobile CR scanner (Dürr)

Disadvantages:
- No automated inspection
- Manual handling for IP read-out
- IP based on BaFBr have limited
absorption efficiency
50 k€
High resolution mode (BSR=40 µm with suitable
Imaging plate) available, with thicker IP high
Sensitivity achievable (BSR 100 … 200 µm)

For more information see www.duerr-ndt.de

26

Zscherpel, Ewert Computed Radiography April 2007

 High Definition CR Systems

Systems available down to

• 12 µm pixel pitch and
• 40 µm basic spatial resolution

• “weld quality”

HD CR 35 NDT:
of Dürr, Germany

HD-IP, light blue

27

Zscherpel, Ewert Computed Radiography April 2007

 BAM Certification 2006

28

Zscherpel, Ewert Computed Radiography April 2007

Under Discussion:
- Intermediate filters Improvement of CNR
- Pre filters
- Max tube voltage

Lead screens may damage the IPs! EN 14784-2

29

Zscherpel, Ewert Computed Radiography April 2007

 Improvement of CNR
Under Discussion:
- Intermediate filters
- Pre filters Draft
- Max tube voltage (lower than for film!) Designation: E 2033–xx

TABLE 1 Lead Screen and Filter Thickness

Lead Thickness A
KV Range Front Screen Maximum, in. Back Screen Minimum, in. Filter at Tube port
> 40kV None. None. <2mm Be Tube Port
40 to 55kV None. None. 0.04 Alum. (1mm)
55 to 90kV None – 0.001 (25µm) None - 0.001 (25µm) 0.04 Alum. (1mm)
90 to 120 kV 0.002 (50µm) 0.002 (50µm) 0.08 Alum. (2mm)
120 to 160kV 0.005 (125µm) 0.005 (125µm) 0.01 Copper (250µm)
160 to 200 kV 0.01 (0.25 mm) 0.01 (0.25 mm) 0.04 Copper (1mm)
200 to 320kV 0.02 (0.5mm) 0.02 (0.5mm) 0.118 Copper (3mm)
320kV-420kV 0.04 (1mm) 0.04 (1mm) 0.236 Copper (6mm)
1MeV to < ≥? 0.04 (1mm) ≥?0.04(1mm) None
Se135 0.01 (0.25mm) 0.01 (0.25mm) None
Ir192 0.02 (0.5mm) 0.02 (0.5mm) None
Co60 0.04 (1mm) 0.04 (1mm) None

Lead screens may damage the IPs!

30

Zscherpel, Ewert Computed Radiography April 2007

 CR Phantom
- long term stability tests -
EN 14784-1, ASTM E 2445

Evaluation of Phantom:

• spatial resolution (by duplex-wire method, optional converging line pairs)

• contrast (recognized contrast percentage of the material to examine)
• slipping (yes/no)
• jitter (yes/no)
• MTF (European standard only)
• shading (percentage at selected distance)
• SNRN (Intensity) near BAM-snail 20x400 window recommended

31

Zscherpel, Ewert Computed Radiography April 2007

EN 14784-1
Appendix B:

32

Zscherpel, Ewert Computed Radiography April 2007

 Photograph:

35x43 cm²
Protoype

Available from:

- Fluke Biomedical,
Part/No. 07-605-2435, 14”x17”
www.flukebiomedical.com/rms

- CIT (8”x10”) in U.K.

33

Zscherpel, Ewert Computed Radiography April 2007

CR
CRradiograph
radiograph
90
90kV,
kV,2m,
2m,4mAmin
4mAmin

34

Zscherpel, Ewert Computed Radiography April 2007

 Duplex
Duplexwire
wireIQI
IQI

Pair 9 = 260 µm

BAM-snail for test of

source position 20% dip

EN 462-5: unsharpness 0.26 mm

Æ BSR = 0.13 mm
35

Zscherpel, Ewert Computed Radiography April 2007

BAM-snail for test of Converging line pair IQI
source position

3.6 lp/mm
Unsharpness = 280 µm

Basic Spatial Resolution = 140 µm

Problems
Problemsarise
arisefor
forhigh
highresolution
resolution
systems;
systems;aliasing
aliasingeffects
effects

36

Zscherpel, Ewert Computed Radiography April 2007

 Linearity test
- Check rulers
- Slipping IP was detected by
a line structure in the image.

Scanner needs repair!

37

Zscherpel, Ewert Computed Radiography April 2007

 - Jitter Test: no problem
Profile for MTF - MTF calculation from profile:

Zero Frequency drop indicates

internal scatter

MTF

MTF20 = 1.6 lp/mm

Unsharpness = 0.62 mm (too high!)
38

Zscherpel, Ewert Computed Radiography April 2007

SNRN (Intensity)
near BAM-snail
20x400 window
recommended

39

Zscherpel, Ewert Computed Radiography April 2007

 Documentation of Long Term Stability Tests

40

Zscherpel, Ewert Computed Radiography April 2007

 Summary:
Summary:
Î The practice for CR (EN 14784-2) is based on EN 444 and ISO
5579 for NDT film.

Î Film can be substituted by IPs

Î The exposure conditions have to be selected to achieve the

required SNR and CNR
Î 2 IQIs are required for CNR and BSR

Î Tab. 4 in EN 14784-2 regulates the device selection, especially

the required basic spatial resolution (BSR)
Î The max tube voltage should be reduced in comparison to film
application

Î Long term stability can be checked by CR Phantom

41

Zscherpel, Ewert Computed Radiography April 2007

 END

42

Zscherpel, Ewert Computed Radiography April 2007